The technical field relates to an acceleration sensor detecting acceleration or angular velocity used for a mobile terminal or a vehicle.
Referring to
It is to be noted that as related art document information concerning this application, for example, Unexamined Japanese Patent Publication No. 2007-85800 (Patent Document 1) is known.
For example, in acceleration sensor 1, piezoresistance is used as sensing portion 5. Because the piezoresistance has a large resistance temperature coefficient to express a rate of change of the electrical resistance by the temperature change, it is difficult to adopt it in a terminal used in a wide temperature range. On the other hand, a rate of change of the electrical resistance for the temperature change is small when a strain resistor film consists of the metal oxide as sensing portion 5. However, the strain resistor film consisting of the metal oxide has low sensitivity because a gauge factor to express a change of resistance for distortion is small.
An acceleration sensor of the present disclosure includes a frame, a weight portion, an arm portion for connecting the frame and the weight portion, and a sensing portion for detecting a bend of the arm portion. The sensing portion includes a first electrode portion and a second electrode portion provided on the weight portion, and a strain resistor portion. A first end of the strain resistor portion is connected to the first electrode portion, and a second end of the strain resistor portion is connected to the second electrode portion. The strain resistor portion is formed of a strain resistor film consisting of the metal oxide. The strain resistor portion is formed in meander shape in the part which is nearer to the weight portion than the frame in the arm portion.
Alternatively, an acceleration sensor includes a frame, a weight portion, an arm portion for connecting the frame and the weight portion, and a sensing portion for detecting a bend of the arm portion. The sensing portion includes a first electrode portion and a second electrode portion provided on the frame, and a strain resistor portion. A first end of the strain resistor portion is connected to the first electrode portion, and a second end of the strain resistor portion is connected to the second electrode portion. The strain resistor portion is formed of a strain resistor film consisting of the metal oxide. The strain resistor portion is formed in meander shape in the frame side of the arm portion.
With this structure, the acceleration sensor has a small resistance temperature coefficient and a large gauge factor.
An exemplary embodiment of the present disclosure will be described as follows with reference to the drawings.
Referring to
Sensing portion 10 includes first electrode portion 11 and second electrode portion 12 provided on weight portion 8, and strain resistor portion 13. First end 13a of strain resistor portion 13 is connected to first electrode portion 11, and second end 13b of strain resistor portion 13 is connected to second electrode portion 12. Strain resistor portion 13 is formed of a strain resistor film comprising a metal oxide. Strain resistor portion 13 is formed in meander shape in the weight portion 8 side on arm portion 9.
With this structure, the acceleration sensor has a small resistance temperature coefficient and a large gauge factor.
Seeing from the top surface, frame 7 is formed in quadrangle. Frame 7 has hollow 7a in the center.
Weight portion 8 is provided in the center of hollow 7a. Arm portion 9 is formed to connect frame 7 and weight portion 8. Arm portion 9 is provided in four places between frame 7 and weight portion 8. Weight portion 8 is supported by arm portion 9. Hollow 7a is divided in the shape of a substantially cruciform in four divisions by weight portion 8 and arm portion 9 placed in the four places.
Subsidiary weight 8a is formed from each of the four corners of weight portion 8 to each division of hollow 7a.
Frame 7, arm portion 9, weight portion 8, and subsidiary weight 8a may include piezoelectric materials such as crystal, LiTaO3, and LiNbO3 and may comprise non piezoelectric materials such as silicon, molten quartz, and alumina. When frame 7, arm portion 9, weight portion 8, and subsidiary weight 8a comprise silicon, it is preferable because a small acceleration sensor can be made by nanofabrication technology.
Preferably, arm portion 9 is formed more thinly than frame 7, weight. portion 8, and subsidiary weight 8a. When arm portion 9 is formed thinly, arm portion 9 becomes easy to bend. Therefore, weight portion 8 and subsidiary weight 8a can be displaced more largely by acceleration given from the outside. Preferably, the thickness of frame 7 is same as that of weight portion 8 and that of subsidiary weight 8a. Thus, a manufacturing process can be simplified.
First electrode portion 11 and second electrode portion 12 are electrodes to measure a resistance level of strain resistor portion 13. First electrode portion 11 and second electrode portion 12 comprise the same material as that of strain resistor portion 13. An insulation film (not shown) comprising SiN or SiO2 is formed on arm portion 9 and strain resistor portion 13. Electrode pads (not shown) are provided in the end of frame 7. Wires are formed on the insulation film. First electrode portion 11 and second electrode portion 12 are connected to the electrode pads (not shown) and a detecting circuit (not shown) electrically by the wires. First electrode portion 11 and second electrode portion 12 are on weight portion 8. Thus noise mixed with signals picked up by first electrode portion 11 and second electrode portion 12 can be suppressed. When first electrode portion 11 and second electrode portion 12 are provided on arm portion 9, noise is mixed with signals picked up by first electrode portion 11 and second electrode portion 12 due to a bend which occurs in arm portion 9.
For example, strain resistor portion 13 is formed of a strain resistor film comprising the metal oxide such as zinc oxide, chromium oxide, and nickel oxide. Strain resistor portion 13 is formed in meander shape in the weight portion 8 side in arm portion 9. When acceleration is applied to acceleration sensor 6, weight portion 8 and subsidiary weight 8a are displaced so that arm portion 9 bends. In arm portion 9, the quantity of bend of the central part is larger than quantity of bend of the edge. In other words, in arm portion 9, the quantity of bend becomes progressively greater near a border part between arm portion 9 and weight portion 8 or a border part between arm portion 9 and frame 7.
Therefore, when strain resistor portion 13 is formed in the weight. portion 8 side in arm portion 9, the gauge factor can be large.
The quantity of bend is detected by the change of the resistance level of strain resistor portion 13. Therefore, the absolute value of the resistance level change for the same bend quantity becomes progressively greater as the length of strain resistor portion 13 per length of arm portion 9 becomes longer. Therefore, when strain resistor portion 13 is formed in meander shape, the length of strain resistor portion 13 per length of arm portion 9 can be longer and the gauge factor can be larger.
When strain resistor portion 13 is formed as piezoresistance, the boron of the P type is diffused in arm portion 9 comprising the silicon of the N type, and the diffusion layers are formed. Therefore, a leak current occurs between the diffusion layers facing to each other when the meander shaped diffusion layers are formed in narrow arm portion 9. Between the diffusion layers facing to each other, only p-n junction (i.e., only the silicon) prevents the diffusion of the electric charge. Because the diffusion layers are spread by an anneal step, the withstanding voltage comes down between the diffusion layers facing to each other, and a leak current occurs. In this embodiment, strain resistor portion 13 is formed of the strain resistor film comprising the metal oxide. Between the strain resistor films facing each other, an insulator comprising SiN or SiO2 exists. Therefore, the withstanding voltage is high and the occurrence of the leak current is prevented. Preferably, an insulator such as SiO2 is formed to cover strain resistor portion 13. Thus, the occurrence of the leak current is more prevented and wires may be formed on the insulator.
Referring to
As shown in
Because acceleration sensor 6 is configured as described above, weight portion 8 and subsidiary weight 8a are displaced by the acceleration that was given from the outside. Thus, the distortions which occur in four arm portions 9a to 9d are detected by sensing portions RX1 to RX4, RY1 to RY4, and RZ1 to RZ4. Therefore, acceleration sensor 6 can detect acceleration in three axis directions.
This invention is not limited to the acceleration sensor of a so-called double cantilever beam structure that weight portion 8 is supported by a plurality of arm portions 9. The effect of the present disclosure can also be obtained in an acceleration sensor of a so-called single cantilever beam structure that one side of weight portion 8 which is formed in a hollow provided in frame 7 is supported by arm portion 9 as shown
The acceleration sensor of the present disclosure has a small resistance temperature coefficient and a large gauge factor, so that it can be used in a wide temperature range and be useful in a mobile terminal or a vehicle because of its high sensitive.
1 Acceleration sensor
2 Frame
3 Weight portion
4 Arm portion
5 Sensing portion
6 Acceleration sensor
7 Arm portion
8 Weight portion
8
a Subsidiary weight
9, 9a, 9b, 9c, 9d Arm portion
10, 14 Sensing portion
11, 15 First electrode portion
12, 16 Second electrode portion
13, 17 Strain resistor portion
13
a First end
13
b Second end
13
c Portion
13
d First meander portion
13
e Connection portion
13
f Second meander portion
18 Center line
19, 20, 21 Voltage detecting portion
RX1, RX2, RX3, RX4 Sensing portion
RY1, RY2, RY3, RY4 Sensing portion
RZ1, RZ2, RZ3, RZ4 Sensing portion
Number | Date | Country | Kind |
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2010-144644 | Jun 2010 | JP | national |
Number | Date | Country | |
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Parent | PCT/JP2011/003466 | Jun 2011 | US |
Child | 13525635 | US |