Edge chamfering methods

Abstract

Processes of chamfering and/or beveling an edge of a glass substrate of arbitrary shape using lasers are described herein. Two general methods to produce chamfers on glass substrates are the first method involves cutting the edge with the desired chamfer shape utilizing an ultra-short pulse laser to create perforations within the glass; followed by an ion exchange.

Description

BACKGROUND

The disclosure relates generally to glass chamfering methods, and more particularly to glass chamfering methods that utilize a laser in conjunction with an ion exchange process.

No admission is made that any reference cited herein constitutes prior art. Applicant expressly reserves the right to challenge the accuracy and pertinency of any cited documents.

In all cases where glass panels are cut for applications in architectural, automotive, consumer electronics, to mention a few areas, there will be edges, which will very likely require attention. There are as many different methods to cut and separate glass. For example, glass can be cut mechanically (CNC machining, abrasive waterjet, scribing and breaking, etc), using electro-magnetic radiation (lasers, electrical discharges, gyrotron, etc). The more traditional and common methods (scribe and break or CNC machining) create edges that are populated with different types and sizes of defects. It is also common to find that the edges are not perfectly perpendicular to the surfaces. In order to eliminate the defects and give the edges a more even surface with improved strength, they are usually ground. The grinding process involves abrasive removal of edge material that can give it the desired finishing and also shape its form (bull nosed, chamfered, pencil shape, etc). In order to allow the grinding and polishing steps, it is necessary to cut parts that are larger than the final desired dimensions.

While it is well known and understood that eliminating defects will increase edge strength, there is not an agreement on the impact that shape has on edge strength. The confusion occurs mainly because it is well known that shape helps to increase damage resistance to impact and handling of the edges. The fact is that edge shape really does not determine edge strength as defined by resistance to flexural (or bending) forces, but the defects size and distribution do have a great impact. However, a shaped edge does help to improve impact resistance by creating smaller cross section and containing defects. For example, an edge with a straight face that is perpendicular to both major surfaces of the glass accumulates stress at these right angled corners, and will chip and break when it is impacted by another object. Because of the accumulated stress, the size of defects can be pretty big, which will diminish the strength of that edge considerably. On the other hand, due to its smoother shape, a rounded “bull-nosed” shaped edge will have lower accumulated stress and smaller cross section which helps to reduce the size and penetration of defects into the volume of the edge. Therefore, after an impact, a shaped edge should have higher “bending” strength than a flat edge.

For the reasons discussed above, it is often desirable to have the edges shaped, as opposed to flat and perpendicular to the surfaces. One important aspect of these mechanical cutting and edge shaping methods is the degree of maintenance of the machines. Both for cutting and grinding, old and worn down cutting heads or grinding rolls can produce damage which can significantly affect the strength of the edges, even if the naked eye cannot be see the differences. Other issues with mechanical cutting and grinding methods is that they are very labor intensive and require many grinding and polishing steps until the final desired finish, which generate a lot of debris and require cleaning steps to avoid introduction of damages to the surfaces.

Ablation by laser processing have been used to create shaped edges.

In general, ablative laser techniques tend to be slow due to the low material removal rate and they also generate a lot of debris and heat affected zones that lead to residual stress and micro-cracks. For the same reason, melting and reshaping of the edges are also plagued with a lot of deformation and accumulated thermal stress that can peel that processed area. Finally, for the thermal peeling or crack propagating techniques, one of the main issues encountered is that the peeling is not continuous.

Subsurface damage, or the small microcracks and material modification caused by any cutting process, is a concern for the edge strength of glass or other brittle materials. Mechanical and ablative laser process are particularly problematic with regard to subsurface damage. Edges cut with these processes typically require a lot of post-cut grinding and polish to remove the subsurface damage layer, thereby increasing edge strength to performance level required for applications such as in consumer electronics.

SUMMARY

Embodiments described herein relate to processes of chamfering and/or beveling an edge of a glass substrate of arbitrary shape using lasers in conjunction with the ion exchange bath.

One embodiment of the disclosure relates a method for creating chamfers or bevels, the method comprising:

• • focusing a pulsed laser beam into a laser beam focal line, viewed along the beam propagation direction;
  • directing the laser beam focal line into the material at a first angle of incidence to the material, the laser beam focal line generating an induced absorption within the material, the induced absorption producing a defect line along the laser beam focal line within the material;
  • translating the material and the laser beam relative to each other, thereby laser drilling a plurality of defect lines along a first plane at the first angle within the material;
  • directing the laser beam focal line into the material at a second angle of incidence to the material, the laser beam focal line generating an induced absorption within the material, the induced absorption producing a defect line along the laser beam focal line within the material;
  • translating the material and the laser beam relative to each other, thereby laser drilling a plurality of defect lines along a second plane at the second angle within the material, the second plane intersecting the first plane, andseparating the material along the first plane and the second plane by applying an ion-exchange process to the material for 10 min to 120 min.

According to some embodiments the separated material is a glass sheet that has at least one chamfered surface, chamfered edge or a bevel.

According to some embodiments the at least one of the first and second angles of incidence is not a normal angle (not a 90° angle) with respect to the major surface of the material. For example, if the material is a glass sheet with two major flat surfaces (and a thickness that is much smaller than the width and the length of the sheet), the first and/or the second angle is greater than 0° and less than 90° relative to the normal to the major flat surface of the glass sheet.

According to some embodiments, during separating of the material along the first plane and the second plane, and the ion-exchange process is applied to the material for time t, wherein 15 min≤t≤120 min. In some embodiments 15 min≤t≤60 min, and in some embodiments 15 min≤t≤50 min or even 15 min≤t≤40 min. According to some embodiments the ion-exchange process is applied to the material at a temperature of 400° to 500° C.

According to some embodiments, the method further comprises subjecting the material to a second ion-exchange process, to strengthen the material and improve the resistance of material to subsequent damage.

One embodiment of the disclosure relates to a method of for creating chamfers or bevels work piece, the method comprising:

• • focusing a pulsed laser beam into a laser beam focal line, viewed along the beam propagation direction;
  • directing the laser beam focal line into the workpiece at an angle of incidence to the workpiece, the angle intersecting an edge of the workpiece, the laser beam focal line generating an induced absorption within the workpiece, the induced absorption producing a defect line along the laser beam focal line within the workpiece;
  • translating the workpiece and the laser beam relative to each other, thereby laser drilling a plurality of defect lines along a plane at the angle within the workpiece; and
  • separating the workpiece along the plane by applying an ion-exchange process to the workpiece.

According to some embodiments, the method further comprises subjecting the material to a second ion-exchange process to strengthen the material and improve the resistance of material to subsequent damage.

According to some embodiments a method of making a chamfered and strengthened glass article, comprises:

(i) providing a glass article having a select contour and a glass surface, and a perforated edge and/or corner;

(ii) removing the a portion of the glass adjacent to the perforated edge and/or corner by subjecting the article to a first ion-exchange process (for example, for 20 to 60 min) to complete a full-body cut between perforations;

(iii) rinsing the glass article,

(iv) air drying the rinsed glass article; and then

(v) subjecting the glass article to a second ion-exchange process to strengthen the glass article and improve the resistance of the glass article to subsequent damage.

According to some embodiments the first ion exchange process is a DIOX process (dual stage IOX exchange process). According to some embodiments the second ion-exchange process is a DIOX process. According to some embodiments the first and the second ion exchange processes area DIOX processes.

Additional features and advantages will be set forth in the detailed description which follows, and in part will be readily apparent to those skilled in the art from the description or recognized by practicing the embodiments as described in the written description and claims hereof, as well as the appended drawings.

It is to be understood that both the foregoing general description and the following detailed description are merely exemplary, and are intended to provide an overview or framework to understand the nature and character of the claims.

The accompanying drawings are included to provide a further understanding, and are incorporated in and constitute a part of this specification. The drawings illustrate one or more embodiment(s), and together with the description serve to explain principles and operation of the various embodiments

BRIEF DESCRIPTION OF THE DRAWINGS

The foregoing will be apparent from the following more particular description of example embodiments of the disclosure, as illustrated in the accompanying drawings in which like reference characters refer to the same parts throughout the different views. The drawings are not necessarily to scale, emphasis instead being placed upon illustrating embodiments of the present disclosure.

FIGS. 1A-1C are illustrations of a fault line with equally spaced defect lines of modified glass.

FIGS. 2A and 2B are illustrations of positioning of the laser beam focal line, i.e., the processing of a material transparent for the laser wavelength due to the induced absorption along the focal line.

FIG. 3A is an illustration of an optical assembly for laser drilling according.

FIGS. 3B1-3B4 are an illustrations of various possibilities to process the substrate by differently positioning the laser beam focal line relative to the substrate.

FIG. 4 is an illustration of a second optical assembly for laser drilling.

FIGS. 5A and 5B are illustrations of a third optical assembly for laser drilling.

FIG. 6 is a schematic illustration of a fourth optical assembly for laser drilling.

FIG. 7A is a flow chart of the various methods described in the present application to form a more robust edge—creating chamfers and sacrificial edges.

FIG. 7B illustrates a process of creating a chamfered edge with defect lines.

FIG. 7C illustrates laser chamfering of glass edges using a focused and angled ultrashort laser that generates defect lines along pre-determined planes. Top shows an example using 3 defect line planes compared to just two for the bottom images.

FIGS. 8A and 8B depict laser emission as a function of time for a picosecond laser. Each emission is characterized by a pulse “burst” which may contain one or more sub-pulses. Times corresponding to pulse duration, separation between pulses, and separation between bursts are illustrated.

FIG. 9 illustrates using defect lines which remain after the cut part is released to serve as sacrificial regions, arresting the propagation of cracks caused by impact to the edges of the part.

FIG. 10A is an illustration of a cut part with internal defect lines being placed into ion-exchange, which adds enough stress to remove the perforated edges and form the desired edge chamfer.

FIG. 10B is the use of ion exchange (IOX) to release chamfered corners, similar to the illustration shown in FIG. 10A, but with only two defect line planes.

FIG. 10C is an illustration of a chamfer with many angles (more than 3 defect line planes.

FIG. 11 illustrates results of several embodiments that utilized IOX process for removing glass along the fault lines (defect lines) to create chamfers.

FIG. 12A illustrates chamfers created by edge chamfering process using a laser to create defect lines (perforations) in glass and then subjecting the perforated glass to 15 min long IOX bath, for peeling and separating, thus creating a chamfered edge.

FIG. 12B illustrates chamfers created by edge chamfering process using a laser to create defect lines (perforations) in glass and then subjecting the perforated glass to 60 min long IOX bath, for peeling and separating, thus creating a chamfered edge. FIG. 12C illustrates chamfers created by edge chamfering process using a laser to create defect lines (perforations) in glass and then subjecting the perforated glass to 30 min long IOX bath, for peeling and separating, thus creating a chamfered edge.

DETAILED DESCRIPTION

A description of exemplary embodiments follows.

Embodiments described herein relate to processes of chamfering and/or beveling an edge of a glass substrate and other transparent materials of arbitrary shape using lasers. A first embodiment involves cutting the edge with the desired chamfer shape utilizing an ultra-short pulse laser that may be optionally followed by a other process steps for fully automated separation. In the first method, the process fundamental step is to create fault lines on intersecting planes that delineate the desired edge shape and establish a path of least resistance for crack propagation and hence separation and detachment of the shape from its substrate matrix. This method essentially creates the shaped edge while cutting the part out of the main substrate. The laser separation method can be tuned and configured to enable manual separation, partial separation, or self-separation of the shaped edges out of the original substrate. The underlying principle to generate these fault lines is described in detail below and in U.S. Application No. 61/752,489 filed on Jan. 15, 2013.

In the first step the object to be processed is irradiated with an ultra-short pulsed laser beam that is condensed into a high aspect ratio line focus that penetrates through the thickness of the substrate. Within this volume of high energy density the material is modified via nonlinear effects. It is important to note that without this high optical intensity, nonlinear absorption is not triggered. Below this intensity threshold, the material is transparent to the laser radiation and remains in its original state as shown in FIGS. 1A-1C. By scanning the laser over a desired line or path a narrow defect line is created (a few microns wide) and define the perimeter or shape to be separated in the next step. The particular laser method used (described below) has the advantage that in a single pass, it creates highly controlled full line perforation through the material, with extremely little (<75 μm, often <50 μm, and in some embodiments ≤40 μm) subsurface damage and debris generation. This is in contrast to the typical use of spot-focused laser to ablate material, where multiple passes are often necessary to completely perforate the glass thickness, large amounts of debris are formed from the ablation process, and more extensive sub-surface damage (>100 μm) and edge chipping occur.

Turning to FIGS. 2A and 2B, a method of laser drilling a material includes focusing a pulsed laser beam 2 into a laser beam focal line 2b, viewed along the beam propagation direction. As shown in FIG. 3A, laser 3 (not shown) emits laser beam 2, at the beam incidence side of the optical assembly 6 referred to as 2a, which is incident onto the optical assembly 6. The optical assembly 6 turns the incident laser beam into an extensive laser beam focal line 2b on the output side over a defined expansion range along the beam direction (length l of the focal line). The planar substrate 1 to be processed is positioned in the beam path after the optical assembly overlapping at least partially the laser beam focal line 2b of laser beam 2. Reference 1a designates the surface of the planar substrate facing the optical assembly 6 or the laser, respectively, reference 1b designates the reverse surface of substrate 1 usually spaced in parallel. The substrate thickness (measured perpendicularly to the planes 1a and 1b, i.e., to the substrate plane) is labeled with d.

As FIG. 2A depicts, substrate 1 is aligned perpendicularly to the longitudinal beam axis and thus behind the same focal line 2b produced by the optical assembly 6 (the substrate is perpendicular to the drawing plane) and viewed along the beam direction it is positioned relative to the focal line 2b in such a way that the focal line 2b viewed in beam direction starts before the surface 1a of the substrate and stops before the surface 1b of the substrate, i.e. still within the substrate. In the overlapping area of the laser beam focal line 2b with substrate 1, i.e. in the substrate material covered by focal line 2b, the extensive laser beam focal line 2b thus generates (in case of a suitable laser intensity along the laser beam focal line 2b which is ensured due to the focusing of laser beam 2 on a section of length l, i.e. a line focus of length l) an extensive section 2c viewed along the longitudinal beam direction, along which an induced absorption is generated in the substrate material which induces a defect line or crack formation in the substrate material along section 2c. The defect line formation is not only local, but over the entire length of the extensive section 2c of the induced absorption. The length of section 2c (i.e., after all, the length of the overlapping of laser beam focal line 2b with substrate 1) is labeled with reference L. The average diameter or the average extension of the section of the induced absorption (or the sections in the material of substrate 1 undergoing the defect line formation) is labeled with reference D. This average extension D basically corresponds to the average diameter 6 of the laser beam focal line 2b, that is, an average spot diameter in a range of between about 0.1 μm and about 5 μm.

As FIG. 2A shows, substrate material transparent for the wavelength λ of laser beam 2 is heated due to the induced absorption along the focal line 2b. FIG. 2B outlines that the warming material will eventually expand so that a correspondingly induced tension leads to micro-crack formation, with the tension being the highest at surface 1a.

Concrete optical assemblies 6, which can be applied to generate the focal line 2b, as well as a concrete optical setup, in which these optical assemblies can be applied, are described below. All assemblies or setups are based on the description above so that identical references are used for identical components or features or those which are equal in their function. Therefore only the differences are described below.

As the parting face eventually resulting in the separation is or must be of high quality (regarding breaking strength, geometric precision, roughness and avoidance of re-machining requirements), the individual focal lines to be positioned on the substrate surface along parting line 5 should be preferably generated using the optical assembly described below (hereinafter, the optical assembly is alternatively also referred to as laser optics). The roughness results particularly from the spot size or the spot diameter of the focal line. In order to achieve a small spot size of, for example, 0.5 μm to 2 μm in case of a given wavelength λ of laser 3 (interaction with the material of substrate 1), certain requirements are usually be imposed on the numerical aperture of laser optics 6. These requirements are met by laser optics 6 described below.

In order to achieve the required numerical aperture, the optics preferably should, on the one hand, dispose of the required opening for a given focal length, according to the known Abbe formulae (N.A.=n sin (theta), n: refractive index of the glass to be processes, theta: half the aperture angle; and theta=arctan (D/2f); D: aperture, f: focal length). On the other hand, the laser beam should preferably illuminate the optics up to the required aperture, which is typically achieved by means of beam widening using widening telescopes between laser and focusing optics.

The spot size should not vary too strongly for the purpose of a uniform interaction along the focal line. This can, for example, be ensured (see the embodiment below) by illuminating the focusing optics only in a small, circular area so that the beam opening and thus the percentage of the numerical aperture only vary slightly.

According to FIG. 3A (section perpendicular to the substrate plane at the level of the central beam in the laser beam bundle of laser radiation 2; here, too, the center of the laser beam 2 is incident substantially perpendicular to the substrate plane, i.e. at an angle of about 0° so that the focal line 2b or the extensive section of the induced absorption 2c is parallel to the substrate normal), the laser radiation 2a emitted by laser 3 is first directed onto a circular aperture 8 which is completely opaque for the laser radiation used. Aperture 8 is oriented perpendicular to the longitudinal beam axis and is centered on the central beam of the depicted beam bundle 2a. The diameter of aperture 8 is selected in such a way that the beam bundles near the center of beam bundle 2a or the central beam (here labeled with 2aZ) hit the aperture and are completely absorbed by it. Only the beams in the outer perimeter range of beam bundle 2a (marginal rays, here labeled with 2aR) are not absorbed due to the reduced aperture size compared to the beam diameter, but pass aperture 8 laterally and hit the marginal areas of the focusing optic elements of the optical assembly 6, which is designed as a spherically cut, bi-convex lens 7 here.

Lens 7 centered on the central beam is deliberately designed as a non-corrected, bi-convex focusing lens in the form of a common, spherically cut lens. Put another way, the spherical aberration of such a lens is deliberately used. As an alternative, aspheres or multi-lens systems deviating from ideally corrected systems, which do not form an ideal focal point but a distinct, elongated focal line of a defined length, can also be used (i.e., lenses or systems which do not have a single focal point). The zones of the lens thus focus along a focal line 2b, subject to the distance from the lens center. The diameter of aperture 8 across the beam direction is approximately 90% of the diameter of the beam bundle (beam bundle diameter defined by the extension to the decrease to 1/e) and approximately 75% of the diameter of the lens of the optical assembly 6. The focal line 2b of a not aberration-corrected spherical lens 7 generated by blocking out the beam bundles in the center is thus used. FIG. 3A shows the section in one plane through the central beam, the complete three-dimensional bundle can be seen when the depicted beams are rotated around the focal line 2b.

One disadvantage of this focal line is that the conditions (spot size, laser intensity) along the focal line, and thus along the desired depth in the material, vary and that therefore the desired type of interaction (no melting, induced absorption, thermal-plastic deformation up to crack formation) may possibly only be selected in a part of the focal line. This means in turn that possibly only a part of the incident laser light is absorbed in the desired way. In this way, the efficiency of the process (required average laser power for the desired separation speed) is impaired on the one hand, and on the other hand the laser light might be transmitted into undesired deeper places (parts or layers adherent to the substrate or the substrate holding fixture) and interact there in an undesirable way (heating, diffusion, absorption, unwanted modification).

FIG. 3B-1-4 show (not only for the optical assembly in FIG. 3A, but basically also for any other applicable optical assembly 6) that the laser beam focal line 2b can be positioned differently by suitably positioning and/or aligning the optical assembly 6 relative to substrate 1 as well as by suitably selecting the parameters of the optical assembly 6: As FIG. 3B-1 outlines, the length l of the focal line 2b can be adjusted in such a way that it exceeds the substrate thickness d (here by factor 2). If substrate 1 is placed (viewed in longitudinal beam direction) centrally to focal line 2b, an extensive section of induced absorption 2c is generated over the entire substrate thickness.

In the case shown in FIG. 3B-2, a focal line 2b of length l is generated which corresponds more or less to the substrate extension d. As substrate 1 relative to line 2 is positioned in such a way that line 2b starts in a point before, i.e. outside the substrate, the length L of the extensive section of induced absorption 2c (which extends here from the substrate surface to a defined substrate depth, but not to the reverse surface 1b) is smaller than the length l of focal line 2b. FIG. 3B-3 shows the case in which the substrate 1 (viewed along the beam direction) is partially positioned before the starting point of focal line 2b so that, here too, it applies to the length l of line 2b 1>L (L=extension of the section of induced absorption 2c in substrate 1). The focal line thus starts within the substrate and extends over the reverse surface 1b to beyond the substrate. FIG. 3B-4 finally shows the case in which the generate focal line length l is smaller than the substrate thickness d so that—in case of a central positioning of the substrate relative to the focal line viewed in the direction of incidence—the focal line starts near the surface 1a within the substrate and ends near the surface 1b within the substrate (l=0.75·d).

It is particularly advantageous to realize the focal line positioning in such a way that at least one surface 1a, 1b is covered by the focal line, i.e. that the section of induced absorption 2c starts at least on one surface. In this way it is possible to achieve virtually ideal drilling or cutting avoiding ablation, feathering and particulation at the surface.

FIG. 4 depicts another applicable optical assembly 6. The basic construction follows the one described in FIG. 3A so that only the differences are described below. The depicted optical assembly is based the use of optics with a non-spherical free surface in order to generate the focal line 2b, which is shaped in such a way that a focal line of defined length l is formed. For this purpose, aspheres can be used as optic elements of the optical assembly 6. In FIG. 4, for example, a so-called conical prism, also often referred to as axicon, is used. An axicon is a special, conically cut lens which forms a spot source on a line along the optical axis (or transforms a laser beam into a ring). The layout of such an axicon is principally known to one skilled in the art; the cone angle in the example is 10°. The apex of the axicon labeled here with reference 9 is directed towards the incidence direction and centered on the beam center. As the focal line 2b of the axicon 9 already starts in its interior, substrate 1 (here aligned perpendicularly to the main beam axis) can be positioned in the beam path directly behind axicon 9. As FIG. 4 shows, it is also possible to shift substrate 1 along the beam direction due to the optical characteristics of the axicon without leaving the range of focal line 2b. The extensive section of the induced absorption 2c in the material of substrate 1 therefore extends over the entire substrate depth d.

However, the depicted layout is subject to the following restrictions: As the focal line of axicon 9 already starts within the lens, a significant part of the laser energy is not focused into part 2c of focal line 2b, which is located within the material, in case of a finite distance between lens and material. Furthermore, length l of focal line 2b is related to the beam diameter for the available refraction indices and cone angles of axicon 9, which is why, in case of relatively thin materials (several millimeters), the total focal line may be too long, having the effect that the laser energy is again not specifically (or not totally) focused into the material.

This is the reason for an enhanced optical assembly 6 which comprises both an axicon and a focusing lens. FIG. 5A depicts such an optical assembly 6 in which a first optical element (viewed along the beam direction) with a non-spherical free surface designed to form an extensive laser beam focal line 2b is positioned in the beam path of laser 3. In the case shown in FIG. 5A, this first optical element is an axicon 10 with a cone angle of 5°, which is positioned perpendicularly to the beam direction and centered on laser beam 3. The apex of the axicon is oriented towards the beam direction. A second, focusing optical element, here the plano-convex lens 11 (the curvature of which is oriented towards the axicon), is positioned in beam direction at a distance z1 from the axicon 10. The distance z1, in this case approximately 300 mm, is selected in such a way that the laser radiation formed by axicon 10 circularly incides on the marginal area of lens 11. Lens 11 focuses the circular radiation on the output side at a distance z2, in this case approximately 20 mm from lens 11, on a focal line 2b of a defined length, in this case 1.5 mm. The effective focal length of lens 11 is 25 mm here. The circular transformation of the laser beam by axicon 10 is labeled with the reference SR.

FIG. 5B depicts the formation of the focal line 2b or the induced absorption 2c in the material of substrate 1 according to FIG. 5A in detail. The optical characteristics of both elements 10, 11 as well as the positioning of them is selected in such a way that the extension 1 of the focal line 2b in beam direction is exactly identical with the thickness d of substrate 1. Consequently, an exact positioning of substrate 1 along the beam direction is required in order to position the focal line 2b exactly between the two surfaces 1a and 1b of substrate 1, as shown in FIG. 5B.

It is therefore advantageous if the focal line is formed at a certain distance from the laser optics, and if the greater part of the laser radiation is focused up to a desired end of the focal line. As described, this can be achieved by illuminating a primarily focusing element 11 (lens) only circularly on a required zone, which, on the one hand, serves to realize the required numerical aperture and thus the required spot size, on the other hand, however, the circle of diffusion diminishes in intensity after the required focal line 2b over a very short distance in the center of the spot, as a basically circular spot is formed. In this way, the defect line formation is stopped within a short distance in the required substrate depth. A combination of axicon 10 and focusing lens 11 meets this requirement. The axicon acts in two different ways: due to the axicon 10, a usually round laser spot is sent to the focusing lens 11 in the form of a ring, and the asphericity of axicon 10 has the effect that a focal line is formed beyond the focal plane of the lens instead of a focal point in the focal plane. The length l of focal line 2b can be adjusted via the beam diameter on the axicon. The numerical aperture along the focal line, on the other hand, can be adjusted via the distance z1 axicon-lens and via the cone angle of the axicon. In this way, the entire laser energy can be concentrated in the focal line.

If the defect line formation is supposed to continue to the emergence side of the substrate, the circular illumination still has the advantage that, on the one hand, the laser power is used in the best possible way as a large part of the laser light remains concentrated in the required length of the focal line, on the other hand, it is possible to achieve a uniform spot size along the focal line—and thus a uniform separation process along the focal line—due to the circularly illuminated zone in conjunction with the desired aberration set by means of the other optical functions.

Instead of the plano-convex lens depicted in FIG. 5A, it is also possible to use a focusing meniscus lens or another higher corrected focusing lens (asphere, multi-lens system).

In order to generate very short focal lines 2b using the combination of an axicon and a lens depicted in FIG. 5A, it is preferably to select a very small beam diameter of the laser beam inciding on the axicon. This has the practical disadvantage that the centering of the beam onto the apex of the axicon should be very precise and that therefore the result is very sensitive to direction variations of the laser (beam drift stability). Furthermore, a tightly collimated laser beam is very divergent, i.e. due to the light deflection the beam bundle becomes blurred over short distances.

Turning back to FIG. 6, both effects can be avoided by inserting another lens, a collimating lens 12: this further, positive lens 12 serves to adjust the circular illumination of focusing lens 11 very tightly. The focal length f of collimating lens 12 is selected in such a way that the desired circle diameter dr results from distance z1a from the axicon to the collimating lens 12, which is equal to P. The desired width br of the ring can be adjusted via the distance z1b (collimating lens 12 to focusing lens 11). As a matter of pure geometry, the small width of the circular illumination leads to a short focal line. A minimum can be achieved at distance P.

The optical assembly 6 depicted in FIG. 6 is thus based on the one depicted in FIG. 5A so that only the differences are described below. The collimating lens 12, here also designed as a plano-convex lens (with its curvature towards the beam direction) is additionally placed centrally in the beam path between axicon 10 (with its apex towards the beam direction), on the one side, and the plano-convex lens 11, on the other side. The distance of collimating lens 12 from axicon 10 is referred to as z1a, the distance of focusing lens 11 from collimating lens 12 as z1b, and the distance of the generated focal line 2b from the focusing lens 11 as z2 (always viewed in beam direction). As shown in FIG. 1, the circular radiation SR formed by axicon 10, which incides divergently and under the circle diameter dr on the collimating lens 12, is adjusted to the required circle width br along the distance z1b for an at least approximately constant circle diameter dr at the focusing lens 11. In the case shown, a very short focal line 2b is supposed to be generated so that the circle width br of approx. 4 mm at lens 12 is reduced to approx. 0.5 mm at lens 11 due to the focusing properties of lens 12 (circle diameter dr is 22 mm in the example).

In the depicted example it is possible to achieve a length of the focal line 1 of less than 0.5 mm using a typical laser beam diameter of 2 mm, a focusing lens 11 with a focal length f=25 mm, and a collimating lens with a focal length f′=150 mm. Furthermore applies Z1a=Z1b=140 mm and Z2=15 mm.

Once the lines with defects are created (also called herein fault lines or perforations), separation can occur via: process 1) manual or mechanical stress on or around the fault line; the stress or pressure should create tension that pulls both sides of the fault line apart and break the areas that are still bonded together; or 2) the stress created in the glass at or around the fault line-during an ion-exchange process and inducing partial or total self-separation. In both cases, separation depends on several of the process parameters, such as laser scan speed, laser power, parameters of lenses, pulse width, repetition rate, etc.

The second method takes advantage of an existing edge to create a chamfer by applying stress via ion exchange process (IOX). In at least some glasses, This combination of the two methods can yield better control of the chamfer edge shape and surface texture than would otherwise be seen by using solely method 1.

Ion-exchange process (IOX) can facilitate release of the glass from the chamfered edges at or around the fault lines creating either chamfered edges or incompletely chamfered edges. Additionally, the use of the picosecond laser process on either non-chamfered edges or incompletely chamfered edges, but that have “sacrificial” regions that control damage caused by edge impact is described below. Such IOX process is similar to IOX process(s) used for glass strengthening.

FIG. 7A gives an overview of the processes described in the present application.

In the method for forming the desired shapes and edges using the short-pulse, burst pulse laser, the developed process relies on the material transparency to the laser wavelength in linear regime, or low laser intensity, which allows maintenance of a clean and high (or pristine) surface quality and on the reduced subsurface damage created by the area of high intensity around the laser focus. One of the important parameters of this process is the high aspect ratio of the defect created by the ultra-short pulsed laser. It allows creation of a long and deep fault or defect line (or perforation) that can extend from the top to the bottom surfaces of the material to be cut and chamfered. In principle, each defect can be created by a single pulse and if necessary, additional pulses can be used to increase the extension of the affected area (depth and width), or a single burst of pulses.

There are several methods to create that defect line. The optical method of forming the line focus can take multiple forms, using donut shaped laser beams and spherical lenses, axicon lenses, diffractive elements, or other methods to form the linear region of high intensity. The type of laser (picosecond, femtosecond, etc.) and wavelength (IR, green, UV, etc.) can also be varied, as long as sufficient optical intensities are reached to create breakdown of the substrate material.

In the present embodiment an ultra-short burst pulsed laser is used to create this high aspect ratio vertical defect line (perforation or hole) in a consistent, controllable and repeatable manner. The detail of the optical setup that enables the creation of this vertical defect line is described above. This embodiment utilizes an axicon lens element in an optical lens assembly to create a region of high aspect ratio taper-free microchannel using ultra-short (picoseconds or femtosecond duration) Bessel beams. In other words, the axicon condenses the laser beam into a region of cylindrical shape and high aspect ratio (long length and small diameter). Due to the high intensity created with the condensed laser beam, nonlinear interaction of the laser electromagnetic field and the material occurs and the laser energy is transferred to the substrate. However, it is important to realize that in the areas where the laser energy intensity is not high (i.e., glass surface, glass volume surrounding the central convergence line), nothing happens to the glass as the laser intensity is below the nonlinear threshold.

As illustrated in FIGS. 1A-1C, the method to cut and separate the glass substrate is essentially based on creating a fault line on the material to be processed with an ultra-short pulsed laser. The specific chosen process parameters will depend on the material properties (absorption, CTE, stress, composition, etc.) and laser parameters chosen for processing.

In some cases, the created fault line is not enough to separate it automatically and a secondary step may be necessary. If so desired, in the case of non-chemically strengthened glass, separation can be achieved, after the creation of a defect line, by application of mechanical force, or by using an ion exchange (IOX) process to force the parts to self-separate. Either partial or total part separation can be achieved by choosing the appropriate dwell time for the part in the IOX bath.

Using the same principle illustrated in FIGS. 1A-1C to separate a glass substrate a glass substrate with flat edges, the process to produce chamfered edges can be modified as illustrated in FIG. 7B. To separate glass and to form a chamfered edge, for example, in one embodiment we create three separate planes of defect lines that intersect and define the boundaries of the shape of the chamfered or beveled edge. A different shape can be created by using, for example, just two intersecting defect line planes as illustrated in FIG. 7C, but the flat part of the edge has to be broken/separated without any defect lines. It should be possible to separate the corner at the defect line plane with the proper combination of defect line characteristics and treatment with IOX bath. For example, the defect lines may be formed at an Θ_i, with respect to the hormal to the flat surface of the glass substrate, In some embodiments angle 0°<Θ_i<90°. For example, a chamfered edge on the bottom of FIG. 7B was produced by 3 intersecting planes, each containing a plurality of defect lines.

Laser and Optical System:

For example, for the purpose of cutting glass or other transparent brittle materials, a process was developed that uses a (for example, 1064 nm, or 532 nm, or 266 nm) picosecond laser in combination with line-focus beam forming optics to create lines of damage (i.e., defect lines) in the substrates. A sample Corning® Gorilla® Glass code 2320 substrate with 0.7 mm thickness is positioned so that it is within the line-focus. With a line-focus of ˜1 mm extension, and a picosecond laser that produces output power of ˜>30 W at a repetition rate of 200 kHz (˜150 μJ/pulse), then the optical intensities in the line region can easily be high enough to create non-linear absorption in the material. A region of damaged, ablated, vaporized, or otherwise modified material is created that approximately follows the linear region of high intensity.

Note that the typical operation of such a picosecond laser creates a “burst” of pulses. (See, for example, FIGS. 8A and 8B). Each “burst” may contain multiple sub-pulses (i.e., individual pulses) of very short duration (for example, ˜10 psec). Each sub-pulse is separated in time, for example by approximately 20 nsec (50 MHz), with the time often governed by the laser cavity design. The time between each “burst” will be much longer, often ˜5 μsec, for a laser repetition rate of ˜200 kHz. The exact timings, pulse durations, and repetition rates can vary depending on the laser design. But short pulses (<15 psec) of high intensity have been shown to work well with this technique.

For example, teach burst of pulses may contain two pulses (also referred to as sub-pulses herein) or more (such as 3 pulses, 4 pulses, 5 pulses, 10 pulses, 15 pulses, 20 pulses, or more pulses within a burst) separated from each other by a duration in a range of between about 1 nsec and about 50 nsec, for example, 10 to 50 nsec (e.g., about 20 nsec, or 30 ns), and the burst repetition frequency (i.e., separation between the first pulses in two subsequent bursts) can be in a range of between about 1 kHz and about 200 kHz. The pulsed laser beam can have a wavelength selected such that the material is substantially transparent at this wavelength. Within the context of the present disclosure, a material is substantially transparent to the laser wavelength when the absorption is less than about 50% (e.g. <40%), more preferably less than 10%, and even more preferably less than about 1% per mm of material depth at this wavelength. This wavelength may be, for example, 1064 nm, 532 nm, 355 nm, or 266 nanometers. The average laser power measured at the material can be greater than 40 microJoules per mm thickness of material, for example between 40 microJoules/mm and 1000 microJoules, for example 100-900 μJ/mm, or between 100 and 650 microJoules/mm, with 200-400 μJ/mm being preferable.

For example, as illustrated in FIGS. 8A and 8B, according to the embodiments described herein the picosecond laser creates a “burst” 500 of pulses 500A, sometimes also called a “burst pulse”. Each “burst” 500 may contain multiple pulses 500A of very short duration T_d up to 100 psec (for example, 0.1 psec, 5 psec, 10 psec, 15 psec, 18 ps, 20 ps, 22 ps, 25 ps, 30 ps, 50 ps, 75 ps, or therebetween). These individual pulses 500A within a single burst 500 can also be termed “sub-pulses,” which simply denotes the fact that they occur within a single burst of pulses. The energy or intensity of each laser pulse 500A within the burst may not be equal to that of other pulses within the bust, and the intensity distribution of the multiple pulses within a burst 500 often follows an exponential decay in time governed by the laser design. Preferably, each pulse 500A within the burst 500 of the exemplary embodiments described herein are separated in time from the subsequent pulse in the burst by a duration T_p from 1 nsec to 50 nsec (e.g. 10-50 ns, or 10-30 nsec, with the time often governed by the laser cavity design. For a given laser, the time separation T_p between each pulses (pulse-to-pulse separation) within a burst 500 is relatively uniform (±10%). For example, in some embodiments, each pulse is separated in time from the subsequent pulse by approximately 20 nsec (50 MHz). For example, for a laser that produces pulse separation T_p of about 20 nsec, the pulse to pulse separation T_p within a burst is maintained within about ±10%, or is about ±2 nsec. The time between each “burst” (i.e., time separation T_b between bursts) will be much longer (e.g., 0.25≤T_b≤1000 microseconds, for example 1-10 microseconds, or 3-8 microseconds,). For example in some of the exemplary embodiments of the laser described herein it is around 5 microseconds for a laser repetition rate or frequency of about 200 kHz. The laser repetition rate is also referred to as burst repetition frequency herein, and is defined as the time between the first pulse in a burst to the first pulse in the subsequent burst. In other embodiments, the burst repetition frequency is in a range of between about 1 kHz and about 4 MHz. More preferably, the laser repetition rates can be, for example, in a range of between about 10 kHz and 650 kHz. The time T_b between the first pulse in each burst to the first pulse in the subsequent burst may be 0.25 microsecond (4 MHz repetition rate) to 1000 microseconds (1 kHz repetition rate), for example 0.5 microseconds (2 MHz repetition rate) to 40 microseconds (25 kHz repetition rate), or 2 microseconds (500 kHz repetition rate) to 20 microseconds (50 kHz repetition rate). The exact timings, pulse durations, and repetition rates can vary depending on the laser design, but short pulses (T_d<20 psec and preferably T_d≤15 psec) of high intensity have been shown to work particularly well.

The required energy to modify the material can be described in terms of the burst energy—the energy contained within a burst (each burst 500 contains a series of pulses 500A), or in terms of the energy contained within a single laser pulse (many of which may comprise a burst). For these applications, the energy per burst can be from 25-750 μJ, more preferably 50-500 μJ, 50-250 μu. In some embodiments the energy per burst is 100-250 μJ. The energy of an individual pulse within the burst will be less, and the exact individual laser pulse energy will depend on the number of pulses 500A within the burst 500 and the rate of decay (e.g., exponential decay rate) of the laser pulses with time as shown in FIGS. 8A and 8B For example, for a constant energy/burst, if a burst pulse contains 10 individual laser pulses 500A, then each individual laser pulse 500A will contain less energy than if the same burst pulse 500 had only 2 individual laser pulses.

The use of laser capable of generating such burst pulses is advantageous for cutting or modifying transparent materials, for example glass. In contrast with the use of single pulses spaced apart in time by the repetition rate of the laser, the use of a burst pulse sequence that spreads the laser energy over a rapid sequence of sub-pulses (that comprise a burst 500) allows access to larger timescales of high intensity interaction with the material than is possible with single-pulse lasers. While a single-pulse can be expanded in time, as this is done the intensity within the pulse must drop as roughly one over the pulse width. Hence if a 10 psec single pulse is expanded to a 10 nsec pulse, the intensity drop by roughly three orders of magnitude. Such a reduction can reduce the optical intensity to the point where non-linear absorption is no longer significant, and light material interaction is no longer strong enough to allow for cutting. In contrast, with a burst pulse laser, the intensity during each sub-pulse 500A (or a pulse within 500A the burst 500) can remain very high—for example three 10 psec pulses 500A spaced apart in time by approximately 10 nsec still allows the intensity within each pulse to be approximately three times higher than that of a single 10 psec pulse, while the laser is allowed to interact with the material over a timescale that is now three orders of magnitude larger. This adjustment of multiple pulses 500A within a burst thus allows manipulation of time-scale of the laser-material interaction in ways that can facilitate greater or lesser light interaction with a pre-existing plasma plume, greater or lesser light-material interaction with atoms and molecules that have been pre-excited by an initial or previous laser pulse, and greater or lesser heating effects within the material that can promote the controlled growth of microcracks. The required amount of burst energy to modify the material will depend on the substrate material composition and the length of the line focus used to interact with the substrate. The longer the interaction region, the more the energy is spread out, and the higher the burst energy that will be required.

Hole or Damage Track Formation:

If the substrate or transparent material has sufficient stress (e.g. with post-ion exchanged glass), then the part will spontaneously crack and separate along the path of perforated damage traced out by the laser process. However, if there is not a lot of stress inherent to the substrate (for example, as is the case of Corning Eagle XG® compositions), then the picosecond laser will simply form damage tracks (i.e., defect lines or perforations) in the piece. These damage tracks generally take the form of holes with interior dimensions 0.5-1.5 μm, or 0.2 microns to 2 microns (for example, in some embodiments, 0.2 to 0.7 microns, or 0.3 to 0.6 microns). Preferably the holes are very small (single microns or less) in dimension.

The holes or defect lines can perforate the entire thickness of the material, and may or may not be a continuous opening throughout the depth of the material. FIG. 1C shows an example of such tracks perforating the entire thickness of a piece of 700 μm thick unstrengthened Gorilla® Glass substrate. The perforations or damage tracks are observed through the side of a cleaved edge. The tracks through the material are not necessarily through holes—there are often regions of glass that plug the holes, but they are generally small in size.

The lateral spacing (pitch) between these holes is determined by the pulse rate of the laser as the substrate is translated underneath the focused laser beam. Only a single picosecond laser pulse burst is necessary to form an entire hole, although multiple pulses may be used if desired. To form holes at different pitches, the laser can be triggered to fire at longer or shorter intervals. For cutting operations, the laser triggering generally is synchronized with the stage driven motion of the part beneath the beam, so laser pulses are triggered at a fixed interval, such for example as every 1 μm, or every 5 μm. The exact spacing is determined by the material properties that facilitate crack propagation from perforated hole to perforated hole, given the stress level in the substrate. However, in contrast to cutting a substrate, it is also possible to use the same method to only perforate the material. In this case, the holes are separated, for example, with a 5 μm pitch.

The laser power and lens focal length (which determines the defect line length and hence power density) are particularly critical parameters to ensure full penetration of the glass and low micro-cracking.

In general, the higher the available laser power, the faster the material can be cut with the above process. Processes disclosed herein can cut glass at a cutting speed of 0.25 m/sec, or faster. A cut speed (or cutting speed) is the rate the laser beam moves relative to the surface of the transparent material (e.g., glass) while creating multiple holes or modified regions.) High cut speeds, such as, for example 250 mm/sec 400 mm/sec, 500 mm/sec, 750 mm/sec, 1 m/sec, 1.2 m/sec, 1.5 m/sec, or 2 m/sec, or even 3.4 m/sec to 4 m/sec are often desired in order to minimize capital investment for manufacturing, and to optimize equipment utilization rate. The laser power is equal to the burst energy multiplied by the burst repetition frequency (rate) of the laser. In general, to cut such glass materials at high cutting speeds, the damage tracks are typically spaced apart by 1-25 microns, in some embodiments the spacing is preferably 3 microns or larger—for example 3-12 microns, or for example 5-10 microns.

For example, to achieve a linear cutting speed of 300 mm/sec, 3 micron hole pitch corresponds to a pulse burst laser with at least 100 kHz burst repetition rate. For a 600 mm/sec cutting speed, a 3 micron pitch corresponds to a burst-pulsed laser with at least 200 kHz burst repetition rate. A pulse burst laser that produces at least 40 μJ/burst at 200 kHz, and cuts at a 600 mm/s cutting speed needs to have laser power of at least 8 Watts. Higher cut speeds therefore require even higher laser powers.

For example a 0.4 m/sec cut speed at 3 μm pitch and 40 μJ/burst would require at least a 5 Watt laser, a 0.5 m/sec cut speed at 3 μm pitch and 40 μJ/burst would require at least a 6 Watt laser. Thus, preferably the laser power of the pulse burst ps laser is 6 watts or higher, more preferably at least 8 Watts or higher, and even more preferably at least 10 W or higher. For example in order to achieve a 0.4 m/sec cut speed at 4 μm pitch (defect lines pacing, or between damage tracks spacing) and 100 μJ/burst one would require at least a 10 Watt laser, and to achieve a 0.5 msec cut speed at 4 μm pitch and 100 μJ/burst one would require at least a 12 Watt laser. For example, to achieve a cut speed of 1 m/sec at 3 μm pitch and 40 μJ/burst one would require at least a 13 Watt laser. Also for example 1 m/sec cut speed at 4 μm pitch and 400 μJ/burst would require at least a 100 Watt laser. The optimal pitch between damage tracks and the exact burst energy is material dependent, and can be determined empirically. However, it should be noted that raising the laser pulse energy or making the damage tracks at a closer pitch are not conditions that always make the substrate material separate better or with improved edge quality. Too dense a pitch (for example <0.1 micron, in some exemplary embodiments <1 μm, or in some embodiments <2 μm) between damage tracks can sometimes inhibit the formation of nearby subsequent damage tracks, and often can inhibit the separation of the material around the perforated contour, and may also result in increased unwanted micro cracking within the glass. Too long a pitch (>50 μm, and in some glasses >25 μm or even >20 μm) may result in “uncontrolled microcracking”—i.e., where instead of propagating from hole to hole the microcracks propagate along a different path, and cause the glass to crack in a different (undesirable) direction. This may ultimately lower the strength of the separated glass part, since the residual microcracks will acts as flaws which weaken the glass. Too high a burst energy (e.g., >2500 μJ/burst, and in some embodiments >500 μJ/burst) used to form each damage track can cause “healing” or re-melting of already formed microcracks of adjacent damage tracks, which will inhibit separation of the glass. Accordingly, it is preferred that burst energy be <2500 μJ/burst, for example, ≤500 μJ/burst. Also, using a burst energy that is too high can cause formation of microcracks that are extremely large and create flaws which reduce the edge strength of the parts after separation. Too low a burst energy (<40 μJ/burst) may result in no appreciable damage track formed within the glass, and hence very high separation strength or complete inability to separate along the perforated contour.

Typical exemplary cutting rates (speeds) enabled by this process are, for example, 0.25 msec and higher. In some embodiments the cutting rates are at least 300 mm/sec. In some embodiments described herein the cutting rates are at least 400 mm/sec, for example 500 mm/sec to 2000 mm/sec, or higher. In some embodiments the picosecond (ps) laser utilizes pulse bursts to produce defect lines with periodicity between 0.5 microns and 13 microns, e.g. 0.5 and 3 microns. In some embodiments the pulsed laser has laser power of 10 W-100 W and the material and/or the laser beam are translated relative to one another at a rate of at least 0.25 m/sec, for example at the rate of 0.25 to 0.35 m/sec, or 0.4 m/sec to 5 m/sec. Preferably, each pulse burst of the pulsed laser beam has an average laser energy measured at the workpiece greater than 40 microJoules per burst mm thickness of workpiece. Preferably, each pulse burst of the pulsed laser beam has an average laser energy measured at the workpiece greater of less than 2500 microJoules per burst per mm thickness of workpiece, and preferably lass than about 2000 microJoules per burst per mm, and in some embodiments less than 1500 microJoules per burst per mm thickness of workpiece, for example not more than 500 microJoules per burst per mm thickness of workpiece.

It has been discovered that much higher (5 to 10 times higher) volumetric pulse energy density (μj/μm³) is required for perforating alkaline earth boro-aluminosilicate glasses with low or no alkali containing glasses as compared to that for glasses such as Corning Gorilla®. This can be achieved, for example, by utilizing pulse burst lasers, preferably with at least 2 pulses per burst and providing volumetric energy densities within the alkaline earth boro-aluminosilicate glasses (with low or no alkali) of about 0.05 μJ/μm³ or higher, e.g., at least 0.1 μJ/μm³, for example 0.1-0.5 μJ/μm³.

Accordingly, it is preferable that the laser produces pulse bursts with at least 2 pulses per burst. For example, in some embodiments the pulsed laser has laser power of 10 W-150 W (e.g., 10-100 W) and produces pulse bursts with at least 2 pulses per burst (e.g., 2-25 pulses per burst). In some embodiments the pulsed laser has the power of 25 W-60 W, and produces pulse bursts with at least 2-25 pulses per burst, and periodicity or distance between the adjacent defect lines produced by the laser bursts is 2-10 microns. In some embodiments the pulsed laser has laser power of 10 W-100 W, produces pulse bursts with at least 2 pulses per burst, and the workpiece and the laser beam are translated relative to one another at a rate of at least 0.25 m/sec. In some embodiments the workpiece and/or the laser beam are translated relative to one another at a rate of at least 0.4 m/sec.

For example, for cutting 0.7 mm thick non-ion exchanged Corning code 2319 or code 2320 Gorilla glass, it is observed that pitches of 3-7 microns can work well, with pulse burst energies of about 150-250 μJ/burst, and burst pulse numbers that range from 2-15, and preferably with pitches of 3-5 microns and burst pulse numbers (number of pulses per burst) of 2-5.

At 1 m/sec cut speeds, the cutting of thick Eagle XG® glass typically requires utilization of laser powers of 15-84 Watts, with 30-45 Watts often being sufficient. In general, across a variety of glass and other transparent materials, applicants discovered that laser powers between 10 and 100 W are preferred to achieve cutting speeds from 0.2-1 m/sec, with laser powers of 25-60 Watts being sufficient (and optimum) for many glasses. For cutting speeds of 0.4 m to 5 m/sec, laser powers should preferably be 10 W-150 W, with burst energy of 40-750 μJ/burst, 2-25 bursts per pulse (depending on the material that is cut), and hole separation (or pitch) of 3 to 15 μm, or 3-10 μm. The use of picosecond pulse burst lasers would be preferable for these cutting speeds because they generate high power and the required number of pulses per burst. Thus, according to some exemplary embodiments, the pulsed laser produces 10-100 W of power, for example 25 W to 60 Watts, and produces pulse bursts at least 2-25 pulses per burst and the distance between the defect lines is 2-15 microns; and the laser beam and/or workpiece are translated relative to one another at a rate of at least 0.25 m/sec, in some embodiments at least 0.4 m/sec, for example 0.5 m/sec to 5 m/sec, or faster.

Cutting and Separating Chamfered Edges:

Chamfer Method 1:

Different conditions were found that allow the separation of chamfered edges using unstrengthened Gorilla® Glass, specifically Corning code 2320. The first method is to use the picosecond laser only to create defect lines and forming a fault line following the desired shape (in this case a chamfered edge). After this step, mechanical separation can be accomplished by using a breaking plier, manually bending the part, or any method that creates tension that initiates and propagates the separation along the fault line. To create chamfered edges with defect lines in 700 μm thick unstrengthened (pre-ion exchanged) Gorilla® Glass and mechanically separate the parts, the best results were found for the following optics and laser parameters: Picosecond laser (1064 nm)

Input beam diameter to axicon lens ˜2 mm

Axicon angle=10 degrees

Initial collimating lens focal length=125 mm

Final objective lens focal length=40 mm

Focus set to be at z=0.7 mm (i.e. line focus set to be centered with regard to the glass thickness)

Laser power at 100% of full power (˜40 Watts)

Pulse repetition rate of the laser=200 kHz.

Pitch=5 μm

3 pulses/burst

Single pass per defect line

Sacrificial edges:

The presence of the remaining defect line inside the glass can be beneficial to arrest the propagation of cracks when the edge is impacted. In this case the defect line planes can be used to serve as damage arrest locations, in effect creating a “sacrificial” edge part of the region of glass that is on the outside relative to the defect lines. In fact, creation of sacrificial edges that simply have an extra defect line to the interior of the separated edge, or a set of defect lines that intersect to form a more complex interior bevel inside of the true edge, may be a method of creating increased part reliability without the need for any physical chamfer feature on the outside edge of the part, nor any mechanical grinding and polishing to create that feature. Some options for this type of sacrificial edge are shown in FIG. 9. Since the picosecond laser process described above creates each defect line in a single pass and at speeds of up to 1 m/s, it is very easy and cost-effective to create these extra “damage stop” lines. It is noted that other laser systems may also be utilized to create a defect line by forming a laser beam focal line. For example, a picosecond laser operating at 532 nm may also be utilized.

Chamfer Method 2:

Exemplary Formation of Defect Lines:

To create chamfered edges with defect lines in 700 μm thick unstrengthened Gorilla® Glass and to separate the parts, according to one embodiment we utilized the following optics and laser parameters: Picosecond laser (1064 nm)

Input beam diameter to axicon lens ˜2 mm

Axicon angle=10 degrees

Initial collimating lens focal length=125 mm

Final objective lens focal length=40 mm

Focus set to be at z=0.7 mm (i.e. line focus set to be centered with regard to the glass thickness)

Laser power at 100% of full power (˜40 Watts)

Pulse repetition rate of the laser=200 kHz.

Pitch=5 μm

3 pulses/burst

Single pass per defect line

The separation of the outside glass edge pieces formed by the defect lines need not be done a mechanical force. Since the pre-ion exchanged glass is generally being cut and then sent to chemical strengthening afterwards (ion exchange), we discovered that ion exchange itself can create enough stress to pop the small chamfer regions or corner pieces off of the part. The introduction of new ions into the glass surface can create enough stress between the perforations or defect lines to cause the outside corner pieces to pop off, or the high temperature salt bath can create enough thermal stress to induce these small pieces to fall off. In either case, the ultimate result is an edge that better follows the existing defect lines and thus forms the desired chamfer shape. Without being bound by theory, applicants believe the ions entering the glass through the glass surface(s) will create high stress concentrations regions near the surfaces, and especially near the corners of the glass part. For example, there will be very high levels of tensile stress created near the corners of any part, which creates a condition that drives separation of glass along any pre-perforated zones (zones with defect lines) in these corners. See FIGS. 10A-10C. More specifically, FIG. 10A is an illustration of a cut part with internal defect lines being placed into ion-exchange, which adds enough stress to remove the perforated edges and form the desired edge chamfer. FIG. 10B illustrates the use of ion exchange (IOX) to release chamfered corners, similar to the illustration shown in FIG. 10A, but with only two defect line planes. FIG. 10C is an illustration of a chamfer with many angles (more than 3 defect line planes). It is noted that other laser systems may also be utilized to create a defect line by forming a laser beam focal line. For example, a picosecond laser operating at 532 nm may also be utilized.

The picosecond material (e.g., glass) perforation portion method has been combined with the IOX exchange to create a controlled separation guided by the defect line planes. More specifically, ion exchange (IOX) process is a process where silicate glass is immersed into molten alkali salt (e.g. potassium nitrate), at temperatures below glass transition temperature. During emersion, alkali ions from the glass close enough to the surface are exchanged for those from the molten salt. This process can be applied to transparent materials, for example thin glass (e.g., <2 mm), or curved glass, and the resultant glass has strong edges and of very high quality. The stress profile created by the ion exchange releases the perforated edges—i.e., the glass separates along the fault lines, creating chamfers. Typical treatment temperatures suitable for an IOX bath are >300° C., for example 400° C., or 450° C., or 500° C., or 550° C., or therebetween. According to some embodiments the treatment time for ion exchange bath that results in a good quality completely chamfered edges is >20 min, for example 30-60 min. For a partial chamfering the treatment time may be, for example 10-20 min or 30 min. The ion exchange process for chamfer creation or for creations of corners is similar or identical to the one used for glass strengthening, but when used for removal of glass along perforations (i.e., along defect line(s)) for making chamfers), the perforated glass part can be subjected to the ion exchange bath for a shorter time than the time used for IOX glass strengthening (e.g., for less than 1 hour, or for example 10 min to 40 min). While not wishing to be bound by theory, applicants believe that the mechanism for IOX chamfering is material separation along defect lines caused by the creation of regions of compressive stress (CS) and/or Central Tension (CT), also referred to as tensile stress, and which occurs within the material. Prior to the IOX bath the samples are heated to prevent thermal shock, which can shatter a glass part, and to minimize bath thermal loading (i.e., cooling) effects. The pre-heating temperature depends on the temperature of the salt bath. The IOX bath creates enough stress to cause the outside corner pieces or perforated areas to pop off, along or near the defect line(s).

FIG. 11 illustrates results of several experiments (embodiments) that utilized an IOX process of varying amounts of time to remove glass along the fault lines (defect lines) to create chamfers. The horizontal axis of FIG. 11 depicts ion exchange bath immersion time, the vertical axis depicts Central Tension (CT) as the function of ion exchange bath immersion time, and also percentage of glass release (glass separation). More specifically the right side of this figure depicts the level of compressive stress (CS), in Mega Pascals, and the left side depicts the depth of compressive stress layer in (DOL) resulting from the IOX bath for chamfer creation. As FIG. 11 indicates, at least for some embodiments, CS after about 15 min of the IOX bath exposure is about 900 to 1000 Mega Pascals. It is noted that, in these exemplary embodiments, full release of glass (full glass separation) along the fault lines occurs when central tension (CT) of the glass part is about 20 MPa, at or near CS peak, which occurs after about 15-20 min of the IOX bath exposure. In the corners of the glass articles, at the same time, the tensile stress can be significantly higher. For example, finite element models indicate that tensile stress in these corner regions can be higher than 200 MPa (e.g. 250 MPa) which facilitates corner separation(s).

FIG. 12A illustrates chamfers created by edge chamfering process using defect lines and then 15 min long IOX bath peeling. First, the picosecond laser is focused at an angle and a defect line is created on an angled plane. Then the perforated glass sample was immersed into an IOX bath, and a strip of glass separated along defect line, forming at least a partial chamfer. More specifically, according to some embodiments, 0.7 mm thick unstrengthened Gorilla® Glass (143 mm×75 mm) with the internal defect lines (perforations) produced by the picosecond laser as described above was preheated to 420° C. and then placed into ion-exchange bath a 420° C. for 15 min. It was then removed, rinsed in deionized water (DI), air dried, and evaluated. We observed that in about 50% of perforated edges were removed. That is, partial chamfering was successfully achieved by subjecting the glass samples to IOX bath for 15 min. Some of the edges were fully removed, some were partially removed (partial chamfering). As stated above, some exemplary embodiments of the chamfers created by this process are shown, for example, in FIG. 12A.

FIG. 12B illustrates chamfers created by edge chamfering process using defect lines and then 60 min long IOX bath peeling. First, the picosecond laser is focused at an angle and a defect line is created on an angled plane. Then the perforated sample was immersed into an IOX bath, and at least strip of glass separated along defect line, forming a chamfer. More specifically, According to some embodiments, cut glass (0.7 mm thick unstrengthened Gorilla® Glass, 143 mm×75 mm) with the internal defect lines was preheated to 420° C., placed into ion-exchange bath at 420° C. for 60 min, then removed, rinsed in deionized water (DI), air dried, and evaluated. We observed full (100%) removal of perforated portions (glass along the defect lines was popped off) and an excellent edge quality in the resultant chamfered edge.

FIG. 12C illustrates chamfers created by edge chamfering process using defect lines and then 30 min long IOX bath peeling. First, the picosecond laser is focused at an angle and a defect line is created on an angled plane. Then the perforated sample was immersed into an IOX bath, and at least one strip of glass separated along defect line, forming a chamfer. More specifically, according to other embodiments, cut glass (0.7 mm thick unstrengthened Gorilla® Glass 143 mm×75 mm) with the internal defect lines was preheated to 420° C., and then placed into ion-exchange bath at 420° C. for 30 min. The perforated edges were separated and the glass with chamfered edges was then removed, in deionized water (DI), air dried and evaluated. During evaluation we observed full removal of perforated portions (100%), and an excellent edge quality in the chamfered edge. Some exemplary embodiments of the chamfers created by this process are shown, for example, in FIG. 12C.

Preferably, according to some embodiments, a method of making a chamfered and strengthened glass article, comprises:

(i) providing a glass article having a select contour and a glass surface, and a perforated (defect lines) edge and/or corner;

(ii) removing the a portion of the glass adjacent to the perforated edge and/or corner by subjecting the article to a first ion-exchange process (for example, for 20 to 60 min) to complete a full-body cut of the material between the perforations;

(iii) rinsing the glass article,

(iv) air drying the rinsed glass article; and then

(v) subjecting the glass article to a second ion-exchange process (for example, for at least 4 hrs, or for 4.5 to 10 hrs, and in some embodiments for 4.5 to 6 hrs) to strengthen the glass article and improve the resistance of the glass article to subsequent damage.The use of the two-step ion exchange process ensures that any glass pieces removed are confined to the first bath, preventing contamination of the second bath. This extends the service life of the second ion exchange bath. By washing and rinsing the parts after the first bath, this method also reduces the problems that arise from small glass pieces adhering to the surface of the cut parts, which may shield small regions of the glass surfaces from being strengthened in the ion exchange process.Either a IOX or DIOX process (dual stage IOX exchange process) can be utilized in step (ii) as the first ion-exchange process for removing the portion of the glass adjacent to the perforated edge and/or corner, to create the chamfered glass article. Either a IOX or DIOX process can also be utilized thereafter in the second ion exchange step (step (v), above) to fully strengthen glass to improve the resistance of the glass article to subsequent damage. It is noted that the second ion exchange step (the strengthening IOX step (v) described above), is significantly longer than the ion exchange process of step (ii) that separates or releases glass to create chamfers or bevels. For example, the time for the first ion exchange bath in the IOX step that facilitates glass release and bevel/chamfer formation in step (ii) may be 3 to 18 times shorter than the time for ion exchange bath in the IOX step (v) required to create strengthened or tempered glass (second ion exchange process).

A DIOX process is an ion exchange process where a chemically strengthenable glass is introduced into a first salt bath, and then into a second salt bath. The first salt bath and the second salt bath can comprise two different salt species, or they can be comprised of the same salt species (e.g. Li, Na, K, Cs, Rb). For example the first bath can be pure KCl₂ and the second salt bath can be KCl₂, with a different concentration of contaminates such as Na that is exchange from the glasses processed. It is also possible to utilize salt baths of differing species. This method helps extend the operational life of the salt baths.

Preferably the first ion exchange process is performed for 10 min to 120 min. More preferably to produce fully chamfered edges or corners the first ion exchange process is performed for 20 min to 120 min, for example, 20 min, 25 min, 30 min, 45 min, 60 min or 75 min. More preferably to produce fully chamfered edges or corners the first ion exchange process is performed for 20 min to 120 min, for example, 20 to 60 min, or 30 to 60 min, and according to some embodiments 30 to 50 min, or 30 to 40 min.

Also, either a IOX or DIOX process (dual stage IOX exchange process) can be utilized to strengthen the chamfered glass articles. For example, the method may include: a) providing a laser processed perforated glass article (e.g., alumina silicate glass); b) separating the glass along the fault line(s) via IOX bath and creating a chamfered edge and/or corner thereby creating a chamfered glass article, preferably for a time t such that 20 min≤t≤60 min, the chamfered glass having a plurality of first metal ions within the outer region; c) ion exchanging a first portion of the plurality of first metal ions in the glass with a plurality of second metal ions in a primary salt bath, wherein the primary salt bath is diluted with a first concentration of the first metal ions; and d) ion exchanging a second portion of the plurality of the first metal ions in the glass with a plurality of the second metal ions in a secondary salt bath, wherein the secondary salt bath has a second concentration of the first metal that is less than the first concentration. According to some embodiments the first metal is one of lithium, sodium, potassium, and cesium and the second metal is one of sodium, potassium, cesium, and rubidium.

Prior to immersion in the primary salt bath of the IOX bath, chamfered glass samples are preheated to prevent thermal shock and minimize bath loading (i.e., cooling) effects. The pre-heating temperature depends on the temperature of the salt bath. The sample is then immersed in the primary bath, and the primary ion exchange stage is carried out at a first predetermined temperature for a time sufficient to achieve a desired depth of layer, at which point the glass sample is removed from the primary salt bath and allowed to cool. The glass sample may be rinsed with water to remove residual dried salt and to prevent contamination of the secondary stage bath, and then dried to remove residual moisture. The glass may optionally be annealed between respective immersions in the primary and secondary salt baths (i.e., between steps c and d).

Before immersion in the secondary ion exchange bath, the glass sample is again pre-heated. The secondary ion exchange stage is carried out in the secondary stage bath having either fresh salt (or a significantly lower dilution rate than the primary stage) to increase or stabilize the compressive stress created in the primary stage ion exchange. The sample is immersed in the bath, and the secondary ion exchange stage is carried out at a second predetermined temperature for a time sufficient to achieve the desired compressive stress, at which point the glass sample is removed from the secondary salt bath and allowed to cool. The glass sample may be rinsed with water to remove residual dried salt and to prevent contamination of the secondary stage bath, and then dried to remove residual moisture. For both the primary and secondary ion exchange baths, the salt (or salts) is melted and heated to a predetermined temperature, typically in a range from about 380° C. up to about 450° C., and the bath is held at that temperature to stabilize for a predetermined time.

The methods described above provide the following benefits that may translate to enhanced laser processing capabilities and cost savings and thus lower cost manufacturing. In the current embodiment, the cutting and chamfering processes offer:

Chamfering or fully cutting parts with chamfered edges: the disclosed method is capable of completely separating/cutting Gorilla® Glass and other types of transparent glasses in a clean and controlled fashion. Full separation and/or edge chamfering were demonstrated using both methods. With method 1, the part is cut to size or separated from glass matrix with a chamfered edge and, in principle, no further post processing. With the second method, the part is already cut to size, perforated and IOX process is used to chamfer the edges.

Reduced subsurface defects: due to the ultra-short pulse interaction between laser and material, there is little thermal interaction and thus a minimal heat affected zone that can result in undesirable stress and micro-cracking. In addition, the optics that condenses the laser beam into the glass creates defect lines that are typically 2 to 5 microns diameter on the surface of the part. After separation, the subsurface damage can be as low as <90 μm, for example <75 μm, <50 μm, or <40 μm. This has great impact on the edge strength of the part and reduces the need to further grind and polish the edges, as these subsurface damages can grow and evolve into micro-cracks when the part is submitted to tensile stress and weaken the strength of the edge.

Process cleanliness: the exemplary embodiment methods of the disclosure are capable of chamfering glass in a clean and controlled fashion. It is very problematic to use conventional ablative processes because they generate a lot of debris. Such ablation generated debris is problematic, because it can be hard to remove even with various cleaning and washing protocols. Any adhered particulates can cause defects for later processes where the glass is coated or metalized to create thin film transistors, etc. The characteristics of the laser pulses and the induced interactions with the material of the disclosed method avoid this issue because they occur in a very short time scale and the material transparency to the laser radiation minimizes the induced thermal effects. Since the defect line is created within the object, the presence of debris and adhered particles during the cutting step is virtually eliminated. If there are any particulates resulting from the created defect line, they are well contained until the part is separated.

Elimination of Process Steps

The process to fabricate glass plates from the incoming glass panel to the final size and shape involves several steps that encompass cutting the panel, cutting to size, finishing and edge shaping, thinning the parts down to their target thickness, polishing, and even chemically strengthening in some cases. Elimination of any of these steps will improve manufacturing cost in terms of process time and capital expense. The presented method may reduce the number of steps by, for example:

Reduced debris and edge defects generation—potential elimination of washing and drying stations.

Cutting the sample directly to its final size with shaped edges, shape and thickness-reducing or eliminating need for mechanical finishing lines and a non-value added cost associated with them.

The relevant teachings of all patents, published applications and references cited herein are incorporated by reference in their entirety.

While exemplary embodiments have been described herein, it will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the scope of the invention encompassed by the appended claims.

Claims

1. A method of chamfering a material comprising: focusing a pulsed laser beam into a laser beam focal line, viewed along the beam propagation direction;directing the laser beam focal line into the material at a first angle of incidence to the material, the laser beam focal line generating an induced absorption within the material, the induced absorption producing a defect line along the laser beam focal line within the material;translating the material and the laser beam relative to each other, thereby laser drilling a plurality of defect lines along a first plane at the first angle within the material;directing the laser beam focal line into the material at a second angle of incidence to the material, the laser beam focal line generating an induced absorption within the material, the induced absorption producing a defect line along the laser beam focal line within the material;translating the material and the laser beam relative to each other, thereby laser drilling a plurality of defect lines along a second plane at the second angle within the material, the second plane intersecting the first plane, andseparating the material along the first plane and the second plane by applying a strengthening ion-exchange process to the material, wherein during separating of the material along the first plane and the second plane the strengthening ion-exchange process is applied to the material for time t, wherein 10 min≤t≤120 min, further comprising subjecting the material to a second ion-exchange process to strengthen the material and improve the resistance of material to subsequent damage.

2. The method of claim 1, wherein directing the laser beam focal line into the material at a first angle of incidence to the material is directed to a first surface of the material and directing the laser beam focal line into the material at a second angle of incidence to the material is directed to a second surface of the material.

3. The method of claim 2, wherein the material separates along the first plane and the second plane to define a chamfered edge.

4. The method of claim 1, further comprising: directing the laser beam focal line into the material at a third angle of incidence to the material, the laser beam focal line generating an induced absorption within the material; the induced absorption producing a defect line along the laser beam focal line within the material; andtranslating the material and the laser beam relative to each other, thereby laser drilling a plurality of defect lines along a third plane at the third angle within the material;wherein at least two of the first plane, second plane, and third plane intersect.

5. The method of claim 4, wherein the material separates along the first plane, the second plane, and the third plane to define a chamfered edge.

6. The method of claim 4, wherein at least one of the first angle, second angle, and third angle is perpendicular to a surface of the material.

7. The method of claim 1, wherein the pulse duration is in a range of between greater than about 1 picosecond and less than about 100 picoseconds.

8. The method of claim 7, wherein the pulse duration is in a range of between greater than about 5 picoseconds and less than about 20 picoseconds.

9. The method of claim 1, wherein the repetition rate is in a range of between about 1 kHz and 2 MHz.

10. The method of claim 9, wherein the repetition rate is in a range of between about 10 kHz and 650 kHz.

11. The method of claim 1, wherein the pulsed laser beam has an average laser power measured at the material greater than 40 μJ per mm thickness of the original material.

12. The method of claim 1, wherein the pulses are produced in bursts of at least two pulses separated by a duration in a range of between 1 nsec and 50 nsec, and the burst repetition frequency is in a range of between 1 kHz and 650 kHz.

13. The method of claim 12, wherein the pulses are separated by a duration of 20 nsec.

14. The method of claim 1, wherein the pulsed laser beam has a wavelength selected such that the material or the work piece is substantially transparent at this wavelength.

15. The method of claim 1, wherein the laser beam focal line has a length in a range of between about 0.1 mm and about 100 mm.

16. The method of claim 1, wherein the laser beam focal line has an average spot diameter in a range of between about 0.1 μm and about 5 μm.

17. The method of claim 1, wherein the material or the work piece comprises non-strengthened glass.

18. The method of claim 1, wherein during separating of the material along the first plane and the second plane the strengthening ion-exchange process is applied to the material for time t, wherein 20 min≤t≤60 min.

19. The method of claim 1, wherein during separating of the material along the first plane and the second plane the strengthening ion-exchange process is applied to the material at a temperature of 400° to 500° C.

20. The method of claim 1, wherein the laser beans focal line has a length extending along the beam propagation direction that is in a range of between about 0.1 mm and about 100 mm and an average spot diameter that is in a range of between about 0.1 μm and about 5 μm.

21. A method of chamfering a material comprising: focusing a pulsed laser beam into a laser beam focal line, viewed along the beam propagation direction; andlaser drilling a plurality of defect lines along each of N planes within the material by, for each of the N planes:directing the laser beam focal line into the material at a corresponding angle of incidence to the material, the laser beam focal line generating an induced absorption within the material, the induced absorption producing a defect line along the laser beam focal line within the material; andtranslating the material and the laser beam relative to each other, thereby laser drilling the plurality of defect lines along the corresponding plane of the N planes; andseparating the material along at least one of said N planes by applying an ion-exchange process to the material.

22. A method of making a chamfered and strengthened glass article, comprises: (i) providing a glass article having a select contour and a glass surface, and a perforated edge and/or corner;(ii) removing a portion of the glass adjacent to the perforated edge and/or corner by subjecting the article to a first ion-exchange process to complete a full-body cut between perforations;(iii) rinsing the glass article,(iv) air drying the rinsed glass article; and then(v) subjecting the glass article to a second ion-exchange process to strengthen the glass article and improve the resistance of the glass article to subsequent damage.

23. The method of making a chamfered and strengthened glass article, according to claim 22, wherein: (i) the step of removing the portion of the glass adjacent to the perforated edge and/or corner is performed by subjecting the article to the ion-exchange for 20 min-60 min; and (ii) the glass article is subjected to the second ion-exchange process for at least 4 hrs.