Claims
- 1. A method of detecting a defect on a surface being scanned, the method comprising:
illuminating an area on the surface from a first direction; scanning the area a first time; illuminating the area on the surface from a second direction; scanning the area a second time; comparing the first and second scans; and determining that a defect is present in the area when the first and second scans are different.
- 2. The method of claim 1, further comprising:
determining that a defect is present in the area when a size of an apparent shadow is different between the first and second scans.
- 3. The method of claim 1, further comprising:
determining that a defect is present in the area when a direction of an apparent shadow is different between the first and second scans.
- 4. The method of claim 1, further comprising:
moving an illumination source to obtain illumination from different directions.
- 5. The method of claim 1, further comprising:
using two different displaced illumination sources to obtain illumination from different directions.
- 6. A method of detecting a defect on a surface being scanned, the method comprising:
scanning an area on the surface with a light source and a first photosensor array; scanning the area on the surface with the light source and a second photosensor array; where the light source, and first and second photosensor arrays are stationary relative to each other, the first and second photosensor arrays are spaced apart, and where the light source and first and second photosensor arrays are moved between the first and second scans; determining that a defect is present in the area when the first and second scans are different.
- 7. The method of claim 6, further comprising:
determining that a defect is present in the area when an apparent shadow in the first scan has a different size in the second scan.
- 8. The method of claim 6, further comprising:
where the first and second photosensor arrays detect substantially the same wavelengths of light.
- 9. The method of claim 6, further comprising:
where the first and second photosensor arrays detect different wavelengths of light.
- 10. A method of detecting a defect on a surface being scanned, the method comprising:
scanning an area on the surface with a light source and a first photosensor array detecting a first color; scanning the area on the surface with the light source and a second photosensor array detecting a second color; where the light source, and first and second photosensor arrays are stationary relative to each other, the first and second photosensor arrays are spaced apart, and where the light source and first and second photosensor arrays are moved between the first and second scans; forming a composite image from the first and second scans; determining that a defect is present in the area when a pattern of color bands, produced by overlapping shadows, is detected.
RELATED APPLICATIONS
[0001] This application is a divisional application of U.S. patent application Ser. No. 09/629,495, filed Jul. 31, 2000, which is hereby incorporated by reference.
Divisions (1)
|
Number |
Date |
Country |
Parent |
09629495 |
Jul 2000 |
US |
Child |
10226859 |
Aug 2002 |
US |