Testing semiconductor operation lifetime or reliability

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CPC
G01R31/2642

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2642Testing semiconductor operation lifetime or reliability

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for detecting aging-dictated damage or delamin...
- Patent number 12,306,264
- Issue date May 20, 2025
- Siemens Aktiengesellschaft
- Robert Baumgartner
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus and testing method
- Patent number 12,298,340
- Issue date May 13, 2025
- Fuji Electric Co., Ltd.
- Mitsuru Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Circuits and techniques for predicting failure of circuits based on...
- Patent number 12,254,254
- Issue date Mar 18, 2025
- Infineon Technologies AG
- Veit Kleeberger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Estimation of life of switching devices
- Patent number 12,248,016
- Issue date Mar 11, 2025
- EATON INTELLIGENT POWER LIMITED
- Deepak Balaji Somayajula
- G01 - MEASURING TESTING
Information Patent Grant
On-die aging measurements for dynamic timing modeling
- Patent number 12,216,150
- Issue date Feb 4, 2025
- Altera Corporation
- Dheeraj Subbareddy
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring semiconductor reliability and predicting device failure...
- Patent number 12,203,973
- Issue date Jan 21, 2025
- Tartan Silicon Systems, Inc.
- Alan Paul Aronoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Display panel and burn-in test method of the display panel
- Patent number 12,203,972
- Issue date Jan 21, 2025
- Shenzhen China Star Optoelectronics Semiconductor Display Technology Co., Ltd.
- Jida Hou
- G01 - MEASURING TESTING
Information Patent Grant
Thermal testing system having safety feature(s) and multiple indepe...
- Patent number 12,174,239
- Issue date Dec 24, 2024
- Microsoft Technology Licensing, LLC
- Quang Thanh Tran
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 12,163,999
- Issue date Dec 10, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor substrate yield prediction based on spectra data from...
- Patent number 12,111,355
- Issue date Oct 8, 2024
- Onto Innovation Inc.
- Xin Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods to monitor leakage current
- Patent number 12,085,601
- Issue date Sep 10, 2024
- STMicroelectronics S.r.l.
- Romeo Letor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test circuit monitoring PBTI and operating method thereof
- Patent number 12,085,602
- Issue date Sep 10, 2024
- SK hynix Inc.
- Min Cheol Kim
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for controlling wind converters
- Patent number 12,074,530
- Issue date Aug 27, 2024
- General Electric Renovables Espana, S.L.
- Lijun He
- F03 - MACHINES OR ENGINES FOR LIQUIDS WIND, SPRING WEIGHT AND MISCELLANEOUS M...
Information Patent Grant
Method and device for wafer-level testing
- Patent number 12,066,484
- Issue date Aug 20, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Jun He
- G01 - MEASURING TESTING
Information Patent Grant
System and method for measuring intermittent operating life of GaN-...
- Patent number 12,038,469
- Issue date Jul 16, 2024
- INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
- Chang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for monitoring gate signal of power semiconductor
- Patent number 12,013,428
- Issue date Jun 18, 2024
- Mitsubishi Electric Corporation
- Nicolas Degrenne
- G01 - MEASURING TESTING
Information Patent Grant
Transport system, inspection system, and inspection method
- Patent number 12,013,429
- Issue date Jun 18, 2024
- Tokyo Electron Limited
- Seiichiro Motomura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and power conversion device
- Patent number 12,000,883
- Issue date Jun 4, 2024
- Mitsubishi Electric Corporation
- Yukihiko Wada
- G01 - MEASURING TESTING
Information Patent Grant
Test circuits and semiconductor test methods
- Patent number 11,988,704
- Issue date May 21, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- ChihCheng Liu
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor apparatus, image capturing apparatus, image capturing...
- Patent number 11,953,541
- Issue date Apr 9, 2024
- Canon Kabushiki Kaisha
- Kei Ochiai
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Test method for tolerance against the hot carrier effect
- Patent number 11,953,542
- Issue date Apr 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yifei Pan
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and system for predicting insulated gate bipolar transistor...
- Patent number 11,953,538
- Issue date Apr 9, 2024
- WUHAN UNIVERSITY
- Yigang He
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device for managing degree of degradation
- Patent number 11,946,967
- Issue date Apr 2, 2024
- Samsung Electronics Co., Ltd.
- Dong-Uk Ryu
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Compressor, monitoring system, and method of monitoring compressor
- Patent number 11,933,291
- Issue date Mar 19, 2024
- Hitachi Industrial Equipment Systems Co., Ltd.
- Tomofumi Okubo
- G01 - MEASURING TESTING
Information Patent Grant
Power semi-conductor module, mask, measurement method, computer sof...
- Patent number 11,927,619
- Issue date Mar 12, 2024
- Mitsubishi Electric Corporation
- Nicolas Degrenne
- G01 - MEASURING TESTING
Information Patent Grant
Reliability evaluation method and system of microgrid inverter IGBT...
- Patent number 11,913,986
- Issue date Feb 27, 2024
- WUHAN UNIVERSITY
- Yigang He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing machine and testing method
- Patent number 11,892,499
- Issue date Feb 6, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Kang Lv
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and control method for inspection apparatus
- Patent number 11,874,319
- Issue date Jan 16, 2024
- Tokyo Electron Limited
- Hiroyuki Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 11,860,221
- Issue date Jan 2, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test circuits and semiconductor test methods
- Patent number 11,860,217
- Issue date Jan 2, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- ChihCheng Liu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
POWER DEVICE PROGNOSTICS WITH QUANTUM SENSING THROUGH 2-D MATERIALS
- Publication number 20250151340
- Publication date May 8, 2025
- Toyota Motor Engineering & Manufacturing North America, Inc.
- Ercan Mehmet DEDE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method of Power MOSFET Diagnostic and Lifetime Estimatio...
- Publication number 20250138078
- Publication date May 1, 2025
- Centre for Advances in Reliability and Safety Limited
- Ka Hong LOO
- G01 - MEASURING TESTING
Information Patent Application
CONTROL CIRCUIT AND SEMICONDUCTOR MODULE
- Publication number 20250085330
- Publication date Mar 13, 2025
- Fuji Electric Co., Ltd.
- Tatsuya OYOBIKI
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Estimating Cyclic Thermal Stress
- Publication number 20250067789
- Publication date Feb 27, 2025
- ABB Schweiz AG
- Juri Voloskin
- G01 - MEASURING TESTING
Information Patent Application
Method for Monitoring a Drive Device of an Electric Motor
- Publication number 20250067790
- Publication date Feb 27, 2025
- ROBERT BOSCH GmbH
- Carsten Rau
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
METHOD AND DEVICE FOR MEASURING THE STATE OF HEALTH OF SEMICONDUCTO...
- Publication number 20250012848
- Publication date Jan 9, 2025
- UNIVERSITE GUSTAVE EIFFEL
- Zoubir KHATIR
- G01 - MEASURING TESTING
Information Patent Application
AGING PROOF DELAY CIRCUIT
- Publication number 20240410932
- Publication date Dec 12, 2024
- STMicroelectronics International N.V.
- Francois TAILLIET
- G01 - MEASURING TESTING
Information Patent Application
Method, computer program, and system for determining respective tra...
- Publication number 20240385262
- Publication date Nov 21, 2024
- HELMHOLTZ-ZENTRUM BERLIN FÜR MATERIALIEN UND ENERGIE GMBH
- Artem Musiienko
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR WAFER-LEVEL TESTING
- Publication number 20240361380
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- JUN HE
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALCULATING THE REMAINING CYCLIC LIFETIME OF AN ELECTRIC...
- Publication number 20240319258
- Publication date Sep 26, 2024
- VACON OY
- Tuomas Yli-Rahnasto
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE AND CURRENT-SENSING-LESS SHORT-CIRCUIT PROTECTION AND LOCAL...
- Publication number 20240288508
- Publication date Aug 29, 2024
- The Florida State University Research Foundation, Inc.
- Hui Li
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR INCREASING LIFETIME OF POWER DIE OR POWER MODULE
- Publication number 20240272222
- Publication date Aug 15, 2024
- Mitsubishi Electric Corporation
- Merouane OUHAB
- G01 - MEASURING TESTING
Information Patent Application
SERVICE LIFE DIAGNOSTIC DEVICE AND POWER CONVERSION DEVICE
- Publication number 20240255565
- Publication date Aug 1, 2024
- Mitsubishi Electric Corporation
- Yukihiko WADA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING WEAR IN AN ELECTRONIC UNIT, AND TEST APPARATUS
- Publication number 20240210465
- Publication date Jun 27, 2024
- ROBERT BOSCH GmbH
- Andreas Schmidtlein
- G01 - MEASURING TESTING
Information Patent Application
TWO-PHASE THERMAL TEST APPARATUSES AND METHODS
- Publication number 20240210462
- Publication date Jun 27, 2024
- Advantest Corporation
- Peter Weixiang ZHENG
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR APPARATUS, IMAGE CAPTURING APPARATUS, IMAGE CAPTURING...
- Publication number 20240210463
- Publication date Jun 27, 2024
- Canon Kabushiki Kaisha
- Kei Ochiai
- B60 - VEHICLES IN GENERAL
Information Patent Application
LIGHT OUTPUT ESTIMATION METHOD FOR LIGHT-EMITTING DEVICE
- Publication number 20240201244
- Publication date Jun 20, 2024
- Nikkiso Co., Ltd.
- Kenta URA
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE TRANSPORT LEVEL TESTER SYSTEM
- Publication number 20240192261
- Publication date Jun 13, 2024
- Wolfspeed, Inc.
- Jason P. Hricik
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MONITORING A HEALTH STATE OF A POWER SEMICONDUCTOR DEVICE
- Publication number 20240192267
- Publication date Jun 13, 2024
- Rolls-Royce plc
- Mohamed Sathik MOHAMED HALICK
- G01 - MEASURING TESTING
Information Patent Application
DISPLAY PANEL AND BURN-IN TEST METHOD OF THE DISPLAY PANEL
- Publication number 20240168081
- Publication date May 23, 2024
- Shenzhen China Star Optoelectronics Semiconductor Display Technology Co., Ltd.
- Jida HOU
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS AND TESTING METHOD
- Publication number 20240142510
- Publication date May 2, 2024
- Fuji Electric Co., Ltd.
- Mitsuru YOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PREDICTING FAILURE OF SEMICONDUCTOR DEVICE, AND SEMICOND...
- Publication number 20240110970
- Publication date Apr 4, 2024
- DENSO CORPORATION
- Masataka DEGUCHI
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20240103068
- Publication date Mar 28, 2024
- Aehr Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method And Apparatus For Monitoring The Condition Of A Power Semico...
- Publication number 20240088782
- Publication date Mar 14, 2024
- ABB Schweiz AG
- Olli Alkkiomäki
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
TEST CIRCUIT MONITORING PBTI AND OPERATING METHOD THEREOF
- Publication number 20240003961
- Publication date Jan 4, 2024
- SK HYNIX INC.
- Min Cheol KIM
- G01 - MEASURING TESTING
Information Patent Application
LOW CURRENT LEAKAGE MEASUREMENT ON A HIGH CURRENT UNIFIED STATIC AN...
- Publication number 20230408577
- Publication date Dec 21, 2023
- KEITHLEY INSTRUMENTS, LLC
- Gregory Sobolewski
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR TESTING OPTICAL RECEIVERS
- Publication number 20230408573
- Publication date Dec 21, 2023
- MELLANOX TECHNOLOGIES, LTD.
- Tatyana ANTONENKO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR WAFER-LEVEL TESTING
- Publication number 20230366925
- Publication date Nov 16, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- JUN HE
- G01 - MEASURING TESTING
Information Patent Application
Monitoring Semiconductor Reliability and Predicting Device Failure...
- Publication number 20230280392
- Publication date Sep 7, 2023
- Alan Paul Aronoff
- G01 - MEASURING TESTING
Information Patent Application
DIRECTLY IMPINGING PRESSURE MODULATED SPRAY COOLING AND METHODS OF...
- Publication number 20230260870
- Publication date Aug 17, 2023
- Intel Corporation
- Prabhakar SUBRAHMANYAM
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...

Testing semiconductor operation lifetime or reliability

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and apparatus for detecting aging-dictated damage or delamin...

Testing apparatus and testing method

Circuits and techniques for predicting failure of circuits based on...

Estimation of life of switching devices

On-die aging measurements for dynamic timing modeling

Monitoring semiconductor reliability and predicting device failure...

Display panel and burn-in test method of the display panel

Thermal testing system having safety feature(s) and multiple indepe...

Apparatus for testing electronic devices

Semiconductor substrate yield prediction based on spectra data from...

Systems and methods to monitor leakage current

Test circuit monitoring PBTI and operating method thereof

Systems and methods for controlling wind converters

Method and device for wafer-level testing

System and method for measuring intermittent operating life of GaN-...

Method and device for monitoring gate signal of power semiconductor

Transport system, inspection system, and inspection method

Semiconductor device and power conversion device

Test circuits and semiconductor test methods

Semiconductor apparatus, image capturing apparatus, image capturing...

Test method for tolerance against the hot carrier effect

Method and system for predicting insulated gate bipolar transistor...

Electronic device for managing degree of degradation

Compressor, monitoring system, and method of monitoring compressor

Power semi-conductor module, mask, measurement method, computer sof...

Reliability evaluation method and system of microgrid inverter IGBT...

Testing machine and testing method

Inspection apparatus and control method for inspection apparatus

Apparatus for testing electronic devices

Test circuits and semiconductor test methods

Patents Applicationslast 30 patents

POWER DEVICE PROGNOSTICS WITH QUANTUM SENSING THROUGH 2-D MATERIALS

System and Method of Power MOSFET Diagnostic and Lifetime Estimatio...

CONTROL CIRCUIT AND SEMICONDUCTOR MODULE

Method and Apparatus for Estimating Cyclic Thermal Stress

Method for Monitoring a Drive Device of an Electric Motor

METHOD AND DEVICE FOR MEASURING THE STATE OF HEALTH OF SEMICONDUCTO...

AGING PROOF DELAY CIRCUIT

Method, computer program, and system for determining respective tra...

METHOD AND DEVICE FOR WAFER-LEVEL TESTING

METHOD FOR CALCULATING THE REMAINING CYCLIC LIFETIME OF AN ELECTRIC...

VOLTAGE AND CURRENT-SENSING-LESS SHORT-CIRCUIT PROTECTION AND LOCAL...

METHOD AND DEVICE FOR INCREASING LIFETIME OF POWER DIE OR POWER MODULE

SERVICE LIFE DIAGNOSTIC DEVICE AND POWER CONVERSION DEVICE

METHOD FOR DETERMINING WEAR IN AN ELECTRONIC UNIT, AND TEST APPARATUS

TWO-PHASE THERMAL TEST APPARATUSES AND METHODS

SEMICONDUCTOR APPARATUS, IMAGE CAPTURING APPARATUS, IMAGE CAPTURING...

LIGHT OUTPUT ESTIMATION METHOD FOR LIGHT-EMITTING DEVICE

MULTIPLE TRANSPORT LEVEL TESTER SYSTEM

METHOD OF MONITORING A HEALTH STATE OF A POWER SEMICONDUCTOR DEVICE

DISPLAY PANEL AND BURN-IN TEST METHOD OF THE DISPLAY PANEL

TESTING APPARATUS AND TESTING METHOD

METHOD FOR PREDICTING FAILURE OF SEMICONDUCTOR DEVICE, AND SEMICOND...

APPARATUS FOR TESTING ELECTRONIC DEVICES

Method And Apparatus For Monitoring The Condition Of A Power Semico...

TEST CIRCUIT MONITORING PBTI AND OPERATING METHOD THEREOF

LOW CURRENT LEAKAGE MEASUREMENT ON A HIGH CURRENT UNIFIED STATIC AN...

SYSTEM AND METHOD FOR TESTING OPTICAL RECEIVERS

METHOD AND DEVICE FOR WAFER-LEVEL TESTING

Monitoring Semiconductor Reliability and Predicting Device Failure...

DIRECTLY IMPINGING PRESSURE MODULATED SPRAY COOLING AND METHODS OF...