using crossed electric and magnetic fields perpendicular to the beam

Industry

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H01J49/288

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/288using crossed electric and magnetic fields perpendicular to the beam

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Mass spectrometer
- Patent number 11,887,832
- Issue date Jan 30, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Johannes Schwieters
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle detector having improved performance and service life
- Patent number 11,848,180
- Issue date Dec 19, 2023
- ADAPTAS SOLUTIONS PTY LTD
- Russell Jurek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wien filter and electron-optics apparatus
- Patent number 11,131,826
- Issue date Sep 28, 2021
- Ebara Corporation
- Shinichi Okada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and structure for controlling magnetic field distributions i...
- Patent number 8,835,866
- Issue date Sep 16, 2014
- FEI Company
- James B. McGinn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wien filter
- Patent number 8,436,317
- Issue date May 7, 2013
- Hermes-Microvision, Inc.
- Zhongwei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wien filter with reduced field leakage
- Patent number 8,421,029
- Issue date Apr 16, 2013
- Hermes-Microvision, Inc.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Achromatic mass separator
- Patent number 8,049,180
- Issue date Nov 1, 2011
- ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Juergen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle spin polarimeter, microscope, and photoelectron sp...
- Patent number 7,985,952
- Issue date Jul 26, 2011
- Hitachi, Ltd.
- Teruo Kohashi
- G01 - MEASURING TESTING
Information Patent Grant
Single stage charged particle beam energy width reduction system fo...
- Patent number 7,468,517
- Issue date Dec 23, 2008
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiternruftechnik mbH
- Jürgen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aberration correction device and method for operating same
- Patent number 7,465,939
- Issue date Dec 16, 2008
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Juergen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MEMS mass spectrometer
- Patent number 7,402,799
- Issue date Jul 22, 2008
- Northrop Grumman Corporation
- Carl B. Freidhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compact ion gauge using micromachining and MISOC devices
- Patent number 7,057,170
- Issue date Jun 6, 2006
- Northrop Grumman Corporation
- Carl B. Freidhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Band gap mass filter with induced azimuthal electric field
- Patent number 6,939,469
- Issue date Sep 6, 2005
- Archimedes Operating, LLC
- Tihiro Ohkawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 6,921,906
- Issue date Jul 26, 2005
- California Institute of Technology
- Frank T. Hartley
- G01 - MEASURING TESTING
Information Patent Grant
Microscale mass spectrometric chemical-gas sensor
- Patent number 6,831,276
- Issue date Dec 14, 2004
- Philip S. Berger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Liquid substrate collector
- Patent number 6,733,678
- Issue date May 11, 2004
- Archimedes Technology Group, Inc.
- Tihiro Ohkawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microscale mass spectrometric chemical-gas sensor
- Patent number 6,590,207
- Issue date Jul 8, 2003
- Mass Sensors, Inc.
- Philip S. Berger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Plasma mass separator using ponderomotive forces
- Patent number 6,585,891
- Issue date Jul 1, 2003
- Archimedes Technology Group, Inc.
- Tihiro Ohkawa
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Monochromator for charged particles
- Patent number 6,580,073
- Issue date Jun 17, 2003
- Leo Elektronenmikros Kopie GmbH
- Erich Plies
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer including multiple mass analysis stages and metho...
- Patent number 6,191,417
- Issue date Feb 20, 2001
- University of British Columbia
- Donald J. Douglas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micro-miniature ionizer for gas sensor applications and method of m...
- Patent number 5,747,815
- Issue date May 5, 1998
- Northrop Grumman Corporation
- Robert M. Young
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micro-miniature diaphragm pump for the low pressure pumping of gases
- Patent number 5,659,171
- Issue date Aug 19, 1997
- Northrop Grumman Corporation
- Robert M. Young
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for removing ions from an electron beam
- Patent number 5,616,920
- Issue date Apr 1, 1997
- Siemens Aktiengesellschaft
- Erich Plies
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micromachined mass spectrometer
- Patent number 5,541,408
- Issue date Jul 30, 1996
- Rosemount Analytical Inc.
- Fred C. Sittler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Miniaturized mass filter
- Patent number 5,536,939
- Issue date Jul 16, 1996
- Northrop Grumman Corporation
- Carl B. Freidhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Solid state detector for sensing low energy charged particles
- Patent number 5,530,244
- Issue date Jun 25, 1996
- Northrop Grumman Corporation
- Saptharish Sriram
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing a miniaturized solid state mass spectrograph
- Patent number 5,492,867
- Issue date Feb 20, 1996
- Westinghouse Elect. Corp.
- Joseph C. Kotvas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thin film preconcentrator array
- Patent number 5,481,110
- Issue date Jan 2, 1996
- Westinghouse Electric Corp.
- Silaipillayarputhur V. Krishnaswamy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micro-miniature piezoelectric diaphragm pump for the low pressure p...
- Patent number 5,466,932
- Issue date Nov 14, 1995
- Westinghouse Electric Corp.
- Robert M. Young
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Grant
Wien filter apparatus with hyperbolic surfaces
- Patent number 5,444,243
- Issue date Aug 22, 1995
- Hitachi, Ltd.
- Teruo Kohhashi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PARTICLE DETECTOR HAVING IMPROVED PERFORMANCE AND SERVICE LIFE
- Publication number 20240063004
- Publication date Feb 22, 2024
- ADAPTAS SOLUTIONS PTY LTD
- Russell Jurek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer
- Publication number 20220223401
- Publication date Jul 14, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Johannes Schwieters
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE DETECTOR HAVING IMPROVED PERFORMANCE AND SERVICE LIFE
- Publication number 20210074531
- Publication date Mar 11, 2021
- ADAPTAS SOLUTIONS PTY LTD
- Russell Jurek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer
- Publication number 20210013017
- Publication date Jan 14, 2021
- Thermo Fisher Scientific (Bremen) GmbH
- Johannes Schwieters
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WIEN FILTER
- Publication number 20130112889
- Publication date May 9, 2013
- HERMES MICROVISION, INC.
- Zhongwei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Structure for Controlling Magnetic Field Distributions i...
- Publication number 20120292497
- Publication date Nov 22, 2012
- FEI Company
- James B. McGinn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE SPIN POLARIMETER, MICROSCOPE, AND PHOTOELECTRON SP...
- Publication number 20080217533
- Publication date Sep 11, 2008
- Teruo KOHASHI
- G01 - MEASURING TESTING
Information Patent Application
ACHROMATIC MASS SEPARATOR
- Publication number 20080185514
- Publication date Aug 7, 2008
- JUERGEN FROSIEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Aberration correction device and method for operating same
- Publication number 20070164228
- Publication date Jul 19, 2007
- Juergen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Single stage charged particle beam energy width reduction system fo...
- Publication number 20070158561
- Publication date Jul 12, 2007
- Jurgen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMS mass spectrometer
- Publication number 20070096023
- Publication date May 3, 2007
- Carl B. Freidhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Compact ion gauge using micromachining and MISOC devices
- Publication number 20050199805
- Publication date Sep 15, 2005
- Carl B. Freidhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Band gap mass filter with induced azimuthal electric field
- Publication number 20040112833
- Publication date Jun 17, 2004
- Tihiro Ohkawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometer
- Publication number 20030201387
- Publication date Oct 30, 2003
- Frank T. Hartley
- G01 - MEASURING TESTING
Information Patent Application
Microscale mass spectrometric chemical-gas sensor
- Publication number 20030193021
- Publication date Oct 16, 2003
- Philip S. Berger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Liquid substrate collector
- Publication number 20030159998
- Publication date Aug 28, 2003
- Tihiro Ohkawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Field ionizing elements and applications thereof
- Publication number 20030071223
- Publication date Apr 17, 2003
- Frank T. Hartley
- G01 - MEASURING TESTING
Information Patent Application
Monochromator for charged particles
- Publication number 20020104966
- Publication date Aug 8, 2002
- Erich Plies
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Microscale mass spectrometric chemical-gas sensor
- Publication number 20020033448
- Publication date Mar 21, 2002
- Philip S. Berger
- G06 - COMPUTING CALCULATING COUNTING

using crossed electric and magnetic fields perpendicular to the beam

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Mass spectrometer

Particle detector having improved performance and service life

Wien filter and electron-optics apparatus

Method and structure for controlling magnetic field distributions i...

Wien filter

Wien filter with reduced field leakage

Achromatic mass separator

Charged particle spin polarimeter, microscope, and photoelectron sp...

Single stage charged particle beam energy width reduction system fo...

Aberration correction device and method for operating same

MEMS mass spectrometer

Compact ion gauge using micromachining and MISOC devices

Band gap mass filter with induced azimuthal electric field

Mass spectrometer

Microscale mass spectrometric chemical-gas sensor

Liquid substrate collector

Microscale mass spectrometric chemical-gas sensor

Plasma mass separator using ponderomotive forces

Monochromator for charged particles

Mass spectrometer including multiple mass analysis stages and metho...

Micro-miniature ionizer for gas sensor applications and method of m...

Micro-miniature diaphragm pump for the low pressure pumping of gases

Apparatus for removing ions from an electron beam

Micromachined mass spectrometer

Miniaturized mass filter

Solid state detector for sensing low energy charged particles

Method for manufacturing a miniaturized solid state mass spectrograph

Thin film preconcentrator array

Micro-miniature piezoelectric diaphragm pump for the low pressure p...

Wien filter apparatus with hyperbolic surfaces

Patents Applicationslast 30 patents

PARTICLE DETECTOR HAVING IMPROVED PERFORMANCE AND SERVICE LIFE

Mass Spectrometer

PARTICLE DETECTOR HAVING IMPROVED PERFORMANCE AND SERVICE LIFE

Mass Spectrometer

WIEN FILTER

Method and Structure for Controlling Magnetic Field Distributions i...

CHARGED PARTICLE SPIN POLARIMETER, MICROSCOPE, AND PHOTOELECTRON SP...

ACHROMATIC MASS SEPARATOR

Aberration correction device and method for operating same

Single stage charged particle beam energy width reduction system fo...

MEMS mass spectrometer

Compact ion gauge using micromachining and MISOC devices

Band gap mass filter with induced azimuthal electric field

Mass spectrometer

Microscale mass spectrometric chemical-gas sensor

Liquid substrate collector

Field ionizing elements and applications thereof

Monochromator for charged particles

Microscale mass spectrometric chemical-gas sensor