Claims
- 1. A rotating field mass spectromemter system, comprising:
an ionizing device, comprising a substrate having at least one opening, a first conductive electrode extending on a first surface of the substrate and a second conductive electrode extending on a second surface of the substrate, and a separator insulating element, having a thickness less than 1 micron, separating said first and second conductive electrodes at said at least one opening, said first and second conductive electrodes being separated by a width of said insulator at said opening; and a rotating field mass spectrometer part that receives ions from said ionizing device and which characterizes said ions.
- 2. A system as in claim 1, wherein said first and second conductive electrodes are separated by less than 300 nm at said at least one opening.
- 3. A system as in claim 1, wherein said separator insulating element is a dielectric.
- 4. A system as in claim 3, wherein said separator insulating element is formed of silicon nitride.
- 5. A system as in claim 1, wherein said first and second electrodes are formed of one of gold, chrome or titanium.
- 6. A system as in claim 1, wherein said mass spectrometer system operates at substantially ambient pressure.
- 7. A system as in claim 6, wherein said mass spectrometer system includes a solid-state electrode sensor array that detects ions.
- 8. A device as in claim 1, wherein there are plurality of said thin portions, and said thin portions each formed from first and second conductive electrodes which are separated by said less than 1 micron.
- 9. A device as in claim 1, wherein said first and second conductive electrodes are separated by less than a mean free path of a gas being analyzed.
- 10. A rotating field mass spectrometer system that operates without a vacuum pump.
- 11. A mass spectrometer system as in claim 10, further comprising a membrane which ionizes the material that passes therethrough, said membrane including electrodes which are separated by a distance less than a mean free path of the material being analyzed.
- 12. A mass spectrometer system as in claim 10, further comprising an electrostatic deflection element which forces ions along a path.
- 13. A mass spectrometer system as in claim 12, wherein said path includes a rotating field cell, which deflects the ions along a path of a specified helix shape.
- 14. A mass spectrometer system as in claim 11, further comprising an element which detects ions impinging in a specified location.
- 15. A mass spectrometer system as in claim 14, wherein said element includes a Faraday cup.
- 16. A mass spectrometer system as in claim 14, wherein said element includes a solid-state electrode array.
- 17. A rotating field mass spectrometer system, comprising:
an ionization membrane formed of a thick supporting portion with holes formed in the thick supporting portion and having first and second metal electrodes coated on surfaces of the thick supporting portion extending into the holes in the thick supporting portion, where a distance between the first and second metal electrodes within the holes of the thick supporting portion is less than the mean free path of a material being ionized; and a rotating field mass spectrometer part, receiving ions formed by said ionization membrane.
- 18. A rotating field mass spectrometer system that operates without fragmenting an incoming sample.
- 19. A method of forming a rotating field mass spectrometer, comprising:
forming a layer of thin dielectric material on a substrate that has a first specified thickness of a sufficient thickness to maintain structural integrity; forming a first electrode on the first surface of said thin dielectric material, said first electrode being formed of a metal material; back etching at least one hole in said substrate; forming a second electrode on a second surface of the substrate including the at least one back etching holes, such that at least a portion of the second electrode is on a second surface of the thin dielectric material; forming holes in the second electrode, thin dielectric material and the first electrode, which holes have side surfaces where the first and second electrodes are separated by a width of the thin dielectric material; and forming a rotating field mass spectrometer part to receive ions which have passed through said holes.
- 20. A method as in claim 19, wherein said thin dielectric material has a thickness which is less than the mean free path of the gas intended to be ionized by the ionization membrane.
- 21. A method as in claim 19, wherein said forming electrodes comprises depositing gold.
- 22. A method as in claim 21, wherein said forming a thin dielectric comprises depositing silicon nitride.
- 23. A method as in claim 19, wherein said thin dielectric has a thickness less than 500 nm.
- 24. A method as in claim 19, wherein said thin dielectric has a thickness less than 300 nm.
- 25. A method as in claim 24, further comprising applying a voltage less than 15 volts between said first and second electrodes to form a field between said first and second electrodes in the range of megavolts per meter.
- 26. A method as in claim 19, wherein said detecting comprises using a solid-state sensor to detect said ions.
- 27. A rotating field mass spectrometer, comprising:
an ionization membrane, having supporting portions, and unsupported parts between said supporting portions, where said unsupported parts include electrodes which are separated by a distance less than the mean free path of a specified sample, and include holes that pass through the ionization membrane; and a rotating field mass spectrometer part, receiving ions from said ionization membrane, and determining characteristics of the ions.
STATEMENT AS TO FEDERALLY-SPONSORED RESEARCH
[0001] The invention described herein was made in the performance of work under a NASA 7-1407 contract, and is subject to the provisions of Public Law 96-517 (U.S.C. 202) in which the contractor has elected to retain title.
Provisional Applications (1)
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Number |
Date |
Country |
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60301092 |
Jun 2001 |
US |