Wobbulating devices similar to swept panoramic receivers

Industry

CPC
G01R23/173

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R23/00Arrangements for measuring frequencies Arrangements for analysing frequency spectra

Current Industry

G01R23/173Wobbulating devices similar to swept panoramic receivers

Industries

Patents Grantslast 30 patents

Information Patent Grant
Spectrum analyzer and method of controlling the same
- Patent number 11,906,558
- Issue date Feb 20, 2024
- Innowireless Co., Ltd.
- Young Su Kwak
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum analyzer and method of controlling the same
- Patent number 11,740,269
- Issue date Aug 29, 2023
- Innowireless Co., Ltd.
- Young Su Kwak
- G01 - MEASURING TESTING
Information Patent Grant
High resolution spectrum monitoring
- Patent number 11,630,138
- Issue date Apr 18, 2023
- The Regents of the University of California
- Yeswanth Reddy Guddeti
- G01 - MEASURING TESTING
Information Patent Grant
Functional noise floor adjustment of signal measurement device
- Patent number 11,137,429
- Issue date Oct 5, 2021
- Keysight Technologies, Inc.
- Bruce A. Erickson
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Anode materials for lithium ion batteries and methods of making and...
- Patent number 10,819,400
- Issue date Oct 27, 2020
- Johnson Matthey Public Limited Company
- Xiaohua Ma
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
Spectral analysis signal identification
- Patent number 10,396,865
- Issue date Aug 27, 2019
- CommScope Technologies LLC
- Zhao Li
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
Adaptive noise reduction in a signal analyzer
- Patent number 10,145,877
- Issue date Dec 4, 2018
- Keysight Technologies, Inc.
- Joseph Michael Gorin
- G01 - MEASURING TESTING
Information Patent Grant
Digital sweep type spectrum analyzer with up/down frequency conversion
- Patent number 9,759,753
- Issue date Sep 12, 2017
- Topcon Positioning Systems, Inc.
- Andrey V. Veitsel
- G01 - MEASURING TESTING
Information Patent Grant
Millimeter-wave band spectrum analysis device and analysis method
- Patent number 9,389,255
- Issue date Jul 12, 2016
- Anritsu Corporation
- Masaaki Fuse
- G01 - MEASURING TESTING
Information Patent Grant
Signal analysis apparatus and signal analysis method
- Patent number 9,140,730
- Issue date Sep 22, 2015
- Anritsu Corporation
- Toru Otani
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum analyzer and spectrum analysis method
- Patent number 8,509,296
- Issue date Aug 13, 2013
- Anritsu Corporation
- Momoko Inadomaru
- G01 - MEASURING TESTING
Information Patent Grant
Frequency characteristics measuring device
- Patent number 8,446,144
- Issue date May 21, 2013
- Advantest Corporation
- Shinji Kuniie
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum analyzer system and spectrum analyze method
- Patent number 8,072,206
- Issue date Dec 6, 2011
- Advantest Corporation
- Eiji Kanoh
- G01 - MEASURING TESTING
Information Patent Grant
Secum-trahenz method, especially for a network analyzer, for measur...
- Patent number 8,022,687
- Issue date Sep 20, 2011
- Rohde & Schwarz GmbH & Co. KG
- Georg Ortler
- G01 - MEASURING TESTING
Information Patent Grant
Method for carrying out a frequency change
- Patent number 7,948,326
- Issue date May 24, 2011
- Rohde & Schwarz GmbH & Co. KG
- Georg Ortler
- G01 - MEASURING TESTING
Information Patent Grant
Image cancellation in frequency converters for spectrum analysers
- Patent number 7,741,830
- Issue date Jun 22, 2010
- Advantest Corporation
- Jacky Griffault
- G01 - MEASURING TESTING
Information Patent Grant
Gated sweep in spectrum analyzers
- Patent number 7,714,564
- Issue date May 11, 2010
- Agilent Technologies, Inc.
- Thomas M Wright
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum analyzer having a resolution filter that can be adjusted v...
- Patent number 7,501,807
- Issue date Mar 10, 2009
- Rohde & Schwarz GmbH & Co. KG
- Kurt Schmidt
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum analyzer and method for correcting frequency errors
- Patent number 7,397,312
- Issue date Jul 8, 2008
- Agilent Technologies, Inc.
- John H. Guilford
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for increasing the dynamic range and measuring ac...
- Patent number 7,313,492
- Issue date Dec 25, 2007
- Rohde & Schwarz GmbH & Co. KG
- Georg Ortler
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for zero-mixing spectrum analysis
- Patent number 7,099,016
- Issue date Aug 29, 2006
- Rohde Schwarz GmbH & Co. KG
- Pavel Baros
- G01 - MEASURING TESTING
Information Patent Grant
Modulation signal analysis apparatus
- Patent number 6,891,904
- Issue date May 10, 2005
- Anritsu Corporation
- Tomohisa Okada
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Frequency conversion sweep measuring method
- Patent number 6,861,833
- Issue date Mar 1, 2005
- Advantest Corporation
- Kouji Miyauchi
- G01 - MEASURING TESTING
Information Patent Grant
Resolution filter for a spectrum analyzer
- Patent number 6,763,323
- Issue date Jul 13, 2004
- Rohde & Schwarz GmbH & Co KG
- Kurt Schmidt
- G01 - MEASURING TESTING
Information Patent Grant
Very fast swept spectrum analyzer
- Patent number 6,700,366
- Issue date Mar 2, 2004
- Anritsu Company
- Derek Truesdale
- G01 - MEASURING TESTING
Information Patent Grant
Signal analysis apparatus having YTO yttrium-iron garnet tuned osci...
- Patent number 6,504,354
- Issue date Jan 7, 2003
- Anritsu Corporation
- Yuichi Waida
- G01 - MEASURING TESTING
Information Patent Grant
Signal analyzing apparatus
- Patent number 6,445,327
- Issue date Sep 3, 2002
- Anritsu Corporation
- Yuji Kishi
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum analyzer and spectrum measuring method using the same
- Patent number 6,344,735
- Issue date Feb 5, 2002
- Advantest Corporation
- Yuji Yoshino
- G01 - MEASURING TESTING
Information Patent Grant
Frequency analysis method and sweep type spectrum analyzer
- Patent number 6,275,020
- Issue date Aug 14, 2001
- Advantest Corporation
- Masao Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Frequency spectrum analyzer with high C/N ratio
- Patent number 6,265,861
- Issue date Jul 24, 2001
- Advantest Corp.
- Hirobumi Musha
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPECTRUM ANALYZER AND METHOD OF CONTROLLING THE SAME
- Publication number 20230037910
- Publication date Feb 9, 2023
- INNOWIRELESS CO., LTD.
- Young Su KWAK
- G01 - MEASURING TESTING
Information Patent Application
Devices, Systems, and Software including Signal Power Measuring and...
- Publication number 20210123959
- Publication date Apr 29, 2021
- Astrapi Corporation
- Jerrold PROTHERO
- G01 - MEASURING TESTING
Information Patent Application
SPECTRUM ANALYZER AND METHOD OF CONTROLLING THE SAME
- Publication number 20200379024
- Publication date Dec 3, 2020
- INNOWIRELESS CO., LTD.
- Young Su KWAK
- G01 - MEASURING TESTING
Information Patent Application
HIGH RESOLUTION SPECTRUM MONITORING
- Publication number 20200326362
- Publication date Oct 15, 2020
- The Regents of the University of California
- Yeswanth Reddy Guddeti
- G01 - MEASURING TESTING
Information Patent Application
FUNCTIONAL NOISE FLOOR ADJUSTMENT OF SIGNAL MEASUREMENT DEVICE
- Publication number 20200309831
- Publication date Oct 1, 2020
- KEYSIGHT TECHNOLOGIES, INC.
- Bruce A. Erickson
- G01 - MEASURING TESTING
Information Patent Application
SPECTRAL ANALYSIS SIGNAL IDENTIFICATION
- Publication number 20180115348
- Publication date Apr 26, 2018
- CommScope Technologies LLC
- Zhao Li
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL ANALYSIS APPARATUS AND SIGNAL ANALYSIS METHOD
- Publication number 20140294199
- Publication date Oct 2, 2014
- Anritsu Corporation
- Toru Otani
- G01 - MEASURING TESTING
Information Patent Application
MILLIMETER-WAVE BAND SPECTRUM ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20140292305
- Publication date Oct 2, 2014
- Anritsu Corporation
- Masaaki Fuse
- G01 - MEASURING TESTING
Information Patent Application
SPECTRUM ANALYZER AND SPECTRUM ANALYSIS METHOD
- Publication number 20110150062
- Publication date Jun 23, 2011
- Anritsu Corporation
- Momoko Inadomaru
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY CHARACTERISTICS MEASURING DEVICE
- Publication number 20100259245
- Publication date Oct 14, 2010
- ADVANTEST CORPORATION
- Shinji Kunie
- G01 - MEASURING TESTING
Information Patent Application
Secum-Trahenz Method, Especially for a Network Analyzer
- Publication number 20100141239
- Publication date Jun 10, 2010
- Rohde& Schwarz GmbH & Co. KG
- Georg Ortler
- G01 - MEASURING TESTING
Information Patent Application
Method For Carrying Out A Frequency Change
- Publication number 20100141305
- Publication date Jun 10, 2010
- Rohde& Schwarz GmbH & Co. KG
- Georg Ortler
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY COMPONENT MEASURING DEVICE
- Publication number 20090315999
- Publication date Dec 24, 2009
- Advantest Corporation
- Hiroyuki Kurita
- G01 - MEASURING TESTING
Information Patent Application
SPECTRUM ANALYZER SYSTEM AND SPECTRUM ANALYZE METHOD
- Publication number 20090302829
- Publication date Dec 10, 2009
- Advantest Corporation
- EIJI KANOH
- G01 - MEASURING TESTING
Information Patent Application
Gated sweep in spectrum analyzers
- Publication number 20090179630
- Publication date Jul 16, 2009
- Thomas M. Wright
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ADJUSTING PHASE RELATIONSHIP BETWEEN SIGNALS IN A MEASUR...
- Publication number 20080309388
- Publication date Dec 18, 2008
- Agilent Technologies, Inc.
- Tomoki Hashimoto
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Image Cancellation In Frequency Converters For Spectrum Analysers
- Publication number 20080136401
- Publication date Jun 12, 2008
- Advantest Corporation
- Jacky Griffault
- G01 - MEASURING TESTING
Information Patent Application
Spectrum Analyzer Having a Resolution Filter that Can Be Adjusted V...
- Publication number 20070222431
- Publication date Sep 27, 2007
- Kurt Schmidt
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Spectrum analyzer and method for correcting frequency errors
- Publication number 20070026830
- Publication date Feb 1, 2007
- John H. Guilford
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Signal measuring device
- Publication number 20060286953
- Publication date Dec 21, 2006
- Hiroaki Takaoku
- G01 - MEASURING TESTING
Information Patent Application
Method and device for increasing the dynamic range and measuring ac...
- Publication number 20050222788
- Publication date Oct 6, 2005
- Georg Ortler
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for zero-mixing spectrum analysis
- Publication number 20040251888
- Publication date Dec 16, 2004
- Pavel Baros
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for determining the resonant frequency of a re...
- Publication number 20040183450
- Publication date Sep 23, 2004
- Patent-Treuhand-Gesellschaft fur elektrische Gluhlampen mbH
- Olaf Busse
- G01 - MEASURING TESTING
Information Patent Application
Frequency conversion sweep measuring method
- Publication number 20040041554
- Publication date Mar 4, 2004
- Kouji Miyauchi
- G01 - MEASURING TESTING
Information Patent Application
Very fast swept spectrum analyzer
- Publication number 20030146743
- Publication date Aug 7, 2003
- Derek Truesdale
- G01 - MEASURING TESTING
Information Patent Application
Resolution filter for a spectrum analyzer
- Publication number 20020135351
- Publication date Sep 26, 2002
- Kurt Schmidt
- G01 - MEASURING TESTING

Wobbulating devices similar to swept panoramic receivers

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Spectrum analyzer and method of controlling the same

Spectrum analyzer and method of controlling the same

High resolution spectrum monitoring

Functional noise floor adjustment of signal measurement device

Anode materials for lithium ion batteries and methods of making and...

Spectral analysis signal identification

Adaptive noise reduction in a signal analyzer

Digital sweep type spectrum analyzer with up/down frequency conversion

Millimeter-wave band spectrum analysis device and analysis method

Signal analysis apparatus and signal analysis method

Spectrum analyzer and spectrum analysis method

Frequency characteristics measuring device

Spectrum analyzer system and spectrum analyze method

Secum-trahenz method, especially for a network analyzer, for measur...

Method for carrying out a frequency change

Image cancellation in frequency converters for spectrum analysers

Gated sweep in spectrum analyzers

Spectrum analyzer having a resolution filter that can be adjusted v...

Spectrum analyzer and method for correcting frequency errors

Method and device for increasing the dynamic range and measuring ac...

Method and apparatus for zero-mixing spectrum analysis

Modulation signal analysis apparatus

Frequency conversion sweep measuring method

Resolution filter for a spectrum analyzer

Very fast swept spectrum analyzer

Signal analysis apparatus having YTO yttrium-iron garnet tuned osci...

Signal analyzing apparatus

Spectrum analyzer and spectrum measuring method using the same

Frequency analysis method and sweep type spectrum analyzer

Frequency spectrum analyzer with high C/N ratio

Patents Applicationslast 30 patents

SPECTRUM ANALYZER AND METHOD OF CONTROLLING THE SAME

Devices, Systems, and Software including Signal Power Measuring and...

SPECTRUM ANALYZER AND METHOD OF CONTROLLING THE SAME

HIGH RESOLUTION SPECTRUM MONITORING

FUNCTIONAL NOISE FLOOR ADJUSTMENT OF SIGNAL MEASUREMENT DEVICE

SPECTRAL ANALYSIS SIGNAL IDENTIFICATION

SIGNAL ANALYSIS APPARATUS AND SIGNAL ANALYSIS METHOD

MILLIMETER-WAVE BAND SPECTRUM ANALYSIS DEVICE AND ANALYSIS METHOD

SPECTRUM ANALYZER AND SPECTRUM ANALYSIS METHOD

FREQUENCY CHARACTERISTICS MEASURING DEVICE

Secum-Trahenz Method, Especially for a Network Analyzer

Method For Carrying Out A Frequency Change

FREQUENCY COMPONENT MEASURING DEVICE

SPECTRUM ANALYZER SYSTEM AND SPECTRUM ANALYZE METHOD

Gated sweep in spectrum analyzers

METHOD FOR ADJUSTING PHASE RELATIONSHIP BETWEEN SIGNALS IN A MEASUR...

Image Cancellation In Frequency Converters For Spectrum Analysers

Spectrum Analyzer Having a Resolution Filter that Can Be Adjusted V...

Spectrum analyzer and method for correcting frequency errors

Signal measuring device

Method and device for increasing the dynamic range and measuring ac...

Method and apparatus for zero-mixing spectrum analysis

Method and apparatus for determining the resonant frequency of a re...

Frequency conversion sweep measuring method

Very fast swept spectrum analyzer

Resolution filter for a spectrum analyzer