Claims
- 1. A cathodic arc evaporation coating apparatus comprising:a vacuum chamber; a cathode arrangement with a target in said chamber; an anode in said chamber; a DC generator for generating an arc evaporation current connected to said cathode arrangement and to said anode; an ignitor for generating a first arc discharge for a subsequent reactive cathodic arc evaporation of said target; an oxygen gas inlet into said vacuum chamber, connected to an oxygen supply for providing an oxygen atmosphere for the chamber; and said target being made of a metal alloy present essentially in a single phase so as to reduce occurrence of droplets during reactive cathodic arc evaporation of said metal alloy in the oxygen atmosphere.
- 2. An apparatus as stated in claim 1, wherein the target comprises an aluminum/chromium alloy.
- 3. An apparatus as stated in claim 1, wherein at least 70 at % of the alloy of the target is present in the single phase.
- 4. An apparatus as stated in claim 1, wherein at least 90 at % of the alloy of the target is present in the single phase.
- 5. An apparatus as stated in claim 1, wherein the target is surrounded by an electrically conducting material other than the essentially single phase material and a process operating point is provided with:a) a measuring device for a partial pressure of the oxygen and a final setting element arrangement for at least one of the following parameters: (i) mass flow of oxygen, (ii) arc conducting voltage, (iii) field strength of a magnetic field perpendicular to the target surface or b) a measuring device for the arc conducting voltage and a final setting element arrangement for at least one of the following parameters: (i) mass flow of the oxygen, (ii) said magnetic field or that c) a measuring device for a frequency spectrum of the arc current is provided and a final setting element arrangement for at least one of the following parameters: (i) arc conducting voltage; (ii) mass flow of oxygen; (iii) said magnetic field, with a measuring signal from the measuring device being carried at an output side of the measuring device to a comparison unit whose output signal acts upon the final setting element arrangement.
Priority Claims (1)
Number |
Date |
Country |
Kind |
2024/94 |
Jun 1994 |
CH |
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Parent Case Info
This application is a continuation, of application Ser. No. 08/493,668, filed Jun. 22, 1995, now abandoned.
US Referenced Citations (5)
Foreign Referenced Citations (3)
Number |
Date |
Country |
0285745 |
Jan 1988 |
EP |
0513662 |
May 1992 |
EP |
5-106022 |
Apr 1993 |
JP |
Non-Patent Literature Citations (3)
Entry |
Search Report of Swiss Application 2024/94. |
“Effects of Target Microstructure . . . ” by Bailey, pp. 1701-1705, J. Vac Sci & Tech., Jul.-Aug. 1992. |
“Cathodic Arc Evaporation . . . ” by V. Skocil et al., J. Vac Sci & Tech., Jul.-Aug. 1992, pp. 1740-1784. |
Continuations (1)
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Number |
Date |
Country |
Parent |
08/493668 |
Jun 1995 |
US |
Child |
08/927864 |
|
US |