The present disclosure relates to detection of nuclear material and, more particularly, relates to a dual-particle imaging system for standoff special nuclear material (SNM) detection in high-background-radiation environments.
This section provides background information related to the present disclosure which is not necessarily prior art. This section provides a general summary of the disclosure, and is not a comprehensive disclosure of its full scope or all of its features.
Stockpiles of SNM exist worldwide. SNM, which includes 239Pu, 233U, and uranium enriched to higher than 20% of 235U, can have both weapons and peaceful applications. Thus, SNM must be monitored to prevent its diversion for weapons applications. To aid in this effort, a variety of tools have been developed to help monitor, detect, and characterize different radioactive sources. These systems take advantage of various materials and detection techniques, each having their own advantages and disadvantages.
Radiation imaging systems are of particular interest because they are capable of detecting and localizing radioactive sources. Traditional Compton-camera systems detect photons and have been commonly used for many years in several applications, including medical imaging and nuclear security. Neutron-scatter cameras have also been part of recent research efforts for use in nuclear-security applications. However, high-Z materials can effectively shield photons and low-Z materials can effectively shield neutrons. This allows for detection systems sensitive to a single particle type to be easily foiled by relatively simple shielding geometries.
This disclosure presents a dual-particle imaging system that overcomes the disadvantages of the prior art by combining a traditional Compton-camera system with a neutron-scatter camera system to detect and image both photons and fast neutrons. In some embodiments, the system of the present teachings utilizes two planes of EJ-309 liquid scintillators and one plane of NaI scintillators, which allows for detection and imaging of both photons and fast neutrons. The present teaching further provides advanced features, such as moveable detecting planes that can be actively, passively, automatically, or otherwise moved to detect a source, track a source, and/or improve the overall efficiency of the system.
Further areas of applicability will become apparent from the description provided herein. The description and specific examples in this summary are intended for purposes of illustration only and are not intended to limit the scope of the present disclosure.
The drawings described herein are for illustrative purposes only of selected embodiments and not all possible implementations, and are not intended to limit the scope of the present disclosure.
Corresponding reference numerals indicate corresponding parts throughout the several views of the drawings.
Example embodiments will now be described more fully with reference to the accompanying drawings. Example embodiments are provided so that this disclosure will be thorough, and will fully convey the scope to those who are skilled in the art. Numerous specific details are set forth such as examples of specific components, devices, and methods, to provide a thorough understanding of embodiments of the present disclosure. It will be apparent to those skilled in the art that specific details need not be employed, that example embodiments may be embodied in many different forms, and that neither should be construed to limit the scope of the disclosure. In some example embodiments, well-known processes, well-known device structures, and well-known technologies are not described in detail.
The terminology used herein is for the purpose of describing particular example embodiments only and is not intended to be limiting. As used herein, the singular forms “a,” “an,” and “the” may be intended to include the plural forms as well, unless the context clearly indicates otherwise. The terms “comprises,” “comprising,” “including,” and “having,” are inclusive and therefore specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof. The method steps, processes, and operations described herein are not to be construed as necessarily requiring their performance in the particular order discussed or illustrated, unless specifically identified as an order of performance. It is also to be understood that additional or alternative steps may be employed.
When an element or layer is referred to as being “on,” “engaged to,” “connected to,” or “coupled to” another element or layer, it may be directly on, engaged, connected or coupled to the other element or layer, or intervening elements or layers may be present. In contrast, when an element is referred to as being “directly on,” “directly engaged to,” “directly connected to,” or “directly coupled to” another element or layer, there may be no intervening elements or layers present. Other words used to describe the relationship between elements should be interpreted in a like fashion (e.g., “between” versus “directly between,” “adjacent” versus “directly adjacent,” etc.). As used herein, the term “and/or” includes any and all combinations of one or more of the associated listed items.
Although the terms first, second, third, etc. may be used herein to describe various elements, components, regions, layers and/or sections, these elements, components, regions, layers and/or sections should not be limited by these terms. These terms may be only used to distinguish one element, component, region, layer or section from another region, layer or section. Terms such as “first,” “second,” and other numerical terms when used herein do not imply a sequence or order unless clearly indicated by the context. Thus, a first element, component, region, layer or section discussed below could be termed a second element, component, region, layer or section without departing from the teachings of the example embodiments.
Spatially relative terms, such as “inner,” “outer,” “beneath,” “below,” “lower,” “above,” “upper,” and the like, may be used herein for ease of description to describe one element or feature's relationship to another element(s) or feature(s) as illustrated in the figures. Spatially relative terms may be intended to encompass different orientations of the device in use or operation in addition to the orientation depicted in the figures. For example, if the device in the figures is turned over, elements described as “below” or “beneath” other elements or features would then be oriented “above” the other elements or features. Thus, the example term “below” can encompass both an orientation of above and below. The device may be otherwise oriented (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein interpreted accordingly.
I. Dual-Particle Imager System
The dual-particle imager system 10 of the present teachings is based on the physics of Compton and neutron scatterings. It is capable of simultaneously utilizing information gathered from both photon and neutron interactions in the system 10 to produce a single, combined visualization of a measured source distribution.
More particularly, dual-particle imager system 10 of the present teachings provide for standoff, passive detection of SNM. In some embodiments, the system 10 comprises three detector planes that together are capable of imaging both photons and fast neutrons. The ability of the system to detect fast neutrons makes it more difficult to effectively shield a threat source. This feature has an advantage over the commonly used Compton-camera systems, which are only sensitive to photons. Additionally, the detection of fast neutrons will allow for increased performance in regions with high depositions of photon-background radiation. In some embodiments, the first two planes of the system consist of EJ-309 liquid scintillators and the third plane consists of NaI scintillators. This detector/plane combination allows image reconstruction using both photons and fast neutrons. In the liquid scintillators, neutron interactions are distinguished from photon interactions using an optimized pulse-shape discrimination technique, as illustrated in
A. Concept and Imaging Principle
A traditional Compton imaging system 100 uses position and energy information from a photon that is scattered and subsequently absorbed to determine the incident angle of approach. Equation (1) demonstrates how the incident angle, θγ1, can be calculated based on the incident photon energy, Eγ0, equal to the sum of the energies deposited, Ed1+Ed2 when the second interaction is an absorption, and the energy lost due to scatter, Ed1. The incident angle, θγ1, actually represents the opening angle of a cone that is aligned along a vector V between the photon scatter of the scatter plane 110 and absorption locations on the absorption plane 112, as shown in
A neutron-scatter camera uses the position and energy information obtained from two consecutive neutron scatters to determine the cone surface of probable source locations. Equations (2) and (3) demonstrate how the energy transferred to the recoil proton by the first scatter, Ep1, and the time of flight (TOF) required to travel a distance, d, between the first scatter at scatter plane 110 and second scatter at absorption plane 112 can be used to determine the opening angle of the cone, θn1. This process is depicted in
In some embodiments of the present teachings, these two scattering principles may be combined into a single, three detector plane system 10 that is operable to image dual particles, namely photons and neutrons, as illustrated in
B. System Components
In some embodiments, EJ-309 liquid scintillators have been chosen for use in first scatter plane 12 and second scatter plane 14. These scintillators are sensitive to both neutrons and photons and are capable of excellent pulse shape discrimination (PSD). Additionally, the high flashpoint (144° C.) of the EJ-309 liquid makes these detectors suitable for field use. In some embodiments, NaI, which is sensitive to photons (scattering and photoelectric absorption), was chosen for use in absorption plane 16 due to its high efficiency, adequate energy resolution, and relatively low cost.
The detectors purchased for prototype development include sixteen 5.08-cm thick EJ-309 liquid scintillators for first scatter plane 12, sixteen 7.62-cm thick EJ-309 liquid scintillators for second scatter plane 14, and sixteen 7.62-cm thick NaI scintillators for absorption plane 16. All detectors are 7.62-cm in diameter and are shown in
It should be noted that the dual-particle imaging system 10 can further include a central processor 20, such as a computer. The central processor 20 can be used for data collection, data analysis and imaging, system control (e.g. control of operation and/or positioning of first scatter plane 12, second scatter plane 14, and absorption plane 16). It should be recognized that elements of dual-particle imager system 10 can be used for multiple purposes to provide improved equipment and use efficiency, reduced cost, and simplified construction.
C. Moveable Planes
In some embodiments, the dual-particle imaging system 10 can comprise two or more planes of multiple detector cells (e.g. planes 12, 14), wherein one or more of the planes is moveable and/or adjustable in real-time to account for varying measurement conditions. In some embodiments, as illustrated in
It should be understood from the foregoing that for a given incident-particle energy the probability of scattering into the second plane 14 from the first plane 12 depends on the separation between the two planes 12, 14. For this reason, it is advantageous to move the planes depending on the energy of particles incident on the system.
One embodiment of the actuation system could adjust this separation in real-time, based on the incoming energy information, to produce the best localization of the source. Similar behavior is observed if one adjusts the group separation and/or angular orientation of the planes (as noted in
II. Monte Carlo Simulation
Simulations have been performed on the dual-particle imaging system 10 using the MCNPX-PoIiMi Monte Carlo code in order to help with system design and to obtain a preliminary understanding of system performance. Additionally, a post-processor, such as central processor 20, has been developed that allows both simulated and measured data to be analyzed and imaged.
A. MCNPX-PoIiMi
MCNPX-PoIiMi is a modified version of the MCNPX Monte Carlo code that is especially useful for tracking correlated events. This is done by tracking detailed information on all interactions occurring within user-defined volumes of interest. MCNPX-PoIiMi output from central processor 20 includes details such as interaction type, energy deposited by an interaction, time of interaction, and position of interaction. As discussed herein, this information can then be used to create imageable events.
B. Data Post-Processing
The information provided by a MCNPX-PoIiMi simulation can be further processed to model the uncertainties found in a realistic detector response. This includes applying a pulse-generation time to combine successive interactions, applying detector thresholds to eliminate energy depositions that would not be detected in a real measurement, and applying energy and time broadening so that energy and time resolution are consistent with the detectors being used. This information is combined and a pulse height and time stamp is generated for each pulse. This allows for the imaging portion of the post-processor to operate on both measured and simulated data alike.
III. Imaging Bare and Shielded Sources
The simulation methods described above were used to gauge the response of the dual-particle imager to a spontaneous fission source. A bare source was tested in addition to a variety of shielding configurations.
A. Simulation Geometry
The dual-particle imaging system 10 was modeled using three, sixteen-detector planes (arranged in a 4×4 array) as illustrated in
The source was a 252Cf point source of approximately 80,000 fissions per second. It was located 2.5 m from the dual-particle imaging system 10 with no angular offset from the centerline of the detector planes. In addition to simulating the bare point source, simulations were run using various shielded spheres surrounding the source. The shielding configurations were 5.08 cm of lead, 5.08 cm of polyethylene and 5.08 cm of polyethylene surrounded by 5.08 cm of lead. The order of the combined shielding was chosen so that the layer of lead would attenuate the 2.2-MeV photons created by neutron absorption on hydrogen. Each source-shielding configuration was simulated for the number of fissions equivalent to a twenty-minute measurement. There was no background radiation present in these simulated measurements.
B. Bare Cf Point Source
a illustrates the simple-backprojection image for the unshielded case using data from both photons and neutrons. It should be noted that simple-backprojection imaging is a worst case scenario and source localization can be significantly improved using more advanced imaging algorithms such as MLEM. The side-view of the image is also shown to give a perspective on the angular resolution of the peak.
C. Shielded Cf Point Source
The lead-shielded case is shown in
Finally,
IV. Validation Measurements
In order to verify the accuracy of the data post-processor, a small Compton camera and a small neutron-scatter camera were constructed using components from the dual-particle imaging system 10. These small systems were then modeled using MCNPX-PoIiMi and the measured data was compared to the simulated and post-processed data.
A. Neutron Validation Measurements
The neutron-scatter camera was set up using two 2×2 planes of EJ-309 liquid scintillators. The front plane consisted of the 5.08-cm thick detectors while the backplane used the 7.62-cm thick detectors. Both planes utilized the ETL 9821 PMTs and the front plane PMTs faced forward while the backplane PMTs faced backward. Additionally, there was a 10-cm spacing between the two detector planes. This setup is shown in
A 252Cf source with a spontaneous fission rate of approximately 11,000 fissions per second was located 50 cm from the active material in the first plane with no angular offset from the centerline of the detector planes. Data were collected for two hours. In the measurement, an energy threshold of 70 keVee (which corresponds to a neutron energy deposition of approximately 500 keV) was set using a CAEN V1720 digitizer. This threshold value was matched in the simulation using the post-processor.
a and 11b show the comparison between the measured simple-backprojection image and the simulated simple-backprojection image. In both cases, a subtle hot spot can be seen directly in front of the system. Additionally, similar imaging artifacts can be seen in both the measured and simulated data. This concentrated “cloverleaf’ pattern is due to the limited number of possible scatter angles in a two-plane, eight-detector imaging system. It should also be noted that the simulated data do not include background radiation while the measured data do, which is why counts appear in all directions.
B. Photon Validation Measurements
The Compton camera was set up using two 2×2 detector planes. The front plane consisted of 7.6-cm thick EJ-309 detectors coupled with ETL 9821 PMTs while the back plane consisted of 7.6-cm thick NaI scintillators coupled with ETL 9305 PMTs. There was a 10-cm spacing between detector planes and the PMTs were oriented similar to the neutron-scatter camera.
A 30-uCi (3×106 photons per second) 22Na source was located 50 cm from of the active material and was offset 30 cm horizontally from the center axis of the detector planes. This setup is shown in
a and 13b show the comparison between the measured simple-backprojection image and the simulated simple-backprojection image. A hot-spot can be seen in both images at a horizontal offset that corresponds closely to the actual 30 cm offset. Similar to the neutron-scatter-camera images, artifacts have been introduced into the images due to the small number of possible scattering angles.
V. Summary
A three-plane, dual-particle imaging system was developed and disclosed herein for the detection and imaging of SNM. In some embodiments, the system uses two planes of EJ-309 liquid scintillators to scatter photons and neutrons and a third plane of NaI scintillators to preferentially absorb photons. The combination of photon and neutron data allows for more accurate detection and localization of SNM in the presence of shielding than the imaging systems sensitive to a single particle type. A post-processing algorithm was developed that is capable of correlating and reconstructing imageable events using data generated from either a measurement or a simulation.
Validation measurements have been performed using small neutron-scatter and Compton cameras. These validation measurements show reasonable agreement between measured and simulated data. To further validate the system, the measurement capabilities could be scaled to allow all 48 detectors to be used. This would allow for three 16-detector planes and increases measurement efficiency and spatial resolution. Additionally, more advanced image reconstruction techniques, such as maximum likelihood expectation maximization, can be implemented to further improve source localization in comparison to simple-backprojection imaging.
The foregoing description of the embodiments has been provided for purposes of illustration and description. It is not intended to be exhaustive or to limit the disclosure. Individual elements or features of a particular embodiment are generally not limited to that particular embodiment, but, where applicable, are interchangeable and can be used in a selected embodiment, even if not specifically shown or described. The same may also be varied in many ways. Such variations are not to be regarded as a departure from the disclosure, and all such modifications are intended to be included within the scope of the disclosure.
This application claims the benefit of U.S. Provisional Application No. 61/472,217, filed on Apr. 6, 2011. The entire disclosure of the above application is incorporated herein by reference.
This invention was made with government support under DE-NE0000324 awarded by the U.S. Department of Energy. The government has certain rights in the invention
Number | Date | Country | |
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61472217 | Apr 2011 | US |