The present invention relates to a technique such as a charged particle beam apparatus, and in particular, to an analysis process of an observation image.
A charged particle beam apparatus such as a scanning electron microscope (SEM) can obtain an image such as a voltage contrast (VC) image as an observation image based on scanning of a sample with beam, light, or the like. A computer system connected to the charged particle beam apparatus executes an analysis process for detecting, for example, an abnormality or a defect (hereinafter, generically referred to as an abnormality) based on the observation image.
In defect analysis of a semiconductor device such as a logic device as a sample, for example, a VC observation method is used. In a VC observation image by an SEM, a difference in VC appears as brightness. The VC occurs with change in efficiency of emission of secondary electrons due to a potential difference generated on a charged surface of the sample. In the method, an abnormality is determined by analyzing brightness in the observation image.
An example of the related art is JP2010-25836A (PTL 1). PTL 1 describes that an external inspection apparatus capable of intuitively and quantitatively evaluating variation in a complicated structure of a semiconductor device is provided. PTL 1 describes that brightness and shape comparison is performed through comparison with a template image.
In the related art, for defect analysis of a logic device or the like, the presence or absence of an abnormality is determined by comparing brightness between cell structures with human's visual observation on a VC observation image obtained by a charged particle beam apparatus such as an SEM. A plug region or the like that is an element configuring a device such as a transistor is included in the cell structure. Note that, in such a related art, for example, comparison of brightness values between plug regions having the same position relation is difficult in an observation image in which many identical or similar cell structures are arranged, and even though comparison is possible, a lot of effort and time is required. Furthermore, in such an observation image, a plurality of plug regions in a certain cell structure may be distributed as images in an inverted relation such as vertical inversion or horizontal inversion. In this case, while there is also a need to discriminate these images, discrimination is very difficult in visual observation and a lot of effort and time is required.
An object of the disclosure is to provide a technique capable of easily and efficiently implementing determination and detection of an abnormality by comparison between identical or similar cell structures in an observation image automatically to a certain extent or more without depending on visual observation, in relation to a technique of a computer system or the like that performs analysis or the like of an observation image obtained by a charged particle beam apparatus.
A representative embodiment of the disclosure has the following configuration. A computer system according to an embodiment is a computer system that analyzes an observation image of a sample by a charged particle beam apparatus, in which the observation image includes a plurality of cell regions, and there is a case where each cell region includes a plurality of regions that are elements configuring the cell region, and the computer system executes an extraction process of extracting one or more second cell regions similar to a reference image as a similar image from the observation image, the reference image being a first cell region designated by a user or automatically set, a determination process of comparing, based on a rule in which a relationship between a plurality of regions of interest included in the reference image is defined, the plurality of regions of interest between the reference image and the extracted similar image to determine presence or absence of an abnormality of a cell region of the similar image, and an output process of outputting, to the user, a position of each cell region and the presence or absence of the abnormality as a determination result.
According to the representative embodiment of the disclosure, determination and detection of an abnormality by comparison between identical or similar cell structures in an observation image can be easily and efficiently implemented automatically to a certain extent or more without depending on visual observation, in relation to a technique of a computer system or the like that performs analysis or the like of an observation image obtained by a charged particle beam apparatus. Problems, configurations, effects, and the like other than those described above are shown in the embodiments for carrying out the invention.
Hereinafter, embodiments of the disclosure will be described in detail with reference to the drawings. In the drawings, the same parts are denoted by the same reference numerals in principle, and repetitive description will be omitted. In the drawings, for ease of understanding of the invention, a representation of each component may not represent an actual position, a size, a shape, a range, and the like.
For description, in a case where a process by a program is described, description may be made with a program, a function, a processing unit, or the like as a subject. However, a subject as hardware regarding the program, the function, the processing unit, or the like is a processor or a controller, a device, a computer, a system, or the like configured with the processor and the like. The computer executes a process according to the program read onto a memory while appropriately using resources such as the memory and a communication interface by the processor. Accordingly, predetermined functions, processing units, and the like are implemented. The processor is configured with, for example, a semiconductor device such as a CPU or a GPU. The processor is configured with a device or a circuit capable of performing predetermined calculation. A process is not limited to a software program process, and can be implemented by a dedicated circuit. An FPGA, an ASIC, a CPLD, and the like can be applied as the dedicated circuit.
The program may be installed as data in a target computer in advance or may be distributed and installed as data into the target computer from a program source. The program source may be a program distribution server on a communication network or may be a non-transient computer-readable storage medium (for example, a memory card). The program may be configured with a plurality of modules. The computer system may be configured with a plurality of devices. The computer system may be configured with a client server system, a cloud computing system, or the like. Various kinds of data or information are represented or implemented in a structure such as a table or a list, but are not limited thereto. Representations of identification information, an identifier, an ID, a name, a number, and the like can be replaced with each other.
A computer system of a first embodiment will be described with reference to
To the computer system 1, an input/output device including a display device 206 such as a liquid crystal display, an operation input device 207 such as a keyboard and a mouse, and the like is externally connected to the computer system 1 via an input/output interface 205. The input/output device may be incorporated in the computer system 1. The user is a person who operates and uses the computer system 1 such as an operator or a worker. The user operates the operation input device 207 to input an instruction or information while viewing a screen of the display device 206. The user operates the charged particle beam apparatus 2 through the computer system 1.
The main body 3 is a portion including a lens barrel (in other words, a housing) and the like configuring the SEM. In a configuration example of
Irradiation of a charged particle beam b1 generated in a vertical direction (Z direction) based on the electron gun 101 is controlled in the X and Y directions through actions of the condenser lens 102, the deflection coil 103, the objective lens 104, and the like. The condenser lens 102 and the objective lens 104 condense the charged particle beam b1. The deflection coil 103 deflects the charged particle beam b1 in the X and Y directions. Accordingly, the surface of the sample 5 is irradiated with the charged particle beam b1 while being scanned in the X and Y direction. With the irradiation of the charged particle beam b1, secondary electrons b2 and the like are generated from the surface of the sample 5. A potential difference occurs on the charged surface of the sample 5, and the efficiency of emission of the secondary electrons b2 is changed due to the potential difference. The potential difference appears as a difference in brightness in the observation image (VC image) of the SEM.
The secondary electrons b2 and the like generated from the surface of the sample 5 are detected by the detector 105. The detector 105 is, for example, a device in which imaging elements are arranged, and converts and detects the secondary electrons b2 and the like as an electrical signal. The detector 105 outputs the detected electrical signal as an image signal 150 through an amplification circuit, an analog/digital conversion circuit, and the like. The image signal 150 corresponds to an observation image. The image signal 150 is input to the computer system 1 through communication means such as a signal line and a communication interface 204 and is stored as data concerning an observation image in a storage device 203, for example. A processor 201 acquires and refers to data of the observation image to execute a process on the memory 202 and stores processing result data in the storage device 203.
The processor 201 of the computer system 1 performs drive control and the like on each unit of the main body 3 and acquires an observation image. The processor 201 reads a program stored in the storage device 203 onto the memory 203 and executes a program process based on the program, thereby implementing predetermined functions (analysis function and the like).
The computer system 1 includes the processor 201, the memory 202, the storage device 203, the communication interface 204, the input/output interface 205, and the like, and these units are connected to one another. Various programs, data, and information are stored in the storage device 203.
The processor 201 generates a screen to be a graphical user interface (GUI) concerning the analysis function and displays the screen on the display screen of the display device 206. The processor 201 receives an input from the user through the operation input device 207 and the GUI of the screen. The processor 201 may output sound to be a user interface through a speaker (not shown) or the like.
The processor 201 creates an observation image, which is a two-dimensional image, in the storage device 203 or the memory 202 based on the image signal 150 transferred from the main body 3. The observation image may be stored in association with information for management such as date and time, target sample information, position coordinate information of the sample surface corresponding to a visual field, imaging conditions, or a sensor value, or related information. The processor 201 displays the observation image within the screen having the GUI as described below. In the first embodiment, the observation image is an image that is used to detect a location of an abnormality on the surface by observation of the surface of the sample 5. The observation image may be called an inspection image or the like according to the purpose.
The present invention is not limited to the configuration of the computer system 1 of
In the first embodiment, the sample 5 as an object for acquiring an observation image is a semiconductor device corresponding to a logic device as a product, for example. During or after manufacturing of a product, an observation image is acquired with the semiconductor device as the sample 5. The user who is a worker observes the observation image and checks the presence or absence of an abnormality on the surface of the semiconductor device using the analysis function by the computer system 1. According to the analysis function, the determination result such as the presence or absence of an abnormality is generated and output substantially automatically (in other words, semi-automatically) by minimizing manual work by the user. Therefore, the user may perform work of checking the determination result, and can significantly reduce effort or time of work by minimizing visual observation.
In the first embodiment, as will be described below (
In Step S2, the processor 201 sets a reference image (in other words, a reference cell region) in the observation image (also described as an entire image). The setting of the reference image can be performed on a setting screen (
In Step S3, the processor 201 extracts similar images (in other words, a similar cell region) from the observation image based on the reference image. The extraction process can be designated as one of commands in software and executed (
In Step S4, the processor 201 sets a plurality of regions of interest (ROIs) for a plurality of plugs in the reference image using the reference image and a plurality of extracted similar cell regions. The setting of the plurality of ROIs can be performed on a setting screen (
In the first embodiment, specifically, the processor 201 calculates, for example, average brightness value or the like of each plug (the plug at the same arrangement position in the cell) as a statistical process using the plurality of similar cell regions extracted in the extraction process and sets the average brightness value to each ROI of the plurality of ROIs of the reference cell region. In the setting of the ROIs or the like, the processor 201 extracts a region where brightness is higher than brightness of a darkest background region by a predetermined brightness threshold value or more on the device surface, as a plug region. The range of the brightness value is, for example, 0 (black) to 255 (white).
In Step S5, the processor 201 sets a determination rule (also simply referred to as a rule) based on an operation or check of the user on a setting screen (
In Step S6, the processor 201 determines an abnormality of a cell region (in particular, a plug that is an ROI) by comparison between the reference image (reference cell region) and the similar image (similar cell region) based on the determination rule to be applied. The abnormality determination includes determination of the presence or absence of an abnormality and a location or position of an abnormality. In the first embodiment, while two-value determination of the presence or absence of an abnormality is simply performed, the invention is not limited thereto, and multi-value determination of a degree or a possibility of abnormality, defect, or the like may be performed. For example, the degree of abnormality may be divided into a plurality of levels using a plurality of threshold values.
In Step S7, the processor 201 displays information of the determination result on the screen having the GUI, or the like to output information to the user. Various kinds of data and information created in the processes of the analysis function as described above are stored in the storage device 203.
The processing flow of the above-described first embodiment is a flow in which the extraction process of Step S3 is executed before Step S4 such that the computer system 1 automatically generates and presents a suitable reference cell region as a plurality of ROIs of a reference cell region (in other words, a reference cell region including a plurality of ROIs). The suitable reference cell region generated using the extracted similar cell is presented, and the user can check the suitable reference cell region and confirm the suitable reference cell region as a reference cell region.
A cell 405 is a cell having a disposition of a plurality of plugs identical to the cell 402, a cell 406 is an example of a cell having a disposition of a plurality of plugs horizontally inverted with respect to the cell 402, a cell 407 is an example of a cell having a disposition of a plurality of plugs vertically inverted with respect to the cell 402, and the cell 408 is an example of a cell having a disposition of a plurality of plugs diagonally inverted with respect to the cell 402. The user can set a desired cell, for example, the cell 402 as a reference image. Then, a plurality of plugs in the cell 402 can be set as ROIs. A plug 421 or a plug 422 shows an example where brightness deviates from brightness of another plug, and such a plug (a cell including the plug) is determined as an abnormality in abnormality determination described below.
Data of the observation image is not only data of the brightness value of each pixel but also data having position coordinate information obtained by the SEM. For example, the observation image has position coordination information for each pixel. For example, the observation image has position coordination information of an upper left point and a lower right point of the observation image. The observation image has the position coordination information, so that map display described below can be performed.
There is a case where each plug region has brightness, and brightness is different between the plug regions. The three plugs of the example have a brightness relation in which brightness is turned from high (white) to low (black) in an order of the plug 513 of ROI number (#)=3, the plug 511 of #=1, and the plug 512 of #=2. In a lower portion of the
In a lower portion of
As in
The cell regions of various disposition patterns including the reference cell region 601 are displayed distinguishingly in a predetermined representation according to the disposition pattern on a screen (
Next, a screen example having a GUI concerning the analysis function of the computer system 1 will be described. Each screen may be provided as a Web page, for example.
First, in a case where the image input button 911 is pressed by an operation of the user, the image input button 911 is displayed distinguishingly, and a GUI for image input for selecting and opening an observation image file is displayed in a lower field 902. In the GUI, the user selects an observation image file as an analysis target and presses an open (Open) button. Then, transition is made to a screen of a next step.
In the first embodiment, the processor 201 automatically generates a suitable reference cell region (including setting of brightness values of a plurality of ROIs) using the plurality of similar cell regions extracted by the extraction process of Step S3 of
In the example, first, the extracted three plugs (#=1 to 3) are displayed in the reference cell region 1203. The user can switch apply/non-apply as an ROI by clicking and surrounding a desired plug region in the left field 1201 to select the plug region. Also in the right field 1202, the user can switch apply/non-apply as an ROI by operating a checkmark in an “Apply (Use)” item of a row of a desired ROI number (#). In the example, three plug regions of #=1 to 3 are displayed in a state of being surrounded by circular or elliptical broken line frames (for example, displayed in red), and all plug regions are set as being applied as an ROI. In addition, the user can add another plug as an ROI to the reference cell image 1203 by an “add (Add) button” and a manual operation, and can remove an unnecessary plug partial image from the reference cell image 1203 by a remove (Remove) button (for example, filled with the same brightness as the background region). In a case where the user manually sets an ROI, for example, the user may designate an elliptical frame in desired shape and size by a mouse operation or the like in the field 1201 and may set the elliptical frame as an ROI.
The user can configure a conditional expression by operating the items 1406 of the template 1405. For example, in an upper row, #2<#1<#3 is set as a conditional expression 1407. The conditional expression defines a magnitude relation of the brightness value between the ROIs of the respective ROI numbers in the reference cell region 1403. Specifically, the conditional expression 1407 defines that the ROI with the ROI number (#) of 1 has the brightness value greater than the ROI with #=2 and has the brightness value smaller than the ROI with #=3. The conditional expression corresponds to the determination rule. Similarly, a conditional expression can be set in each row, and in addition, AND/OR logic is set between rows, so that a conditional expression obtained by combining a plurality of conditional expressions with the AND/OR logic can be configured as a determination rule.
One determination rule can be set on one page of the field 1402. The page can be switched by an operation of a page button 1408. On another page, similarly, a different determination rule can be set. Furthermore, a determination rule can be added by an add (Add) button. A determination rule can be removed by a remove (Remove) button. The user can proceed to a next step by a next (Next) button.
The determination rule of the conditional expression 1407 in
While the determination rule of the conditional expression 1501 of the example is the rule that the deviation in brightness between the ROIs is smaller than the threshold value, the invention is not limited thereto, and a rule that a difference in brightness between ROIs is greater than a threshold value can be set.
While each type determination rule is the rule that determines the absence of an abnormality in a case where the conditional expression is satisfied and determines the presence of an abnormality in a case where the conditional expression is not satisfied, the invention is not limited thereto, and conversely, a form can be made in which a rule that determines the presence of an abnormality in a case where the conditional expression is satisfied, and determines the absence of an abnormality in a case where the conditional expression is not satisfied is set. After the three determination rules of the above-described examples are set, in a case where the next button is pressed, the user proceeds to the next step (abnormality determination). In a case where a plurality of determination rules are set on the screen, the plurality of determination rules are automatically applied to abnormality determination. An abnormality determination process is executed for each determination rule, and a determination result is generated for each determination rule.
As described above, the user can check and set various determination rules on the determination rule setting screen. In the example, a case where various determination rules are set based on the same GUI is shown. The invention is not limited thereto, and the user may set a determination rule on a different GUI for each type of determination rule. In the example, while a case where three types of abnormality determination are performed using the three types of determination rules is shown, not only the three determination rules of the above-described examples are set simultaneously, but also only the second type or the third type can be set as a determination rule or as described below, abnormality determination can be performed by setting two random determination rules in combination.
The setting examples of the determination rule of
In the field 1701, similar cell regions 1704 are displayed by, for example, a yellow solid line frame on a target observation image 1703. In addition, a reference cell region may be displayed distinguishingly on the observation image 1703. Though not shown, the content of the reference cell region may be displayed in another field. In addition, in a case where a cell region with an abnormality is detected as a determination result, a cell region 1705 with an abnormality is displayed distinguishingly on the observation image 1703 by, for example, a red solid line frame (in the drawing, shown by a white frame). Accordingly, the user can check a position of a cell where there is an abnormality, in the observation image. The invention is not limited to the display of the presence or absence of an abnormality in units of cell regions, and the presence or absence of an abnormality may be displayed in units of plug regions. In a case where the page button 1702 is operated, transition is made to another page, and other determination results can be checked similarly.
The user can perform a selection operation of a desired cell region where there is an abnormality or there is no abnormality and press an image (Image) button to display the cell region on an enlarged scale and check details. In this case, the reference cell image and the selected cell image may be displayed in parallel inside the screen to allow comparison and check. Furthermore, the user can press a rule (Rule) button to display and check the content of the above-described determination rule corresponding to the determination process of the page. Moreover, the user can press an all storage (All save) button to store all of the reference image, the similar images, the set rules, the determination results, and the like as data. In addition, the user can store only a selected determination result as a result of checking the determination results on the screen. In a case where an operation of storage is made, the processor 201 stores each piece of data stored on the above-described data screen in the storage device 203 in association with determination result data.
A screen example of
In the example, on the first page of the field 1701, the determination result using the first determination rule is displayed. The determination result corresponds to the extraction result of
The invention is not limited to identification display, and other display aspects can be made. For example, the reference cell region and other similar cell regions may be displayed distinguishingly. The cell region with an abnormality may be displayed by a red frame, the cell region with no abnormality may be displayed by a predetermined color frame, and the disposition patterns may be distinguished only by characters. The on and off of identification display of the disposition pattern may be switched by a button (not shown). Furthermore, the user may select only a specific disposition pattern by a button (not shown) and may allow only the cell region of the specific disposition pattern (for example, the pattern A) to be displayed.
In the example, as the determination results, a cell 1811 and a cell 1812 are determined as the presence of an abnormality, and some plugs (the plugs 421 and 422 in
A determination rule obtained by combining a plurality of types of determination rules can be set and applied to abnormality determination. For example, on a certain page of the above-described determination rule setting screen, a first conditional expression corresponding to a first type determination rule is set in a first row, and a second conditional expression corresponding to a second type determination rule is set in a second row via AND or OR logic. Then, a determination rule by a conditional expression configured by combining the first type determination rule and the second type determination rule can be set.
On the plane of the map 2002, a cell region with an abnormality detected as an abnormality determination result is displayed to be identifiable in an aspect such as a frame line, a color, characters, or a mark. In particular, in a case where an inverted disposition pattern is included like the sample B, various disposition patterns are displayed distinguishingly. A cell region with an abnormality is displayed with a predetermined mark or the like (in the example, a red x mark) at a location of an ROI (plug) with an abnormality in the cell region. Furthermore, in the cell region with an abnormality, position coordinate information of (X, Y) in a coordinate system of the map 2002 (that is, a device surface) is also displayed. The position coordinate information is a relative position from a device coordinate origin or an absolute position of the stage of the SEM. In the example, while the position coordinate information is set to, in detail, position coordinate information of an ROI (plug) with an abnormality in the cell region, the invention is not limited thereto, and the position coordinate information can be set to position coordinate information of a center point or the like of a cell region having an ROI (plug) with an abnormality.
The user can check a location with an abnormality, a distribution, or the like in the entire device by viewing such map display understandably. A desired location in the map can be designated and details can be displayed. Furthermore, the map display of each determination rule can be switched by an operation of a page button. The map can be displayed in enlargement or reduction display, scroll display, page display, or the like.
In the first embodiment, as described above (Steps S2 to S4), a plurality of ROIs (in particular, brightness or the like) of the suitable reference cell region can be generated, presented, and set based on the extraction (Step S3) of the similar cell regions for the cell region designated by the user. Average brightness or the like can be calculated from a plurality of extracted similar cell regions by a statistical process and can be set as brightness of a plurality of ROIs of the reference cell region. The user can check the reference cell region automatically generated and presented, and as necessary, the user can change and set the reference cell region. Detailed description of such a method will be provided below.
First, the user designates an initial reference cell region in the observation image on the screen. The designation of the initial reference cell region is temporary, and the reference cell region is confirmed later. The designation may be, for example, designation of surrounding the region from the observation image or may be designation of position coordinates (for example, an upper left point and a lower right point of a rectangle) of the region.
In the field 2101, the user can set a plurality of ROIs in an initial reference cell region 2103. For example, a plug region may be surrounded by an ellipse or may be surrounded by a rectangle. The example shows a case where a plug region is surrounded by an elliptical broken line frame. Position coordinates of an upper left point and a lower right point of a figure surrounding a plug may be designated or position coordinates of the center of gravity or the center of a figure surrounding a plug may be designated.
The designation of the ROI is not limited to a manual operation of the user, and the processor 201 may execute an automatic process to support the designation of the ROI. For example, the processor 201 may estimate and extract a plug region by calculating a brightness distribution using an image processing technique such as binarization from the initial reference cell region designated by the user and may present, to the user, whether to set the extracted plug region as an ROI.
The processor 201 specifies a position relation of a plurality of specified ROIs included in the initial reference cell region and sets the initial reference cell region including the plurality of ROIs as a reference cell region. Alternatively, the user may set the position relation between the ROIs in the specification.
The processor 201 sets a region where the brightness value is equal to or greater than a threshold value, as an ROI using the threshold value of the brightness value to distinguish a plurality of ROIs from the background region (the darkest region of the device). For example, in an initial reference cell region 2104 of the field 2101, three plugs surrounded by red broken line frames are designated. The three plugs are separated from the background region and identified, and are set as three ROIs included in the initial reference cell region.
The initial reference cell region 2104 of the field 2101 shows an example where the position relation of a plurality of ROIs is specified. In the example, as position coordinates of each ROI, position coordinates of the center of an ellipse of a plug region are designated. In a right table, position coordinates are displayed for each ROI number (#). The ROI position coordinates may be absolute position coordinates or may be relative position coordinates with a certain ROI as a reference ROI. As another processing example, a distance (shown by a line segment) between the ROI position coordinates may be set. As another processing example, the size of each ROI, for example, a diameter (shown by an arrow) may be set.
The processor 201 extracts regions similar to the initial reference cell region including a plurality of ROIs as a similar image from the observation image as an entire image based on a preset condition (described as an extraction condition) using the initial reference cell region set in this way and a plurality of ROIs (initial ROIs) included in the initial reference cell region as described above.
In the extraction process, the following may be applied as the extraction condition. For example, the relative position coordinates of each ROI in the initial reference cell region and the size (for example, the diameter) of each ROI are specified in advance. The processor 201 determines and specifies regions similar to the reference cell region (a plurality of ROIs) in order in the entire image and extracts the regions as a similar image. In the determination, extraction condition for determining a relationship between a plurality of ROIs included in the reference cell region is used.
An example of the extraction condition is a condition regarding whether a distance corresponding to the ROI relative position coordinates or a distance corresponding to a difference between the ROI absolute position coordinates is within a threshold value range.
In the extraction condition, for example, in a case where the range is narrowed, the determination of the difference can be performed strictly, and in a case where the range is widened, determination can be performed loosely.
The extraction condition is different from the determination rule in the abnormality determination. In the determination using the extraction condition, there is a need to form a population of an inspection target (sample 5). Even though there is an abnormality in a semiconductor device itself as an inspection target, the semiconductor device needs to be included in the population. Furthermore, a portion that is not an inspection target in the semiconductor device as an inspection target should not be included in the population. That is, in strict determination, an inspection region including an abnormal portion should not leak, and in loose determination, a portion that is not an inspection target should not be included.
In the first embodiment, to confirm the formation of the population early, the extraction process (Step S3) for the setting of the reference cell region and the setting of a plurality of ROIs included in the reference cell region before the setting of the determination rule of subsequent abnormality determination, a check is made on the screen, and the reference cell region including the plurality of ROIs is confirmed. Accordingly, the certainty of specifying the inspection target (target region) can be increased, and subsequent abnormality determination can be performed with high accuracy.
The extraction condition is designed and set in software of the computer system 1 in advance. Alternatively, the extraction condition may be displayed on the screen, and the user may select and change an algorithm or a parameter value to enable user setting using a user setting function of the software. A plurality of templates may be set and prepared in advance such that an extraction condition to be applied or setting information (a reference cell region including a plurality of ROIs, determination rules, and the like) can be easily selected for each client or target device.
In a case where there is less need to perform the specification of the inspection target early, as a modification example, a form may be made in which the extraction process for the setting of the reference cell region and a plurality of ROIs in the reference cell region is automatically executed after the setting of the determination rule of the subsequent abnormality determination.
As described above, according to the first embodiment, in the computer system 1 that analyzes the VC image (observation image) obtained by the charged particle beam apparatus (SEM), the determination and detection of the abnormality by brightness comparison between the identical or similar structures in the observation image can be easily and efficiently implemented automatically to a certain extent or more without depending on visual observation. The analysis function of the computer system 1 of the first embodiment extracts the similar cell regions based on the relationship between a plurality of plugs (ROI) included in the cell region in the observation image and determines the abnormality in the cell region. As the relationship, the position relation or the brightness relation between the ROIs is determined. According to the first embodiment, also in a VC image of a sample (semiconductor device) having a complicated structure, a location or the like of an abnormality can be specified and detected easily and semi-automatically, in other words, by automating a main process excluding some operations such as setting or an instruction.
According to the first embodiment, various kinds of determination can be performed according to the setting of the determination rule in which the relationship between the ROIs in the cell is defined. According to the first embodiment, in a case where a relative relationship between the ROIs in the cell is defined, patterns can be extracted as similar regardless of the disposition pattern such as vertical inversion. Then, abnormality determination according to the determination rule can be performed on the similar patterns. As a modification example, inverted disposition patterns can be distinguished and abnormality determination can be performed for each disposition pattern. For example, abnormality determination can be performed only on the above-described pattern A.
In Step S21, the processor 201 of the computer system 1 receives and acquires the observation image from the main body 3. In Step S22, the processor 201 sets the reference image (reference cell region) in the observation image. In Step S23, the processor 201 sets a plurality of regions of interest (ROIs) in the reference image. In the modification example, specifically, the user manually sets a plurality of ROIs in the reference image. In Step S24, the processor 201 sets the determination rule based on an operation or check of the user on the setting screen.
In Step S25, the processor 201 extracts the similar images (similar cell regions) from the observation image based on the reference image. In Step S26, the processor 201 determines the abnormality of the cell region (in particular, the plug having the ROI) by comparison between the reference image (reference cell region) and the similar images (similar cell regions) based on the determination rule to be applied. In Step S27, the processor 201 displays the determination result on the screen of the GUI, or the like to output the determination result to the user. Also in the modification example of such a flow, the same or similar effects as or to those in the first embodiment are obtained.
With Step S3 of the extraction process of
In another modification example (referred to as a second modification example), the size is determined on a plurality of ROIs in the reference image. A relation regarding the size of the ROI can be set as one of the determination rules. The processor 201 performs abnormality determination using the determination rule.
In the setting example of the determination rule of
A conditional expression 2302 of a second row sets a range of a threshold value (size threshold value) on the size of the ROI with #=1. In the example, an AND condition between the conditional expression 2301 and the conditional expression 2302 is established. For example, a relationship that the diameter (major axis) of the ROI with #=1 is greater than 100 (lower limit threshold value) and smaller than 150 (upper limit threshold value) is defined. Each threshold value is the diameter (major axis). In a case where a threshold value range is narrowed, the determination of the difference can be detected strictly. In a case where the threshold value range is widened, determination can be performed loosely.
As another example, in a case where the diameter is reduced and an upper threshold value of an inequality is eliminated (for example, 10<#1), determination can be performed while permitting various sizes on the ROI with #=1. Note that, in a case where the size of the ROI with #=1 becomes large, the comparison of the size between the ROI with #=3 and the ROI with #=1 is affected in relation (AND condition) with the conditional expression 2301 of the first row. In this way, in the modification example, the relationship regarding the size between a plurality of ROIs can be flexibly set as the determination rule. Furthermore, a determination rule in which a condition such as brightness is combined with the condition of the size can be set.
The setting of the determination rule of
The setting of the determination rule of
While the embodiment of the disclosure has been specifically described above, the invention is not limited to the above-described embodiment and can be modified in various forms without departing from the scope of the invention. In the above-described embodiment, components can be added, deleted, or replaced except for essential components. Each embodiment or the modification examples can also be combined.
In the above-described example, while the sample 5 as an observation target has been described as observation of a semiconductor device, the invention is not limited thereto. For example, with application to composition observation of materials or tissue observation of living things, a plurality of regions of interest as a reference cell region are collected from among similar structures in the observation image, and a relationship between a plurality of regions of interest is compared based on a rule in which a relationship between a plurality of regions of interest is defined, also in an image of a sample having a complicated structure. Accordingly, a location of an abnormality, or the like can be specified and detected easily and self-automatically, in other words, by automating a main process excluding some operations such as setting or an instruction.
Filing Document | Filing Date | Country | Kind |
---|---|---|---|
PCT/JP2021/031595 | 8/27/2021 | WO |