Information
-
Patent Grant
-
6422930
-
Patent Number
6,422,930
-
Date Filed
Wednesday, January 17, 200123 years ago
-
Date Issued
Tuesday, July 23, 200222 years ago
-
Inventors
-
Original Assignees
-
Examiners
- Hail, III; Joseph J.
- McDonald; Shantese
Agents
- Ohlandt, Greeley, Ruggiero & Perle, L.L.P.
-
CPC
-
US Classifications
Field of Search
US
- 451 41
- 451 43
- 451 44
- 451 57
- 451 177
- 451 179
-
International Classifications
-
Abstract
An edge face of a deposited film at an edge portion of a device wafer having the deposited film formed on a substrate is polished at a substantially right angle so as to prevent the deposited film from peeling-off and dusting. A forming body having a sectional shape substantially agreeing with that of an edge portion of a device wafer after polishing, which is an object to be polished, is rotated and brought into contact with a polishing body so as to form a polishing portion on the polishing body surface. The edge portion of the object-to be polished is rotated and urged into contact with the formed polishing portion, so that the edge portion of the object to be polished is polished in a sectional shape agreeing with that of the polishing portion of the polishing body. The edge face of the deposited film on the substrate surface is polished not slantingly but at a right angel so as to be removed, so that peeling-off of the deposited film due to a post-process, etc., which will generate a foreign substance, can be prevented.
Description
BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates to an apparatus for removing a deposited film at an edge portion of an object to be polished, and in particular relates to an apparatus for removing a deposited film at an edge portion of a device wafer having a circuit formed on the top surface thereof.
2. Description of the Related Art
A semiconductor wafer used as a substrate of a semiconductor device, for example, having no circuit formed thereon is called a bare wafer and is produced from a sliced ingot of a single crystal of silicon, etc., via processes such as chamfering, lapping, etching, annealing, and polishing.
The bare wafer is generally polished by a material manufacturer and there are various known polishing means disclosed in Japanese Unexamined Patent Application Publication No. 7-193030 and Japanese Unexamined Patent Application Publication No. 8-85051, for example.
On the other hand, a semiconductor wafer having a circuit formed thereon is called a device wafer and as means for removing an unnecessary deposited film by polishing it, such techniques disclosed as in Japanese Unexamined Patent Application Publication No. 10-312981 and Japanese Unexamined Patent Application Publication No. 2000-068273 are known.
In Japanese Unexamined Patent Application Publication No. 10-312981, it is shown that an excess metal film adhering to the outer circumferential fringe of a device wafer is polished and removed,by etching or making contact with a polishing pad. In Japanese Unexamined Patent Application Publication No. 2000-068273, it is disclosed that a film remaining in a portion having no pattern formed thereon in the outer circumferential fringe of a device wafer (a wafer edge portion) is removed by mechanically polishing it using a polishing pad rotated to be made contact with it.
However, in any one of the cases disclosed in the above-mentioned publications, a deposited film is removed along an extension line of a slope or a deposited film on a flat plane linking with a slope cannot be removed, so that the deposited film on the flat plane is prone to be peeled off during the transferring of the device wafer due to the contact with a chuck, for example, which may have a bad influence upon a post-process.
Furthermore, apparatuses capable of simultaneously removing a deposited film on the entire outer circumferential fringe, i.e., an end face, a slope, and a flat plane linking with the slope by a single polishing are demanded.
SUMMARY OF THE INVENTION
The present invention aims at solving the above-described conventional problems and further at responding to the demand, wherein deposited films on an end face, a slope, and a flat plane linking with the slope of the outer circumferential fringe of a device wafer can be simultaneously removed by a single polishing while peeling off due to a post-process, etc., which will generate a foreign substance, can be securely prevented by removing a deposited film on the flat plane. in an orthogonal direction thereto. Thereby, it is an object of the present invention to provide an apparatus for removing a deposited film being capable of completely suppressing a bad influence due to dusting and the like upon a post-process.
In order to achieve the above-described object, in accordance with the present invention, there is provided an apparatus for removing a deposited film in an edge portion of a substrate to be polished, the apparatus for removing the deposited film comprising: a polishing body having at least one polishing portion formed thereon and having substantially the same shape as that of the edge portion of the substrate; a forming body for forming the polishing portion having substantially the same shape as that of the edge portion of the substrate on the polishing body; a holding member for a forming body; a holding member for a polishing body; and a holding member for an object to be polished having mechanisms for rotation, horizontal movement, and pressing, wherein the forming body movably held by the holding member for a forming body is brought into contact with the polishing body held rotatably and vertically movably by the holding member for a polishing body so as to form the polishing portion, and wherein the substrate held by the holding member is urged into contact with the polishing body so as to remove a deposited film at the edge portion by polishing.
The polishing portion of the polishing body may be formed so as to substantially agree with an edge face, a slope, and a flat plane of the substrate to be polished. Preferably, the holding member for a forming body rotatably holding the forming body is capable of relatively approaching to and separating from the direction of the holding member for a polishing body while making an edge portion of the forming body in contact with the surface of the polishing body during the approaching. Further, the object to be polished may comprise the substrate and a deposited film formed on the surface of the substrate.
By adopting the means as described above in the present invention, an edge portion that is the external periphery of the device wafer is positioned at the polishing portion of the polishing body, so that deposited films on an edge face, a slope, and a flat plane linking to the slope of the edge portion can be simultaneously removed.
Even when the polishing portion wears down due to polishing, the most suitable shape can be maintained by correcting the polishing portion of the polishing body with the forming body. Then, the external periphery of the device wafer to be polished is positioned at the polishing portion and is relatively urged into contact with the polishing portion and rotating the device wafer, so that the edge portion of the device wafer can be polished in a sectional shape agreeing with that of the polishing portion of the polishing body, thereby simultaneously polishing the edge face, the slope, and the flat plane linking to the slope.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1
is a schematic explanatory view of a polishing apparatus according to an embodiment of the present invention showing a completed state of polishing;
FIG. 2
is an enlarged view of a forming body shown in
FIG. 1
;
FIG. 3
is an enlarged sectional view of a polishing body shown in
FIG. 1
;
FIG. 4
is an enlarged fragmentary sectional view of an object to be polished after polishing;
FIG. 5
is a schematic illustration of a holding member for a forming body;
FIG. 6
is an enlarged sectional view of another example of a polishing body;
FIG. 7
is an enlarged sectional view of still another example of a polishing body;
FIG. 8
is an enlarged sectional view of further another example of a polishing body;
FIG. 9
is an enlarged sectional view of further another example of a polishing body;
FIG. 10
is an enlarged fragmentary sectional view of a conventional object to be polished before polishing;
FIG. 11
is an enlarged fragmentary sectional view of a conventional object to be polished before polishing; and
FIG. 12
is an enlarged fragmentary sectional view of a conventional object to be polished after polishing.
DESCRIPTION OF THE PREFERRED EMBODIMENTS
An embodiment of the present invention shown in the drawings will be described below.
FIGS. 1
to
3
show a polishing apparatus according to an embodiment of the present invention. A polishing apparatus
1
comprises a forming body
2
having an edge portion
3
thereof formed to agree in a sectional shape with an edge portion
27
of an object to be polished
24
after polishing, a holding member for a forming body (not shown) rotatably holding the forming body
2
and being movable in the horizontal direction, a polishing body
4
having a polishing portion
7
thereof formed to agree in a sectional shape with the edge portion
3
of the forming body
2
in the periphery, a holding member for a polishing body
8
rotatably holding the polishing body
4
and being movable in the vertical direction, a holding member for an object to be polished
28
rotatably holding the object to be polished
24
and being movable in the horizontal direction, and a pressuring member
40
for pressuring the holding member for an object to be polished
28
in the direction of the holding member for a polishing body
8
.
The above-mentioned forming body
2
is plate-shaped and made of a molded grindstone and the like, and the edge portion
3
thereof is formed to agree in a sectional shape with the edge portion
27
of the object to be polished
24
after polishing.
The edge portion
3
of the forming body
2
is formed of an edge-face-forming portion
3
a
corresponding to a periphery of a substrate
25
, which will be described later, of the object to be polished
24
, an slope-forming portion
3
b
corresponding to a chamfering portion of the substrate
25
, a deposited-film-surface-forming portion
3
c
corresponding to an end of a deposited film
26
located in the top-face side of the edge portion
27
of the substrate
25
, and a deposited-film-edge-face-forming portion
3
d
corresponding to an edge face of the deposited film
26
(see FIG.
2
).
The forming body
2
rotatably held by a holding member for a forming body
50
moves in the horizontal direction during the movement of the holding member for a forming body
50
, so that the edge portion
3
makes contact with the periphery of the polishing body held by the holding member for a polishing body
8
, which will be described later.
As shown in
FIG. 5
, in the holding member for a forming body
50
, a base
53
holding a driving source
52
for rotationally driving a shaft
51
holding the forming body
2
is movable in the horizontal direction by a ball screw
57
being rotatable by a stepping motor
55
, which is a driving source and disposed on the top of a base
54
, via a belt
56
.
In addition, the transferring means may be a cylinder or a combination of a cylinder and a weight instead of the ball screw
57
.
The above-mentioned polishing body
4
is formed of a column-shaped core member
5
and a cylindrical polishing pad
6
unitarily attached on the surface of the core member
5
by means such as adhesion, and on the entire peripheral face of the polishing pad
6
formed is the polishing portion
7
having a sectional shape agreeing with that of the edge portion
3
of the forming body
2
.
The polishing portion
7
on the periphery of the polishing pad
6
is formed of an edge-face-polishing portion
7
a
corresponding to the edge-face-forming portion
3
a
of the edge portion
3
of the forming body
2
, a slope-polishing portion
7
b
corresponding to the slope-forming portion
3
b
, a deposited-film-surface-polishing portion
7
c
corresponding to the deposited-film-surface-forming portion
3
c
, and a deposited-film-edge-face-polishing portion
7
d
corresponding to the deposited-film-edge-face-forming portion
3
d
(see FIG.
3
).
In the embodiment, one polishing portion
7
is formed on the periphery of the polishing pad
6
; however, as shown in
FIG. 6
, two polishing portions
7
and
7
may be formed or although not shown in the drawing, three or more polishing portions
7
, . . . may be formed. In such a manner, by forming plural polishing portions
7
, . . . on the periphery of the polishing pad
6
, even when one polishing portion
7
cannot be used due to hanging by use, another polishing portion
7
can be used instead, thereby eliminating the replacing work to a new polishing body
4
, so that production efficiency can be extremely improved.
The above-mentioned holding member for a polishing body
8
is formed of a rotating shaft
9
with its upper end portion unitarily connected to the lower end portion of the core member
5
of the polishing body
4
, a bearing case
10
for rotatably supporting the rotating shaft
9
, a driving source
11
for rotationally driving the rotating shaft
9
, and driving force transmitting means
13
such as pulleys and a belt for connecting between a driving shaft
12
of the driving source
11
and the lower end portion of the rotating shaft
9
.
The bearing case
10
and the driving source
11
of the holding member for a polishing body
8
are unitarily attached to a base
14
while the base
14
is attached to a base frame
16
via a guide
15
movably in the vertical direction. Therefore, the holding member for a polishing body
8
is movable in the vertical direction along the guide
15
together with the base
14
.
The above-mentioned base frame
16
is formed of an upper plate
17
, a supporting plate
18
unitarily connected to the left end of the upper plate
17
in the bottom surface side, a lower plate
19
disposed in the lower side of the upper plate
17
and opposing the upper plate
17
, and a pair of connecting plates
20
and
20
for unitarily connecting between the upper plate
17
and the lower plate
19
, and on the supporting plate
18
, the base
14
and the holding member for a polishing body
8
are attached movably in the vertical direction along the guide
15
.
A transferring member
21
is attached to the supporting plate
18
, and the holding member for a polishing body
8
is to be moved in the vertical direction during the operation of the transferring member
21
. The transferring member
21
is constructed from a cylinder
22
such as a servo-cylinder and a connecting plate
23
for connecting between a rod
22
a
of the cylinder
22
and the base
14
. When the rod
22
a
is extended by actuating the cylinder
22
, the base
14
and the holding member for a polishing body
8
ascend in the vertical direction via the connecting plate
23
while the rod
22
a
is retracted, the base
14
and the holding member for a polishing body
8
descend in the vertical direction via the connecting plate
23
.
The transferring member
21
serves as a pressuring member as well, that is, when the holding member for a polishing body
8
is lowered by actuating the cylinder
22
, the polishing body
4
can be urged into contact with the object to be polished
24
from above.
Although not shown in the drawing, the holding member for an object to be polished
28
may be constructed to be upwardly moved while the holding member for a polishing body
8
is fixed, and both the holding member for an object to be polished
28
and the holding member for a polishing body
8
may be movable in the vertical direction.
The object to be polished
24
is the disc-like substrate
25
formed of a semiconductor wafer, etc., having the deposited film
26
such as an insulating film formed on the top surface of the substrate
25
, and a part of the deposited film
26
located on the top surface of the edge portion
27
is to be removed by polishing.
In addition, the substrate
25
is not limited to be circular disc-like; it may be a disk having an orientation flat which is a flat notch at a part of the peripheral face.
The holding member for an object to be polished
28
is formed of a retaining disc
29
for horizontally holding the object to be polished
24
by means such as vacuum sucking means, a rotational shaft
30
with the upper end thereof unitarily connected to the center of the bottom surface of the retaining disc
29
, a bearing case
31
for rotatably supporting the rotational shaft
30
, a driving source
32
for driving the rotational shaft
30
, and a driving force transmitting means
34
comprising a belt and pulleys for connecting between a driving shaft
33
of the driving source
32
and the lower end portion of the rotational shaft
30
.
The bearing case
31
and the driving source
32
of the holding member for an object to be polished
28
are attached to a base
35
which is arranged movably in the horizontal direction in the top face side of the lower plate
19
of the base frame
16
along a guide
36
. Therefore, the holding member for an object to be polished
28
is movable in the horizontal direction along the guide
36
unitarily with the base
35
.
In the bottom face side of the lower plate
19
of the base frame
16
, a transferring member
37
is arranged, and the holding member for an object to be polished
28
is moved in the horizontal direction during the operation of the transferring member
37
. The transferring member
37
comprises a cylinder
38
attached to the bottom face side of the lower plate
19
and a pushing plate
39
attached to the side of the base
35
of the holding member for an object to be polished
28
. When the cylinder
38
is actuated, a rod
38
a is extended in the horizontal direction so that the end thereof abuts the pushing plate
39
, and thereby the holding member for an object to be polished
28
is urged so as to be moved in the separating direction from the holding member for a polishing body
8
via the pushing plate
39
.
In addition, although not shown in the drawing, the holding member for an object to be polished
28
may be urged in the approaching direction toward the holding member for a polishing body
8
so as to be moved in this direction when the cylinder
38
is actuated.
Also, while the holding member for an object to be polished
28
is fixed, the holding member for a polishing body
8
may be movable in the horizontal direction, or both the holding member for an object to be polished
28
and the holding member for a polishing body
8
may be movable in the horizontal direction.
In the bottom face side of the lower plate
19
, a pressing member
40
is arranged, and the holding member for an object to be polished
28
is urged by the pressing member
40
in the direction toward the holding member for a polishing body
8
, so that the object to be polished
24
held by the holding member for an object to be polished
28
is urged into contact with the polishing body
4
held by the holding member for a polishing body
8
from the horizontal direction.
The pressing member
40
is formed of a pulley
41
rotatably arranged in the bottom face side of the lower plate
19
, a rope
42
wound around the pulley
41
and connected to the pushing plate
39
at one end of the rope
42
, and a weight
43
connected to the other end of the rope
42
.
By applying a load due to the weight
43
to the object to be polished
24
via the rope
42
, the pushing plate
39
, the base
35
, and the holding member for an object to be polished
28
, the object to be polished
24
can be urged toward the polishing body
4
. Also, by changing the size of the weight
43
, the load urged toward the polishing body
4
can be changed.
Next, the effects of the apparatus described-above will be described.
First, the holding member for a forming body
50
is moved in the horizontal direction so that the edge portion
3
of the forming body
2
is made contact with the peripheral face of the polishing pad
6
of the polishing body
4
held by the holding member for a polishing body
8
, while the holding member for a forming body
50
and the holding member for a polishing body
8
are rotationally driven so that the polishing portion
7
having a sectional shape agreeing with that of the edge portion
3
of the forming body
2
is formed on the peripheral face of the polishing pad
6
.
Then, the holding member for a forming body
50
is moved in the horizontal direction so that the forming body
2
is separated from the polishing body
4
, while the holding member for an object to be polished
28
holding the object to be polished
24
is moved in the horizontal direction so that the edge portion
27
of the object to be polished
24
is made contact with the polishing portion
7
of the polishing pad
6
of the polishing body
4
and the edge portion
27
of the object to be polished
24
is urged into contact with the polishing portion
7
of the polishing body
4
from the horizontal direction by applying the load due to the weight
43
of the pressuring member
40
. Then, by actuating the cylinder
22
of the holding member for a polishing body
8
, the polishing body
4
is lowered in the vertical direction so that the polishing portion
7
of the polishing body
4
is urged into contact with the edge portion
27
of the object to be polished
24
.
By rotating the polishing body
4
and the object to be polished
24
in this state in the same direction or different directions with each other, the edge portion
27
of the object to be polished
24
is started to be polished. At this time, when the substrate
25
of the object to be polished
24
has an orientation flat on the edge face thereof, which is a flat notch at a part of the edge face thereof, the rotational speed of the object to be polished
24
is set to be low, about 1 rpm, for example.
After a predetermined time elapsed, the holding member for a polishing body
8
and the holding member for an object to be polished
28
are stopped; the holding member for a polishing body
8
is lifted by the operation of the cylinder
22
; the holding member for an object to be polished
28
is moved by the operation of the cylinder
38
in the horizontal direction (the separating direction from the holding member for a polishing body
8
). In such a manner, the edge portion
27
of the object to be polished
24
is polished in a sectional shape agreeing with that of the polishing portion
7
of the polishing body
4
. This edge portion
27
of the object to be polished
24
is formed of an edge face
27
a
, a slope
27
b
, and a flat plane
27
c
linking with the slope
27
b
(see FIG.
4
). In addition, by rotating the object to be polished
24
at a low rotational speed, the orientation flat portion can also be sufficiently polished.
That is, as shown in
FIGS. 10 and 11
, in the edge portion
27
of the object to be polished
24
before polishing, the deposited film of the object to be polished
24
is formed to the edge face or extended to the bottom face to cover it across the edge face. By a conventional polishing apparatus, the deposited film
26
is diagonally polished so as to have an inclined sectional shape after polishing, as shown in
FIG. 12
, so that the deposited film
26
is prone to be peeled off the substrate
25
due to the inclined sectional shape, thereby originating a foreign substance due to a post-process, etc.
However, in the polishing apparatus
1
according to the embodiment formed as described above, the polishing portion
7
of the polishing pad
6
in the polishing body
4
is formed of the edge-face-polishing portion
7
a
corresponding to the edge face of the substrate
25
in the object to be polished
24
, the slope-polishing portion
7
b
corresponding to the slope of the substrate
25
, the deposited-film-surface-polishing portion
7
c
corresponding to the end portion of the deposited film
26
located in the top face side of the edge portion
27
of the substrate
25
, and the deposited-film-edge-face-polishing portion
7
d
corresponding to the edge face of the deposited film
26
. Therefore, by the deposited-film-surface-polishing portion
7
c
and other polishing portions
7
a
,
7
b
, and
7
d
, the edge face of the deposited film
26
can be polished so as to be mirror-finished via the edge face of the substrate
25
, the slope of the substrate
25
, and the flat plane of the substrate
25
of the object to be polished
24
. Moreover, the edge face of the deposited film
26
is polished at a substantially right angle relative to the flat plane of the substrate
25
.
Therefore, the portion of the deposited film
26
positioned in the top face side of the edge portion
27
on the substrate
25
in the object to be polished
24
is polished not in an inclined shape but at a right angle instead due to the flat plane, so that possibilities of dusting due to the peeling off are completely eliminated.
Also, when the end portion of the deposited film
26
positioned in the top face side of the edge portion
27
on the substrate
25
is removed, the substrate
25
cannot be damaged. Consequently, post-processes cannot have the bad effect, thereby sharply increasing the production efficiency.
Furthermore, as the polishing pad
6
, structures shown in
FIGS. 7 and 8
may be adopted. The structure shown
FIG. 7
comprises the edge-face-polishing portion
7
a
, the slope-polishing portion
7
b
, the deposited-film-surface-polishing portion
7
c
, the deposited-film-edge-face-polishing portion
7
d
, and further a slope-polishing portion
7
e
extending from the edge-face-polishing portion
7
a
to the deposited-film-edge-face-polishing portion
7
d.
The structure shown in
FIG. 8
comprises the slope-polishing portion
7
b
and the deposited-film-surface-polishing portion
7
c
in each of upper and lower portions.
By using the polishing pad
6
having the structures described above, the polishing can be securely performed; however, there is a case that the polishing pad
6
can be no longer used due to gradual widening of the width in the vertical direction with use.
In order to eliminate such a case, a polishing pad
6
shown in
FIG. 9
is effective. That is,
FIG. 9
shows the polishing pad
6
capable of two-step polishing in the vertical direction. This polishing pad
6
comprises the deposited-film-edge-face-polishing portion
7
d
, the deposited-film-surface-polishing portion
7
c
, the slope-polishing portion
7
b
, and the edge-face-polishing portion
7
a
, and in particular comprises the deposited-film-surface-polishing portion
7
c
and the slope-polishing portion
7
b
in each of upper and lower portions in a widened state of the width larger than the thickness of the object to be polished
24
.
By such a structure, even when the width in the vertical direction is gradually widened with use, the object to be polished
24
can be securely polished.
In addition, when any one of the polishing pads described above is used, by polishing the deposited film
26
at a substantially right angle, on an object to be polished after polishing, a flat plane, which is not formed on a conventional object to be polished, is to be formed.
In addition, in the embodiment, the forming body
2
and the holding member for a forming body
50
are constituent elements of the polishing apparatus
1
; however, the forming body
2
and the holding member for a forming body
50
may be different members from the polishing apparatus
1
; before the polishing of the object to be polished
24
by the polishing apparatus
1
, a polishing portion
7
is formed on the surface of the polishing body
4
by a different forming body
2
and a holding member for a forming body
50
in advance, so that the polishing body
4
having this polishing portion
7
formed thereon may be held by the holding member for a polishing body
8
.
Also, in the embodiment, when the polishing portion
7
is formed on the polishing body
4
by the forming body
2
, both the holding member for a forming body
50
and the holding member for a polishing body
8
are rotationally driven; however, only the polishing body may be rotated.
Furthermore, when the edge portion
27
of the object to be polished
24
is polished by the polishing portion
7
of the polishing body
4
, both the holding member for a polishing body
8
and the holding member for an object to be polished
28
are rotationally driven; however, only the object to be polished may be rotated.
In addition, in the embodiment described above, the most preferable example is that all of the forming body, the polishing body, and the object to be polished are rotated. During the forming, the forming body of the forming body and the polishing body may be stopped; further, during the polishing, the polishing body of the polishing body and the object to be polished may be stopped.
Claims
- 1. An apparatus for removing a deposited film in an edge portion of a substrate to be polished, the apparatus for removing the deposited film comprising:a polishing body having at least one polishing portion formed thereon and having substantially the same shape as that of the edge portion of the substrate; a forming body for forming the polishing portion having substantially the same shape as that of the edge portion of the substrate on the polishing body; a holding member for a forming body; a holding member for a polishing body; and a holding member for an object to be polished having mechanisms for rotation, horizontal movement, and pressing, wherein the forming body movably held by the holding member for a forming body is brought into contact with the polishing body held rotatably and vertically movably by the holding member for a polishing body so as to form the polishing portion, and wherein the substrate held by the holding member is urged into contact with the polishing body so as to remove a deposited film at the edge portion by polishing.
- 2. An apparatus according to claim 1, wherein the polishing portion of the polishing body is formed so as to substantially agree with an edge face, a slope, and a flat plane of the substrate to be polished.
- 3. An apparatus according to claim 1, wherein the holding member for a forming body rotatably holding the forming body is capable of relatively approaching to and separating from the direction of the holding member for a polishing body while making an edge portion of the forming body in contact with the surface of the polishing body during the approaching.
- 4. An apparatus according to claim 1, wherein the object to be polished comprises the substrate and a deposited film formed on the surface of the substrate.
Priority Claims (1)
Number |
Date |
Country |
Kind |
2000-124405 |
Apr 2000 |
JP |
|
US Referenced Citations (4)
Number |
Name |
Date |
Kind |
5476413 |
Hasegawa et al. |
Dec 1995 |
A |
5866477 |
Ogawa et al. |
Feb 1999 |
A |
6159081 |
Hakomori |
Dec 2000 |
A |
6261160 |
Hakomori |
Jul 2001 |
B1 |
Foreign Referenced Citations (2)
Number |
Date |
Country |
08-085051 |
Apr 1996 |
JP |
09-186234 |
Jul 1997 |
JP |