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G01R31/2862
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Parent Industries
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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R31/00
Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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G01R31/2862
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Patents Grants
last 30 patents
Information
Patent Grant
Apparatus for testing a semiconductor package
Patent number
12,169,219
Issue date
Dec 17, 2024
TSE CO., LTD.
Min Cheol Kim
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor package test apparatus and method
Patent number
12,072,370
Issue date
Aug 27, 2024
Samsung Electronics Co., Ltd.
Sung Ok Kim
G01 - MEASURING TESTING
Information
Patent Grant
Thermoelectric device with Seebeck effect
Patent number
12,025,648
Issue date
Jul 2, 2024
Hutchinson
Fabrice Chopard
G01 - MEASURING TESTING
Information
Patent Grant
Burn-in board seating
Patent number
12,007,434
Issue date
Jun 11, 2024
Micro Control Company
Aidan Michael Fawcett
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus, transfer method, chamber and frame for semiconductor bur...
Patent number
11,982,706
Issue date
May 14, 2024
MSV SYSTEMS & SERVICES PTE LTD
Teck Huat Tan
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor test device including temperature control module and...
Patent number
11,927,623
Issue date
Mar 12, 2024
SK Hynix Inc.
Nack Hyun Kim
G01 - MEASURING TESTING
Information
Patent Grant
Cryogenic wafer testing system
Patent number
11,927,621
Issue date
Mar 12, 2024
High Precision Devices, Inc.
Michael Snow
G01 - MEASURING TESTING
Information
Patent Grant
Elevator unit for transferring tray and test handler including same
Patent number
11,892,500
Issue date
Feb 6, 2024
Semes Co., Ltd.
Jin Ho Kang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method of testing a semiconductor device
Patent number
11,885,846
Issue date
Jan 30, 2024
SK hynix Inc.
Gyung Jin Kim
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method of testing an object within a dry gas environment
Patent number
11,860,083
Issue date
Jan 2, 2024
Samsung Electronics Co, Ltd.
Dahm Yu
G01 - MEASURING TESTING
Information
Patent Grant
Test system
Patent number
11,852,677
Issue date
Dec 26, 2023
Tokyo Electron Limited
Kentaro Konishi
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor testing apparatus for wafer probing testing and final...
Patent number
11,835,574
Issue date
Dec 5, 2023
TEST21 TAIWAN CORPORATION
Shun-Bon Ho
G01 - MEASURING TESTING
Information
Patent Grant
Allocation of test resources to perform a test of memory components
Patent number
11,808,806
Issue date
Nov 7, 2023
Micron Technology, Inc.
Aswin Thiruvengadam
G01 - MEASURING TESTING
Information
Patent Grant
Test site configuration in an automated test system
Patent number
11,754,596
Issue date
Sep 12, 2023
Teradyne, Inc.
Michael O. McKenna
G01 - MEASURING TESTING
Information
Patent Grant
Burn-in board and burn-in apparatus
Patent number
11,719,741
Issue date
Aug 8, 2023
Advantest Corporation
Hiroaki Takeuchi
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for conducting burn-in testing of semiconducto...
Patent number
11,719,743
Issue date
Aug 8, 2023
Kes Systems, Inc.
Ballson Gopal
G01 - MEASURING TESTING
Information
Patent Grant
Planar ring radiation barrier for cryogenic wafer test system
Patent number
11,639,957
Issue date
May 2, 2023
Northrop Grumman Systems Corporation
Kelsey McCusker
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor package test system and semiconductor package fabrica...
Patent number
11,592,478
Issue date
Feb 28, 2023
Samsung Electronics Co., Ltd.
Jaehong Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method of testing a semiconductor device
Patent number
11,543,450
Issue date
Jan 3, 2023
SK hynix Inc.
Gyung Jin Kim
G01 - MEASURING TESTING
Information
Patent Grant
EMC test system and EMC test method using LiFi
Patent number
11,506,699
Issue date
Nov 22, 2022
Rohde & Schwarz GmbH & Co. KG
Erik Araojo
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Integrated-circuit-level test system and method
Patent number
11,408,931
Issue date
Aug 9, 2022
NANYA TECHNOLOGY CORPORATION
Cheng-Sung Lai
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and temperature control meihod
Patent number
11,385,280
Issue date
Jul 12, 2022
Tokyo Electron Limited
Shigeru Kasai
G01 - MEASURING TESTING
Information
Patent Grant
Method for testing the hermetic seal of a package
Patent number
11,353,503
Issue date
Jun 7, 2022
STMicroelectronics S.r.l.
Paolo Aranzulla
G01 - MEASURING TESTING
Information
Patent Grant
Feedback burn-in device of burn-in oven
Patent number
11,353,498
Issue date
Jun 7, 2022
Hongbang Automation Co., Ltd.
Kuo-Ching Hsiao
G01 - MEASURING TESTING
Information
Patent Grant
Testing device includes radiation shields for testing integrated ci...
Patent number
11,181,574
Issue date
Nov 23, 2021
Afore Oy
Aki Junes
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and cleaning method of inspection apparatus
Patent number
11,181,573
Issue date
Nov 23, 2021
Tokyo Electron Limited
Tomoya Endo
G01 - MEASURING TESTING
Information
Patent Grant
Allocation of test resources to perform a test of memory components
Patent number
11,131,705
Issue date
Sep 28, 2021
Micron Technology, Inc.
Aswin Thiruvengadam
G01 - MEASURING TESTING
Information
Patent Grant
Environment control apparatus and chip testing system
Patent number
11,119,147
Issue date
Sep 14, 2021
ONE TEST SYSTEMS
Chen-Lung Tsai
G01 - MEASURING TESTING
Information
Patent Grant
Burn-in test apparatus for semiconductor devices
Patent number
11,061,069
Issue date
Jul 13, 2021
Kes Systems, Inc.
Ballson Gopal
G01 - MEASURING TESTING
Information
Patent Grant
Adjustment method of inspection system and auxiliary element therefor
Patent number
11,016,142
Issue date
May 25, 2021
Tokyo Electron Limited
Minoru Uchida
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL TUNING TEST SYSTEM USING PARALLEL OVEN PIPELINES WITH PARAL...
Publication number
20240353491
Publication date
Oct 24, 2024
Tektronix, Inc.
John J. Pickerd
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR TESTING AND/OR OPERATING ELECTRONIC DEVICES
Publication number
20240329121
Publication date
Oct 3, 2024
KIUTRA GMBH
Jan Spallek
G01 - MEASURING TESTING
Information
Patent Application
DEVICE COOLING ENCLOSURE AND ADAPTER FOR HOUSING DEVICES OF DIFFERE...
Publication number
20240302430
Publication date
Sep 12, 2024
Advantest Corporation
Brad EMBERGER
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR BURN-IN BOARD ALIGNMENT AND SEALING BETWEE...
Publication number
20240053397
Publication date
Feb 15, 2024
MSV SYSTEMS & SERVICES PTE LTD
Teck Huat TAN
G01 - MEASURING TESTING
Information
Patent Application
BURN-IN SYSTEM WITH MULTIPLE PLUGS ON THE TEST BOARD
Publication number
20240003966
Publication date
Jan 4, 2024
Meritech Co., Ltd.
BYUNG GOOK CHANG
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR TESTING A SEMICONDUCTOR PACKAGE
Publication number
20230384364
Publication date
Nov 30, 2023
TSE CO., LTD.
Min Cheol Kim
G01 - MEASURING TESTING
Information
Patent Application
ELECTROMAGNETIC WAVE TEST DEVICE AND ELECTROMAGNETIC WAVE TEST METHOD
Publication number
20230296665
Publication date
Sep 21, 2023
TDK Corporation
Shotaro HAMAMOTO
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS, TRANSFER METHOD, CHAMBER AND FRAME FOR SEMICONDUCTOR BUR...
Publication number
20230251305
Publication date
Aug 10, 2023
MSV SYSTEMS & SERVICES PTE LTD
Teck Huat TAN
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR TEST DEVICE AND METHOD OF DRIVING THE SAME
Publication number
20230133368
Publication date
May 4, 2023
SK HYNIX INC.
Nack Hyun KIM
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD OF TESTING A SEMICONDUCTOR DEVICE
Publication number
20230122944
Publication date
Apr 20, 2023
SK HYNIX INC.
Gyung Jin KIM
G01 - MEASURING TESTING
Information
Patent Application
THERMAL MEASUREMENT OF MATERIALS
Publication number
20230091586
Publication date
Mar 23, 2023
Western Digital Technologies, Inc.
Rohan Shirsat
G01 - MEASURING TESTING
Information
Patent Application
Cryogenic Wafer Testing System
Publication number
20230014966
Publication date
Jan 19, 2023
High Precision Devices, Inc.
Michael Snow
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELEVATOR UNIT FOR TRANSFERRING TRAY AND TEST HANDLER INCLUDING SAME
Publication number
20230010924
Publication date
Jan 12, 2023
SEMES CO., LTD.
Jin Ho KANG
B66 - HOISTING LIFTING HAULING
Information
Patent Application
RADIATION BARRIER FOR CRYOGENIC WAFER TEST SYSTEM
Publication number
20230003791
Publication date
Jan 5, 2023
Northrop Grumman Systems Corporation
KELSEY McCUSKER
G01 - MEASURING TESTING
Information
Patent Application
BURN-IN BOARD AND BURN-IN APPARATUS
Publication number
20220334173
Publication date
Oct 20, 2022
Advantest Corporation
Hiroaki Takeuchi
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR TESTING APPARATUS FOR WAFER PROBING TESTING AND FINAL...
Publication number
20220291279
Publication date
Sep 15, 2022
TEST21 TAIWAN CORPORATION
Shun-Bon HO
G01 - MEASURING TESTING
Information
Patent Application
TEST SYSTEM
Publication number
20220276298
Publication date
Sep 1, 2022
TOKYO ELECTRON LIMITED
Kentaro KONISHI
G01 - MEASURING TESTING
Information
Patent Application
THERMOELECTRIC DEVICE WITH SEEBECK EFFECT
Publication number
20220155362
Publication date
May 19, 2022
HUTCHINSON
Fabrice CHOPARD
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TEST SITE CONFIGURATON IN AN AUTOMATED TEST SYSTEM
Publication number
20220128597
Publication date
Apr 28, 2022
Teradyne, Inc.
Michael O. McKenna
G01 - MEASURING TESTING
Information
Patent Application
BURN-IN BOARD SEATING
Publication number
20220120808
Publication date
Apr 21, 2022
Micro Control Company
Aidan Michael Fawcett
G05 - CONTROLLING REGULATING
Information
Patent Application
SEMICONDUCTOR PACKAGE TEST APPARATUS AND METHOD
Publication number
20220057444
Publication date
Feb 24, 2022
Samsung Electronics Co., Ltd.
Sung Ok KIM
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR PACKAGE TEST SYSTEM AND SEMICONDUCTOR PACKAGE FABRICA...
Publication number
20220026488
Publication date
Jan 27, 2022
Samsung Electronics Co., Ltd.
Jaehong Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ALLOCATION OF TEST RESOURCES TO PERFORM A TEST OF MEMORY COMPONENTS
Publication number
20210373072
Publication date
Dec 2, 2021
Micron Technology, Inc.
Aswin Thiruvengadam
G01 - MEASURING TESTING
Information
Patent Application
BURN-IN TEST APPARATUS FOR SEMICONDUCTOR DEVICES
Publication number
20210293877
Publication date
Sep 23, 2021
KES Systems, Inc.
Ballson GOPAL
G01 - MEASURING TESTING
Information
Patent Application
FEEDBACK BURN-IN DEVICE OF BURN-IN OVEN
Publication number
20210247439
Publication date
Aug 12, 2021
HONGBANG AUTOMATION CO., LTD.
KUO-CHING HSIAO
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS AND TEMPERATURE CONTROL METHOD
Publication number
20210208194
Publication date
Jul 8, 2021
TOKYO ELECTRON LIMITED
Shigeru KASAI
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD OF TESTING A SEMICONDUCTOR DEVICE
Publication number
20210190857
Publication date
Jun 24, 2021
SK HYNIX INC.
Gyung Jin KIM
G01 - MEASURING TESTING
Information
Patent Application
WET LEAKAGE CURRENT TEST SYSTEM FOR PHOTOVOLTAIC COMPONENT
Publication number
20210175848
Publication date
Jun 10, 2021
Miasolé Equipment Integration (Fujian) Co., Ltd.
Shengtao MA
G01 - MEASURING TESTING
Information
Patent Application
EMC TEST SYSTEM AND EMC TEST METHOD USING LIFI
Publication number
20210165031
Publication date
Jun 3, 2021
ROHDE & SCHWARZ GMBH & CO. KG
Erik ARAOJO
G01 - MEASURING TESTING
Information
Patent Application
ENVIRONMENT CONTROL APPARATUS AND CHIP TESTING SYSTEM
Publication number
20210132142
Publication date
May 6, 2021
ONE TEST SYSTEMS
CHEN-LUNG TSAI
G01 - MEASURING TESTING