Claims
- 1. A method for fabricating an imprint tool master, comprising:
providing a metallic substrate; forming a first photoresist layer onto said substrate; aligning an image pattern mask onto said photoresist layer, wherein said pattern mask has portions that block exposure light and portions which transmit exposure light; exposing said photoresist layer with a first exposure of exposure light; removing said first pattern mask; developing said first photoresist layer to produce a master mandrel; forming a conductive film onto said master mandrel; and forming a tool master on said conductive film.
- 2. The method of claim 1, further comprising forming an embossing tool from said tool master.
- 3. The method of claim 2, wherein the step of forming an embossing tool comprises:
passivating said tool master; electroplating a metal layer onto said tool master; and separating said metal layer from said tool master to provide said embossing tool.
- 4. The method of claim 3, wherein the step of electroplating a metal layer includes electroplating a metal selected from the group consisting of the Transition series of metal listed in New IUPAC Group Numbers 4-12 of the Period Table of elements, tin, and any alloy thereof.
- 5. The method of claim 3, wherein the step of electroplating includes electroplating nickel.
- 6. The method of claim 1, wherein the step of providing a metallic substrate comprises providing a stainless steel substrate.
- 7. The method of claim 6, wherein the step of providing a stainless steel substrate comprises providing a stainless steel substrate that is about 0.090 inches thick.
- 8. The method of claim 1, wherein the step of providing a metallic substrate comprises providing a titanium substrate.
- 9. The method of claim 8, wherein the step of providing a titanium substrate comprises providing a titanium substrate that is about 0.090 inches thick.
- 10. The method of claim 1, wherein the step of forming a first photoresist layer onto said substrate comprises forming a first dry film photoresist layer on said substrate.
- 11. The method of claim 1, wherein the step of forming a first photoresist layer onto said substrate comprises forming a first wet photoresist layer onto said substrate.
- 12. The method of claim 1, wherein the step of aligning an image pattern mask comprises aligning a positive trace image pattern mask.
- 13. The method of claim 1, wherein the step of aligning an image pattern mask comprises aligning a negative trace image pattern mask.
- 14. The method of claim 1, wherein the step of forming a second photoresist layer comprises forming a second dry film photoresist layer.
- 15. The method of claim 1, wherein the step of forming a second photoresist layer comprises forming a second wet photoresist layer.
- 16. A method for fabricating an imprint tool master, comprising:
providing a metallic substrate; forming a first photoresist layer onto said substrate; aligning an image pattern mask onto said photoresist layer, wherein said pattern mask has first portions that block exposure light and first portions which transmit exposure light; exposing said photoresist layer with a first exposure of exposure light; removing said first pattern mask; forming a second photoresist layer onto said first photoresist layer; aligning a second pattern mask of a second desired pattern onto said second photoresist layer, wherein said second pattern mask has second portions that block exposure light and second portions which transmit exposure light; exposing said second photoresist layer with a second exposure of said exposure light transmitted through said second portions; removing said second pattern mask; developing both said first photoresist layer and said second photoresist layer to produce a master mandrel; forming a conductive film onto said master mandrel; and forming a tool master on said conductive film.
- 17. The method of claim 16, further comprising forming an embossing tool from said tool master.
- 18. The method of claim 17, wherein the step of forming a tool comprises:
passivating said tool master; electroplating a metal layer onto said tool master; and separating said metal from said tool master.
- 19. The method of claim 18, wherein the step of electroplating a metal layer includes electroplating The method of claim 3, wherein the step of electroplating a metal layer includes electroplating a metal selected from the group consisting of the Transition series of metal listed in New IUPAC Group Numbers 4-12 of the Period Table of elements, tin, and any alloy thereof.
- 20. The method of claim 18, wherein the step of electroplating a metal layer includes electroplating nickel.
- 21. The method of claim 16, wherein the step of providing a metallic substrate comprises providing a stainless steel substrate.
- 22. The method of claim 21, wherein the step of providing a stainless steel substrate comprises providing a stainless steel substrate that is about 0.090 inches thick.
- 23. The method of claim 16, wherein the step of providing a metallic substrate comprises providing a titanium substrate.
- 24. The method of claim 23, wherein the step of providing a titanium substrate comprises providing a titanium substrate that is about 0.090 inches thick.
- 25. The method of claim 16, wherein the step of forming a first photoresist layer onto said substrate comprises forming a first dry film photoresist layer on said substrate.
- 26. The method of claim 16, wherein the step of forming a first photoresist layer onto said substrate comprises forming a first wet photoresist layer onto said substrate.
- 27. The method of claim 16, wherein the step of aligning an image pattern mask comprises aligning a positive trace image pattern mask.
- 28. The method of claim 16, wherein the step of aligning an image pattern mask comprises aligning a negative trace image pattern mask.
- 29. The method of claim 16, wherein the step of forming a second photoresist layer comprises forming a second dry film photoresist layer.
- 30. The method of claim 16, wherein the step of forming a second photoresist layer comprises forming a second wet photoresist layer.
- 31. The method of claim 16, wherein the step of aligning a second pattern mask comprises aligning a second positive trace image pattern mask.
- 32. The method of claim 16, wherein the step of aligning a second pattern mask comprises aligning a second negative trace image pattern mask.
- 33. The method of claim 16, wherein the step of forming a conductive film comprises forming a conductive film by particle vapor deposition.
- 34. The method of claim 16, wherein the step of forming a conductive film comprises forming a copper film.
- 35. A 3 dimensional embossing tool, comprising:
an electroformed metal sheet having a print positive electroformed image of an embossing pattern, said pattern including a plurality of structures having variable geometries and minimum feature dimensions as small as about 0.0005 inches.
- 36. The embossing tool of claim 35, wherein said plurality of structures include multi-layered structures.
- 37. The embossing tool of claim 36, wherein each of said layers has a thickness ranging from about 0.0005 inch to about 0.01 inch.
- 38. A tool master for forming a 3 dimensional embossing tool, comprising:
an electroformed metal sheet having a print negative image of an embossing structure formed into said electroformed sheet, said sheet formed by electroplating a thickness of a metal over a print positive image comprising a metallic coated photoresist.
Government Interests
[0001] The United States Government has rights in this invention pursuant to Contract No. DE-AC04-94AL85000 between the United States Department of Energy and Sandia Corporation for the operation of Sandia National Laboratories.
Divisions (1)
|
Number |
Date |
Country |
Parent |
09544703 |
Apr 2000 |
US |
Child |
10074212 |
Feb 2002 |
US |