Claims
- 1. A device for optically determining phase space distribution and emittance of a charged particle beam at any position in the beam trajectory comprising:
- a. an adjustable supporting assembly disposed adjacent to said beam for supporting other elements of the device;
- b. means for generating optical transition radiation (OTR) patterns attached to said adjustable supporting assembly and disposed within the beam;
- c. a lens system disposed in the path of the OTR patterns for collecting and imaging said OTR patterns generated by said means for generating OTR patterns attached to said adjustable supporting assembly;
- d. an optical mask having perforations connected to said lens system for masking the OTR patterns from multiple positions in an optical image of the charged particle beam; and
- e. a detector disposed behind said optical mask.
- 2. A device for measuring emittance of a charged particle beam as in claim 1 wherein said means for generating optical transition radiation (OTR) patterns comprise a plurality of thin foils.
- 3. A device for measuring emittance of a charged particle beam as in claim 1 wherein said means for generating optical transition radiation (OTR) patterns comprise a single thin foil.
- 4. A device for optically determining phase space distribution and emittance of a charged particle beam at any position in the beam trajectory comprising:
- a. means for generating optical transition radiation (OTR) patterns;
- b. means for collecting the OTR; and
- c. means for masking for resolving the point source OTR pattern for each of multiple positions in a spatial distribution of an image of the beam.
- 5. A device for measuring emittance of a charged particle beam as in claim 4 wherein said means for generating optical transition radiation comprises a thin foil disposed within the beam trajectory.
- 6. A device for measuring emittance of a charged particle beam as in claim 4 wherein said means for generating optical transition radiation comprise a plurality of thin foils disposed within the beam trajectory.
- 7. A device for measuring complete emittance of a charged particle beam as in claim 4 wherein said means for collecting the OTR comprises a lens system having a sufficient aperture that a large fraction of OTR pattern from the entire beam is collected.
- 8. A device for measuring emittance of a charged particle beam as in claim 4 wherein said means for resolving the point source OTR patterns comprise a multiply perforated mask.
- 9. A device for measuring emittance of a charged particle beam as in claim 4 wherein said means for resolving the point source of OTR patterns comprise a detector of optical radiation.
- 10. A device for measuring emittance of a charged particle beam as in claim 9 wherein said detector further comprises an optical multichannel analyzer.
- 11. A device for measuring emittance of a charged particle beam as in claim 9 wherein said detector further comprises a linear array with a plurality of pixels.
- 12. A device for measuring emittance of a charged particle beam as in claim 9 wherein said detector further comprises a streak camera having a plurality of pixels.
- 13. A device for measuring emittance of a charged particle beam as in claim 9 wherein said detector further comprises a streak tube having a plurality of pixels.
- 14. A device for measuring emittance of a charged particle beam as in claim 9 wherein said detector further comprises a microchannel plate detector having a plurality of pixels.
ORIGIN OF THE INVENTION
The invention described herein was made in the performance of official duties by employees of the Department of the Navy and may be manufactured, used, licensed by and for the Government for any governmental purposes without payment of any royalties thereon.
US Referenced Citations (11)
Non-Patent Literature Citations (3)
Entry |
Lumpkin et al., "OTR Measurements for Los Alamos Free-Electron Laser Expeents", Nuclear Instr. & Methods, Sec. A vol. A285, No. 1-2, pp. 343-348. |
Iversen et al., "Change Particle Beam Divergence Measurements Using OTR" Proceed. of the 1987 IEEE Particle Accelerator (Cat. No. 87CH2387-9) Pub. IEEE, N.Y., pp. 573-575, vol. 1. |
Wartski et al., "Interference Phenomenon in OTR & Its Applic. to Particle Beams", J. Appl. Phys. 46(8), 3644-3653 (Aug. 75). |