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G01R33/5604
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Measuring instruments
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MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
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Arrangements or instruments for measuring magnetic variables
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G01R33/5604
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Patents Grants
last 30 patents
Information
Patent Grant
Pore contribution corrected quantifying of surface roughness
Patent number
11,530,999
Issue date
Dec 20, 2022
Halliburton Energy Services, Inc.
Gabriela Singer
G01 - MEASURING TESTING
Information
Patent Grant
Sub voxel resolution magnetic resonance fingerprinting imaging
Patent number
11,092,659
Issue date
Aug 17, 2021
Koninklijke Philips N.V.
Thomas Erik Amthor
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for MR microscopy analysis of resected tissue
Patent number
10,830,844
Issue date
Nov 10, 2020
Cornell University
Douglas J. Ballon
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance magnification imaging
Patent number
10,698,056
Issue date
Jun 30, 2020
The United States of America, as represented by the Secretary, Department of...
Jun Shen
G01 - MEASURING TESTING
Information
Patent Grant
Method and RF transmitter arrangement for generating RF fields
Patent number
8,390,288
Issue date
Mar 5, 2013
Koninklijke Philips Electronics N.V.
Ingmar Graesslin
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance stage microscope
Patent number
7,633,295
Issue date
Dec 15, 2009
California Institute of Technology
Julian Michael Tyszka
G01 - MEASURING TESTING
Information
Patent Grant
Truncated MR imaging with fractional readout FOV useful for breast...
Patent number
7,358,727
Issue date
Apr 15, 2008
General Electric Company
Elisabeth C. Angelos
G01 - MEASURING TESTING
Information
Patent Grant
MR ductography
Patent number
7,208,953
Issue date
Apr 24, 2007
Koninklijke Philips Electronics N.V.
Yasuyuki Kurihara
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic lens, method and focus volume imaging MRI
Patent number
7,193,415
Issue date
Mar 20, 2007
California Institute of Technology
Mladen Barbic
G01 - MEASURING TESTING
Information
Patent Grant
Mechanical force detection of magnetic fields using heterodyne demo...
Patent number
7,146,282
Issue date
Dec 5, 2006
Wisconsin Alumni Research Foundation
Daniel W. van der Weide
G01 - MEASURING TESTING
Information
Patent Grant
MR-compatible methods and systems for cardiac monitoring and gating
Patent number
7,054,676
Issue date
May 30, 2006
Duke University
Laurence W. Hedlund
G01 - MEASURING TESTING
Information
Patent Grant
Two-dimensional magnetic resonance tomographic microscopy
Patent number
7,042,216
Issue date
May 9, 2006
California Institute of Technology
Mladen Barbic
G01 - MEASURING TESTING
Information
Patent Grant
Phased array knee coil
Patent number
7,042,222
Issue date
May 9, 2006
General Electric Company
Tsinghua Zheng
G01 - MEASURING TESTING
Information
Patent Grant
Synthetic aperture MRI
Patent number
7,005,854
Issue date
Feb 28, 2006
976076 Alberta Inc.
J. Ross Mitchell
G01 - MEASURING TESTING
Information
Patent Grant
Supersensitive nuclear magnetic resonance micro imaging apparatus
Patent number
6,975,118
Issue date
Dec 13, 2005
Hitachi, Ltd.
Michiya Okada
G01 - MEASURING TESTING
Information
Patent Grant
Supersensitive nuclear magnetic resonance micro imaging apparatus
Patent number
6,937,019
Issue date
Aug 30, 2005
Michiya Okada
G01 - MEASURING TESTING
Information
Patent Grant
System and method of magnetic resonance imaging
Patent number
6,897,654
Issue date
May 24, 2005
California Institute of Technology
Mladen Barbic
G01 - MEASURING TESTING
Information
Patent Grant
Cantilever-free magnetic resonance force microscope
Patent number
6,836,112
Issue date
Dec 28, 2004
Michael J. Hennessy
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for nanomagnetic manipulation and sensing
Patent number
6,828,786
Issue date
Dec 7, 2004
California Institute of Technology
Axel Scherer
G01 - MEASURING TESTING
Information
Patent Grant
Batch-fabricated gradient and RF coils for submicrometer resolution...
Patent number
6,798,200
Issue date
Sep 28, 2004
Long-Sheng Fan
G01 - MEASURING TESTING
Information
Patent Grant
Correcting geometry and intensity distortions in MR data
Patent number
6,788,062
Issue date
Sep 7, 2004
Stryker Leibinger GmbH & Co., KG
Achim Schweikard
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance force microscope for the study of biological sys...
Patent number
6,683,451
Issue date
Jan 27, 2004
Wayne State University
Gregory J. Moore
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance imaging
Patent number
6,593,741
Issue date
Jul 15, 2003
Koninklijke Philips Electronics N.V.
Mark Bydder
G01 - MEASURING TESTING
Information
Patent Grant
Gradient coil apparatus and method of micro-imaging
Patent number
6,563,315
Issue date
May 13, 2003
GE Medical Systems Global Technology Co., LLC
Ed Benjamin Boskamp
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus to reduce perturbation field effects in MR ima...
Patent number
6,469,505
Issue date
Oct 22, 2002
GE Medical Systems Global Technology Co., LLC
Joseph K. Maier
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance force microscopy with oscillator actuation
Patent number
6,181,131
Issue date
Jan 30, 2001
University of Washington
Kelly Bruland
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Multiple resonance superconducting probe
Patent number
6,169,399
Issue date
Jan 2, 2001
The Trustees of Columbia University In the City of New York
Kuan Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Microcoil based micro-NMR spectrometer and method
Patent number
6,097,188
Issue date
Aug 1, 2000
The Board of Trustees of The University of Illinois
Jonathan V. Sweedler
G01 - MEASURING TESTING
Information
Patent Grant
Near-electrode imager
Patent number
6,046,592
Issue date
Apr 4, 2000
U.S. Department of Energy
Jerome W. Rathke
G01 - MEASURING TESTING
Information
Patent Grant
Reconstruction of images from MR signals obtained in the presence o...
Patent number
5,777,472
Issue date
Jul 7, 1998
Siemens Aktiengesellschaft
Oliver Heid
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PORE CONTRIBUTION CORRECTED QUANTIFYING OF SURFACE ROUGHNESS
Publication number
20210373106
Publication date
Dec 2, 2021
Halliburton Energy Services, Inc.
Gabriela Singer
G01 - MEASURING TESTING
Information
Patent Application
SUB VOXEL RESOLUTION MAGNETIC RESONANCE FINGERPRINTING IMAGING
Publication number
20200041594
Publication date
Feb 6, 2020
Koninklijke Philips N.V.
THOMAS ERIK AMTHOR
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR MR MICROSCOPY ANALYSIS OF RESECTED TISSUE
Publication number
20180100903
Publication date
Apr 12, 2018
Cornell University
Douglas J. Ballon
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC RESONANCE MAGNIFICATION IMAGING
Publication number
20170248668
Publication date
Aug 31, 2017
The United States of America, as represented by the Secretary, Department of...
Jun Shen
G01 - MEASURING TESTING
Information
Patent Application
System and Method for Detecting Labeled Entities Using Microcoil Ma...
Publication number
20100207631
Publication date
Aug 19, 2010
Andrew F. McDowell
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND RF TRANSMITTER ARRANGEMENT FOR GENERATING RF FIELDS
Publication number
20100141259
Publication date
Jun 10, 2010
Koninklijke Philips Electronics N.V.
Ingmar Graesslin
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR MANIPULATION AND/OR DETECTION OF BIOLOGIC...
Publication number
20100006439
Publication date
Jan 14, 2010
President and Fellows of Harvard College
Donhee Ham
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
IC Microfluidic Platform With Integrated Magnetic Resonance Probe
Publication number
20100001724
Publication date
Jan 7, 2010
University of Florida Research Foundation, Inc.
Rizwan Bashirullah
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC RESONANCE STAGE MICROSCOPE
Publication number
20080284430
Publication date
Nov 20, 2008
Julian Michael Tyszka
G01 - MEASURING TESTING
Information
Patent Application
MECHANICAL FORCE DETECTION OF MAGNETIC FIELDS USING HETERODYNE DEMO...
Publication number
20060265139
Publication date
Nov 23, 2006
Daniel W. van der Weide
G01 - MEASURING TESTING
Information
Patent Application
Magnetic lens, method and focus volume imaging MRI
Publication number
20060220642
Publication date
Oct 5, 2006
California Institute of Technology
Mladen Barbic
G01 - MEASURING TESTING
Information
Patent Application
Mr ductography
Publication number
20060192555
Publication date
Aug 31, 2006
Yasuyuki Kurihara
G01 - MEASURING TESTING
Information
Patent Application
Methods and apparatus for manipulation and/or detection of biologic...
Publication number
20060020371
Publication date
Jan 26, 2006
President and Fellows of Harvard College
Donhee Ham
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Supersensitive nuclear magnetic resonance imaging apparatus
Publication number
20050248349
Publication date
Nov 10, 2005
Michiya Okada
G01 - MEASURING TESTING
Information
Patent Application
Phased array knee coil
Publication number
20050134271
Publication date
Jun 23, 2005
Tsinghua Zheng
G01 - MEASURING TESTING
Information
Patent Application
Synthetic aperture MRI
Publication number
20040263169
Publication date
Dec 30, 2004
J. Ross Mitchell
G01 - MEASURING TESTING
Information
Patent Application
Two-dimensional magnetic resonance tomographic microscopy
Publication number
20040232914
Publication date
Nov 25, 2004
California Institute of Technology
Mladen Barbic
G01 - MEASURING TESTING
Information
Patent Application
Cantilever-free magnetic resonance force microscope
Publication number
20040056657
Publication date
Mar 25, 2004
Michael J. Hennessy
G01 - MEASURING TESTING
Information
Patent Application
Supersensitive nuclear magnetic resonance imaging apparatus
Publication number
20040046556
Publication date
Mar 11, 2004
Michiya Okada
G01 - MEASURING TESTING
Information
Patent Application
Correcting geometry and intensity distortions in MR data
Publication number
20040032261
Publication date
Feb 19, 2004
Achim Schweikard
G01 - MEASURING TESTING
Information
Patent Application
Batch-fabricated gradient glossary
Publication number
20030222648
Publication date
Dec 4, 2003
Long-Sheng Fan
G01 - MEASURING TESTING
Information
Patent Application
Supersensitive nuclear magnetic resonance imaging apparatus
Publication number
20030210052
Publication date
Nov 13, 2003
Michiya Okada
G01 - MEASURING TESTING
Information
Patent Application
System and method of magnetic resonance imaging
Publication number
20030193333
Publication date
Oct 16, 2003
Mladen Barbic
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for nanomagnetic manipulation and sensing
Publication number
20030158474
Publication date
Aug 21, 2003
Axel Scherer
G01 - MEASURING TESTING
Information
Patent Application
Magnetic resonance imaging
Publication number
20030025499
Publication date
Feb 6, 2003
Mark Bydder
G01 - MEASURING TESTING
Information
Patent Application
MR-compatible methods and systems for cardiac monitoring and gating
Publication number
20020156371
Publication date
Oct 24, 2002
Laurence W. Hedlund
G01 - MEASURING TESTING
Information
Patent Application
MR microscopy of whole specimens, individual organs or tissue speci...
Publication number
20020143248
Publication date
Oct 3, 2002
G. Allan Johnson
G01 - MEASURING TESTING