Infrared polarimetry has potential applications in astronomy, space exploration, material characterization, semiconductor manufacturing, microscopy for biological measurements and, not the least of all, characterization of military targets. However, for the last-mentioned application, infrared polarimetry is still a relatively immature technology that is not currently a part of fielded military hardware. The reasons are that the instrumentation developed for research and development endeavors is limited in sensitivity and optical components in such instrumentation, as well as optical coatings, scattering and birefringence effects in the instrument, can cause unintended changes in the polarization to be measured, all to the detriment of target identification accuracy. In addition, during the process of dividing the incoming radiation to obtain measurements of the individual components of polarization, the sensitivity of the measurements may be further reduced.
U.S. Pat. No. 6,310,345 (Oct. 30, 2001) for a polarization-resolving infrared imager provides a passive means of sensing polarized infrared radiation. The passive imager employs the configuration of either first-generation (60 horizontal rows by 1 vertical column of detector elements) or second-generation (at least 240 horizontal rows by 4 vertical columns of detector elements) infrared imaging detector devices and polarization filters that work in conjunction with the infrared imaging detector devices to separate incoming infrared radiation into portions, each portion having a different polarization orientation. Such polarization separation enables the production of visible images in which various aspects of the scene are differentiated. In the preferred embodiment using the second-generation infrared imaging detector device, polarization-filtering grids are integrated onto the detector elements. The detector elements in three of the four columns have coupled thereto polarization filtering elements to filter 0 (horizontal), 90 (vertical) and 45-degree polarizations, respectively, of the incoming infrared radiation. Using a scan mirror of sufficient sweep in conjunction with the detector device and the polarization-filtering grid results in one frame of the target scene with horizontal polarization, one frame with vertical polarization, one frame with 45-degree polarization and a frame with no polarization distinction, all with one sweep of the scan mirror in real-time scenario. This provides nearly simultaneous infrared target scenes at different polarization from a single cycle of the scan mirror.
However, due to the limitations of current infrared polarimetric instrumentation, there are still many unknowns in the process of characterizing military targets in a natural or man-made clutter background. The principles of characterization of radiation emanating from simple geometric objects such as spheres, cylinders or plane surfaces are well understood in static, controlled environments; but the radiation emanating from a complex object such as a tank that can be modeled with literally thousands of plane surfaces containing a thermal source viewed from, say, a moving platform, such as an unmanned aerial vehicle or a missile, has not been systematically characterized. The fact that the measurements are passive means that they are heavily influenced by the diurnal and seasonal variation in the thermal loading that the sun imposes on the earth.
The Active Polarization-Resolving Infrared Imager improves on the passive polarization-resolving infrared imager of U.S. Pat. No. 6,310,345 by adding a laser to illuminate actively the selected target scene and a means for selectively changing the polarization orientation of the beam emitted by the laser in synchronism with the switching of the polarization filters associated with the passive detector device. The result is received signals that are maximized on the items or articles, such as geometric or regular structure in the target scene, that preserve the original polarization. Such items stand out against random nature background which tends to diffuse polarization.
Referring now to the drawing wherein like numbers represent like parts in each of the several figures and solid lines with arrow heads indicate beam paths (unless otherwise stated in the drawing) while solid lines without arrow heads indicate mechanical or electronic connection, the structure and operation of active polarization-resolving infrared imager 100 (hereinafter referred to as “the active imager”) is explained in detail. As this active imager teaches a significant improvement of the passive means disclosed in U.S. Pat. No. 6,310,345, the teaching of U.S. Pat. No. 6,310,345 is hereby incorporated in its entirety into the instant application.
The passive mode of measurement utilized in U.S. Pat. No. 6,310,345 relies on the intensity of the received radiation which, in turn, depends on the time of the day, the angle of incidence and whether the article from which the radiation is received is hot or cold. There are many unknowns and uncontrolled factors associated with this mode. Actively illuminating the target scene would remove some of these unknowns and reduce the randomness. The active imager utilizes active reflectance which is a measurement of a known (wavelength, energy, pulse width, etc.) signal and which accounts for atmospheric conditions. Reflectance does not rely on the temperature of the items found in target scene 4 or the time (therefore ambient temperature of the environment) of the day. Rather, in active imager 100, functionally depicted in
In either of the implementations described above, laser 1 may emit either pulsed or continuous wave and the number of pulses emitted at a given polarization orientation can be varied to match the specific environmental conditions, thus providing the desired signal-to-noise ratio. Typically, the FLIR operates in wavelengths of 3 to 5 or 8 to 12 microns.
Although particular embodiments and forms of this invention have been illustrated, it is apparent that various modifications and embodiments of the invention may be made by those skilled in the art without departing from the scope and spirit of the foregoing disclosure. Accordingly, the scope of the invention should be limited only by the claims appended hereto.
The invention described herein may be manufactured, used and licensed by or for the Government for governmental purposes without the payment of any royalties to us.