Number | Name | Date | Kind |
---|---|---|---|
4688222 | Blum | Aug 1987 | A |
5410547 | Drain | Apr 1995 | A |
5517615 | Sefidvash et al. | May 1996 | A |
5604754 | Itskin et al. | Feb 1997 | A |
5638381 | Cho et al. | Jun 1997 | A |
5740199 | Sibigtroth | Apr 1998 | A |
5742616 | Torreiter et al. | Apr 1998 | A |
6085334 | Giles et al. | Jul 2000 | A |
Entry |
---|
Williams, “A Painless Guide to CRC Error Detection Algorithms V3.00”, Rocksoft{circumflex over ( )}tm Pty Ltd, 28 pgs. (1993). |
Kuo, et al., “Soft-Defect Detection (SDD) Technique for a High-Reliability CMOS SRAM”, IEEE Journal of Solid-State Circuits, vol. 25, No. 1, pp. 61-67 (1990). |