related to sensing or controlling of force, position, temperature

Industry

CPC
G01R31/2891

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Display panel with touch pins and test pins
- Patent number 12,210,704
- Issue date Jan 28, 2025
- WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD.
- Zuzhao Xu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer-level test method for optoelectronic chips
- Patent number 12,210,057
- Issue date Jan 28, 2025
- Jenoptik Optical Systems GmbH
- Christian Karras
- G01 - MEASURING TESTING
Information Patent Grant
Probe array and probe structure
- Patent number 12,210,037
- Issue date Jan 28, 2025
- VUETTE PTE. LTD.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer testing system and related method for improving...
- Patent number 12,210,055
- Issue date Jan 28, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Harry-Hak-Lay Chuang
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor fault analysis device and semiconductor fault analysi...
- Patent number 12,203,974
- Issue date Jan 21, 2025
- Hamamatsu Photonics K.K.
- Masataka Ikesu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe system and machine apparatus thereof
- Patent number 12,196,779
- Issue date Jan 14, 2025
- MPI CORPORATION
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Aging test system and aging test method for thermal interface mater...
- Patent number 12,196,806
- Issue date Jan 14, 2025
- CHROMA ATE INC.
- I-Shih Tseng
- G01 - MEASURING TESTING
Information Patent Grant
Method for accurate pad contact testing
- Patent number 12,188,961
- Issue date Jan 7, 2025
- International Business Machines Corporation
- Kushagra Sinha
- G01 - MEASURING TESTING
Information Patent Grant
Probe structure for micro device inspection
- Patent number 12,188,978
- Issue date Jan 7, 2025
- VueReal Inc.
- Gholamreza Chaji
- G01 - MEASURING TESTING
Information Patent Grant
Microbump cluster probing architecture for 2.5D and 3D dies
- Patent number 12,163,982
- Issue date Dec 10, 2024
- Intel Corporation
- Jagat Shakya
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 12,163,999
- Issue date Dec 10, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Alignment platform and electronic component transmission apparatus
- Patent number 12,131,935
- Issue date Oct 29, 2024
- HON. PRECISION, INC.
- Yuan-Long Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor failure analysis device and semiconductor failure ana...
- Patent number 12,117,480
- Issue date Oct 15, 2024
- Hamamatsu Photonics K.K.
- Masataka Ikesu
- G01 - MEASURING TESTING
Information Patent Grant
Optical detection system and alignment method for a predetermined t...
- Patent number 12,092,658
- Issue date Sep 17, 2024
- MPI CORPORATION
- Sebastian Giessmann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated heater and temperature measurement
- Patent number 12,061,227
- Issue date Aug 13, 2024
- AEM SINGAPORE PTE. LTD.
- Carl L. Ostrowski
- G01 - MEASURING TESTING
Information Patent Grant
Touch testing apparatus for touch detection module and method for t...
- Patent number 12,038,475
- Issue date Jul 16, 2024
- Samsung Display Co., Ltd.
- Jun Seong Lee
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for aligning device having fine pitch and method therefor
- Patent number 12,019,116
- Issue date Jun 25, 2024
- AMT CO., LTD.
- Du Chul Kim
- G01 - MEASURING TESTING
Information Patent Grant
Sensor-based planar wafer probe alignment
- Patent number 12,019,096
- Issue date Jun 25, 2024
- Infineon Technologies AG
- Stefano Di Martino
- G01 - MEASURING TESTING
Information Patent Grant
Heater substrate, probe card substrate, and probe card
- Patent number 12,013,433
- Issue date Jun 18, 2024
- Kyocera Corporation
- Daisuke Jingu
- G01 - MEASURING TESTING
Information Patent Grant
Prober controlling device, prober controlling method, and prober
- Patent number 12,007,413
- Issue date Jun 11, 2024
- Tokyo Seimitsu Co., Ltd.
- Tetsuo Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Probe card with angled probe and wafer testing method using the same
- Patent number 11,994,555
- Issue date May 28, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yuan-Chun Wu
- G01 - MEASURING TESTING
Information Patent Grant
Probe position monitoring structure and method of monitoring positi...
- Patent number 11,994,556
- Issue date May 28, 2024
- United Semiconductor Japan Co., Ltd.
- Yasunobu Torii
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for aligning device having fine pitch, apparatus for test...
- Patent number 11,982,708
- Issue date May 14, 2024
- AMT CO., LTD.
- Du Chul Kim
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit package with internal circuitry to detect extern...
- Patent number 11,959,962
- Issue date Apr 16, 2024
- QUALCOMM Incorporated
- Chengyue Yu
- G01 - MEASURING TESTING
Information Patent Grant
Thermal solution for massively parallel testing
- Patent number 11,940,487
- Issue date Mar 26, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device
- Patent number 11,940,482
- Issue date Mar 26, 2024
- Nidec-Read Corporation
- Takashi Isa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test device including temperature control module and...
- Patent number 11,927,623
- Issue date Mar 12, 2024
- SK Hynix Inc.
- Nack Hyun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Automated test system
- Patent number 11,899,042
- Issue date Feb 13, 2024
- Teradyne, Inc.
- Philip Luke Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 11,860,221
- Issue date Jan 2, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated heater and temperature measurement
- Patent number 11,828,796
- Issue date Nov 28, 2023
- AEM Holdings Ltd.
- Carl L. Ostrowski
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF DETERMINING PROBING PARAMETERS FOR PROBE SYSTEM TO TEST D...
- Publication number 20250044350
- Publication date Feb 6, 2025
- MPI Corporation
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Application
WAFER PROBE STATION AND METHOD FOR ESTABLISHING AN EVALUATION MODEL...
- Publication number 20250044349
- Publication date Feb 6, 2025
- MPI CORPORATION
- ANDREJ RUMIANTSEV
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT PACKAGE WITH INTERNAL CIRCUITRY TO DETECT EXTERN...
- Publication number 20250020715
- Publication date Jan 16, 2025
- QUALCOMM Incorporated
- Chengyue YU
- G01 - MEASURING TESTING
Information Patent Application
TECHNIQUES FOR DETECTING PROBE LANDING IN INTEGRATED CIRCUIT TESTIN...
- Publication number 20240410937
- Publication date Dec 12, 2024
- FEI Company
- James S. Vickers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITSMETHOD...
- Publication number 20240410938
- Publication date Dec 12, 2024
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20240402243
- Publication date Dec 5, 2024
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20240393387
- Publication date Nov 28, 2024
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20240393388
- Publication date Nov 28, 2024
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR FAULT ANALYSIS DEVICE AND SEMICONDUCTOR FAULT ANALYSI...
- Publication number 20240393384
- Publication date Nov 28, 2024
- HAMAMATSU PHOTONICS K. K.
- Masataka IKESU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED HEATER AND TEMPERATURE MEASUREMENT
- Publication number 20240369621
- Publication date Nov 7, 2024
- AEM SINGAPORE PTE. LTD.
- Carl L. OSTROWSKI
- G01 - MEASURING TESTING
Information Patent Application
WAFER-LEVEL TEST METHOD FOR OPTOELECTRONIC CHIPS
- Publication number 20240369624
- Publication date Nov 7, 2024
- JENOPTIK OPTICAL SYSTEMS GMBH
- Christian KARRAS
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS FOR SEMICONDUCTOR DEVICE AND MEASURING METHOD U...
- Publication number 20240353484
- Publication date Oct 24, 2024
- Samsung Electronics Co., Ltd.
- Jinhyuk Choi
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR ALIGNING DEVICE HAVING FINE PITCH, APPARATUS FOR TEST...
- Publication number 20240288493
- Publication date Aug 29, 2024
- AMT CO., LTD.
- Du Chul KIM
- G01 - MEASURING TESTING
Information Patent Application
PROBE POSITION MONITORING STRUCTURE AND METHOD OF MONITORING POSITI...
- Publication number 20240264225
- Publication date Aug 8, 2024
- United Semiconductor Japan Co., Ltd.
- Yasunobu Torii
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND TECHNIQUES FOR DETERMINING WHEN A PROBE TIP IS PROXIMAT...
- Publication number 20240255571
- Publication date Aug 1, 2024
- Xallent Inc.
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
VOICE COIL LEAF SPRING PROBER
- Publication number 20240125847
- Publication date Apr 18, 2024
- MACOM Technology Solutions Holdings, Inc.
- Timothy James VANDERWERF
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SETTING UP TEST APPARATUS AND TEST APPARATUS
- Publication number 20240118338
- Publication date Apr 11, 2024
- TOKYO ELECTRON LIMITED
- Shinjiro WATANABE
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20240103068
- Publication date Mar 28, 2024
- Aehr Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FLEXIBLE PROBE FOR MICROLED DEFECT DETECTION AND MANUFACTURING METH...
- Publication number 20240085493
- Publication date Mar 14, 2024
- INSTITUTE OF FLEXIBLE ELECTRONICS TECHNOLOGY OF THU, ZHEJIANG
- Xian Huang
- G01 - MEASURING TESTING
Information Patent Application
PROBE ARRAY AND PROBE STRUCTURE
- Publication number 20240053381
- Publication date Feb 15, 2024
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
DISPLAY PANEL
- Publication number 20240045545
- Publication date Feb 8, 2024
- WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD.
- Zuzhao Xu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR ACCURATE PAD CONTACT TESTING
- Publication number 20240036074
- Publication date Feb 1, 2024
- International Business Machines Corporation
- KUSHAGRA SINHA
- G01 - MEASURING TESTING
Information Patent Application
Alignment Mark Design for Wafer-Level Testing and Method Forming th...
- Publication number 20240019486
- Publication date Jan 18, 2024
- Taiwan Semiconductor Mamufacturing Co., Ltd.
- Cheng-Chieh Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING A SINGLE CHIP IN A WAFER PROBING SYSTEM
- Publication number 20240019488
- Publication date Jan 18, 2024
- International Business Machines Corporation
- Thomas Gentner
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT PACKAGE WITH INTERNAL CIRCUITRY TO DETECT EXTERN...
- Publication number 20230417828
- Publication date Dec 28, 2023
- QUALCOMM Incorporated
- Chengyue YU
- G01 - MEASURING TESTING
Information Patent Application
AGING TEST SYSTEM AND AGING TEST METHOD FOR THERMAL INTERFACE MATER...
- Publication number 20230375615
- Publication date Nov 23, 2023
- CHROMA ATE INC.
- I-Shih TSENG
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...
- Publication number 20230333157
- Publication date Oct 19, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Harry-Hak-Lay Chuang
- G01 - MEASURING TESTING
Information Patent Application
PROBE POSITION MONITORING STRUCTURE AND METHOD OF MONITORING POSITI...
- Publication number 20230314504
- Publication date Oct 5, 2023
- United Semiconductor Japan Co., Ltd.
- Yasunobu Torii
- G01 - MEASURING TESTING
Information Patent Application
MICROBUMP CLUSTER PROBING ARCHITECTURE FOR 2.5D AND 3D DIES
- Publication number 20230314479
- Publication date Oct 5, 2023
- Intel Corporation
- Jagat SHAKYA
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR TESTING ELECTRONIC DEVICES COMPRISING INTEGRATED OPT...
- Publication number 20230305054
- Publication date Sep 28, 2023
- TECHNOPROBE S.P.A.
- Riccardo VETTORI
- G01 - MEASURING TESTING

related to sensing or controlling of force, position, temperature

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Display panel with touch pins and test pins

Wafer-level test method for optoelectronic chips

Probe array and probe structure

Semiconductor wafer testing system and related method for improving...

Semiconductor fault analysis device and semiconductor fault analysi...

Probe system and machine apparatus thereof

Aging test system and aging test method for thermal interface mater...

Method for accurate pad contact testing

Probe structure for micro device inspection

Microbump cluster probing architecture for 2.5D and 3D dies

Apparatus for testing electronic devices

Alignment platform and electronic component transmission apparatus

Semiconductor failure analysis device and semiconductor failure ana...

Optical detection system and alignment method for a predetermined t...

Integrated heater and temperature measurement

Touch testing apparatus for touch detection module and method for t...

Apparatus for aligning device having fine pitch and method therefor

Sensor-based planar wafer probe alignment

Heater substrate, probe card substrate, and probe card

Prober controlling device, prober controlling method, and prober

Probe card with angled probe and wafer testing method using the same

Probe position monitoring structure and method of monitoring positi...

Apparatus for aligning device having fine pitch, apparatus for test...

Integrated circuit package with internal circuitry to detect extern...

Thermal solution for massively parallel testing

Inspection device

Semiconductor test device including temperature control module and...

Automated test system

Apparatus for testing electronic devices

Integrated heater and temperature measurement

Patents Applicationslast 30 patents

METHOD OF DETERMINING PROBING PARAMETERS FOR PROBE SYSTEM TO TEST D...

WAFER PROBE STATION AND METHOD FOR ESTABLISHING AN EVALUATION MODEL...

INTEGRATED CIRCUIT PACKAGE WITH INTERNAL CIRCUITRY TO DETECT EXTERN...

TECHNIQUES FOR DETECTING PROBE LANDING IN INTEGRATED CIRCUIT TESTIN...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITSMETHOD...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

SEMICONDUCTOR FAULT ANALYSIS DEVICE AND SEMICONDUCTOR FAULT ANALYSI...

INTEGRATED HEATER AND TEMPERATURE MEASUREMENT

WAFER-LEVEL TEST METHOD FOR OPTOELECTRONIC CHIPS

MEASURING APPARATUS FOR SEMICONDUCTOR DEVICE AND MEASURING METHOD U...

APPARATUS FOR ALIGNING DEVICE HAVING FINE PITCH, APPARATUS FOR TEST...

PROBE POSITION MONITORING STRUCTURE AND METHOD OF MONITORING POSITI...

METHODS AND TECHNIQUES FOR DETERMINING WHEN A PROBE TIP IS PROXIMAT...

VOICE COIL LEAF SPRING PROBER

METHOD FOR SETTING UP TEST APPARATUS AND TEST APPARATUS

APPARATUS FOR TESTING ELECTRONIC DEVICES

FLEXIBLE PROBE FOR MICROLED DEFECT DETECTION AND MANUFACTURING METH...

PROBE ARRAY AND PROBE STRUCTURE

DISPLAY PANEL

METHOD FOR ACCURATE PAD CONTACT TESTING

Alignment Mark Design for Wafer-Level Testing and Method Forming th...

TESTING A SINGLE CHIP IN A WAFER PROBING SYSTEM

INTEGRATED CIRCUIT PACKAGE WITH INTERNAL CIRCUITRY TO DETECT EXTERN...

AGING TEST SYSTEM AND AGING TEST METHOD FOR THERMAL INTERFACE MATER...

SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...

PROBE POSITION MONITORING STRUCTURE AND METHOD OF MONITORING POSITI...

MICROBUMP CLUSTER PROBING ARCHITECTURE FOR 2.5D AND 3D DIES

PROBE HEAD FOR TESTING ELECTRONIC DEVICES COMPRISING INTEGRATED OPT...