The present invention relates to coating apparatuses, and particularly to a coating apparatus for applications such as forming a photoresist film on a substrate.
In the manufacturing of a liquid crystal display panel, a lithography process is often used for forming patterns on a component substrate. The substrate is commonly a glass substrate. The lithography process involves forming a photoresist film on the substrate. The forming of the photoresist film is carried out by coating a photoresist material on the substrate by use of a coating apparatus. The photoresist material generally comprises photoresist particles dissolved in a solvent.
Referring to
However, the surroundings of the coating apparatus 10 may not be absolutely clean. If micro-particles in the surrounding environment settle on the substrate 13, the coating performance is reduced. In addition, the micro-particles may scratch or damage the nozzle 11.
What is needed, therefore, is a coating apparatus for coating a photoresist film on a substrate which can timely clean the substrate before coating.
A coating apparatus for forming a photoresist film on a glass substrate includes a flat table, a nozzle unit, and a particle cleaning unit. The flat table is used for supporting the substrate. The nozzle unit is used for dispensing photoresist material on a major surface of the substrate. The particle cleaning unit is used for removing particles from the major surface before the coating material is coated thereon. The coating apparatus can timely clean the glass substrate before coating. The coating performance is improved, and the nozzle unit is protected from being scratched or damaged.
Other objects, advantages, and novel features become more apparent from the following detailed description of a preferred embodiment when taken in conjunction with the accompanying drawings, in which:
Reference will now be made to the drawings to describe a preferred embodiment of the present invention in detail.
Referring to
The flat table 30 can support and hold the substrate 21 to be coated by way of vacuum absorption way. The nozzle rinser is positioned at a side of the flat table 30, and is used for rinsing and cleaning a slit nozzle 41 of the nozzle unit 40.
The nozzle unit 40 includes the slit nozzle 41, a photoresist material supplying unit 42, a pair of first supporting frames 43, and a first driver (not shown). The first supporting frames 43 are positioned at two opposite long sides of the flat table 30, respectively. Two opposite ends of the slit nozzle 41 are engaged with the first supporting frames 43 respectively. Thus, the slit nozzle 41 is suspended over the flat table 30. The photoresist material supplying unit 42 communicates with the slit nozzle 41 through a pipe (not labeled), so as to supply photoresist material to the slit nozzle 41. The first driver can drive the slit nozzle 41 to move back and forth along a linear path defined perpendicular to and between the first supporting frames 43. Thus, the slit nozzle 41 can also function as a kind of wiper blade.
The particle cleaning unit 50 includes a particle cleaner 51, and pair of second supporting frames 53. The second supporting frames 53 are positioned at the two opposite long sides of the flat table 30 respectively, parallel with the first supporting frames 53. Two opposite ends of the particle cleaner 51 are engaged with the second supporting frames 53 respectively. Thus, the particle cleaner 51 is suspended over the flat table 30, and is set at a right side of the slit nozzle 41. The particle cleaner 51 can be, for example, an ultrasonic vacuum ultrasonic (UVU) system. The UVU system utilizes ultrasonic waves to vibrate particles, and utilizes a vacuum to take in the particles. The particle cleaner 51 includes a switch 511, and a second driver (not shown). Switching on and off of the particle cleaner 51 can be controlled by the switch 511. The second driver can drive the particle cleaner 51 to move back and forth along a linear path defined perpendicular to and between the second supporting frames 53.
Referring to
The particle cleaner 51 of the coating apparatus 20 can remove particles from the substrate 21 before the photoresist material is coated on the substrate 21. Therefore the coating performance is improved. In addition, the slit nozzle 41 is protected from scratching or damage.
It is to be understood, however, that even though numerous characteristics and advantages of the preferred embodiment have been set forth in the foregoing description, together with details of the structure and function of the preferred embodiment, the disclosure is illustrative only, and changes may be made in detail, especially in matters of shape, size and arrangement of parts within the principles of the invention to the full extent indicated by the broad general meaning of the terms in which the appended claims are expressed.
Number | Date | Country | Kind |
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93111374 | Apr 2004 | TW | national |