with spherical mirrors

Industry

CPC
H01J49/484

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/484with spherical mirrors

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Analyser arrangement for particle spectrometer
- Patent number 9,978,579
- Issue date May 22, 2018
- SCIENTA OMICRON AB
- Björn Wannberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analyser arrangement for particle spectrometer
- Patent number 9,437,408
- Issue date Sep 6, 2016
- SCIENTA OMICRON AB
- Björn Wannberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Parallel radial mirror analyser with an angled zero-volt equipotent...
- Patent number 8,981,292
- Issue date Mar 17, 2015
- National University of Singapore
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spheroidal charged particle energy analysers
- Patent number 8,373,122
- Issue date Feb 12, 2013
- Shimadzu Research Laboratory (Europe) Ltd.
- Nikolay Alekseevich Kholine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging energy filter for electrons and other electrically charged...
- Patent number 7,126,117
- Issue date Oct 24, 2006
- Krzysztof Grzelakowski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Large geometric factor charged particle spectrometer
- Patent number 6,703,612
- Issue date Mar 9, 2004
- Luke Goembel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for surface analysis
- Patent number 5,665,967
- Issue date Sep 9, 1997
- Thermo Instrument Systems Inc.
- Peter A. Coxon
- G01 - MEASURING TESTING
Information Patent Grant
Charged-particle analyzer
- Patent number 5,506,414
- Issue date Apr 9, 1996
- Fisons plc
- Peter Coxon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle analyser
- Patent number 5,451,783
- Issue date Sep 19, 1995
- Fisons plc
- Peter Coxon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for filtering electrically charged particles and energy filter
- Patent number 5,365,064
- Issue date Nov 15, 1994
- Balzers Aktiengesellschaft
- Gerhard Rettinghaus
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging XPS system
- Patent number 5,285,066
- Issue date Feb 8, 1994
- Jeol Ltd.
- Tetsu Sekine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle energy analyzers
- Patent number 5,185,524
- Issue date Feb 9, 1993
- Kratos Analytical Limited
- Simon C. Page
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Energy filter for charged particle beam apparatus
- Patent number 5,126,565
- Issue date Jun 30, 1992
- U.S. Philips Corp.
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spherical electrode type charged particle analyzer
- Patent number 5,107,111
- Issue date Apr 21, 1992
- Shimadzu Corporation
- Hiroshi Daimon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lens system for a photo ion spectrometer
- Patent number 4,973,842
- Issue date Nov 27, 1990
- Arch Development Corp.
- Dieter M. Gruen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron spectrometer
- Patent number 4,942,298
- Issue date Jul 17, 1990
- The Victoria University of Manchester
- John Comer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photo ion spectrometer
- Patent number 4,889,987
- Issue date Dec 26, 1989
- Arch Development Corporation
- Dieter M. Gruen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photo ion spectrometer
- Patent number 4,864,130
- Issue date Sep 5, 1989
- Arch Development Corporation
- Dieter M. Gruen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photo ion spectrometer
- Patent number 4,855,596
- Issue date Aug 8, 1989
- Arch Development Corp.
- Dieter M. Gruen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Secondary ion mass spectrometer
- Patent number 4,800,273
- Issue date Jan 24, 1989
- Bradway F. Phillips
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Energy and analysis detection system for surface chemical analysis
- Patent number 4,737,639
- Issue date Apr 12, 1988
- The Perkin-Elmer Corporation
- Thomas W. Rusch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle energy spectrometer
- Patent number 4,593,196
- Issue date Jun 3, 1986
- Vg Instruments Group Limited
- Kenneth Yates
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3870882
- Patent number 3,870,882
- Issue date Mar 11, 1975
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3806728
- Patent number 3,806,728
- Issue date Apr 23, 1974
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3787692
- Patent number 3,787,692
- Issue date Jan 22, 1974
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3766381
- Patent number 3,766,381
- Issue date Oct 16, 1973
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3742214
- Patent number 3,742,214
- Issue date Jun 26, 1973
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3733483
- Patent number 3,733,483
- Issue date May 15, 1973
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3714417
- Patent number 3,714,417
- Issue date Jan 30, 1973
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3699331
- Patent number 3,699,331
- Issue date Oct 17, 1972
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ANALYSER ARRANGEMENT FOR PARTICLE SPECTROMETER
- Publication number 20180269054
- Publication date Sep 20, 2018
- SCIENTA OMICRON AB
- Björn WANNBERG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYSER ARRANGEMENT FOR PARTICLE SPECTROMETER
- Publication number 20140361161
- Publication date Dec 11, 2014
- VG SCIENTA AB
- Björn Wannberg
- G01 - MEASURING TESTING
Information Patent Application
PARALLEL RADIAL MIRROR ANALYSER FOR SCANNING MICROSCOPES
- Publication number 20140042317
- Publication date Feb 13, 2014
- National University of Singapore
- Anjam KHURSHEED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE ENERGY ANALYSERS
- Publication number 20110147585
- Publication date Jun 23, 2011
- Nikolay Alekseevich Kholine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electromagnetic Imaging Analyser
- Publication number 20110069862
- Publication date Mar 24, 2011
- VACUUM SYSTEMS LTD
- Jiri Krizek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Imaging energy filter for electrons and other electrically charged...
- Publication number 20050285032
- Publication date Dec 29, 2005
- Krzysztof Grzelakowski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Large geometric factor charged particle spectrometer
- Publication number 20030042416
- Publication date Mar 6, 2003
- Luke Goembel
- H01 - BASIC ELECTRIC ELEMENTS

with spherical mirrors

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Analyser arrangement for particle spectrometer

Analyser arrangement for particle spectrometer

Parallel radial mirror analyser with an angled zero-volt equipotent...

Spheroidal charged particle energy analysers

Imaging energy filter for electrons and other electrically charged...

Large geometric factor charged particle spectrometer

Apparatus and method for surface analysis

Charged-particle analyzer

Charged-particle analyser

Process for filtering electrically charged particles and energy filter

Imaging XPS system

Charged particle energy analyzers

Energy filter for charged particle beam apparatus

Spherical electrode type charged particle analyzer

Lens system for a photo ion spectrometer

Electron spectrometer

Photo ion spectrometer

Photo ion spectrometer

Photo ion spectrometer

Secondary ion mass spectrometer

Energy and analysis detection system for surface chemical analysis

Charged particle energy spectrometer

3870882

3806728

3787692

3766381

3742214

3733483

3714417

3699331

Patents Applicationslast 30 patents

ANALYSER ARRANGEMENT FOR PARTICLE SPECTROMETER

ANALYSER ARRANGEMENT FOR PARTICLE SPECTROMETER

PARALLEL RADIAL MIRROR ANALYSER FOR SCANNING MICROSCOPES

CHARGED PARTICLE ENERGY ANALYSERS

Electromagnetic Imaging Analyser

Imaging energy filter for electrons and other electrically charged...

Large geometric factor charged particle spectrometer