X-ray absorption fine structure [EXAFS]

Industry

CPC
G01N2223/041

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/041X-ray absorption fine structure [EXAFS]

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Spectrometer
- Patent number 12,235,228
- Issue date Feb 25, 2025
- EasyXAFS, LLC
- William Holden
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detector system with at least two stacked flat Bragg diffractors
- Patent number 12,209,977
- Issue date Jan 28, 2025
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray sequential array wavelength dispersive spectrometer
- Patent number 11,885,755
- Issue date Jan 30, 2024
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining a material composition
- Patent number 11,579,100
- Issue date Feb 14, 2023
- Bruker Nano GmbH
- Ralf Terborg
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analyzer
- Patent number 11,467,103
- Issue date Oct 11, 2022
- APPLIED SCIENCE LABORATORY CO., LTD.
- Hiroyoshi Soejima
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
System and method for x-ray absorption spectroscopy using a crystal...
- Patent number 11,428,651
- Issue date Aug 30, 2022
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
System and method for x-ray absorption spectroscopy using a crystal...
- Patent number 11,215,572
- Issue date Jan 4, 2022
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
Method for evaluating piezoelectric film, piezoelectric element, li...
- Patent number 10,096,766
- Issue date Oct 9, 2018
- Seiko Epson Corporation
- Masayuki Omoto
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Deterioration analyzing method
- Patent number 9,851,342
- Issue date Dec 26, 2017
- Sumitomo Rubber Industries, Ltd.
- Fusae Kaneko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Kinematic X-ray analyses apparatus
- Patent number 4,637,041
- Issue date Jan 13, 1987
- Technische Hogeschool Eindhoven
- Peter Brinkgreve
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ANALYSIS APPARATUS, ANALYSIS METHOD, AND ANALYSIS PROGRAM
- Publication number 20240319121
- Publication date Sep 26, 2024
- Rigaku Corporation
- Yoshiyasu ITO
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS
- Publication number 20240280515
- Publication date Aug 22, 2024
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING A CRYSTAL...
- Publication number 20220082516
- Publication date Mar 17, 2022
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING A CRYSTAL...
- Publication number 20210356412
- Publication date Nov 18, 2021
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EVALUATING PIEZOELECTRIC FILM, PIEZOELECTRIC ELEMENT, LI...
- Publication number 20180145246
- Publication date May 24, 2018
- SEIKO EPSON CORPORATION
- Masayuki OMOTO
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
DETERIORATION ANALYZING METHOD
- Publication number 20140349407
- Publication date Nov 27, 2014
- Fusae Kaneko
- G01 - MEASURING TESTING

X-ray absorption fine structure [EXAFS]

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Spectrometer

X-ray detector system with at least two stacked flat Bragg diffractors

X-ray sequential array wavelength dispersive spectrometer

Method for determining a material composition

X-ray analyzer

System and method for x-ray absorption spectroscopy using a crystal...

System and method for x-ray absorption spectroscopy using a crystal...

Method for evaluating piezoelectric film, piezoelectric element, li...

Deterioration analyzing method

Kinematic X-ray analyses apparatus

Patents Applicationslast 30 patents

ANALYSIS APPARATUS, ANALYSIS METHOD, AND ANALYSIS PROGRAM

X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS

SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING A CRYSTAL...

SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING A CRYSTAL...

METHOD FOR EVALUATING PIEZOELECTRIC FILM, PIEZOELECTRIC ELEMENT, LI...

DETERIORATION ANALYZING METHOD