The present invention relates to a detection method for an intermolecular interaction and a detection device thereof, in particular to a detection method for an intermolecular interaction of a biomolecule, an organic molecule, or the like, and a detection device thereof.
Heretofore, measurement of bonding such as an intermolecular interaction between biomolecules such as an antigen-antibody reaction, or an intermolecular interaction between organic molecules has, in general, been carried out using a label such as a radioactive substance, a phosphor. The labeling takes a lot of work, and, in particular, a labeling method to a protein is sometimes complicated, or the characteristics of a protein were sometimes changed due to the labeling. In recent years, as a means to detect a bonding between biomolecules or organic molecules easily and directly without using the label, the RIS (reflectometric interference spectroscopy) method utilizing the change of interference color of optical film has been known. Its basic principle is described in Patent Document 1, Non-patent Document 1, or the like.
When describing briefly the RIS method, detector 100, which is shown in
For detecting the intermolecular interaction, ligand 120 is arranged on optical film 104, as it is shown in
When observing the transition of changes of the bottom peak wavelength over time, as it is shown in
Patent Document 1: Japanese Patent No. 3786073
Non-Patent Document 1: Sandstrom et al, APPL. OPT., 24, 472, 1985
In the meantime, in the above RIfS method in which the transition of changes of the bottom peak wavelength over time is observed, since the true reflectance bottom peak wavelength often exists between wavelengths of the actually detected reflected light, it is necessary to follow the transition of the bottom peak wavelength over time with a smaller (narrower) wavelength interval than a wavelength interval of the actually detected reflected light. To this, it is usually performed that the wavelength distribution of reflectance is approximated by a high-degree polynomial to determine the solution (minimum value) from the high-degree polynomial, and then the solution is assigned to the bottom peak wavelength.
However, though the approximation by the high-degree polynomial is useful in terms of fitting, it takes a long time to determine a solution from the polynomial due to its high-degree, and it is difficult to calculate and specify the bottom peak wavelength easily and in a short time.
Further, the above RIfS method, in which the transition of changes of the bottom peak wavelength over time is observed, is made possible to deal with a plurality kinds of molecules, and then the intermolecular interaction can be detected even if a plurality kinds of molecules are piled together, or a sample solution is laced with a plurality kinds of analytes 130. For example, as it is shown in
When the bottom peak wavelengths are calculated and specified in the case where intermolecular interactions between a plurality kinds of molecules are practically detected, for example, reflection spectrum 170, such as shown in
However, in this case, because of dealing with a plurality kinds of molecules, minimum value 172 exists in reflection spectrum 170, and then, when reflection spectrum 170 is approximated, reflection spectrum 174 affected by minimum value 172 is obtained, and the bottom peak wavelength is shifted with it. Therefore, the correct bottom peak wavelength in reflection spectrum 170 cannot sometimes be calculated and specified.
Therefore, the main purpose of the present invention is to provide a detection method for an intermolecular interaction and a detection device thereof, by which the bottom peak wavelength can be calculated and specified easily and in a short time with or without the minimum value of the reflection spectrum.
According to one embodiment of the present invention, a detection method for an intermolecular interaction is provided, wherein the method is provided with a step of calculating a reflectance over a fixed wavelength interval to obtain a reflectance spectrum; a step of approximating the above reflectance spectrum by a high-dimensional function; a step of selecting a wavelength interval having the minimum reflectance from the above high-dimensional function; a step of approximating, in the above wavelength interval, the above high-dimensional function by a quadratic function, which is lower order than the high-dimensional function; and a step of differentiating the above quadratic function with respect to the wavelength to obtain a solution in which the value thereof becomes zero.
According to another embodiment of the present invention, a detection method for an intermolecular interaction is provided, wherein the method is provided with a step of calculating a reflectance at a fixed wavelength interval to obtain a reflectance spectrum; a step of filtering the above reflectance spectrum; a step of selecting, from the above reflectance spectrum after being filtered, a first wavelength interval which has the minimum reflectance, and in which an inflection point is made a boundary; a step of approximating, in the above first wavelength interval, the above reflectance spectrum after being filtered by a high-dimensional function; a step of selecting a second wavelength interval having the minimum reflectance from the above high-dimensional function; a step of approximating, in the above second wavelength interval, the above high-dimensional function by a quadratic function, which is lower order than the high-dimensional function; and a step of differentiating the above quadratic function with respect to the wavelength to obtain a solution in which the value thereof becomes zero.
According to another embodiment of the present invention, a detection device for an intermolecular interaction is provided, wherein the device is equipped with a detector provided with a ligand; a white light source which irradiates white light on the above detector; a spectrometer which detects reflected light from the above detector; and a control device, which controls the above white light source and the above spectrometer, and calculates reflectance over a fixed wavelength interval to obtain a reflectance spectrum, approximates the above reflectance spectrum by a high-dimensional function, selects a wavelength interval having the minimum reflectance from the above high-dimensional function, approximates, in the above wavelength interval, the above high-dimensional function by a quadratic function, which is lower order than the high-dimensional function, and differentiates the above quadratic function with respect to the wavelength to obtain a solution in which the value thereof becomes zero.
According to another embodiment of the present invention, a detection device for an intermolecular interaction is provided, wherein the device is equipped with a detector provided with a ligand; a white light source which irradiates white light on the above detector; a spectrometer which detects reflected light from the above detector; and a control device, which controls the above white light source and the above spectrometer, and calculates reflectance at a fixed wavelength interval to obtain reflectance spectrum, filters the above reflectance spectrum, selects, from the above reflectance spectrum after being filtered, a first wavelength interval which has the minimum reflectance, and in which an inflection point is made a boundary, approximates, in the above first wavelength interval, the above reflectance spectrum after being filtered by a high-dimensional function, selects a second wavelength interval having the minimum reflectance from the above high-dimensional function, approximates, in the above second wavelength interval, the above high-dimensional function by a quadratic function, which is lower order than the high-dimensional function, and differentiates the above quadratic function with respect to the wavelength to obtain a solution in which the value thereof becomes zero.
According to the present invention, since, after approximating a wavelength distribution (reflection spectrum) of reflectance by a high-dimensional function, a wavelength interval is selected and the reflection spectrum is again approximated at the above wavelength interval by a quadratic function, a bottom peak wavelength can be determined by simple processing such that the above quadratic function is differentiated to obtain a solution in which the value thereof becomes zero, and the bottom peak wavelength can be calculated and specified easily and in a short time with or without a minimum value of the reflection spectrum.
Hereinafter, a preferable first embodiment of the present invention will be described with reference to drawings.
As it is shown in
Detector 10 is basically comprised of sensor chip 12, and flow cell 14.
As it is shown in
Flow cell 14 is a transparent member made of silicon rubber. Groove 14a is formed on flow cell 14. When flow cell 14 is made close contact with sensor chip 12, closed channel 14b is formed (refer to
In detector 10, flow cell 14 is designed to be reattachable to sensor chip 12, and flow cell 14 is made disposable. On the surface of sensor chip 12, surface modification may be carried out using a silane coupling agent or the like, and in this case, flow cell 14 is easily reattachable to the surface.
As it is shown in
Subsequently, the detection method for the intermolecular interaction using detection device 1 will be described.
As it is shown in
While sample solution 60 is being passed through closed channel 14b, white light source 20 is turned on. The white light penetrates flow cell 14 and is irradiated on sensor chip 12, and then, the reflected light is detected by spectrometer 30. The detection intensity of the reflected light, which was detected by spectrometer 30, is transmitted to control device 50.
In this case, as it is shown in
The method for calculating and specifying bottom peak wavelength. λbottom is mainly comprised of steps (S1) to (S4) of
S1: Determine a reflection spectrum and approximate it by a high-dimensional function.
S2: Select an optional wavelength interval from the high-dimensional function.
S3: Approximate, in the above wavelength interval, the above high-dimensional function by a quadratic function, which is lower order than the high-dimensional function.
S4: Determine bottom peak wavelengths λbottom from the quadratic function.
The method for calculating and specifying bottom peak wavelength λbottom before the bonding between analyte 62 and ligand 16 is similar to that after the bonding.
In step S1, from the detection results of spectrometer 30, the reflectance with respect to wavelength is calculated over a constant wavelength interval (for example, at an interval of 0.35 nm), and then, as it is shown in
After that, reflection spectrum 72 is approximated by a high-dimensional function of about 20th order to smooth the waveform of reflection spectrum 72 as it is shown in
In step S2, as it is shown in
Namely, since, in step S1, the reflectances corresponding to the measured wavelengths have been calculated even in the high-dimensional function, the minimum wavelength is specified from these reflectances, which is then taken as standard wavelength λ0 (refer to
In step S3, in wavelength interval 74, reflection spectrum 72 after the approximation (a high-dimensional function) is approximated by a quadratic function. The aforesaid approximation may be performed by any commonly known method, and can be achieved by, for example, the least square method.
In this case, the reflectance of a wavelength in wavelength interval 74 is expressed by Equation (1), where x and y indicate wavelength and reflectance, respectively.
y=ax
2
+bx+c Equation (1)
In Equation (1), a, b, and c are arbitrary constants.
In step S4, bottom peak wavelength λbottom is determined from the quadratic function expressed by Equation (1). The quadratic function expressed by Equation (1) describes a parabola that is convex downward, and if a gradient at a certain wavelength is zero, the wavelength is the one which takes the minimum reflectance and corresponds to bottom peak wavelength λbottom. Therefore, in step S4, the quadratic function expressed by Equation (1) is differentiated with respect to wavelength (x), to derive an equation in which a value after the differentiation becomes zero, and the solution is determined. The equation in which a value after the differentiation becomes zero is expressed by Equation (2), and the solution is expressed by Equation (3).
2ax+b=0 Equation (2)
x=−b/2a Equation (3)
Through such processing, bottom peak wavelength λbottom can be calculated and specified as “−b/2a.”
According to the above-described first embodiment, reflection spectrum 72 is approximated by a high-dimensional function from the detection results of spectrometer 30 in step S1, after which wavelength interval 74 is determined in steps S2 and S3, and then reflection spectrum 72 is approximated again by a quadratic function. Therefore, by carrying out simple processing such that above quadratic function is differentiated at step S4 to obtain a solution in which the differentiated value becomes zero, bottom peak wavelength λbottom is calculated and specified, and therefore bottom peak wavelength λbottom can be calculated and specified easily and in a short period of time.
Hereinafter, a preferable second embodiment of the present invention will be described with reference to drawings.
The structure of the detection device in the second embodiment is the same as detection device 1 of the first embodiment.
The second embodiment differs from the first embodiment in a point of a method for calculating and specifying bottom peak wavelength λbottom. Hereinafter, a method for calculating and specifying bottom peak wavelength λbottom in the second embodiment will be described.
The method for calculating and specifying bottom peak wavelength λbottom is mainly comprised of steps (S11) to (S16) of
S11: Determine a reflection spectrum, which is then filtered.
S12: Select an optional wavelength interval from the reflection spectrum after the filtering.
S13: Approximate the reflection spectrum after the filtering by a high-dimensional function in the selected wavelength interval.
S14: Select an optional wavelength interval from the high-dimensional function.
S15: Approximate the above high-dimensional function by a quadratic function, which is lower order than the high-dimensional function, in the above wavelength interval.
S16: Determine bottom peak wavelengths λbottom from the quadratic function.
The method for calculating and specifying bottom peak wavelength λbottom before the bonding between analyte 62 and ligand 16 is similar to that after the bonding.
In step S11, from the detection results of spectrometer 30, the reflectance with respect to wavelength is calculated over a constant wavelength interval (for example, at an interval of 0.35 nm), and then, as it is shown in
After that, reflection spectrum 72 is subjected to filtering (smoothing processing) to smooth the waveform of reflection spectrum 72 as it is shown in
In step S12, as it is shown in
Namely, since, in step S11, the reflectances, which are averaged at a constant wavelength interval, have been calculated, the minimum wavelength is specified from these reflectances, which is then taken as standard wavelength λ0. After that, several wavelengths are selected around standard wavelength λ0 as the center, and the selected interval is referred to as wavelength interval 76. In the case where inflection point 78 exists at the shorter or longer wavelength side with respect to standard wavelength 4, inflection point 78 is set as a boundary of wavelength interval 76. A point, which is away from standard wavelength λ0 by wavelengths equivalent to several points (2 to 3 points) from inflexion point 78, may be set as a boundary of wavelength interval 76.
In step S13, in wavelength interval 76, reflection spectrum 72 after the filtering is approximated by a high-dimensional function of about 20th order to further smooth the waveform of reflection spectrum 72 as it is shown in
In step S14, as it is shown in
Namely, since, in step S13, even in the high-dimensional function, the reflectances corresponding to the measured wavelengths have been calculated, the minimum wavelength is specified from these reflectances, which is then taken as standard wavelength λ1 (refer to
In step S15, in wavelength interval 74, reflection spectrum 72 after the approximation (a high-dimensional function) is approximated by a quadratic function. The aforesaid approximation may be performed by any commonly known method, and can be achieved by, for example, the least square method.
In this case, the reflectance of a wavelength in wavelength interval 74 is expressed by above-described Equation (1), where x and y indicate wavelength and reflectance, respectively.
In step S16, bottom peak wavelength λbottom is determined from the quadratic function expressed by Equation (1). The quadratic function expressed by Equation (1) describes a parabola that is convex downward, and if a gradient at a certain wavelength is zero, the wavelength is the one which takes the minimum reflectance and corresponds to bottom peak wavelength λbottom. Therefore, in step S16, the quadratic function expressed by Equation (1) is differentiated with respect to wavelength (x), to derive an equation in which a value after the differentiation becomes zero, and the solution is determined. The equation in which a value after the differentiation becomes zero is expressed by above-described Equation (2), and the solution is expressed by above-described Equation (3).
Through such processing, bottom peak wavelength λbottom can be calculated and specified as “−b/2a.”
According to the above-described second embodiment, reflection spectrum 72 is subjected to the filtering to obtain reflection spectrum 72 from the detection results of spectrometer 30 in step S11, after which, in step S12, wavelength interval 76, in which inflection point 78 is taken as a boundary, is selected and determined. Therefore, even in the case where there are a plurality of minimum values in reflection spectrum 72, bottom peak wavelength λbottom can be determined in a range in which the minimum value is avoided (a range excepting the minimum value), and then bottom peak wavelength λbottom can be correctly calculated and specified.
Further, according to the second embodiment, in step S13, reflection spectrum 72 after the filtering is approximated by a high-dimensional function, after which wavelength interval 74 is determined in steps S14 and S15, and then reflection spectrum 72 is approximated again by a quadratic function. Therefore, by carrying out simple processing such that above quadratic function is differentiated at step S16 to obtain a solution in which the differentiated value becomes zero, bottom peak wavelength λbottom is calculated and specified, and therefore bottom peak wavelength λbottom can be calculated and specified easily and in a short period of time.
1: a detection device
10: a detector
12: a sensor chip
12
a: a silicon substrate
12
b: an SiN film
14: a flow cell
14
a: a groove
14
b: a closed channel
14
c: an inflow orifice
14
d: an outflow orifice
16: a ligand
20: a white light source
30: a spectrometer
40: an optical fiber
50: a control device
60: a sample solution
62: an analyte
70: an optical thickness
72: a reflection spectrum
74: a wavelength interval
100: a detector
102: a substrate
104: an optical film
106 and 108: a solid line
110: a reflection spectrum
112: an optical thickness
120: a ligand
122: a reflection spectrum
130: an analyte
132: a reflection spectrum
140 and 142: a point of time
150: a biotin
152: an avidin
154: a BSA
156: an antibody
158: an antigen
160, 162, 164, and 166: an interval
170: a reflection spectrum
172: the minimum value
174: a reflection spectrum
Number | Date | Country | Kind |
---|---|---|---|
2010-055325 | Mar 2010 | JP | national |
2010-055328 | Mar 2010 | JP | national |
Filing Document | Filing Date | Country | Kind | 371c Date |
---|---|---|---|---|
PCT/JP2011/052838 | 2/10/2011 | WO | 00 | 9/7/2012 |