This relates generally to electronic devices and, more particularly, to electronic devices with components such as strain gauges.
Electronic devices often include sensors. Sensors allow information to be gathered on the operating environment of an electronic device. Sensors can also be used to gather user input.
In some situations, buttons may be used to gather user input. Buttons may be based on mechanical components such as dome switches.
Mechanical button components may be subject to wear during use and may be bulkier than desired. Mechanical button components may also be challenging to integrate with other components.
It would therefore be desirable to be able to provide improved sensors for electronic devices such as strain gauge sensors that can be used in implementing buttons.
An electronic device may be provided with a flexible printed circuit. A semiconductor strain gauge may be incorporated into flexible printed circuit. A component such as a fingerprint sensor may be mounted to the flexible printed circuit over the semiconductor strain gauge. The semiconductor strain gauge may be mounted to a display cover layer to serve as a strain-gauge-based button.
The semiconductor strain gauge may be mounted in an opening in the flexible printed circuit. Electrical connections such as wire bonds may couple the semiconductor strain gauge to metal traces on a flexible printed circuit substrate in the flexible printed circuit. The fingerprint sensor may also be coupled to metal traces on the flexible printed circuit using wire bonds.
The flexible printed circuit opening may be filled with an encapsulant that encapsulates the semiconductor strain gauge. Vias may be formed through the encapsulant to contact the semiconductor strain gauge. Metal traces that run across the surface of the substrate and the surface of the encapsulant may contact the vias. The metal traces and the vias may form signal paths to the semiconductor strain gauge.
The semiconductor strain gauge may be mounted on the surface of a substrate. A dielectric such as polymer may cover the semiconductor strain gauge and the surface of the substrate. Metal traces in the dielectric may form a redistribution layer in the dielectric. The metal traces of the redistribution layer may overlap the semiconductor strain gauge and make contact to the semiconductor strain gauge.
Electronic devices may be provided with printed circuits. The printed circuits may include rigid printed circuit boards (e.g., printed circuits formed from rigid printed circuit board material such as fiberglass-filled epoxy) and flexible printed circuits (e.g., printed circuits that include one or more sheets of polyimide substrate material or other flexible polymer layers). The flexible printed circuits may be provided with strain gauges. Illustrative electronic devices that may be provided with flexible printed circuits having strain gauges are shown in
Electronic device 10 of
In the example of
An electronic device such as electronic device 10 of
Device 10 may include a display such as display 14. Display 14 may be mounted in housing 12. Housing 12, which may sometimes be referred to as an enclosure or case, may be formed of plastic, glass, ceramics, fiber composites, metal (e.g., stainless steel, aluminum, etc.), other suitable materials, or a combination of any two or more of these materials. Housing 12 may be formed using a unibody configuration in which some or all of housing 12 is machined or molded as a single structure or may be formed using multiple structures (e.g., an internal frame structure, one or more structures that form exterior housing surfaces, etc.).
Display 14 may be a touch screen display that incorporates a layer of conductive capacitive touch sensor electrodes or other touch sensor components (e.g., resistive touch sensor components, acoustic touch sensor components, force-based touch sensor components, light-based touch sensor components, etc.) or may be a display that is not touch-sensitive. Capacitive touch screen electrodes may be formed from an array of indium tin oxide pads or other transparent conductive structures.
Display 14 may include an array of display pixels formed from liquid crystal display (LCD) components, an array of electrophoretic display pixels, an array of plasma display pixels, an array of organic light-emitting diode display pixels, an array of electrowetting display pixels, or display pixels based on other display technologies.
Display 14 may be protected using a display cover layer such as a layer of transparent glass or clear plastic. Openings may be formed in the display cover layer. For example, an opening may be formed in the display cover layer to accommodate a button, an opening may be formed in the display cover layer to accommodate a speaker port, etc.
A schematic diagram of an illustrative device such as devices 10 of
Input-output circuitry 32 may be used to allow data to be supplied to device 10 and to allow data to be provided from device 10 to external devices. Input-output circuitry 32 may include wired and wireless communications circuitry 34. Communications circuitry 34 may include radio-frequency (RF) transceiver circuitry formed from one or more integrated circuits, power amplifier circuitry, low-noise input amplifiers, passive RF components, one or more antennas, and other circuitry for handling RF wireless signals. Wireless signals can also be sent using light (e.g., using infrared communications).
Input-output circuitry 32 may include input-output devices 36. Input-output devices 36 may include devices such as buttons (see, e.g., button 26 of
A cross-sectional side view of an illustrative electronic device of the type that may be provided with one or more flexible printed circuits is shown in
Device 10 may include components such as components 62 that are mounted on one or more printed circuit boards such as printed circuit board 60. Printed circuit board 60 may have one or more layers of dielectric material and one or more layers of metal traces. Printed circuit board 60 of
If desired, device 10 may have components mounted on the underside of display cover layer 52 such as illustrative component 56 on opaque masking layer 54 in inactive area IA of device 10 of
Flexible printed circuits 58 may have layers of dielectric and layers of metal traces. The metal traces of flexible printed circuits 58 may be used to form signal paths to interconnect the circuitry of device 10. For example, flexible printed circuits 58 may have signal paths that interconnect component 56 to the circuitry of components 62 on printed circuit 60, signal path that couple display module 50 to components 62 on printed circuit 60, or signal paths for interconnecting other components in device 10. Strain gauge structures such as strain gauge resistors may also be formed in flexible printed circuits 58. The strain gauge resistors (sometimes referred to as strain gauge sensors or strain gauges) may be formed from a semiconductor strain gauge structure such as a piece of silicon. A thin strip of silicon may, for example, be contacted by two conductive metal paths at opposing ends. When the silicon bends, the resistance measured between the two metal paths changes in proportion to the amount of strain imparted to the silicon. Semiconductor strain gauges such as silicon strain gauges may exhibit high gauge factors and other desired characteristics.
A cross-sectional side view of an illustrative flexible printed circuit is shown in
Electrical components such as illustrative electrical component 68 of
The outermost dielectric layers of flexible printed circuit 58 (i.e., the cover layers for flexible printed circuit 58) may be formed from a laminated polymer film (e.g., a polyimide film attached to flexible printed circuit 58 with a layer of adhesive), may be formed from a cured liquid polymer (e.g., photoimageable polymer formed directly on underlying layers without adhesive), or may be formed from other dielectric materials formed directly on underlying metal traces or other structures on the surface of printed circuit 58 and/or attached to underlying metal traces or other structures on the surface of printed circuit 58 using adhesive. Metal traces 82 may be formed directly on the surface of substrate 80 as shown in the examples of
If desired, through vias, blind vias, and buried vias may be used to interconnect metal traces on different layers of flexible printed circuit 58. Holes or other openings may be formed in flexible printed circuit 58 using laser drilling, stamping, machining, or other hole formation techniques. The holes may be filled with metal using electroplating, electroless deposition, or other metal deposition techniques. Plated holes may form tubular vias that form conductive signal paths between the metal layers of flexible printed circuit 58. As shown in
The equipment of
Hole formation equipment 132 may include tools such as laser drilling tools, machining tools, and other equipment for forming openings in one or more layers of material for flexible printed circuit 58. For example, hole formation equipment 132 may use a laser or other tool to drill holes for vias such as via 126 of
Lamination equipment 134 may include rollers and other equipment for laminating layers of material together (e.g., using heat and pressure to cause adhesive to attach layers of flexible printed circuit 58 together or to otherwise attach layers together).
Global layer deposition equipment 142 may include equipment for depositing layers of material by blanket spray coating, by spinning, by physical vapor deposition (e.g., sputtering), or other deposition techniques.
Patterning equipment 140 may be used to pattern layers of material such as blanket layers of metal and/or dielectric. Equipment 140 may include photolithographic equipment such as equipment for depositing photoresist or other photoimageable materials, equipment for exposing photoresist or other photoimageable materials to patterned light associated with a photomask, developing equipment to use in developing photoresist or other photoimageable materials, etching equipment for etching the structures of flexible printed circuit 58 after deposited photoresist has been patterned by exposure and development, etc.
Electrochemical deposition tools 144 such as tools for electroplating metal in a via, tools for electroless deposition, and other electrochemical deposition equipment may be used in forming flexible printed circuit 58.
One or more of the layers of flexible printed circuit 58 and/or other structures may be bent using bending tools 146. Bending tools 146 may be formed from stand-alone equipment or equipment that is integrated into other equipment of
If desired, other tools 136 may be used in processing the structures of flexible printed circuit 58 such as lasers for cutting, machining tools for trimming or cutting, heated presses, die cutting equipment, injection molding equipment, heating equipment such as infrared lamps and ovens, light-emitting diodes, or other light sources for adhesive curing (e.g., ultraviolet light-emitting diodes), and other equipment for depositing, patterning, processing, and removing layers of dielectric and metal for structures 58.
Soldering tools 138 and other equipment may be used in mounting electrical components to flexible printed circuit 58 and/or may be used in coupling flexible printed circuit 58 to other circuitry in device 10.
Strain gauge structures may be incorporated into a device such as device 10. A strain gauge may be used, for example, to implement a button. A strain gauge may be based on a network of resistors. One or more of the resistors may be formed from a semiconductor such as silicon that exhibits a change in resistance in proportion to applied strain. Semiconductor strain gauges such as these may exhibit enhanced performance (e.g., higher gauge factor) compared to strain gauges based on other types of strain-sensitive resistors such as metal resistors.
Strain gauge structures such as strain gauge resistors can be formed in a recessed portion of a flexible printed circuit such as flexible printed circuit 58 or may otherwise be incorporated into flexible printed circuit 58. This type of arrangement conserves space within device 10 and can improve performance and reduce complexity. In general, strain gauge structures for flexible printed circuit 58 may be based on semiconductor strain gauge structures (i.e., one or more strain-sensitive semiconductor resistors), may be based on metal resistor strain gauge structures, or may be based on other strain gauge structures. Configurations in which flexible printed circuit 58 is provided with a semiconductor strain gauge are sometimes described here as an example. This is, however, merely illustrative. Any suitable strain gauge may be incorporated into flexible printed circuit 58, if desired.
An illustrative configuration for device 10 in which a flexible printed circuit has been provided with a semiconductor strain gauge (e.g., one or more semiconductor strain gauge resistors) is shown in
Device 10 may include components such as components 62 that are mounted on one or more printed circuit boards such as printed circuit board 60. In the illustrative configuration of
If desired, a fingerprint sensor may be provided in device 10. For example, a fingerprint sensor may overlap strain gauge structure 150. The fingerprint sensor may have electrodes or other structures that are formed in flexible printed circuit 58. As shown in
Signals may be routed between fingerprint sensor 156 and traces on flexible printed circuit 58 using solder joints, conductive adhesive connections, or wire-bond connections formed by wire bonds such as wires bonds 162 of
A Wheatstone bridge or other strain gauge circuitry may be used to measure resistance changes in the semiconductor strain gauge resister(s) of the strain gauge. An illustrative strain gauge circuit that may be used in monitoring strain-induced resistance changes in the strain-sensitive strain gauge resistor(s) of strain gauge structures such as strain gauge structure 150 of
Semiconductor strain gauge circuitry 172 may include an analog-to-digital converter such as analog-to-digital converter 174 and processing circuitry 176. Analog-to-digital converter 174 and 176 may be implemented using integrated circuits mounted to flexible printed circuit 58 or to elsewhere in device 10.
Analog-to-digital converter circuitry 174 may be coupled to a bridge circuit such as bridge circuit 178 that is formed from resistors R1, R2, R3, and R4 using signal paths 180 and 182. A power supply may provide a power supply voltage Vcc to bridge circuit terminal 184 of bridge circuit 178 and may provide a power supply voltage Vss to bridge circuit terminal 186 of bridge circuit 178. Power supply voltages Vcc and Vss may be, for example, a positive power supply voltage and a ground power supply voltage, respectively.
During operation of strain gauge circuitry 172, a voltage drop of Vcc-Vss will be applied across bridge circuit 178. Resistors R1, R2, R3, and R4 may all nominally have the same resistance value (as an example). In this configuration, bridge circuit 178 will serve as a voltage divider that nominally provides each of paths 180 and 182 with a voltage of (Vcc-Vss)/2. The voltage difference across nodes N1 and N2 will therefore initially be zero.
With one suitable arrangement, semiconductor resistors R1 and R3 are mounted in flexible printed circuit 58 so that both resistors R1 and R3 will experience similar stresses during use. Resistors R2 and R4 (which may be formed using non-semiconductor resistor structures) may be located away from resistors R1 and R3 and/or may be oriented so as to avoid being stressed while resistors R1 and R3 are being stressed. This allows resistors R2 and R4 to serve as reference resistors. With this approach, pressure to the strain gauge resistors R1 and R3 in flexible printed circuit 56 from user finger 164 will cause the resistance of resistors R1 and R3 to rise simultaneously while resistors R2 and R4 serve as nominally fixed reference resistors (compensating for drift, temperature changes, etc.). Other types of bridge circuit layout may be used if desired. For example, bridge circuit 178 may be implemented using a single strain-sensing resistor (e.g., resistor R1) and three fixed resistors (e.g., R2, R3, and R4), etc.
Due to the changes in resistance to one or more strain-sensitive semiconductor resistors in circuit 178, the voltage between paths 180 and 182 will vary in proportion to the strain that is being applied to the strain gauge structure 150. Analog-to-digital converter 174 digitizes the voltage signal across paths 180 and 182 and provides corresponding digital strain (stress) data to processing circuitry 176. Processing circuitry 176 and other control circuitry in device 10 can take appropriate action in response to the measured strain data. For example, processing circuitry 176 can convert raw strain data into button press data or other button input information. Device 10 can then respond accordingly (e.g., by using the strain gauge button data as button press data for a menu or home button, etc.).
Strain gauge circuitry 172 such as analog-to-digital converter 174 and processing circuitry 176 may be mounted on board 60 (i.e., analog-to-digital converter 174 and processing circuitry 176 may be implemented in one or more components 62 on board 60) and/or circuitry such as analog-to-digital converter 174 and processing circuitry 176 may be mounted on flexible printed circuit 58 (e.g., using solder, wire bonds, etc.). Signal paths such as paths 180 and 182 may run between nodes N1 and N2 in bridge circuit 178 and analog-to-digital converter 174. To form low-resistance paths that are not subject to changes due to variations in strain, signal paths in strain gauge circuitry 172 such as paths 180 and 182 are preferably formed from low-resistivity materials such as copper. Wire bonds, solder connections, and other connections may be used to interconnect the strain gauge resistor(s) to circuitry 174. Connections such as these may also be used in mounting electrical components such as fingerprint sensor 156 over the strain gauge resistor(s).
A semiconductor strain gauge (i.e., one or more strain-sensing semiconductor strain gauge resistors) may be mounted in a recess or other opening in flexible printed circuit 58 or may otherwise be incorporated into flexible printed circuit 58. As shown in
Semiconductor strain gauge 200 may include one or more semiconductor resistors for bridge circuit 178. For example, semiconductor strain gauge 200 may form one or more strain-sensing silicon resistors. Electrical connections such as wire bonds 214 or other signal paths may be used to couple traces 206 to semiconductor strain gauge 200.
An electrical component such as component 156 may be mounted on flexible printed circuit 58. Component 156 may be a fingerprint sensor having an array of electrodes 164. Wire bonds 162 or other signal paths may be used to couple metal traces 212 on fingerprint sensor 156 to metal traces 206 on flexible printed circuit substrate 204.
Fingerprint sensor 156 may be mounted over opening 202 in flexible printed circuit 58 using adhesive layer 160. A portion of adhesive layer 160 on the lower surface of fingerprint sensor 156 may be exposed in opening 202. Semiconductor strain gauge 200 may be attached to adhesive layer 160. If desired, a layer of dielectric (e.g., a polymer layer such as a layer of polyimide) may be interposed between fingerprint sensor 156 and opening 202. The example of
Illustrative steps involved in forming a flexible printed circuit with a semiconductor strain gauge such as strain gauge 200 are shown in
At step 216, flexible printed circuit 58 may be provided with patterned metal traces and one or more openings. For example, cutting equipment may be used to form openings such as opening 202 in substrate 204 and photolithography or printing techniques may be used in forming patterned metal traces 206 on substrate 204. Metal traces 206 may, if desired, be formed by laminating metal foil to substrate 204, by printing metal paint onto substrate 204, etc.
The flexible printed circuit layers of flexible printed circuit 56 may include one or more metal layers, dielectric layers, and adhesive layers. If desired, adhesive layers may be used in attaching metal layers to dielectric layers and may be used in attaching substrate layers, cover layers, and other dielectric layers within flexible printed circuit 56. Openings such as opening 202 may be formed by laser cutting, knife cutting, stamping, etching, or other techniques. Openings such as opening 202 may pass completely through flexible printed circuit 58 (e.g., through substrate layer 204 and any additional substrate layers in flexible printed circuit 58) or may pass only part way through flexible printed circuit 58 to form a recess with a closed bottom. Openings such as opening 202 may be sized to accommodate a strain gauge structure such as structure 200 and may therefore sometimes be referred to as strain gauge openings.
At step 218, an electrical component such as fingerprint sensor 156 may be attached over opening 202 using adhesive layer 160 (i.e., opening 202 may be overlapped by sensor 156) or may otherwise be mounted to flexible printed circuit substrate 204 in a configuration that overlaps strain gauge sensor 200. Exposed portions of adhesive layer 160 may be present on the lower surface of sensor 156.
At step 220, strain gauge 200 may be mounted on the exposed portion of adhesive layer 160. If desired, additional adhesive (e.g., liquid adhesive) may be placed in the cavity formed by opening 202 to help secure strain gauge 200 within opening 202. For example, strain gauge 200 may be mounted in opening 202 using two-part epoxy or other adhesive.
It may be desirable to form signal paths to strain gauge 200 by extending patterned metal traces 206 over strain gauge 200. This type of arrangement is shown in
Initially, opening 202 may be formed in flexible printed circuit substrate 204. A support structure may then be used to cover the bottom of opening 202. For example, tape 222 may be placed over opening 202 on lower surface 210 of substrate 204. Tape 222 may have a flexible carrier layer such as flexible polymer carrier layer 226 and an adhesive layer such as adhesive layer 224. Adhesive layer 224 may be used to attach tape 222 to lower surface 210. Strain gauge 200 may then be mounted on the exposed portion of adhesive 224 that is present in opening 202. Encapsulant (e.g., a polymer adhesive such as epoxy or other liquid adhesive) such as encapsulant 230 may be used to fill opening 202. Encapsulant 230 may be cured using ultraviolet light, heat that produces elevated temperatures, or room-temperature curing.
Vias such as vias 232 may be used to form electrical connections between the exposed upper surface of cured encapsulant layer 230 and strain gauge sensor 200. Vias 232 may be drilled using a laser drilling tool or other hole formation equipment and may be partly or entirely filled with a conductive material such as metal to form an interconnect path between strain gauge 200 and metal traces on flexible printed circuit 58. Following via formation, metal traces 206 may be formed on upper surface 208 of flexible printed circuit substrate 204. Traces 206 overlap vias 232 and thereby form electrical connections to strain gauge 200.
After traces 206 have been formed, tape 222 may be removed from the lower surface of substrate 204, as shown in
As shown in
Illustrative steps involved in forming flexible printed circuit 58 with a semiconductor strain gauge that is mounted within a substrate opening such as opening 202 and that is contacted using vias are shown in
At step 236, openings such as opening 202 are formed in flexible printed circuit layers such as substrate 204.
At step 238, a layer of tape such as tape 222 of
At step 240, semiconductor strain gauge 200 may be mounted in the opening. The tape or other support structure that covers the lower portion of opening 202 may serve as a temporary support structure or opening 202 may be formed from a recess in a flexible printed circuit that passes only partway into the flexible printed circuit.
While maintaining semiconductor strain gauge 200 within opening 202, polymer encapsulant 230 (e.g., epoxy or other liquid adhesive) may be introduced into opening 202 (step 242). Encapsulant 230 may fill the gaps between strain gauge 200 and the surrounding portions of flexible printed circuit substrate material and may encapsulate semiconductor strain gauge 200.
At step 244, laser drilling or other hole formation techniques are used to form holes through encapsulant 230 that reach strain gauge 200. Metal or other conductive material may be deposited into the holes to form vias 232 that contact semiconductor strain gauge 200.
At step 246, metal traces 206 are deposited and patterned onto the flexible printed circuit layers. In particular, traces 206 may be formed that contact vias 232, thereby forming signal paths in the interconnects of flexible printed circuit 58 that are coupled to semiconductor strain gauge 200.
At step 248, fingerprint sensor 156 or other electrical component may be mounted to flexible printed circuit 58, fingerprint sensor 156 and other portions of flexible printed circuit 58 may be attached to the underside of display cover layer 52, and other assembly operations in device 10 may be completed.
If desired, a redistribution layer may be formed on the upper surface of flexible printed circuit 58. The redistribution layer may contain metal traces that are used in forming signal paths coupled to semiconductor strain gauge 200. This type of approach is shown in
Initially, a flexible printed circuit substrate may be provided, as shown in
After forming the structures of
Illustrative steps involved in forming flexible printed circuit 58 of
At step 256, a flexible printed circuit structure is formed that includes patterned metal traces 206 on a flexible printed circuit substrate such as flexible printed circuit substrate 202. Semiconductor strain gauge 200 may be mounted on the upper surface of the flexible printed circuit substrate using a layer of adhesive. The flexible printed circuit substrate may, if desired, be attached to one or more additional substrate layers, one or more adhesive layers, and/or one or more metal layers.
At step 258, additional material may be added to the flexible printed circuit substrate. For example, upper and lower polyimide cover layers may be added. The additional material may include one or more additional polyimide layers, one or more adhesive layers, and/or one or more metal layers. A redistribution layer may be formed in the additional material. The metal traces of the redistribution layer may form part of the metal traces forming interconnects in flexible printed circuit 58 and may be coupled to semiconductor strain gauge 200. As shown in
At step 260, fingerprint sensor 156 or other electrical circuitry may be mounted over semiconductor strain gauge 200 and the overlapping redistribution layer. Fingerprint sensor 156 may be coupled to the metal traces of flexible printed circuit 58 using wire bonds or other conductive paths. Flexible printed circuit 58 may be mounted in device 10 (e.g., by attaching fingerprint sensor 156 to display cover layer 52.
The foregoing is merely illustrative and various modifications can be made by those skilled in the art without departing from the scope and spirit of the described embodiments. The foregoing embodiments may be implemented individually or in any combination.