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Patents Grants
last 30 patents
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Patent Grant
Method of using a dual stage lithographic apparatus and lithographi...
Patent number
12,153,354
Issue date
Nov 26, 2024
ASML Netherlands B.V.
Wouter Jan Cornelis Vijselaar
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Process window optimizer
Patent number
12,141,507
Issue date
Nov 12, 2024
ASML Netherlands B.V.
Stefan Hunsche
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for avoiding a degradation of an optical element, projection...
Patent number
12,140,877
Issue date
Nov 12, 2024
Carl Zeiss SMT GmbH
Dirk Ehm
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Wafer processing apparatus and wafer transfer method
Patent number
12,099,309
Issue date
Sep 24, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Xueyu Liang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Process variability aware adaptive inspection and metrology
Patent number
12,092,965
Issue date
Sep 17, 2024
ASML Netherlands B.V.
Venugopal Vellanki
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Computational wafer inspection
Patent number
12,067,340
Issue date
Aug 20, 2024
ASML Netherlands B.V.
Christophe David Fouquet
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of manufacturing devices
Patent number
12,044,980
Issue date
Jul 23, 2024
ASML Netherlands B.V.
Abraham Slachter
G05 - CONTROLLING REGULATING
Information
Patent Grant
Method and apparatus for optimization of lithographic process
Patent number
12,044,981
Issue date
Jul 23, 2024
ASML Netherlands B.V.
Marc Hauptmann
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Multi-charged-particle-beam writing method, multi-charged-particle-...
Patent number
12,046,447
Issue date
Jul 23, 2024
NuFlare Technology, Inc.
Taku Yamada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and apparatus for reducing hydrogen permeation from lithogr...
Patent number
12,025,922
Issue date
Jul 2, 2024
Taiwan Semiconductor Manufacturing Company, Ltd
Chi-Hung Liao
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Information processing apparatus and information processing method
Patent number
12,007,698
Issue date
Jun 11, 2024
Canon Kabushiki Kaisha
Takahiro Takiguchi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Manufacturing method of semiconductor device
Patent number
11,996,335
Issue date
May 28, 2024
Kioxia Corporation
Masaya Shima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Determining a correction to a process
Patent number
11,994,845
Issue date
May 28, 2024
ASML Netherlands B.V.
Sarathi Roy
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Dispatch method for production line in semiconductor process, stora...
Patent number
11,988,969
Issue date
May 21, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Chin-Chang Huang
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Process monitoring of deep structures with X-ray scatterometry
Patent number
11,955,391
Issue date
Apr 9, 2024
KLA-Tencor Corporation
Antonio Arion Gellineau
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Methods and apparatus for obtaining diagnostic information relating...
Patent number
11,940,740
Issue date
Mar 26, 2024
ASML Netherlands B.V.
Alexander Ypma
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for characterizing a manufacturing process of semiconductor...
Patent number
11,860,548
Issue date
Jan 2, 2024
ASML Netherlands B.V.
Wim Tjibbo Tel
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Fluid handling structure for lithographic apparatus
Patent number
11,860,546
Issue date
Jan 2, 2024
ASML Netherlands B.V.
Pepijn Van Den Eijnden
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Machine and deep learning methods for spectra-based metrology and p...
Patent number
11,815,819
Issue date
Nov 14, 2023
Nova Ltd.
Barak Bringoltz
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Semiconductor processing tool and methods of operation
Patent number
11,809,087
Issue date
Nov 7, 2023
Taiwan Semiconductor Manufacturing Company, Ltd
Kai-Chieh Chang
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Control method and device of overlay accuracy
Patent number
11,803,128
Issue date
Oct 31, 2023
CHANGXIN MEMORY TECHNOLOGIES, INC.
Xiaofang Zhou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for controlling a manufacturing process and associated appar...
Patent number
11,796,920
Issue date
Oct 24, 2023
ASML Netherlands B.V.
Jochem Sebastiaan Wildenberg
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Writing data generating method, multi charged particle beam writing...
Patent number
11,774,860
Issue date
Oct 3, 2023
NuFlare Technology, Inc.
Kenichi Yasui
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Induced displacements for improved overlay error metrology
Patent number
11,774,863
Issue date
Oct 3, 2023
KLA Corporation
Mark Ghinovker
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method for controlling a manufacturing process and associated appar...
Patent number
11,768,441
Issue date
Sep 26, 2023
ASML Netherlands B.V.
Peter Ten Berge
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method for determining an inspection strategy for a group of substr...
Patent number
11,740,560
Issue date
Aug 29, 2023
ASML Netherlands B.V.
Eleftherios Koulierakis
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method for manufacturing a plurality of resonators in a wafer
Patent number
11,709,431
Issue date
Jul 25, 2023
Richemont International SA
Susana del Carmen Tobenas Borron
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method to characterize post-processing data in terms of individual...
Patent number
11,709,432
Issue date
Jul 25, 2023
ASML Netherlands B.V.
Wim Tjibbo Tel
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Methods and apparatus for monitoring a manufacturing process, inspe...
Patent number
11,698,346
Issue date
Jul 11, 2023
ASML Netherlands B.V.
Ioana Sorina Barbu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for dynamically controlling temperature of thermo...
Patent number
11,693,326
Issue date
Jul 4, 2023
Taiwan Semiconductor Manufacturing Company, Ltd
Tzu-Jung Pan
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
HIGH RESOLUTION PHOTOLITHOGRAPHY
Publication number
20240411229
Publication date
Dec 12, 2024
TERA-PRINT LLC
Andrey IVANKIN
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
SEMICONDUCTOR PROCESSING APPARATUS
Publication number
20240404780
Publication date
Dec 5, 2024
HITACHI HIGH-TECH CORPORATION
Masahiro KAMIGAKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
UVC LED LIGHT FINISHER FOR DETACKING FLEXOGRAPHIC PRINTING PLATES
Publication number
20240402607
Publication date
Dec 5, 2024
ESKO-GRAPHICS IMAGING GMBH
Thomas Klein
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
COMPUTATIONAL WAFER INSPECTION
Publication number
20240403537
Publication date
Dec 5, 2024
ASML NETHERLANDS B.V.
Christophe David FOUQUET
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
HOLDING APPARATUS, LITHOGRAPHY APPARATUS, AND ARTICLE MANUFACTURING...
Publication number
20240393703
Publication date
Nov 28, 2024
Canon Kabushiki Kaisha
KOHEI IMOTO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FIRST HOLDING APPARATUS, THIRD HOLDING APPARATUS, FIFTH HOLDING APP...
Publication number
20240377763
Publication date
Nov 14, 2024
Nikon Corporation
Arata OCHINO
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
THERMAL CONDITIONING UNIT, SUBSTRATE HANDLING DEVICE AND LITHOGRAPH...
Publication number
20240369948
Publication date
Nov 7, 2024
ASML NETHERLANDS B.V.
Gijs KRAMER
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
EXPOSURE DEVICE
Publication number
20240345486
Publication date
Oct 17, 2024
Nikon Corporation
Masaki KATO
G02 - OPTICS
Information
Patent Application
TEMPERATURE ADJUSTMENT APPARATUS, LITHOGRAPHY APPARATUS, AND ARTICL...
Publication number
20240345494
Publication date
Oct 17, 2024
Canon Kabushiki Kaisha
NAOKI FUNABASHI
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
DETERMINING A CORRECTION TO A PROCESS
Publication number
20240345569
Publication date
Oct 17, 2024
ASML NETHERLANDS B.V.
Sarathi ROY
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LITHOGRAPHY SYSTEM, SUBSTRATE SAG COMPENSATOR, AND METHOD
Publication number
20240329546
Publication date
Oct 3, 2024
ASML NETHERLANDS B.V.
Marcus Adrianus Van De Kerkhof
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
PREDICTION APPARATUS AND METHOD FOR OPTICAL SOURCE
Publication number
20240319612
Publication date
Sep 26, 2024
CYMER, LLC
Russell Allen BURDT
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
LITHOGRAPHY SYSTEM AND METHOD OF DETECTING FLUID LEAKAGE IN LIQUID...
Publication number
20240319611
Publication date
Sep 26, 2024
United Microelectronics Corp.
Zhi Fan Sun
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DEVICE MANUFACTURING METHOD, LASER DEVICE, AND WAVELENGT...
Publication number
20240322521
Publication date
Sep 26, 2024
Gigaphoton Inc.
Koichi FUJII
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF DETERMINING A CORRECTION FOR AT LEAST ONE CONTROL PARAMET...
Publication number
20240310738
Publication date
Sep 19, 2024
ASML NETHERLANDS B.V.
Roy WERKMAN
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
MACHINE AND DEEP LEARNING METHODS FOR SPECTRA-BASED METROLOGY AND P...
Publication number
20240310737
Publication date
Sep 19, 2024
NOVA LTD
Barak BRINGOLTZ
G05 - CONTROLLING REGULATING
Information
Patent Application
METHODS AND APPARATUS FOR REDUCING HYDROGEN PERMEATION FROM LITHOGR...
Publication number
20240310743
Publication date
Sep 19, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Chi-Hung LIAO
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
EUV LIGHT GENERATION APPARATUS AND ELECTRONIC DEVICE MANUFACTURING...
Publication number
20240295824
Publication date
Sep 5, 2024
Gigaphoton Inc.
Tomoyoshi TOIDA
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
DIGITAL LITHOGRAPHY SCAN SEQUENCING
Publication number
20240288778
Publication date
Aug 29, 2024
Applied Materials, Inc.
Ying-Chiao Wang
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
INFORMATION PROCESSING APPARATUS AND INFORMATION PROCESSING METHOD
Publication number
20240288780
Publication date
Aug 29, 2024
Canon Kabushiki Kaisha
Takahiro Takiguchi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR DETERMINING A POSITION OF A MIRROR
Publication number
20240255319
Publication date
Aug 1, 2024
Carl Zeiss SMT GMBH
Michael Patra
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS TO REDUCE EXTREME ULTRAVIOLET LIGHT FOR PHOTO...
Publication number
20240241446
Publication date
Jul 18, 2024
Intel Corporation
Marvin Paik
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASK, LITHOGRAPHING APPARATUS AND METHOD FOR MANUFACTURING MASK
Publication number
20240231218
Publication date
Jul 11, 2024
WESTLAKE UNIVERSITY
Xijun LI
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
ELECTRONIC MODULE FOR A MAGNETIC SWITCHING NETWORK TO PRODUCE A PUL...
Publication number
20240222927
Publication date
Jul 4, 2024
CYMER, LLC
Paul Christopher Melcher
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TEMPERATURE MEASUREMENT OF OPTICAL ELEMENTS IN AN OPTICAL APPARATUS
Publication number
20240201029
Publication date
Jun 20, 2024
ASML Netherland B.V.
Koen Martin Willem Jan BOS
G01 - MEASURING TESTING
Information
Patent Application
CAUSAL CONVOLUTION NETWORK FOR PROCESS CONTROL
Publication number
20240184254
Publication date
Jun 6, 2024
ASML NETHERLANDS B.V.
Roy WERKMAN
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
LASER APPARATUS AND ELECTRONIC DEVICE MANUFACTURING METHOD
Publication number
20240186760
Publication date
Jun 6, 2024
Gigaphoton Inc.
Takayuki YABU
G02 - OPTICS
Information
Patent Application
SUBSTRATE PROCESSING APPARATUS
Publication number
20240176256
Publication date
May 30, 2024
ECLAT FOREVER MACHINERY CO., LTD.
KUN-LIN CHOU
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
LITHOGRAPHIC APPARATUS AND METHOD FOR ILLUMINATION UNIFORMITY CORRE...
Publication number
20240160108
Publication date
May 16, 2024
ASML NETHERLANDS B.V.
Nikolaos SOTIROPOULOS
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHOD FOR OPERATING AN OPTICAL SYSTEM
Publication number
20240160113
Publication date
May 16, 2024
Carl Zeiss SMT GMBH
Julian Zips
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY