1. Field of the Invention
The present invention relates to an exposure apparatus which exposes a substrate to radiant energy in accordance with a recipe, and a method of manufacturing a device using the exposure apparatus.
2. Description of the Related Art
A semiconductor element, a liquid crystal display element, an image sensing element (e.g., a CCD (Charge Coupled Device)), a thin-film magnetic head, and other devices are manufactured by various substrate processes using a substrate processing apparatus. Examples of the substrate processes by the substrate processing apparatus are a thin film formation process, a photolithography process, an impurity diffusion process, and a process of inspecting/evaluating a circuit formed on a substrate by these processes.
The photolithography process often uses an exposure apparatus as a type of substrate processing apparatus to perform a process of exposing a shot region on a substrate coated with a photosensitive agent to radiant energy by projecting the pattern of a mask onto the shot region by a projection optical system. In this exposure process, the operator or someone creates in advance a setting file called a recipe which records the exposure processing procedure and exposure parameters. The exposure apparatus reads the recipe and performs an exposure process in accordance with the recipe.
The recipe generally includes a large number of elements such as a mask to be used, a shot layout to be projected onto a wafer, and an alignment mark for use in wafer alignment. SEMI (Semiconductor Equipment and Materials International) proposes standard E139. Standard E139 defines a concept for automatic recipe management called RaP (Recipe and Parameter Management). The concept specifies, for example, the following details.
(1) A recipe and each recipe element are formed from a unit called PDEs (Process Definition Elements).
(2) If a recipe is formed from a plurality of elements, it is expressed by the hierarchical structure of PDEs.
(3) Each PDE has a unique identifier called uid.
(4) Each PDE has a version number for configuration management.
Japanese Patent Laid-Open No. 2006-186254 discloses a method of combining one or a plurality of recipe elements. Each element is expressed by the hierarchical structure of a combination of further detailed elements. Examples of the recipe elements are mask information, substrate information, shot information, shot layout information, alignment mark information, an alignment mark measurement condition, exposure correction process data, and exposure means data. To easily change a recipe and each recipe element which are expressed by a hierarchical structure as described above, Japanese Patent Laid-Open No. 2002-373836 closes a method of displaying the hierarchical structure of the recipe in a tree structure and changing each displayed element.
According to the contents of the above-mentioned SEMI standard E139 and the invention disclosed in Japanese Patent Laid-Open No. 2006-186254, there is provided a means for expressing a recipe as the hierarchical structure of elements. Also, according to the invention disclosed in Japanese Patent Laid-Open No. 2002-373836, there is provided a means for easily changing each element of a recipe with a hierarchical structure and the hierarchical structure itself of the recipe. SEMI standard E139 assigns version numbers to a recipe and PDEs as recipe elements to appropriately manage changes in PDEs.
However, when recipe elements form a hierarchical structure, and the hierarchical structure is implemented as the reference relation between the elements, change in the content of a certain element has an influence on all elements which refer to the certain element. Therefore, when the content of a certain element is changed, all elements which refer to the certain element must be changed. Recipe editing upon this change requires a tremendous load.
It is an exemplary object of the present invention to provide an exposure apparatus which reduces the load of recipe editing upon change of an element.
According to the present invention, there is provided an exposure apparatus for exposing a substrate to radiant energy in accordance with a recipe including a plurality of elements, the apparatus comprises:
According to the present invention, it is possible to provide an exposure apparatus which reduces the load of recipe editing upon change of, for example, an element.
Further features of the present invention will become apparent from the following description of exemplary embodiments with reference to the attached drawings.
The exposure apparatus comprises a first storage 1, second storage 2, first processor 3, and second processor 4. The first storage 1 stores the plurality of recipe elements. The second storage 2 stores the history of changes of each element stored in the first storage 1. The first processor 3 changes the content of an element stored in the first storage 1, and the history of changes of the element stored in the second storage 2. The second processor 4 changes an element, which is stored in the first storage 1 and which refers to the element which is stored in the first storage 1 and changed by the first processor 3, in accordance with the change. The second processor 4 further changes the history of changes, stored in the second storage 2, of each element which refers to the element whose history of changes is changed by the first processor 3, in accordance with the change. Although the exposure apparatus according to this embodiment has the second storage 2, the second storage 2 can be omitted. In this case, the first processor 3 requires no function of changing the history of changes of an element stored in the second storage 2. Also, the second processor 4 requires no function of changing the history of changes, stored in the second storage 2, of each element which refers to an element whose history of changes is changed by the first processor 3, in accordance with the change.
The contents of the elements stored in the first storage 1, the histories of changes of the elements stored in the second storage 2, an element change process by the first processor 3, and an element change process by the second processor 4 will be explained in detail in turn below.
The second storage 2 stores information on the history of changes of each entry stored in the first storage 1.
The first processor 3 changes the content of an element stored in the first storage 1 and the history of changes of the element stored in the second storage 2 by an element change process. The procedure of the element change process by the first processor 3 will be explained with reference to the flowchart illustrated in
Upon receiving the notification of the factor identification number from the first processor 3, the second processor 4 performs a referring element change process for reflecting, in all entries, the influence of change in an entry specified by a factor identification number.
In step S504, the second processor 4 repeats processes in steps S505 to S508 for all the process target identification numbers included in the process target identification number list. In step S505, the second processor 4 repeats processes in steps S506 and S507 for all entries having process target identification numbers and identification numbers included in the reference list 204. In step S506, the second processor 4 confirms whether the identification number of the target entry is included in the processed identification number list. If the identification number of the target entry is included in that list, the influence of the change by the first processor 3 has already been reflected in the target entry. The second processor 4 advances to step S508 to process the next entry without processing the current entry. On the other hand, if the identification number of the target entry is not included in that list, the change is reflected in the target entry by the change reflecting process in step S507. The identification number of the target entry is then added to the process-in-progress identification number list and the processed identification number list. Details of the change reflecting process will be described later. After the change reflecting process is ended, the second processor 4 advances to step S508 to process the next entry. After the repetition process in step S504 is ended, the change is reflected in an entry which directly refers to the identification number included in the process target identification number list.
In step S510, the second processor 4 confirms whether the process-in-progress identification number list is empty. If the process-in-progress identification number list is not empty, an entry to consider the influence of the change still remains. In step S511, the second processor 4 substitutes the process-in-progress identification number list for the process target identification number list. The second processor 4 then returns to step S503 to continue the process. On the other hand, if it is determined in step S510 that the process-in-progress identification number list is empty, the influence of the change in target entry by the first processor 3 has been reflected in all the entries. The second processor 4 then ends the referring element change process. The second processor changes, first, a referring element which directly refers to an element changed by the first processor, and changes, next, an element which further refers to the referring element.
The change reflecting process by the second processor 4 will be explained with reference to the flowchart illustrated in
As has been described above, according to the first embodiment, when the first processor 3 changes an entry stored in the first storage 1, the second processor 4 appropriately processes the influence of the change on other entries which refer to the changed entry. Hence, an exposure apparatus which attains high-precision configuration management is provided.
The tree display portion 810 reflects that a reference list 204 of an entry having an identification number 100 includes identification numbers 102 and 103 in the elements shown in
In the history of changes of the entry having an identification number 100 stored in the second storage 2 (
Also in the history of changes shown in
The detailed history display portion 820 acquires, from the second storage 2, change history data of the “RECIPE_1” entry currently being selected in the tree display portion 810, and displays the data.
The operation button display portion 830 displays a “Change Entry” button 831. When the operator presses the “Change Entry” button, a display switching process (to be described later) is notified of the identification number of the entry currently being selected in the tree display portion 810.
The entry list display portion 910 displays a list of all entries other than the change target “RECIPE_1” entry based on the elements stored in the first storage 1. As is obvious from the elements shown in
The parameter display portion 920 displays a change input field for a unique parameter 205 of the change target entry. Since the entry having an identification number 100 does not have the unique parameter 205, nothing is displayed in the parameter display portion 920 shown in
The operation button display portion 930 displays an “Apply Change” button and “Cancel” button. When the operator presses the “Apply Change” button, the first processor 3 is notified of the change content and identification number of the change target entry in the entry list display portion 910 and parameter display portion 920 so that the first processor 3 performs an element change process. After the element change process is ended, a display switching process (to be described later) is notified of the identification number of the change target entry. When the operator presses the “Cancel” button, the change content of the target entry in the entry list display portion 910 and parameter display portion 920 is discarded, and a display switching process (to be described later) is notified of the identification number of the change target entry. At this time, whether to discard the change content of the target entry may be inquired of the operator.
Upon receiving the notification of the identification number from the display 5 by the entry change screen and the first processor 3 by the entry display screen, the display switching unit 6 performs a display switching process of switching screens presented to the operator. The procedure of the display switching process will be explained with reference to the flowchart illustrated in
As has been described above, according to the second embodiment, the display 5 provides a screen for displaying the reference relation between entries and the history of changes of each entry in a tree structure. In addition, the display switching unit 6 for switching between the entry change screen for changing each entry and the screen for displaying the history is provided, thus attaining a high-operability exposure apparatus.
An exemplary exposure apparatus to which a recipe management apparatus according to the present invention is applied will be explained below. As shown in
The illumination unit 11 illuminates the reticle on which the circuit pattern is formed, and comprises a light source unit and illumination optical system. The light source unit uses, for example, a laser as a light source. The laser can be, for example, an ArF excimer laser with a wavelength of about 193 nm, a KrF excimer laser with a wavelength of about 248 nm, or an F2 excimer laser with a wavelength of 153 nm. However, the type of laser is not particularly limited to an excimer laser. For example, the type of laser may be a YAG laser, and the number of lasers is also not particularly limited. If a laser is used as the light source, a light beam shaping optical system for shaping a parallel beam from the laser source into a desired beam shape, and an incoherent optical system for converting a coherent laser beam into an incoherent laser beam are preferably used. The light source which can be used for the light source unit is not particularly limited to a laser, and one or a plurality of lamps such as mercury lamps or xenon lamps can also be used.
The illumination optical system illuminates a mask, and includes, for example, a lens, mirror, light integrator, and stop.
The projection optical system 13 can be, for example, an optical system having only a plurality of lens elements, an optical system having a plurality of lens elements and at least one concave mirror, an optical system having a plurality of lens elements and at least one diffraction optical element, or an optical system having a total reflection mirror.
The reticle stage 12 and substrate stage 14 can be moved by, for example, linear motors. If the exposure apparatus is of the step & scan projection exposure scheme, these stages move in synchronism with each other. An actuator is separately provided to at least one of the substrate stage and the reticle stage to align the pattern of the reticle on the substrate.
Such an exposure apparatus can be used to manufacture micropatterned devices such as a semiconductor device, for example, a semiconductor integrated circuit, a micromachine, and a thin-film magnetic head.
An embodiment of a method of manufacturing a device using the above-described exposure apparatus will be explained next. A device (e.g., a semiconductor integrated circuit element or liquid crystal display element) is manufactured by a step of exposing a substrate (e.g., a wafer or glass plate) coated with a photosensitive agent to radiant energy using the exposure apparatus according to any one of the above-described embodiments, a step of developing the substrate exposed in the exposing step, and other known steps.
While the present invention has been described with reference to exemplary embodiments, it is to be understood that the invention is not limited to the disclosed exemplary embodiments. The scope of the following claims is to be accorded the broadest interpretation so as to encompass all such modifications and equivalent structures and functions.
This application claims the benefit of Japanese Patent Application No. 2007-112298, filed Apr. 20, 2007, which is hereby incorporated by reference herein in its entirety.
Number | Date | Country | Kind |
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2007-112298 | Apr 2007 | JP | national |