Claims
- 1. An end-effector for handling a microelectronic workpiece, comprising:
a body; a plurality of spaced-apart abutments carried by the body, the plurality of abutments defining a workpiece-receiving area; an actuator carried by the body and associated with at least one of the abutments, the actuator being adapted to move the associated abutment inwardly toward the workpiece-receiving area from a retracted position; and a detector operatively associated with the actuator, the detector being adapted to generate an error signal if the associated abutment fails to engage an edge of a workpiece when the actuator moves the associated abutment inwardly.
- 2. The end-effector of claim 1 wherein the actuator carries a flag, the detector monitoring a position of the flag.
- 3. The end-effector of claim 1 wherein the actuator carries a flag and the detector comprises spaced-apart first and second flag sensors.
- 4. The end-effector of claim 3 wherein the first flag sensor is positioned to detect movement of the flag as the actuator moves the associated abutment inwardly of the retracted position.
- 5. The end-effector of claim 3 wherein the second flag sensor is positioned to detect movement of the flag beyond a position of the flag when the associated abutment engages the edge of the workpiece.
- 6. The end-effector of claim 1 wherein the abutment is adapted to move the associated abutment outwardly from a workpiece-engaging position to the retracted position to release the workpiece.
- 7. The end-effector of claim 6 wherein the detector is adapted to generate the error signal when the associated abutment moves inwardly beyond the workpiece-engaging position.
- 8. The end-effector of claim 1 wherein the actuator is slidably received in a channel member, the channel member defining a forward ramp at its inward end.
- 9. An end-effector for handling a microelectronic workpiece, comprising:
a body; a plurality of abutments carried by the body at locations adapted to selectively engage an edge of a workpiece; and a detector adapted to detect engagement of the edge of the workpiece by at least one of the abutments.
- 10. The end-effector of claim 9 further comprising an actuator associated with at least one of the abutments, the actuator moving the associated abutment between a retracted position and a deployed position.
- 11. The end-effector of claim 10 wherein the actuator carries a flag, the detector monitoring a position of the flag.
- 12. The end-effector of claim 10 wherein the actuator carries a flag and the detector comprises spaced-apart first and second flag sensors.
- 13. The end-effector of claim 12 wherein the first flag sensor is positioned to detect movement of the flag as the associated abutment is moved between the retracted position and the deployed position.
- 14. The end-effector of claim 12 wherein the second flag sensor is positioned to detect movement of the flag beyond a position of the flag when the associated abutment is in its deployed position.
- 15. The end-effector of claim 9 wherein one of the abutments is a moveable abutment moveable between a retracted position and a workpiece-engaging position, the moveable abutment engaging the edge of the workpiece when in its workpiece-engaging position and releasing the edge of the workpiece when in its retracted position.
- 16. The end-effector of claim 15 wherein the moveable abutment moves in a first direction in moving from its retracted position to its workpiece-engaging position, the detector detecting movement of the moveable abutment in the first direction beyond the workpiece-engaging position.
- 17. The end-effector of claim 16 wherein the detector is adapted to generate an error signal when the moveable abutment moves beyond the workpiece-engaging position.
- 18. An end-effector for handling a microelectronic workpiece, comprising:
a body; spaced-apart, stationary first and second abutments carried by the body, and a moveable third abutment carried by the body opposite the first and second abutments, the three abutments together defining a workpiece-receiving area; an actuator comprising a shaft having an inward end carrying the third abutment and being adapted to move inwardly from a retracted position to a deployed position wherein the third abutment engages a workpiece; and a detector comprising spaced-apart first and second position sensors positioned adjacent a path of travel of the actuator, the first position sensor generating a first signal when the actuator moves inwardly a predetermined distance from the retracted position, the second position sensor generating a second signal when the actuator moves inwardly beyond the deployed position, the detector being adapted to generate an error signal if the second position sensor generates the second signal.
- 19. The end-effector of claim 18 wherein each of the first and second abutments comprises a sloped base sloping upwardly at an incline angle in a direction away from the third abutment, a sloped shoulder sloping upwardly from an upper edge of the base in a direction away from the third abutment, the shoulder having an incline angle greater than the incline angle of the base, and an overhang sloping upwardly from the shoulder in a direction toward the third abutment, the overhang and the shoulder together defining an angular edge-receiving recess.
- 20. A method of grasping a microelectronic workpiece, comprising:
providing an end-effector having a plurality of abutments, an actuator, and a detector, at least one of the abutments comprising a moveable abutment; positioning a microelectronic workpiece between the abutments of the end-effector; moving the moveable abutment inwardly using the actuator; and monitoring action of the actuator using the detector and generating an error signal if the moveable abutment fails to engage an edge of the workpiece.
- 21. The method of claim 20 wherein the actuator carries a flag and the detector comprises a first flag sensor, monitoring action of the actuator comprising detecting a position of the flag with the first flag sensor.
- 22. The method of claim 21 wherein the first flag sensor detects movement of the flag as the actuator moves the moving abutment inwardly from a retracted position.
- 23. The method of claim 21 wherein the first flag sensor comprises a first light source, detecting the position of the flag comprising detecting interruption of a path of light from the first light source.
- 24. The method of claim 21 wherein the detector includes a second flag sensor, monitoring action of the actuator further comprising detecting a different second position of the flag with the second flag sensor.
- 25. The method of claim 24 wherein the second flag sensor comprises a second light source, detecting the second position of the flag comprising detecting interruption of a path of light from the second light source.
- 26. The method of claim 24 wherein the second flag sensor detects movement of the flag as the actuator moves the third abutment inwardly beyond a position wherein the third abutment grasps the edge of the workpiece.
- 27. A transfer device for handling microelectronic workpieces, comprising:
a transport unit configured to move along a transport path; a lift assembly carried by the transport unit; an arm carried by the lift assembly; and a first end-effector rotatably coupled to the arm, the first end-effector comprising a body, a plurality of abutments carried by the body at locations adapted to selectively engage an edge of a workpiece, and a detector adapted to detect engagement of the edge of the workpiece by at least one of the abutments.
CROSS-REFERENCE TO RELATED APPLICATION(S)
[0001] This application claims the benefit of U.S. Provisional Patent Application Serial No. 60/305,388, filed Jul. 13, 2001, and U.S. Provisional Patent Application No. 60/305,335 filed Jul. 13, 2001, both currently pending and incorporated herein in its entirety by reference.
[0002] The following applications identified in paragraphs (a)-(k) are herein incorporated by reference:
[0003] (a) U.S. application Ser. No. 09/386,566, filed Aug. 31, 1999, entitled “IMPROVED ROBOT FOR MICROELECTRONIC WORKPIECE HANDLING;”
[0004] (b) U.S. application Ser. No. 09/386,590, filed Aug. 31, 1999, and entitled “ROBOTS FOR MICROELECTRONIC WORKPIECE HANDLING;”
[0005] (c) U.S. application Ser. No. 08/990,107, filed Dec. 15, 1997, entitled “SEMICONDUCTOR APPARATUS HAVING LINEAR CONVEYOR SYSTEM;”
[0006] (d) U.S. application Ser. No. 09/114,105, filed Jul. 11, 1998, entitled “IMPROVED ROBOT FOR MICROELECTRONIC WORKPIECE HANDLING.” All of which are herein incorporated by reference. Additionally, this application is related to the following:
[0007] (e) U.S. patent application Ser. No. 09/875,428, entitled “INTEGRATED TOOLS WITH TRANSFER DEVICES FOR HANDLING MICROELECTRONIC WORKPIECES,” filed on Jun. 5,2001
[0008] (f) U.S. patent application Ser. No. 09/875,304, entitled “DISTRIBUTED POWER SUPPLIES FOR MICROELECTRONIC WORKPIECE PROCESSING TOOLS,” filed on Jun. 5, 2001;
[0009] (g) U.S. patent application Ser. No. 09/875,365, entitled “ADAPTABLE ELECTROCHEMICAL PROCESSING CHAMBER,” filed on Jun. 5, 2001;
[0010] (h) U.S. patent application Ser. No. 09/875,424, entitled “LIFT AND ROTATE ASSEMBLY FOR USE IN A WORKPIECE PROCESSING STATION AND A METHOD OF ATTACHING THE SAME,” filed on Jun. 5, 2001;
[0011] (i) U.S. patent application Ser. No. 09/872,151, entitled “APPARATUS AND METHODS FOR ELECTROCHEMICAL PROCESSING OF MICROELECTRONIC WORKPIECES,” filed on May 31, 2001;
[0012] (j) U.S. patent application Ser. Nos. 09/866,391 and 09/866,463, each entitled “TUNING ELECTRODES USED IN A REACTOR FOR ELECTROCHEMICALLY PROCESSING A MICROELECTRONIC WORKPIECE,” filed on May 24, 2001;
[0013] (k) U.S. patent application Ser. No. 09/875,300, entitled “TRANSFER DEVICES FOR HANDLING MICROELECTRONIC WORKPIECES WITHIN AN ENVIRONMENT OF A PROCESSING MACHINE AND METHODS OF MANUFACTURING AND USING SUCH DEVICES IN THE PROCESSING OF MICROELECTRONIC WORKPIECES,” filed on Jun. 5, 2001.
Provisional Applications (2)
|
Number |
Date |
Country |
|
60305388 |
Jul 2001 |
US |
|
60305335 |
Jul 2001 |
US |