related to tip portion

Industry

CPC
G01R1/06738

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/06738related to tip portion

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Compliant probes including dual independently operable probe contac...
- Patent number 12,181,493
- Issue date Dec 31, 2024
- Microfabrica Inc.
- Ming Ting Wu
- G01 - MEASURING TESTING
Information Patent Grant
Probe tip with rigid frame and flexible tip portion
- Patent number 12,169,210
- Issue date Dec 17, 2024
- Keysight Technologies, Inc.
- Nicholas Fernandez
- G01 - MEASURING TESTING
Information Patent Grant
Contact pin with individually movable contact elements
- Patent number 12,163,981
- Issue date Dec 10, 2024
- Feinmetall GmbH
- Lutz Benedix
- G01 - MEASURING TESTING
Information Patent Grant
Multi-beam probes with decoupled structural and current carrying be...
- Patent number 12,146,898
- Issue date Nov 19, 2024
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Grant
Contact, inspection jig, inspection device, and method of manufactu...
- Patent number 12,135,336
- Issue date Nov 5, 2024
- Nidec-Read Corporation
- Norihiro Ota
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probe card device and elastic probe thereof
- Patent number 12,092,661
- Issue date Sep 17, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Compliant pin probes with extension springs, methods for making, an...
- Patent number 12,078,657
- Issue date Sep 3, 2024
- Microfabrica Inc.
- Ming Ting Wu
- G01 - MEASURING TESTING
Information Patent Grant
Probes with planar unbiased spring elements for electronic componen...
- Patent number 12,066,462
- Issue date Aug 20, 2024
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Grant
Contact terminal, inspection jig, and inspection apparatus
- Patent number 12,055,562
- Issue date Aug 6, 2024
- Nidec-Read Corporation
- Yusuke Yokota
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Securing a probe to a device under test
- Patent number 12,055,578
- Issue date Aug 6, 2024
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for electronic devices and corresponding probe card
- Patent number 12,032,003
- Issue date Jul 9, 2024
- Technoprobe, S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Sensor-based planar wafer probe alignment
- Patent number 12,019,096
- Issue date Jun 25, 2024
- Infineon Technologies AG
- Stefano Di Martino
- G01 - MEASURING TESTING
Information Patent Grant
High performance outer cylindrical spring pin
- Patent number 12,000,864
- Issue date Jun 4, 2024
- Jungdon Cho
- G01 - MEASURING TESTING
Information Patent Grant
Probe pin having gripping structure
- Patent number 12,000,863
- Issue date Jun 4, 2024
- TSE CO., LTD.
- Seung Bae An
- G01 - MEASURING TESTING
Information Patent Grant
Probes having improved mechanical and/or electrical properties for...
- Patent number 11,982,689
- Issue date May 14, 2024
- Microfabrica Inc.
- Garret R. Smalley
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe
- Patent number 11,959,940
- Issue date Apr 16, 2024
- Yokowo Co., Ltd.
- Kenichi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Probes that define retroreflectors, probe systems that include the...
- Patent number 11,927,603
- Issue date Mar 12, 2024
- FormFactor, Inc.
- Quan Yuan
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing a measurement probe, and measurement probe
- Patent number 11,921,131
- Issue date Mar 5, 2024
- Rohde & Schwarz GmbH & Co. KG
- Alexander Kunze
- G01 - MEASURING TESTING
Information Patent Grant
Contact assembly array and testing system having contact assembly a...
- Patent number 11,906,576
- Issue date Feb 20, 2024
- Johnstech International Corporation
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Grant
Compliant pin probes with flat extension springs, methods for makin...
- Patent number 11,906,549
- Issue date Feb 20, 2024
- Microfabrica Inc.
- Ming Ting Wu
- G01 - MEASURING TESTING
Information Patent Grant
Probe system for QFP integrated circuit device test tooling
- Patent number 11,906,550
- Issue date Feb 20, 2024
- Essai, Inc.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive test needle for measuring electrically conductive layers...
- Patent number 11,774,495
- Issue date Oct 3, 2023
- ATG LUTHER & MAELZER GMBH
- Stefan Weiss
- G01 - MEASURING TESTING
Information Patent Grant
Multi-member test probe structure
- Patent number 11,774,489
- Issue date Oct 3, 2023
- Intel Corporation
- Pooya Tadayon
- G01 - MEASURING TESTING
Information Patent Grant
Probes with planar unbiased spring elements for electronic componen...
- Patent number 11,761,982
- Issue date Sep 19, 2023
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Grant
Probe pin
- Patent number 11,630,128
- Issue date Apr 18, 2023
- GENED CO., LTD.
- Byung Sung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe, inspection jig, inspection device, and method for manufactur...
- Patent number 11,454,650
- Issue date Sep 27, 2022
- Nidec-Read Corporation
- Hidekazu Yamazaki
- G01 - MEASURING TESTING
Information Patent Grant
Integrated pogo pin enabling integrated housing
- Patent number 11,454,649
- Issue date Sep 27, 2022
- Sangyang Pak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact device for electrical test
- Patent number 11,442,079
- Issue date Sep 13, 2022
- ISC CO., LTD.
- Young Bae Chung
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe and relative probe head of an apparatus for testing e...
- Patent number 11,442,080
- Issue date Sep 13, 2022
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Electrical contactor and electrical connecting apparatus
- Patent number 11,372,022
- Issue date Jun 28, 2022
- Kabushiki Kaisha Nihon Micronics
- Yasutaka Kishi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CAPACITANCE-BASED DETECTION OF PROBE CONTACT
- Publication number 20240385238
- Publication date Nov 21, 2024
- FEI Company
- Shyam Sundar Aswadha Narayanan
- G01 - MEASURING TESTING
Information Patent Application
PROBE MEMBER FOR INSPECTION, AND MANUFACTURING METHOD THEREFOR
- Publication number 20240319228
- Publication date Sep 26, 2024
- Jung Gyun BAEK
- G01 - MEASURING TESTING
Information Patent Application
Electrical Testing Device with Probe Having Portions with Different...
- Publication number 20240288471
- Publication date Aug 29, 2024
- Snap-on Incorporated
- Nicholas A. Gabbey
- G01 - MEASURING TESTING
Information Patent Application
PROBE TIP WITH RIGID FRAME AND FLEXIBLE TIP PORTION
- Publication number 20240272199
- Publication date Aug 15, 2024
- KEYSIGHT TECHNOLOGIES, INC.
- Nicholas Fernandez
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE AND PROBE UNIT
- Publication number 20240264200
- Publication date Aug 8, 2024
- NHK Spring Co., Ltd.
- Kazuya Soma
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICALLY CONDUCTIVE CONTACT PIN AND MANUFACTURING METHOD THEREFOR
- Publication number 20240183881
- Publication date Jun 6, 2024
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD AND METHOD OF PRODUCING TESTED SEMICONDUCTOR DIE AND VER...
- Publication number 20240175900
- Publication date May 30, 2024
- MPI Corporation
- CHIN-YI LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE CARD NEEDLE SHAPE AND METHOD OF MANUFACTURING
- Publication number 20240151743
- Publication date May 9, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ting-Yu CHIU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PRODUCING A PROBE CARD
- Publication number 20240110948
- Publication date Apr 4, 2024
- Exaddon AG
- Kun-Hsien LIN
- G01 - MEASURING TESTING
Information Patent Application
Probes with Planar Unbiased Spring Elements for Electronic Componen...
- Publication number 20240103042
- Publication date Mar 28, 2024
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Application
Compliant Probes with Enhanced Pointing Stability and Including At...
- Publication number 20240103038
- Publication date Mar 28, 2024
- Microfabrica Inc.
- Ming Ting Wu
- G01 - MEASURING TESTING
Information Patent Application
Compliant Probes Including Dual Independently Operable Probe Contac...
- Publication number 20240094250
- Publication date Mar 21, 2024
- Microfabrica Inc.
- Ming Ting Wu
- G01 - MEASURING TESTING
Information Patent Application
Multi-Beam Probes with Decoupled Structural and Current Carrying Be...
- Publication number 20240094259
- Publication date Mar 21, 2024
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Application
Probes with Planar Unbiased Spring Elements for Electronic Componen...
- Publication number 20240094255
- Publication date Mar 21, 2024
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Application
Probes with Planar Unbiased Spring Elements for Electronic Componen...
- Publication number 20240094256
- Publication date Mar 21, 2024
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Application
Probes with Planar Unbiased Spring Elements for Electronic Componen...
- Publication number 20240094257
- Publication date Mar 21, 2024
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Application
Probes with Planar Unbiased Spring Elements for Electronic Componen...
- Publication number 20240094258
- Publication date Mar 21, 2024
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Application
Probes Having Improved Mechanical and/or Electrical Properties for...
- Publication number 20240094253
- Publication date Mar 21, 2024
- Microfabrica Inc.
- Garret R. Smalley
- G01 - MEASURING TESTING
Information Patent Application
COAXIAL WAFER PROBE AND CORRESPONDING MANUFACTURING METHOD
- Publication number 20240085454
- Publication date Mar 14, 2024
- Federal Institute of Metrology METAS
- Johannes Hoffmann
- G01 - MEASURING TESTING
Information Patent Application
PROBE JOINT AND SPRING PROBE COMPRISING THE SAME
- Publication number 20240085458
- Publication date Mar 14, 2024
- AZOTH STUDIO LTD. CO.
- Zhou Yi Lin
- G01 - MEASURING TESTING
Information Patent Application
PROBE PIN AND METHOD OF MANUFACTURING PROBE PIN
- Publication number 20240053382
- Publication date Feb 15, 2024
- PT&K CO., LTD.
- Tae Yoon KIM
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES
- Publication number 20240044940
- Publication date Feb 8, 2024
- TECHNOPROBE S.P.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD AND PROBE ASSEMBLY
- Publication number 20240036073
- Publication date Feb 1, 2024
- AZOTH STUDIO LTD. CO.
- Zhou Yi Lin
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES AND CORRESPONDI...
- Publication number 20240027495
- Publication date Jan 25, 2024
- TECHNOPROBE S.P.A.
- Riccardo VETTORI
- G01 - MEASURING TESTING
Information Patent Application
TESTING DEVICE AND METHOD, AND NON-TRANSITORY COMPUTER-READABLE REC...
- Publication number 20240019483
- Publication date Jan 18, 2024
- TOKYO ELECTRON LIMITED
- Shinjiro WATANABE
- G01 - MEASURING TESTING
Information Patent Application
Test Needle, Test Probe, and Flying Probe Tester for Testing Printe...
- Publication number 20230400509
- Publication date Dec 14, 2023
- ATG LUTHER & MAELZER GMBH
- Stefan Weiss
- G01 - MEASURING TESTING
Information Patent Application
PROBE DEVICE, PROBE SYSTEM INCLUDING THE PROBE DEVICE AND OPERATING...
- Publication number 20230400480
- Publication date Dec 14, 2023
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
CONTACT, INSPECTION JIG, INSPECTION DEVICE, AND METHOD OF MANUFACTU...
- Publication number 20230349950
- Publication date Nov 2, 2023
- NIDEC-READ CORPORATION
- Norihiro OTA
- G01 - MEASURING TESTING
Information Patent Application
CONDUCTIVE PROBE, METHOD OF MANUFACTURING THE SAME, AND PROBE CARD...
- Publication number 20230333141
- Publication date Oct 19, 2023
- Global Unichip Corporation
- Chih-Chieh LIAO
- G01 - MEASURING TESTING
Information Patent Application
Pin-Type Probes for Contacting Electronic Circuits and Methods for...
- Publication number 20230324435
- Publication date Oct 12, 2023
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING

related to tip portion

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Compliant probes including dual independently operable probe contac...

Probe tip with rigid frame and flexible tip portion

Contact pin with individually movable contact elements

Multi-beam probes with decoupled structural and current carrying be...

Contact, inspection jig, inspection device, and method of manufactu...

Cantilever probe card device and elastic probe thereof

Compliant pin probes with extension springs, methods for making, an...

Probes with planar unbiased spring elements for electronic componen...

Contact terminal, inspection jig, and inspection apparatus

Securing a probe to a device under test

Probe head for electronic devices and corresponding probe card

Sensor-based planar wafer probe alignment

High performance outer cylindrical spring pin

Probe pin having gripping structure

Probes having improved mechanical and/or electrical properties for...

Contact probe

Probes that define retroreflectors, probe systems that include the...

Method for manufacturing a measurement probe, and measurement probe

Contact assembly array and testing system having contact assembly a...

Compliant pin probes with flat extension springs, methods for makin...

Probe system for QFP integrated circuit device test tooling

Capacitive test needle for measuring electrically conductive layers...

Multi-member test probe structure

Probes with planar unbiased spring elements for electronic componen...

Probe pin

Probe, inspection jig, inspection device, and method for manufactur...

Integrated pogo pin enabling integrated housing

Contact device for electrical test

Contact probe and relative probe head of an apparatus for testing e...

Electrical contactor and electrical connecting apparatus

Patents Applicationslast 30 patents

CAPACITANCE-BASED DETECTION OF PROBE CONTACT

PROBE MEMBER FOR INSPECTION, AND MANUFACTURING METHOD THEREFOR

Electrical Testing Device with Probe Having Portions with Different...

PROBE TIP WITH RIGID FRAME AND FLEXIBLE TIP PORTION

CONTACT PROBE AND PROBE UNIT

ELECTRICALLY CONDUCTIVE CONTACT PIN AND MANUFACTURING METHOD THEREFOR

PROBE HEAD AND METHOD OF PRODUCING TESTED SEMICONDUCTOR DIE AND VER...

PROBE CARD NEEDLE SHAPE AND METHOD OF MANUFACTURING

METHOD FOR PRODUCING A PROBE CARD

Probes with Planar Unbiased Spring Elements for Electronic Componen...

Compliant Probes with Enhanced Pointing Stability and Including At...

Compliant Probes Including Dual Independently Operable Probe Contac...

Multi-Beam Probes with Decoupled Structural and Current Carrying Be...

Probes with Planar Unbiased Spring Elements for Electronic Componen...

Probes with Planar Unbiased Spring Elements for Electronic Componen...

Probes with Planar Unbiased Spring Elements for Electronic Componen...

Probes with Planar Unbiased Spring Elements for Electronic Componen...

Probes Having Improved Mechanical and/or Electrical Properties for...

COAXIAL WAFER PROBE AND CORRESPONDING MANUFACTURING METHOD

PROBE JOINT AND SPRING PROBE COMPRISING THE SAME

PROBE PIN AND METHOD OF MANUFACTURING PROBE PIN

CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES

PROBE HEAD AND PROBE ASSEMBLY

CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES AND CORRESPONDI...

TESTING DEVICE AND METHOD, AND NON-TRANSITORY COMPUTER-READABLE REC...

Test Needle, Test Probe, and Flying Probe Tester for Testing Printe...

PROBE DEVICE, PROBE SYSTEM INCLUDING THE PROBE DEVICE AND OPERATING...

CONTACT, INSPECTION JIG, INSPECTION DEVICE, AND METHOD OF MANUFACTU...

CONDUCTIVE PROBE, METHOD OF MANUFACTURING THE SAME, AND PROBE CARD...

Pin-Type Probes for Contacting Electronic Circuits and Methods for...