This invention relates to configuring optical layers in imprint lithography processes, and more particularly to forming features of different orders of magnitude in size on a substrate in one processing step.
Nanofabrication (e.g., nanoimprint lithography) can include the fabrication of very small structures that have features on the order of 100 nanometers or smaller. One application in which nanofabrication has had a significant impact is in the processing of integrated circuits. The semiconductor processing industry continues to strive for larger production yields, while increasing a number of circuits formed on a substrate per unit area of the substrate. To this end, nanofabrication has become increasingly important to achieving desired results in the semiconductor processing industry. Nanofabrication provides greater process control while allowing continued reduction of minimum feature dimensions of structures formed on substrates. Other areas of development in which nanofabrication has been employed include biotechnology, optical technology, mechanical systems, and the like. In some examples, nanofabrication includes fabricating structures on substrates that are assembled to form an optical device.
The invention involves a realization that improvements in imprinting three-dimensional (3D) patterns on substrates can increase an accuracy and a precision, while reducing a cost and a complexity associated with producing such patterns. Conventional imprint lithography processes may include imprinting a nano-scale pattern on a substrate in a first step and subsequently imprinting features of a larger order of magnitude on the substrate in a second, subsequent step. For such processes, cleaning and treating of the nano-scale pattern may be required prior to forming the larger features, which is associated with additional costs and additional time. Furthermore, aspects of forming the larger features in the subsequent step can sometimes jeopardize a mechanical integrity and/or a functional integrity of the nano-patterned substrate. In this regard, various aspects of disclosed imprint lithography methods can allow imprinting of 3D structures with features that have different orders of magnitudes with multiple functions (e.g., any of optical functions, anti-reflective, and spacing) in a single imprinting step. Such methods yield precise, accurate structures at a reduced cost and duration, as compared to alternative methods.
One aspect of the invention features an imprint lithography method of configuring an optical layer. The imprint lithography method includes imprinting first features of a first order of magnitude in size on a side of a substrate with a patterning template, while imprinting second features of a second order of magnitude in size on the side of the substrate with the patterning template, wherein the second features are sized and arranged to define a gap between the substrate and an adjacent surface.
In some embodiments, imprinting the first features includes forming one or both of diffraction gratings and anti-reflective features on the side of the substrate.
In certain embodiments, imprinting the second features includes forming spacers on the side of the substrate.
In some embodiments, the method further includes imprinting one or both of the spacers and the anti-reflective features along a peripheral edge of the side of the substrate.
In certain embodiments, the method further includes imprinting one or both of the spacers and the anti-reflective features within an interior region of the side of the substrate.
In some embodiments, the side of the substrate is a first side of the substrate, and the imprint lithography method further includes imprinting third features of the first order of magnitude in size on a second side of the substrate.
In certain embodiments, imprinting the third features includes forming diffraction gratings or anti-reflective features on the second side of the substrate.
In some embodiments, the second order of magnitude in size is greater than the first order of magnitude in size.
In certain embodiments, the first order of magnitude in size is of a nano-scale, and the second order of magnitude in size is of a micro-scale.
In some embodiments, the method further includes imprinting the second features on opposite sides of the first features.
In certain embodiments, the method further includes creating the patterning template from a predecessor mold.
In some embodiments, the method further includes forming deep features of the second order of magnitude in size in the predecessor mold.
In certain embodiments, the method further includes forming shallow features of the first order of magnitude in size in the predecessor mold.
In some embodiments, the substrate is a first substrate, and the adjacent surface is defined by a second substrate.
In certain embodiments, the method further includes aligning the first and second substrates with each other.
In some embodiments, the method further includes dispensing an adhesive substance atop the second features imprinted on the side of the first substrate.
In certain embodiments, the method further includes attaching the first and second substrates to each other at the adhesive substance atop the second features imprinted on the side of the first substrate to form the gap between the first substrate and the adjacent surface defined by the second substrate.
In some embodiments, the method further includes attaching the first and second substrates to each other at the adhesive substance atop the second features imprinted on the side of the first substrate to form a multi-layer optical device.
In certain embodiments, the method further includes defining a layer of air between the first and second substrates with a thickness that is determined by heights of the second features.
In some embodiments, the gap provides a low index region.
In certain embodiments, the low index region is air with an index of refraction of 1.
In some embodiments, the imprint lithography method further includes providing the multi-layer optical device with layers characterized by alternating indexes of refraction.
Another aspect of the invention features an optical layer that includes a substrate and a pattern imprinted on a side of the substrate with a patterning template. The pattern includes first features of a first order of magnitude in size and second features of a second order of magnitude in size. The second features are sized and arranged to define a gap between the substrate and an adjacent surface.
The details of one or more embodiments of the invention are set forth in the accompanying drawings and the description below. Other features, aspects, and advantages of the invention will be apparent from the description, the drawings, and the claims.
Like reference symbols in the various figures indicate like elements.
In some examples, illustrations shown in the drawings may not be drawn to scale.
An imprint lithography process for configuring an optical layer is described below. The imprint lithography process involves imprinting a multi-functional structure including features of different orders of magnitude from a single template. Such a process can improve a precision and an accuracy and reduce a cost and a complexity associated with producing such structures for creating multi-layer optical devices.
The substrate 101 is a substantially planar, thin slice that is typically made of one or more materials including silicon, silicon dioxide, aluminum oxide, sapphire, germanium, gallium arsenide (GaAs), an alloy of silicon and germanium, indium phosphide (InP), or other example materials. The substrate 101 typically has a substantially circular or rectangular shape. The substrate 101 typically has a diameter in a range of about 50 mm to about 200 mm (e.g., about 65 mm, about 150 mm, or about 200 mm) or a length and a width in a range of about 50 mm to about 200 mm (e.g., about 65 mm, about 150 mm, or about 200 mm). The substrate 101 typically has and a thickness in a range of about 0.2 mm to about 1.0 mm. The thickness of the substrate 101 is substantially uniform (e.g., constant) across the substrate 101. The relief pattern is formed as a set of structural features (e.g., protrusions and suction structures) in the polymerizable substance upon the top surface 103 of the substrate 101, as will be discussed in more detail below.
The support assembly 102 includes a chuck 110 that supports and secures the substrate 101, an air bearing 112 that supports the chuck 110, and a base 114 that supports the air bearing 112. The base 114 is located in a fixed position, while the air bearing 112 can move in up to three directions (e.g., x, y, and z directions) to transport the chuck 110 (e.g., in some instances, carrying the substrate 101) to and from the robot 108, the fluid dispenser 106, and the imprinting assembly 104. In some embodiments, the chuck 110 is a vacuum chuck, a pin-type chuck, a groove-type chuck, an electromagnetic chuck, or another type of chuck.
Still referring to
In operation of the imprint lithography system 100, the flexible template 116 and the substrate 101 are aligned in desired vertical and lateral positions by the rollers 118, 120, 122 and the air bearing 112, respectively. Such positioning defines a volume 124 within the processing region 130 between the flexible template 116 and the substrate 101. The volume 124 can be filled by the polymerizable substance once the polymerizable substance is deposited upon the top surface 103 of the substrate 101 by the fluid dispenser 106, and the chuck 110 (e.g., carrying the substrate 101) is subsequently moved to the processing region 130 by the air bearing 112. Accordingly, both the flexible template 116 and the top surface 103 of the substrate 101 can be in contact with the polymerizable substance in the processing region 130 of the imprint lithography system 100. Example polymerizable substances may be formulated from one or more substances, such as isobornyl acrylate, n-hexyl acrylate, ethylene glycol diacrylate, 2-hydroxy-2-methyl-1-phenyl-propan-1-one, (2-Methyl-2-Ethyl-1,3-dioxolane-4-yl)methyl acrylate, hexanediol diacrylate, 2-methyl-1-[4-(methylthio)phenyl]-2-(4-morpholinyl)-1-propanone, diphenyl (2,4,6-trimethylbenzoyl)-phosphine oxide, 2-hydroxy-2-methyl-1-phenyl-1-propanone, and various surfactants. Example techniques by which the polymerizable substance may be deposited atop the substrate 101 by the fluid dispenser 106 include drop dispense, spin-coating, dip coating, chemical vapor deposition (CVD), physical vapor deposition (PVD), thin film deposition, thick film deposition, and other techniques. In some examples, the polymerizable substance is deposited atop the substrate 101 in multiple droplets.
The printing system 104 includes an energy source 126 that directs energy (e.g., broadband ultraviolet radiation) towards the polymerizable substance atop the substrate 101 within the processing region 130. Energy emitted from the energy source 126 causes the polymerizable substance to solidify and/or cross-link, thereby resulting in a patterned layer that conforms to a shape of the portion of the flexible template 116 in contact with the polymerizable substance in the processing region 130.
While the imprint lithography system 100 is described and illustrated as a roll-to-plate or plate-to-roll system, imprint lithography systems of a different configurations can also be used to produce the example patterned layer 105 and the example patterns discussed below. Such imprint lithography systems may have a roll-to-roll or a plate-to-plate configuration.
In some embodiments, a substrate (e.g., the substrate 101 of the imprint lithography system 100) is processed (e.g., imprinted on one or both sides and cut out to shape) to form an optical layer of a multi-layer optical device (e.g., a wearable eyepiece, an optical sensor, or an optical film, such as that used in a display). For example,
The functional pattern 204 is imprinted atop an upper side 208 of the substrate 202 and is located along an interior region 218 with respect to a peripheral edge 216 of the substrate 202. The functional pattern 204 is a waveguide pattern formed of multiple diffraction gratings that provide a basic working functionality of the optical layer 200. The diffraction gratings have dimensions in a range of about 10 nm to about 500 nm. The diffraction gratings are configured to project light of wavelengths within a particular range and to focus a virtual image at a particular depth plane. The focused light, together with focused light projected through proximal optical layers, forms a multi-color virtual image over one or more depth planes. The transmitted light may be red light with wavelengths in a range of about 560 nm to about 640 nm, green light with wavelengths in a range of about 490 nm to about 570 nm, or blue light with wavelengths in a range of about 390 nm to about 470 nm. The diffraction gratings can include multiple combinations and arrangements of protrusions and recessions (e.g., such as the protrusions 109 and the recessions 111) that together provide desired optical effects. The diffraction gratings include in-coupling gratings 220 and form an orthogonal pupil expander region 222 and an exit pupil expander region 224. The functional pattern 204 has a total length of about 10 mm to about 500 mm and a total width of about 10 mm to about 500 mm.
The auxiliary pattern 206 is imprinted atop the upper side 208 of the substrate 202 and surrounds the functional pattern 204. The auxiliary pattern 206 is also co-located with the interior region 218 of the substrate 202. The auxiliary pattern 206 includes both anti-reflective features 210 of a nano-scale and spacers 212 of a micro-scale that may be distributed in various quantities and arrangements across the auxiliary pattern 206. The auxiliary pattern 206 coincides with the interior region 218 of the substrate 202 and has a total length of about 10 mm to about 500 mm and a total width of about 10 mm to about 500 mm.
The anti-reflective features 210 may be arranged anywhere within the auxiliary pattern 206. The anti-reflective features 210 are sized (e.g., having a height of less than or equal to about 300 nm and a pitch of about 50 nm to about 150 nm) and shaped to reduce surface reflection at the side (e.g., the upper side 208) of the substrate 202 on which the anti-reflective features 210 are imprinted. For example, the anti-reflective features 210 may reduce the surface reflection of the substrate 202 by about 1.0% to about 4.5%. The anti-reflective features 210 are further sized and shaped to increase the transmissivity of the substrate 202 to greater than about 98.5% (e.g., for a plastic substrate 202) and up to about 99.5% (e.g., for a glass substrate 202). The anti-reflective features 210 are also sized and shaped to provide the substrate 202 with a new effective refractive index in a range of about 1.2 to about 1.4. Additionally, the anti-reflective features 210 can introduce birefringence to diminish or enhance refraction of certain light wavelengths transmitted through the substrate 202.
The spacers 212 are sized to produce a gap (e.g., a layer of air) between the optical layer 200 and an adjacent optical layer that together form a part of a multi-layer stacked optical device when the two optical layers are adhered to one another, as will be discussed in more detail below with respect to
Other arrangements of functional patterns and auxiliary patterns are possible. For example,
In another example embodiment,
For each optical layer 200 in the optical device 500, the spacers 212 together form a spacer layer that creates a gap 530 defining a layer of air between adjacent optical layers 200, as shown in
In a first step (a) for creating the patterning mold 600, the deep features 646 are formed in the predecessor mold 642 via a course method to create a micro-featured mold 648. Example course methods include lithography and reactive ion etching. In a next step (b), a polymerizable substance 650 is deposited atop the micro-featured mold 648 and patterned with fine features 652 of a nano-scale that project from a residual layer 654 in the manner as described above with respect to
While the optical layer 200 has been described and illustrated as having the functional pattern 204 and the auxiliary pattern 206 imprinted on a single side (e.g., the upper side 208) of the substrate 202, other configurations are possible. For example,
In another example,
The second order of magnitude in size is greater than the first order of magnitude in size. In some examples, the first order of magnitude in size is of a nano-scale, and the second order of magnitude in size is of a micro-scale. In some embodiments, the process further includes imprinting third features of the first order of magnitude in size on a second side (e.g., the upper side 208 or the lower side 214) of the substrate. The third features may include diffraction gratings or anti-reflective features.
In some embodiments, the process further includes creating the patterning template from a predecessor mold (e.g., the predecessor mold 642). In some embodiments, the process further includes forming deep features (e.g., the deep features 646) of the second order of magnitude in size in the predecessor mold. In some embodiments, the process further includes forming shallow features (e.g., the shallow features 644) of the first order of magnitude in size in the predecessor mold.
In some examples, the substrate is a first substrate, and the adjacent surface is defined by a second substrate. In some embodiments, the process further includes aligning the first and second substrates with each other. In some embodiments, the process further includes dispensing an adhesive substance (e.g., a drop of glue) atop the second features imprinted on the first side of the first substrate. In some embodiments, the process further includes attaching the first and second substrates to each other at the adhesive substance atop the second features imprinted on the first side of the first substrate to form a multi-layer optical device (e.g., the optical device 500). In some embodiments, the process further includes attaching the first and second substrates to each other at the adhesive substance atop the second features imprinted on the first side of the first substrate to form the gap between the first substrate and the adjacent surface defined by the second substrate. In some embodiments, the process further includes defining a layer of air between the first and second substrates with a thickness that is determined by heights of the second features such that the multi-layer optical device has alternating indexes of refraction.
Advantageously, the process 600 can be used to imprint a multi-functional (e.g., any of functional, anti-reflective, and spacing) 3D structure in a single step (e.g., via a single patterning mold) at ambient conditions (e.g., at an ambient temperature and at an ambient pressure) that reduces a complexity, a duration, and a cost associated with imprinting such 3D structures as compared to producing the 3D structures according to other processes. For example, conventionally formed anti-reflective patterns are deposited under vacuum and can be relatively costly, with spacer components being added in a separate, subsequent process that may include imprinting of large spacer structures, dispensing of microspheres, or dispensing of curable resist material. Additional time and complexity is associated with cleaning and treating the anti-reflective pattern prior to performing such a second processing step.
While a number of embodiments have been described for illustration purposes, the foregoing description is not intended to limit the scope of the invention, which is defined by the scope of the appended claims. There are and will be other examples, modifications, and combinations within the scope of the following claims.
This application is a divisional of U.S. application Ser. No. 15/704,129, filed on Sep. 14, 2017, which claims the benefit of the filing date of U.S. Provisional Application No. 62/429,214, filed on Dec. 2, 2016. The contents of U.S. application Ser. No. 15/704,129 and U.S. Application No. 62/429,214 are incorporated herein by reference in their entirety.
Number | Date | Country | |
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62429214 | Dec 2016 | US |
Number | Date | Country | |
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Parent | 15704129 | Sep 2017 | US |
Child | 16934226 | US |