Number | Name | Date | Kind |
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4105216 | Graham et al. | Aug 1978 | A |
5384457 | Sommer | Jan 1995 | A |
5940545 | Kash et al. | Aug 1999 | A |
6028952 | Kash et al. | Feb 2000 | A |
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Kash et al., “Dynamic Internal Testing of CMOS Circuits Using Hot Luminescence”, IEEE Electron Device Letters, vol. 8, No. 7, Jul. 1997, pp. 330-332. |