The present invention relates to an anode holder and a plating apparatus.
Heretofore, a wiring has been formed in a fine wiring groove, hole or resist opening provided in a surface of a semiconductor wafer or the like, and a bump (a protruding electrode) to be electrically connected to an electrode of a package or the like has been formed on the surface of the semiconductor wafer or the like. As a method of forming this wiring and bump, for example, an electroplating method, an evaporation method, a printing method, a ball bump method or the like is known, but with increase in an I/O number of semiconductor chips and for a finer pitch, the electroplating method is becoming often used in which miniaturization is possible and performance is relatively stable.
A plating apparatus for use in the electroplating method includes a substrate holder holding a substrate of a semiconductor wafer or the like, an anode holder holding an anode, and a plating solution tank that stores a plating solution containing a large number of types of additives. When a substrate surface of the semiconductor wafer or the like is plated in this plating apparatus, the substrate holder is disposed to face the anode holder in the plating solution tank. In this state, the substrate and the anode are energized, and accordingly a plating film is formed on the substrate surface. In addition, the additive has an effect of accelerating or suppressing a film formation speed of the plating film, an effect of improving film quality of the plating film, and the like.
Heretofore, a soluble anode that dissolves in the plating solution or an insoluble anode that does not dissolve in the plating solution has been used as the anode to be held by the anode holder. In a case where the plating is performed by using the insoluble anode, oxygen is generated by reaction between the anode and the plating solution. The additive in the plating solution reacts with this oxygen and is decomposed. There is a problem that, when the additive is decomposed, the additive loses the above-described effects, and a desired film cannot be obtained on the substrate surface (e.g., see PTL 1). It is also known that, in a case w % here, for example, phosphorus-containing copper is used as the soluble anode, deterioration of the additive, especially an accelerator, occurs due to reaction with monovalent copper generated from the anode when electrolysis is not performed. To prevent this problem, the additive may be added to the plating solution as required to keep concentration of the additive in the plating solution in a predetermined concentration or more. However, the additive is expensive, and hence it is desirable to inhibit the decomposition of the additive as much as possible.
Consequently, it has been suggested that an interior of the plating solution tank is divided, by a diaphragm, into a space in which the anode is disposed (an anode tank) and a space in which the substrate and a cathode are arranged (a cathode tank), to inhibit the additive in the plating solution from reaching the anode and suppress decomposition of the additive (e.g., see PTL 2).
As described above, by a diaphragm including a fine hole with a size smaller than an average size of a molecule included in an additive, an additive included in a plating solution in a cathode tank is inhibited from being moved into an anode tank, and decomposition of the additive is suppressed. Heretofore, the diaphragm has been disposed to cover an opening in an anode holder, an anode box, or a regulation plate. However, according to investigation by the present inventors, it has been found that in a conventional configuration, a region where the diaphragm acts on the plating solution in the cathode tank is wide, the additive is therefore consumed, and there is room for improvement.
The present invention has been developed in view of the above problems, and one of objects thereof is to provide an anode holder capable of reducing consumption of an additive in a plating apparatus, and a plating apparatus.
According to an embodiment of the present invention, an anode holder for holding an anode for use in a plating apparatus is provided, and the anode holder includes an inner space formed in the anode holder, to house the anode, a mask including a plurality of holes, and configured to cover a front surface of the inner space, and a diaphragm, at least part of the diaphragm being fixed to the mask in a region of the mask that covers the front surface of the inner space. According to this anode holder, the mask can reduce a region where the diaphragm is in contact with a plating solution, and can further inhibit the additive from reaching the anode to reduce consumption of the additive.
According to another embodiment of the present invention, a plating apparatus is provided, and the plating apparatus includes a plating solution tank, a mask including a plurality of holes, and dividing the plating solution tank into an anode tank in which an anode is disposed and a cathode tank in which a cathode is disposed, and a diaphragm, at least part of the diaphragm being fixed to the mask in a region of the mask that covers a front surface of an inner space. According to this plating apparatus, the mask can reduce a region where the diaphragm is in contact with a plating solution, and can further inhibit an additive from reaching the anode to reduce consumption of the additive.
Hereinafter, embodiments of a plating apparatus and an anode holder according to the present invention will be described with reference to the accompanying drawings. In the accompanying drawings, the same or similar element is denoted with the same or similar reference sign, and in descriptions of the respective embodiments, a description concerning the same or similar element may not be repeated. Also, characteristics illustrated in the respective embodiments are also applicable to another embodiment as long as the characteristics of the embodiments are not contradictory to each other.
The substrate W is, for example, a semiconductor substrate, a glass substrate, or a resin substrate. The metal with which the surface of the substrate W is plated is, for example, copper (Cu), nickel (Ni), tin (Sn), Sn—Ag alloy, or cobalt (Co).
The anode 40 and the substrate W are arranged to extend in a vertical direction, that is, so that plate surfaces of the anode 40 and the substrate W face in a horizontal direction and face each other in the plating solution. The anode 40 is connected to a positive electrode of a power source 90 via the anode holder 60, and the substrate W is connected to a negative electrode of the power source 90 via the substrate holder 18. When a voltage is applied between the anode 40 and the substrate W, current flows to the substrate W, and a metal film is formed on the surface of the substrate W in the presence of the plating solution.
The plating solution tank 50 includes a plating solution storage tank 52 in which the substrate W and the anode 40 are arranged, and an overflow tank 54 disposed adjacent to the plating solution storage tank 52. The plating solution in the plating solution storage tank 52 flows over a side wall of the plating solution storage tank 52 to flow into the overflow tank 54.
One end of a plating solution circulation line 58a is connected to a bottom of the overflow tank 54, and the other end of the plating solution circulation line 58a is connected to a bottom of the plating solution storage tank 52. A circulation pump 58b, a constant temperature unit 58c and a filter 58d are attached to the plating solution circulation line 58a. The plating solution flows over the side wall of the plating solution storage tank 52 to flow into the overflow tank 54, and further flows from the overflow tank 54 through the plating solution circulation line 58a to return to the plating solution storage tank 52. Thus, the plating solution circulates between the plating solution storage tank 52 and the overflow tank 54 through the plating solution circulation line 58a.
The plating apparatus further includes a regulation plate 14 that regulates a potential distribution on the substrate W, and a paddle 16 that stirs the plating solution in the plating solution storage tank 52. The regulation plate 14 is disposed between the paddle 16 and the anode 40, and includes an opening 14a for limiting an electric field in the plating solution. The paddle 16 is disposed in the vicinity of the surface of the substrate W held by the substrate holder 18 in the plating solution storage tank 52. The paddle 16 is made of, for example, titanium (Ti) or resin. The paddle 16 reciprocates in parallel with the surface of the substrate W, to stir the plating solution so that metal ions are sufficiently and uniformly supplied to the surface of the substrate W during the plating of the substrate W.
As shown in
As shown in
Also, as shown in
The diaphragm 66 is, for example, an ion exchange membrane such as a cation exchange membrane, or a neutral diaphragm. During plating, cations can pass through the diaphragm 66 from an anode side to a cathode side while any additive in the plating solution does not pass. A specific example of the diaphragm 66 is YUMICRON (registered trademark) manufactured by Yuasa Membrane Systems Co., Ltd.
The mask 67 is a plate-shaped member including the plurality of holes 67a, and is disposed to reduce a region where the diaphragm 66 is in contact with the plating solution. The mask 67 has a plate thickness of, for example, about 1 mm. The mask 67 is made of a resin such as polypropylene (PP) or polyvinyl chloride (PVC), a metal such as titanium (Ti) or the like. The mask 67 is fixed to the plate surface of the diaphragm 66. In an example shown in
In the mask 67, the plurality of holes 67a are formed. In each of the plurality of holes 67a, for example, a maximum distance from one end to the other end (an inner diameter in a case where the plurality of holes 67a each have a circular shape) is preferably 10 mm or less, especially preferably 8 mm or less, 5 mm or less, 3 mm or less, or 2 mm or less. Also, it is preferable that each of the plurality of holes 67a has the circular shape, but may have an elliptic shape, a polygonal shape or the like. Furthermore, in the example shown in
Also, in the plurality of holes 67a, it is preferable that an opening ratio is equal to or more than 2% and equal to or less than 25%, and it is especially preferable that the opening ratio is equal to or more than 3%, equal to or more than 5%, equal to or less than 10%, or equal to or less than 12.5%. This is based on the fact that, if the opening ratio is large, the contact region of the diaphragm 66 with the plating solution is large, an effect of reducing consumption of an additive accordingly decreases, and it is difficult to sufficiently fix the diaphragm 66 and the mask 67. This is also based on the fact that, if the opening ratio is small, it is difficult to remove gas (bubble) from the holes 67a, and passage of cations from the anode side to the cathode side through the diaphragm 66 runs short. In the present embodiment, the plurality of holes 67a are substantially uniformly arranged, and the opening ratio due to the plurality of holes 67a is 6%. However, the present invention is not limited to this example. For example, the mask 67 may be formed with the opening ratio decreasing closer to the center of the anode 40 and increasing away from the center of the anode 40, and conversely, the mask may be formed with the opening ratio increasing closer to the center of the anode 40 and decreasing away from the center of the anode 40.
Further, the plurality of holes 67a may be formed with the same diameter in a front-rear direction, or may be formed to be tapered. It is especially preferable that the plurality of holes 67a of the mask 67 may be formed to be tapered with a diameter decreasing closer to the diaphragm 66 and increasing away from the diaphragm 66. In this case, foreign matter such as gas or bubbles can be inhibited from staying in the holes 67a.
The mask 67 is fixed to the diaphragm 66. In other words, the diaphragm 66 is fixed to the mask 67. At least part of the diaphragm 66 is fixed to the mask 67 in a region of the mask 67 that covers a front surface of the inner space 61, that is, a region of the mask that covers the opening 63a of the holder base cover 63. However, the diaphragm 66 and the mask 67 may be fixed to each other also in a region other than the region that covers the front surface of the inner space 61. In addition, it may be also considered that the mask 67 is “secured” to the diaphragm 66.
In the present embodiment, the mask 67 is attached to the diaphragm 66 by welding. However, a method of fixing the mask 67 to the diaphragm 66 is not limited to the welding. For example, the diaphragm 66 and the mask 67 may be non-removably welded, pressed or bonded (hereinafter, referred to together as “closely connected”) via a closely connecting layer. Specifically, the diaphragm 66 and the mask 67 may be closely connected to each other by heat welding with a sealer or the like, laser welding, ultrasonic welding, or vibration welding. Alternatively, the diaphragm 66 and the mask 67 may be closely connected to each other by using a pouch processing technology, a laminate processing technology, or an adhesive such as vinyl chloride. In the pouch processing technology and the laminate processing technology, attaching a sheet material such as a PET material at high temperature and high pressure, attaching sheet materials such as PET materials to each other by plasma treatment, or extruded lamination by use of the sheet material such as a PET material may be adopted. Alternatively, as the adhesive, TAKIBOND (registered trademark) that is an adhesive for PVC manufactured by TAKIRON Corporation, an epoxy resin adhesive for PE and PET, or a low outgas adhesive manufactured by Sunstar Engineering may be adopted.
The mask 67 and the diaphragm 66 may be non-removably closely connected in the whole region of the mask 67, or may be non-removably closely connected to be fixed to each other in part of the region. However, the plating solution enters a gap between the mask 67 and the diaphragm 66 to increase a contact region of the diaphragm 66 with the plating solution. Especially in the plating apparatus of the present embodiment, the plating solution is stirred with the paddle 16, and hence the plating solution easily enters the gap between the mask 67 and the diaphragm 66. Consequently, it is preferable that the mask 67 and the diaphragm 66 are non-removably closely connected in a wide region to reduce entrance of the plating solution into the gap.
Thus, the anode holder 60 of the present embodiment includes the mask 67 including the plurality of holes 67a and covering the front surface of the inner space 61, and the diaphragm 66 is disposed to be fixed to the mask 67. Consequently, the region where the diaphragm 66 is in contact with the plating solution can be smaller than that in a case where the mask 67 is not provided, and the additive can be inhibited from reaching the anode 40 to reduce the consumption of the additive.
The outer edge mask 68 is a plate-shaped member including an annular opening in a central portion of the member, and is removably mounted to a front surface of the diaphragm retainer 69. A diameter of the opening in the outer edge mask 68 is smaller than an outer diameter of the anode 40. Consequently, when the outer edge mask 68 is attached to the diaphragm retainer 69, the outer edge mask 68 is configured to cover an outer peripheral edge of the anode 40 when seen from a plane shown in
The holder base cover 63 is fixed to the holder base 62 by screw connection, welding or the like, and the holder base cover 63 is closely connected to the holder base 62. Alternatively, the holder base cover 63 may be formed integrally with the holder base 62.
As shown in
An electrode terminal 82 for applying a voltage to the anode 40 is disposed in a lower part of the arm 70-1 extending outward from the couplings 62-1 and 62-2. The electrode terminal 82 is connected to the positive electrode of the power source 90, when the anode holder 60 is housed in the plating solution tank. Also, the anode holder 60 includes a power supply member 89 extending from the electrode terminal 82 to a substantially central portion of the inner space 61. The power supply member 89 is a substantially plate-shaped conductive member, and electrically connected to the electrode terminal 82.
As shown in
An annular opening 62a for changing the anode 40 is formed in a substantially central portion of the holder base 62, that is, at a position corresponding to the fixing member 88. The opening 62a communicates with aback surface side of the inner space 61, and is covered with a lid 86. On a back surface side of the holder base 62, an annular second sealing member 85 including, for example, an O-ring or the like is disposed along the opening 62a. A gap between the opening 62a and the lid 86 is sealed with the second sealing member 85.
The lid 86 is removed when the anode 40 is changed. Specifically, for example, with elapse of useful life of the anode 40, an operator removes the lid 86, and removes the fixing member 88 via the opening 62a. The operator removes the outer edge mask 68 from the diaphragm retainer 69, and removes the anode 40 from the inner space 61. Subsequently, the operator houses another anode 40 in the inner space 61, and fixes the anode 40 to the front surface of the power supply member 89 with the fixing member 88 via the opening 62a. Lastly, the operator seals the opening 62a with the lid 86, and attaches the outer edge mask 68 to the diaphragm retainer 69.
A weight 87 is attached to a back surface of the holder base 62. Consequently, the anode holder 60 can be prevented from floating on a surface of water due to buoyancy, when the anode holder 60 is immersed into the plating solution.
As shown in
The valve 91 is disposed in the holder base 62 so that the hole 71 can be sealed on an inner side of the holder base 62. The shaft 93 is disposed along an up-down direction in the holder base 62. The shaft 93 has one end coupled to the valve 91, and the other end coupled to the spring 96. Consequently, the shaft 93 transmits the biasing force of the spring 96 to the valve 91, and the valve 91 is biased so that the hole 71 is sealed with the valve 91 on the inner side of the holder base 62.
Thus, the anode holder 60 includes the valve 91 that seals the hole 71, so that the hole 71 can be sealed, after the anode holder 60 is immersed into the plating solution to fill the inner space 61 with the plating solution. Consequently, if oxygen, hypochlorous acid or monovalent copper is generated in the vicinity of the anode 40, proceeding of decomposition of the additive can be inhibited, because the outer space and the inner space 61 are divided. Alternatively, in the plating apparatus, the anode holder 60 may be disposed in the plating solution storage tank 52 in a state where a base liquid is put in the plating solution storage tank 52, the inner space 61 of the anode holder 60 may be filled with the base liquid and then sealed, and a liquid containing the additive may be put in the plating solution storage tank 52 to prepare the plating solution in the outer space. In this case, the inner space 61 of the anode holder 60 does not store the additive, and hence consumption of the additive in the vicinity of the anode 40 can be reduced more. However, the present invention is not limited to this example, and the anode holder 60 may be disposed in the plating solution storage tank 52 in a state where the plating solution containing the additive is put in the plating solution storage tank 52, and the inner space 61 of the anode holder 60 may be filled with the plating solution containing the additive and then sealed.
Next, description will be made as to fixing of the diaphragm 66 and the mask 67 in the anode holder 60.
In an example shown in
Next, description will be made as to a specific example of the fixing of the diaphragm 66 and the mask 67. Each of
Specifically, in the first example shown in
In the second example shown in
In the third example shown in
In the fourth example shown in
Specifically, in the fifth example shown in
In the plating apparatus according to the second embodiment, a shield box 160 is disposed in a plating solution storage tank 52, and accordingly, an interior of the plating solution storage tank 52 is divided into an anode tank 170 inside the shield box 160 and a cathode tank 172 outside the shield box. In the example shown in
The shield box 160 includes an opening 160a at a position corresponding to the opening 14a of the regulation plate 14. Also, a tubular part that defines the opening 14a of the regulation plate 14 is fitted into the opening 160a of the shield box 160. According to this configuration, the anode tank 170 communicates with the cathode tank 172 through the opening 14a of the regulation plate 14. Then, in the second embodiment, the diaphragm 66 and the mask 67 are mounted in the opening 14a of the regulation plate 14, and the anode tank 170 and the cathode tank 172 are divided by the diaphragm 66 and the mask 67. Alternatively, the diaphragm 66 and the mask 67 may be mounted from an anode tank 170 side in the regulation plate 14, or may be mounted from a cathode tank 172 side.
As an example, the diaphragm 66 and the mask 67 are mounted to the regulation plate 14 by use of an annular diaphragm retainer 69. Here, the diaphragm 66 and the mask 67 may be fixed in the regulation plate 14 in the same manner as in fixing the diaphragm 66 and the mask 67 in the anode holder 60 in the first embodiment. That is, as an example, the diaphragm 66 and the mask 67 may be mounted to the regulation plate 14 with a mounting structure in which the holder base cover 63 in the mounting structure shown in
In the plating apparatus of the second embodiment, a plating solution in the cathode tank 172 flows over a side wall of the plating solution storage tank 52 to flow into an overflow tank 54. On the other hand, the plating solution in the anode tank 170 is configured not to overflow. Further, a liquid discharge line 190 in which an on-off valve 186 is disposed is connected to the anode tank 170. For example, in a case where a soluble anode is used as an anode 40, a black film generated in the anode tank 170 can be discharged to outside through the liquid discharge line 190. Therefore, according to the plating apparatus of the second embodiment, an amount of the black film to be included in the plating solution (base liquid) in the anode tank 170 can be decreased, and the black film floating in the plating solution can be substantially completely inhibited from entering the cathode tank 172.
Also, in the plating apparatus according to the second embodiment, a base liquid supply line 158 is connected to a plating solution circulation line 58a. The base liquid supply line 158 is not intended to supply the plating solution to the plating solution storage tank 52 during plating of a substrate W, but is used to first supply the base liquid to the plating solution storage tank 52 for performing plating, that is, used only for so-called initial make-up of an electrolytic bath. The base liquid supply line 158 is provided with a first supply valve 151. Also, in the plating apparatus of the second embodiment, a connection line 192 is disposed to connect the plating solution circulation line 58a and the liquid discharge line 190. The connection line 192 is provided with a second supply valve 152. Further, the plating apparatus of the second embodiment is provided with an additive supply line 159 for supplying an additive to the cathode tank 172. The additive supply line 159 is provided with a third supply valve 153. Usually, the first to third supply valves 151 to 153 are closed.
According to the plating apparatus of the second embodiment, the first supply valve 151 and the second supply valve 152 are opened only during the initial make-up of the electrolytic bath, and the base liquid from the base liquid supply line 158 is supplied through the liquid discharge line 190 and the plating solution circulation line 58a into the anode tank 170 and the cathode tank 172. Then, the third supply valve 153 is opened, to supply the additive only to the cathode tank 172. According to this configuration, the anode tank 170 does not store the additive, and hence consumption of the additive in the vicinity of the anode 40 can be reduced.
In the plating apparatus of the second embodiment described above, the plating solution storage tank 52 is divided into the anode tank 170 and the cathode tank 172 by the shield box 160 and the regulation plate 14. Then, the diaphragm 66 and the mask 67 including a plurality of holes and fixed to the diaphragm 66 are provided in the opening 14a of the regulation plate 14. According to this configuration, a region where the diaphragm 66 is in contact with the plating solution can be reduced, and the additive can be inhibited from reaching the anode 40 to reduce consumption of the additive, in the same manner as in the plating apparatus of the first embodiment.
In the plating apparatus according to the third embodiment, a bottom plate 51 is disposed in a plating solution storage tank 52, and an interior of the plating solution storage tank 52 is divided, by this bottom plate, into an upper substrate treatment chamber and a lower plating solution distributing chamber 53. The shield box 160 is disposed in the upper substrate treatment chamber. The substrate treatment chamber is divided into an anode tank 170 and a cathode tank 172 by the shield box 160.
The plating apparatus of the third embodiment is configured so that a plating solution in the cathode tank 172 can overflow to flow into an overflow tank 54 and the plating solution in the anode tank 170 does not overflow, in the same manner as in the plating apparatus of the second embodiment. One end of a plating solution circulation line 58a is connected to a bottom of the overflow tank 54, and the other end of the plating solution circulation line 58a is connected to a bottom of the plating solution distributing chamber 53.
A shielding plate 51c hanging downward to regulate flow of the plating solution is attached to the bottom plate 51 in the plating solution storage tank 52. Also, in the bottom plate 51, a first plating solution flow port 51a that communicates between the cathode tank 172 and the plating solution distributing chamber 53 is formed. Furthermore, a second plating solution flow port 51b located below the anode tank 170 is formed in the bottom plate 51. In a bottom of the shield box 160, a bottom opening is formed at a position corresponding to the second plating solution flow port 51b. The plating solution distributing chamber 53 communicates with the anode tank 170 through the second plating solution flow port 51b and the bottom opening of the shield box 160. The bottom opening of the shield box 160 is usually sealed with a plating solution plug 210. The plating solution plug 210 is connected to a plating solution unplugging stick 212 extending in an up-down direction to outside the shield box 160. The plating solution unplugging stick 212 moves in a vertical direction, to open and close an opening 160b. Here, the plating solution unplugging stick 212 may be manually operated, or may be operated by any power source such as a motor, a solenoid, or a pneumatic actuator.
In the plating apparatus of the third embodiment, the plating solution containing an additive is stored in the plating solution storage tank 52 during initial make-up of the electrolytic bath. Subsequently, the shield box 160 is placed in the plating solution in a state where the plating solution plug 210 is opened, and the anode tank 170 is filled with the plating solution. Then, the plating solution plug 210 is closed, to divide the anode tank 170 and the cathode tank 172.
Also, in the plating apparatus of the third embodiment, the substrate treatment chamber is divided into the anode tank 170 and the cathode tank 172 by the shield box 160 and the regulation plate 14. Then, the diaphragm 66 and the mask 67 including a plurality of holes and fixed to the diaphragm 66 are mounted in the opening 14a of the regulation plate 14. Consequently, a region where the diaphragm 66 is in contact with the plating solution can be reduced, and the additive in the cathode tank 172 can be inhibited from reaching an anode 40 to reduce consumption of the additive, in the same manner as in the plating apparatus of the first embodiment.
Note that in the first to third embodiments, the diaphragm 66 and the mask 67 are arranged to extend in a vertical direction of the plating apparatus (to orient plate surfaces in a horizontal direction), but the present invention is not limited to the examples. For example, the diaphragm 66 and the mask 67 may be arranged to extend in the horizontal direction of the plating apparatus (to orient the plate surfaces in the vertical direction).
The present embodiments described above can be described in aspects as follows.
[Aspect 1]
According to Aspect 1, an anode holder for holding an anode for use in a plating apparatus is provided. The anode holder includes an inner space formed in the anode holder, to house the anode, a mask including a plurality of holes, and configured to cover a front surface of the inner space, and a diaphragm, at least part of the diaphragm being fixed to the mask in a region of the mask that covers the front surface of the inner space. According to the anode holder of Aspect 1, the mask can reduce a region where the diaphragm is in contact with a plating solution, and can further inhibit an additive from reaching the anode to reduce consumption of the additive.
[Aspect 2]
According to Aspect 2, in Aspect 1, the diaphragm and the mask are closely connected to each other via a closely connecting layer.
[Aspect 3]
According to Aspect 3, in Aspect 1 or 2, the diaphragm and the mask are bonded or welded to each other.
[Aspect 4]
According to Aspect 4, an opening ratio by the plurality of holes is equal to or more than 2% and equal to or less than 25%.
Aspect 5
According to Aspect 5, in Aspects 1 to 4, the anode holder includes a base body supporting at least one of the diaphragm and the mask, and the diaphragm and the mask are fixed to each other in a second region that is different from a first region where the at least one of the diaphragm and the mask is supported by the base body. According to Aspect 5, the plating solution can be inhibited from entering a gap between the diaphragm and the mask, and the consumption of the additive can be further reduced.
[Aspect 6]
According to Aspect 6, in Aspects 1 to 5, the mask is fixed on a side of the inner space with respect to the diaphragm.
[Aspect 7]
According to Aspect 7, in Aspects 1 to 5, the mask is fixed on a side opposite to the inner space with respect to the diaphragm.
[Aspect 8]
According to Aspect 8, in Aspect 7, the diaphragm is sandwiched between the mask and the anode to be fixed to the mask.
[Aspect 9]
According to Aspect 9, in Aspects 1 to 8, each of the plurality of holes is tapered with a diameter increasing away from the diaphragm. According to Aspect 9, foreign matter can be inhibited from staying in the plurality of holes in the mask.
[Aspect 10]
According to Aspect 10, in Aspects 1 to 9, the diaphragm and the mask are arranged to extend in a vertical direction of the plating apparatus.
[Aspect 11]
According to Aspect 11, in Aspects 1 to 10, the mask is made of a resin.
[Aspect 12]
According to Aspect 12, in Aspects 1 to 11, the diaphragm is an ion exchange membrane or a neutral diaphragm.
[Aspect 13]
According to Aspect 13, a plating apparatus is provided. The plating apparatus includes a plating solution tank, a mask including a plurality of holes, and dividing the plating solution tank into an anode tank in which an anode is disposed and a cathode tank in which a cathode is disposed, and a diaphragm, at least part of the diaphragm being fixed to the mask in a region of the mask that covers a front surface of an inner space. According to the plating apparatus of Aspect 13, the mask can reduce a region where the diaphragm is in contact with a plating solution, and can further inhibit an additive from reaching the anode to reduce consumption of the additive.
The embodiments of the present invention have been described above based on several examples, but the above embodiments of the present invention are described to facilitate understanding of the present invention, and do not limit the present invention. The present invention may be changed or modified without departing from the scope, and needless to say, the present invention includes equivalents to the invention. Also, in a range in which at least some of the above-described problems can be solved or a range in which at least some of effects are exhibited, any arbitrary combination or omission of respective constituent components described in claims and description is possible.
The present application is based on and claims the benefit of priority of Japanese Patent Application No. 2019-107724 filed on Jun. 10, 2019. All disclosed contents including the description, claims, drawings and abstract of Japanese Patent Application No. 2019-107724 are entirely incorporated herein by reference. All disclosure including the description, claims, drawings and abstract of each of Japanese Patent No. 2510422 (PTL 1) and Japanese Patent Laid-Open No. 2009-155726 (PTL 2) is entirely incorporated herein by reference.
Number | Date | Country | Kind |
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2019-107724 | Jun 2019 | JP | national |
Filing Document | Filing Date | Country | Kind |
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PCT/JP2020/021060 | 5/28/2020 | WO |