This is a continuation of application Ser. No. 08/293,090 filed on Aug. 19, 1994, now abandoned, which is a continuation of application Ser. No. 07/878,494 filed on May 5, 1992, now abandoned.
Number | Name | Date | Kind |
---|---|---|---|
RE33669 | Nomura et al. | Aug 1991 | |
4168908 | Cubalchini | Sep 1979 | |
4176276 | Kaul et al. | Nov 1979 | |
4631416 | Tratna, Jr. | Dec 1986 | |
4639863 | Harrison et al. | Jan 1987 | |
4655587 | Wijntjes et al. | Apr 1987 | |
4676645 | Taniguchi et al. | Jun 1987 | |
4703176 | Hahn et al. | Oct 1987 | |
4710026 | Magone et al. | Dec 1987 | |
4711573 | Wijntjes et al. | Dec 1987 | |
4728193 | Bartelt et al. | Mar 1988 | |
4731772 | Lee | Mar 1988 | |
4764014 | Makosch et al. | Aug 1988 | |
4776698 | Crosdale | Oct 1988 | |
4776701 | Pettigrew | Oct 1988 | |
4815850 | Kanayama et al. | Mar 1989 | |
4829342 | Nishimura | May 1989 | |
4868385 | Nishimura | Sep 1989 | |
4870635 | Block et al. | Sep 1989 | |
4872751 | Hercher | Oct 1989 | |
4967072 | Nishimura | Oct 1990 | |
4970388 | Nishimura et al. | Nov 1990 | |
5036192 | Ishizuka et al. | Jul 1991 | |
5043775 | Lee | Aug 1991 | |
5050153 | Lee | Sep 1991 | |
5066130 | Tsukiji et al. | Nov 1991 | |
5098190 | Wijntjes et al. | Mar 1992 | |
5104225 | Masreliez | Apr 1992 | |
5108184 | Brown et al. | Apr 1992 | |
5121371 | Farnsworth et al. | Jun 1992 | |
5129725 | Ishizuka et al. | Jul 1992 | |
5136152 | Lee | Aug 1992 | |
5159408 | Waldenmaier et al. | Oct 1992 | |
5162955 | Burdenko | Nov 1992 | |
5179485 | Tamayama | Jan 1993 | |
5182610 | Shibata | Jan 1993 | |
5196970 | Seko et al. | Mar 1993 | |
5227930 | Thanos et al. | Jul 1993 | |
5325349 | Taniguchi | Jun 1994 |
Number | Date | Country |
---|---|---|
0248277A2 | Jun 1986 | EPX |
2316248.3 | Mar 1973 | DEX |
1474049 | Jan 1974 | GBX |
Entry |
---|
Alfons Ernst, Digital Linear and Angular Metrology, 2d ed. 1992 (translation by Robert W. Brown, Robert Franks, Herber Uhtenwoldt), pp. 17-19. |
Hoetron Advertisement, Dr. Wai-Hon Lee, "A Simpler Test for Wavefront Quality," Photonics Spectra, Nov. 1992, p. 201. |
G. N. Rassudova and F. M. Gerasimov, "The Use of Reflection Diffraction Gratings in Interference Systems for Measuring Linear Shifts. II," Optical Spectroscope, vol. 14, No. 215, (1963), pp. 295-300. |
Michael Hercher and Geert Wyntjes, "Precision Angle Measurement With a Two-Frequency HeNe Laser,", Proceedings of SPIE-The International Society for Optical Engineering, Jan. 15-16, 1987, Vo. 741, pp. 174-185. |
Lawrence Mertz, "Optical homodyne phase metrology," Applied Optics, vol. 28, No. 5, Mar. 1, 1989, pp. 1011-1014. |
Lawrence Mertz, "Complex Interferometry", Applied Optics, vol. 22, No. 10, May 15, 1983, pp. 1530-1534. |
Lawrence Mertz, "Real-time Fringe-Pattern Analysis", Applied Optics, vol. 22, No. 10, May 15, 1983, pp. 1535-1539. |
Lawrence Mertz, "Phase Estimation with Few Photons," Applied Optics, vol. 23, No. 10, May 15, 1994, pp. 1638-1641. |
Sharp Corporation Japan brochure, "Laser Diodes,", Mar. 1992. |
Number | Date | Country | |
---|---|---|---|
Parent | 293090 | Aug 1994 | |
Parent | 878494 | May 1992 |