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G01N2201/1042

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2201/00Features of devices classified in G01N21/00

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Patents Grantslast 30 patents

Information Patent Grant
Appearance inspection device and defect inspection method
- Patent number 11,936,985
- Issue date Mar 19, 2024
- Omron Corporation
- Shingo Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
System and method for characterization of patterns marked on a fabric
- Patent number 11,851,795
- Issue date Dec 26, 2023
- JEANOLOGIA, S. L.
- Pere Pérez Millán
- D06 - TREATMENT OF TEXTILES OR THE LIKE LAUNDERING FLEXIBLE MATERIALS NOT OTH...
Information Patent Grant
Color measuring device and color measuring method
- Patent number 10,502,627
- Issue date Dec 10, 2019
- Konica Minolta, Inc.
- Yasutaka Tanimura
- G01 - MEASURING TESTING
Information Patent Grant
Imaging apparatus and method
- Patent number 10,094,780
- Issue date Oct 9, 2018
- FUJIFILM Corporation
- Yasutake Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Infrared imaging system with automatic referencing
- Patent number 9,739,661
- Issue date Aug 22, 2017
- Agilent Technologies, Inc.
- Andrew Ghetler
- G01 - MEASURING TESTING
Information Patent Grant
Motion control systems and methods for biosensor scanning
- Patent number 8,922,860
- Issue date Dec 30, 2014
- Corning Incorporated
- Cameron John Tovey
- G01 - MEASURING TESTING
Information Patent Grant
Sorting device with a broad spectrum light source and according method
- Patent number 8,259,298
- Issue date Sep 4, 2012
- Belgian Electronic Sorting Technology N.V.
- Paul Berghmans
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Beam scanner and surface measurement apparatus
- Patent number 8,098,382
- Issue date Jan 17, 2012
- Samsung Electro-Mechanics Co., Ltd.
- Tak Gyum Kim
- G01 - MEASURING TESTING
Information Patent Grant
System and method for multimode imaging
- Patent number 7,567,346
- Issue date Jul 28, 2009
- General Electric Company
- Pavel A. Fomitchov
- G01 - MEASURING TESTING
Information Patent Grant
Optical sensor and method for optically inspecting surfaces
- Patent number 7,538,866
- Issue date May 26, 2009
- Siemens Aktiengesellschaft
- Wolfgang Heine
- G01 - MEASURING TESTING
Information Patent Grant
Multiple-label fluorescence imaging using excitation-emission matrices
- Patent number 7,532,326
- Issue date May 12, 2009
- Timothy C. Corcoran
- G01 - MEASURING TESTING
Information Patent Grant
Optical spot grid array scanning system
- Patent number 7,468,507
- Issue date Dec 23, 2008
- Applied Materials, Israel, Ltd.
- Steven R. Rogers
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for analyzing samples
- Patent number 7,202,945
- Issue date Apr 10, 2007
- Tecan Trading AG
- Andreas Erlbacher
- G01 - MEASURING TESTING
Information Patent Grant
Image reading method and apparatus
- Patent number 6,835,946
- Issue date Dec 28, 2004
- Fuji Photo Film Co., Ltd.
- Nobuhiko Ogura
- G01 - MEASURING TESTING
Information Patent Grant
System and method for determining changes in fluorescence of staine...
- Patent number 5,108,179
- Issue date Apr 28, 1992
- Stephen A. Myers
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL MEASUREMENT DEVICE
- Publication number 20240201085
- Publication date Jun 20, 2024
- Ushio Denki Kabushiki Kaisha
- Toshikazu NAGASHIMA
- G01 - MEASURING TESTING
Information Patent Application
APPEARANCE INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20220360720
- Publication date Nov 10, 2022
- Omron Corporation
- Shingo HAYASHI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEM AND METHOD FOR CHARACTERIZATION OF PATTERNS MARKED ON A FABRIC
- Publication number 20210238786
- Publication date Aug 5, 2021
- JEANOLOGIA, S. L.
- Pere PÉREZ MILLÁN
- G01 - MEASURING TESTING
Information Patent Application
Motion Control Systems and Methods For Biosensor Scanning
- Publication number 20130063724
- Publication date Mar 14, 2013
- Cameron John Tovey
- G01 - MEASURING TESTING
Information Patent Application
CONFOCAL FLUORESCENCE SLIDE SCANNER WITH PARALLEL DETECTION
- Publication number 20130015370
- Publication date Jan 17, 2013
- Huron Technologies International In
- Savvas Damaskinos
- G01 - MEASURING TESTING
Information Patent Application
BEAM SCANNER AND SURFACE MEASUREMENT APPARATUS
- Publication number 20100201993
- Publication date Aug 12, 2010
- Samsung Electro-Mechanics CO., LTD.
- Tak Gyum KIM
- G02 - OPTICS
Information Patent Application
SORTING DEVICE WITH A BROAD SPECTRUM LIGHT SOURCE AND ACCORDING METHOD
- Publication number 20100198397
- Publication date Aug 5, 2010
- Belgian Electronic Sorting Technology N.V.
- Paul Berghmans
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
Optical sensor and method for optically inspecting surfaces
- Publication number 20070252976
- Publication date Nov 1, 2007
- Siemens Aktiengesellschaft
- Wolfgang Heine
- G01 - MEASURING TESTING
Information Patent Application
System and method for multimode imaging
- Publication number 20070206192
- Publication date Sep 6, 2007
- GENERAL ELECTRIC COMPANY
- Pavel A. Fomitchov
- G02 - OPTICS
Information Patent Application
Masking to prevent overexposure and light spillage in microarray sc...
- Publication number 20070132831
- Publication date Jun 14, 2007
- Bio-Rad Laboratories, Inc.
- Daniel Y. Chu
- G01 - MEASURING TESTING
Information Patent Application
Optical spot grid array scanning system
- Publication number 20070133077
- Publication date Jun 14, 2007
- Steven R. Rogers
- G01 - MEASURING TESTING
Information Patent Application
Multiple-label fluorescence imaging using excitation-emisssion matr...
- Publication number 20060007439
- Publication date Jan 12, 2006
- Timothy C. Corcoran
- G01 - MEASURING TESTING
Information Patent Application
Device and method for analyzing samples
- Publication number 20050030541
- Publication date Feb 10, 2005
- Andreas Erlbacher
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Image reading method and apparatus
- Publication number 20020066866
- Publication date Jun 6, 2002
- Fuji Photo Film Co., Ltd.
- Nobuhiko Ogura
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Appearance inspection device and defect inspection method

System and method for characterization of patterns marked on a fabric

Color measuring device and color measuring method

Imaging apparatus and method

Infrared imaging system with automatic referencing

Motion control systems and methods for biosensor scanning

Sorting device with a broad spectrum light source and according method

Beam scanner and surface measurement apparatus

System and method for multimode imaging

Optical sensor and method for optically inspecting surfaces

Multiple-label fluorescence imaging using excitation-emission matrices

Optical spot grid array scanning system

Device and method for analyzing samples

Image reading method and apparatus

System and method for determining changes in fluorescence of staine...

Patents Applicationslast 30 patents

OPTICAL MEASUREMENT DEVICE

APPEARANCE INSPECTION DEVICE AND DEFECT INSPECTION METHOD

SYSTEM AND METHOD FOR CHARACTERIZATION OF PATTERNS MARKED ON A FABRIC

Motion Control Systems and Methods For Biosensor Scanning

CONFOCAL FLUORESCENCE SLIDE SCANNER WITH PARALLEL DETECTION

BEAM SCANNER AND SURFACE MEASUREMENT APPARATUS

SORTING DEVICE WITH A BROAD SPECTRUM LIGHT SOURCE AND ACCORDING METHOD

Optical sensor and method for optically inspecting surfaces

System and method for multimode imaging

Masking to prevent overexposure and light spillage in microarray sc...

Optical spot grid array scanning system

Multiple-label fluorescence imaging using excitation-emisssion matr...

Device and method for analyzing samples

Image reading method and apparatus