Number | Name | Date | Kind |
---|---|---|---|
1862811 | Strong | Jun 1932 | |
2799523 | Parker | Jul 1957 | |
2956106 | Hasselhorn et al. | Oct 1960 | |
3165674 | Swan | Jan 1965 | |
3341806 | Joachim | Sep 1967 | |
3408565 | Frick et al. | Oct 1968 | |
3412333 | Frick et al. | Nov 1961 | |
3508315 | Hoffken | Apr 1970 | |
3609547 | Slusser | Sep 1971 | |
3645545 | Garnache et al. | Feb 1972 | |
3710479 | Bernardo et al. | Jan 1973 | |
3727284 | Ragard et al. | Apr 1973 | |
3842346 | Bobbitt | Oct 1974 | |
3845234 | Brenner | Oct 1974 | |
3889053 | Lloyd et al. | Jun 1975 | |
3893232 | Fletcher et al. | Jul 1975 | |
3898561 | Leighton, Sr. | Aug 1975 | |
3912353 | Kasuya et al. | Oct 1975 | |
4063347 | Woodman, Jr. | Dec 1977 | |
4067794 | Ganzi et al. | Jan 1978 | |
4070753 | Liu | Jan 1978 | |
4088381 | Harnett | May 1978 | |
4099325 | Baker | Jul 1978 | |
4148534 | Veburg | Apr 1979 | |
4161064 | Woodman, Jr. et al. | Jul 1979 | |
4196513 | Harigawe et al. | Apr 1980 |
Number | Date | Country |
---|---|---|
2117554 | Oct 1972 | DEX |
Entry |
---|
Brochure, "Cost Effective Burn-In for All Types of Semiconductors," Reliability, Inc., 3/76. |
Brochure, Reliability, Inc., (Exhibit E), Undated. |
Brochure, Reliability, Inc., (Exhibit A), undated. |
Brochure, Reliability, Inc., (Exhibit B), undated. |
Brochure, "Criteria IV", Reliability, Inc., Copyright 11/77, (Exhibit C). |