Claims
- 1. A diamond film depositing apparatus comprising:a process chamber having a gas inlet for injecting a reactive gas and an exhaust gas outlet for discharging an exhaust gas; a cathode disposed at an upper portion inside the process chamber; an anode disposed below the cathode for fixing a substrate, the cathode and the anode being concave or convex with respect to each other, or in a disk-type; an SMPS(switched-mode power supply) connected to the cathode and the anode, applying a DC voltage to the cathode and anode to form a plasma between the cathode and the anode; and a holder for fixing the cathode to the upper inside portion of the process chamber, wherein the cathode is fixed by the holder, the holder including a central fixing bar disposed at a center of an upper surface of the cathode, plural edge fixing bars disposed at an edge of the upper surface of the cathode at regular intervals, a rotatable handle fixed to the central fixing bar, and a cooling line formed inside the holder, wherein rotation of the handle moves the cathode to control temperature of the cathode by varying the degree of thermal contact between the cathode and the holder containing the cooling line therein.
- 2. The apparatus according to claim 1, wherein the cathode and the anode each have a diameter of over 100 mm, respectively.
- 3. The apparatus according to claim 1, wherein a plurality of vacuum holes and vacuum grooves are formed in an upper surface of the anode.
- 4. The apparatus according to claim 1, wherein at least one spacer is inserted between the cathode and the holder.
- 5. The apparatus according to claim 4, wherein the at least one spacer is formed to be a thin plate.
- 6. The apparatus according to claim 4, wherein the at least one spacer is formed of one of molybdenum, copper or stainless steel.
- 7. The apparatus according to claim 4, wherein the surface of the at least one spacer is one of (a) abrasive-processed, and (b) indented in a uniform pattern.
- 8. The apparatus according to claim 1, wherein the temperature of the cathode is controlled within a range of 950° C. to 2000° C.
- 9. The apparatus according to claim 1, wherein the cathode and the anode are concave and convex with respect to each other.
- 10. The apparatus according to claim 1, wherein rotation of the handle controls temperature of the cathode without varying generating power of the plasma.
- 11. The apparatus according to claim 4, wherein rotation of the handle controls temperature of the cathode by varying thermal contact between the cathode, the spacer and the holder.
- 12. The apparatus according to claim 11, wherein rotation of the handle controls temperature of the cathode without varying generating power of the plasma.
Priority Claims (1)
Number |
Date |
Country |
Kind |
1999/11854 |
Oct 1999 |
KR |
|
CROSS REFERENCE TO RELATED APPLICATION
The present application is a divisional of copending application Ser. No. 09/427,897 filed on Oct. 27, 1999.
US Referenced Citations (20)
Foreign Referenced Citations (3)
Number |
Date |
Country |
06305886 |
Nov 1994 |
JP |
07297157 |
Nov 1995 |
JP |
11224795 |
Aug 1999 |
JP |