This application claims priority to Chinese Patent Application No. 201710049601.5 filed on Jan. 20, 2017, the contents of which are incorporated by reference herein.
The subject matter herein generally relates to a light emitting diode, especially relates to a flip chip light emitting diode and method of manufacturing the same.
Light emitting diode (LED) is a semiconductor device for converting current to light with different waves. The light emitting diode widely used in light area, because the light emitting diode has advantages of high brightness, low voltage, long life, great environment protection etc.
The light emitting diode generally has a vertical type structure and flip chip type structure. The light emitting diode with the vertical type structure has a P electrode and an N electrode. The P electrode and the N electrode are mounted on different side of the light emitting diode. The light emitting diode couples with a base by wiring. Thus, electrical conductivity between the light emitting diode and the base may be poor, so the light emitting diode with the vertical type structure may have low quality.
The light emitting diode with flip chip type structure also has a P electrode and an N electrode. The flip chip light emitting diode couples with the base by the P electrode and the N electrode rather than the wiring. However, while the flip chip light emitting diode is coupled with the base, the P electrode and the N electrode of the flip chip light emitting diode position with the electrode of the base are so difficult that the P electrode and the N electrode are poorly coupled with the base.
Implementations of the present technology will now be described, by way of example only, with reference to the attached figures.
It will be appreciated that for simplicity and clarity of illustration, numerous specific details are set forth in order to provide a thorough understanding of the embodiments described herein. However, it will be understood by those of ordinary skill in the art that the exemplary embodiments described herein can be practiced without these specific details. In other instances, methods, procedures and components have not been described in detail so as not to obscure the related relevant feature being described. Also, the description is not to be considered as limiting the scope of the embodiments described herein. The drawings are not necessarily to scale and the proportions of certain parts have been exaggerated to better illustrate details and features of the present disclosure. The description is not to be considered as limiting the scope of the exemplary embodiments described herein.
Several definitions that apply throughout this disclosure will now be presented. The term “comprising” means “including, but not necessarily limited to”; it specifically indicates open-ended inclusion or membership in a so-described combination, group, series and the like. The term “coupled” is defined as connected, whether directly or indirectly through intervening components, and is not necessarily limited to physical connections. The connection can be such that the objects are permanently connected or releasably connected.
Referring to
Referring to
Referring to
In the cross-sectional view of the light emitting diode 100 in
The N-semiconductor layer 12 is mounted on a bottom surface of the epitaxial layer 11. A center portion of a bottom surface of the N-semiconductor layer 12 protrudes away from the epitaxial layer 11 to form a protruding portion 120. The light active layer 13 and the P-semiconductor layer 14 mounts on the protruding portion 120 in series.
The first electrode 20 mounts on a peripheral portion of a bottom surface of the N-semiconductor layer 12 away from the epitaxial layer 11. The first electrode 20 is spaced from the protruding portion 120. The second electrode 30 is mounted on a bottom surface of the P-semiconductor layer 14. A bottom surface 21 of the first electrode 20 and a bottom surface 31 of the second electrode 30 are on the same plane. In the first exemplary embodiment, the first electrode 20 is an N electrode, the second electrode 30 is a P electrode.
The insulating layer 40 is located between the protruding portion 120, the light active layer 13, the P-semiconductor layer 14 and the first electrode 20 as shown in
Further, the flip chip light emitting diode 100 of the first exemplary embodiment includes a supporting portion 50. The supporting portion 50 mounts on a top surface of the epitaxial layer 11. The supporting portion 50 is made of rubber materials, polymer materials, silicon, or SiNx. The supporting portion 50 is black, white or transparent.
Further, a connecting portion 51 is mounted between the supporting portion 50 and the epitaxial layer 11 to increase a stability of the supporting portion 50. In the first exemplary embodiment, the connecting portion 51 is made of silicon. In other exemplary embodiment, the connecting portion 51 has same materials as the supporting portion 50.
Further, the flip chip light emitting diode 100 includes a conductive layer 60 mounted on between the second electrode 30 and the P-semiconductor 14. The conductive layer 60 increases the conductivity of the second electrode 30 and the P-semiconductor 14.
Further, the flip chip light emitting diode 100 includes a buffer layer 70 mounted on the first electrode 20 and the second electrode 30. The buffer layer 70 is made one or more of the Ti, Ni, Sn, In and Au.
In the first exemplary embodiment, a width of the flip chip light emitting diode 100 is defined as wd. wd is 5-200 μm, preferably wd is 40 μm. A height of the flip chip light emitting diode 100 is defined as Hd. Hd about is 0.1-40 μm, preferably, Hd about is 4.35 μm. A height of the supporting portion 50 is defines as Hp. Hp is between 0.2 μm and 40 μm, preferably, Hd is about 2 μm. A width of the supporting portion 50 is defined as wp. wp is between 0.5 μm and 40 μm, preferably, wp is about 5 μm. Further, wd/Hd (radio) is between 5 and 50. Preferably, wd/Hd is about 9.2. wp/wd (radio) is between 0.1 and 0.2. Preferably, wp/wd is about 0.13. Hp/wp is between 0.3 and 1. Preferably, Hp/wp is about 0.4.
In this exemplary embodiment, the supporting portion 50 mounts on the epitaxial layer 11. The connecting portion 51 is mounted between the supporting portion 50 and the epitaxial layer 11. So the flip chip light emitting diode 100 has good mechanical strength and assembly yield. Further, the flip chip light emitting diode 100 has defined a number of Wp, Hd, Wd, Hp. So the flip chip light emitting diode 100 has good coordination with the supporting portion 50 and quality.
Referring to
In the second exemplary embodiment, the light active layer 13, the P-semiconductor layer 14 surrounds the first electrode 20. Thus, the flip chip light emitting diode 100a increases an emitting angle and a scope of emitting light.
Referring to
A method of manufacturing the flip chip light emitting diode 100 of the first exemplary embodiment includes the following steps:
First, referring to
The original semiconductor layer 10a includes a substrate 200, the epitaxial layer 11, the N-semiconductor layer 12, the light active layer 13 and the P-semiconductor layer 14 arranged from top to bottom in series.
Referring to
Then, etching a peripheral portion of the conductive layer 60, a peripheral portion of the P-semiconductor layer 14, a peripheral portion of the light active layer 13, a peripheral portion of the N-semiconductor layer 12 from top to bottom as shown in
While etching, the original semiconductor layer 10a is T-shaped. The N-semiconductor layer 12 is etched to form a protruding portion 120 as shown in
Referring to
The first electrode 20 surrounds the protruding portion 120, the light active layer 13, the P-semiconductor layer 14 and the conductive layer 60. The first electrode 20 is also spaced from the protruding portion 120, the light active layer 13, the P-semiconductor layer 14 and the conductive layer 60. A height of the first electrode 20 is a sum of a height of the protruding portion 120, a height of the light active layer 13, a height of the P-semiconductor layer 14, a height of the conductive layer 60 and a height of the second electrode 30. A bottom surface 21 of the first electrode 20 and a bottom surface 31 of the second electrode 30 are coplanar.
Referring to
A height of the insulating layer 40 is equal to the height of the first electrode 20.
Sixth, referring to
The buffer layer 70 is made of one or more of the following elements: Ti, Ni, Sn, In or Au.
Referring to
Referring to
Referring to
Tenth, referring to
The supporting portion 50 is made of rubber materials, polymer materials, silicon, or SiNx. The connecting portion 51 is made of silicon. A height of the supporting portion 50 is defined as Hp. Hp is 0.2-40 μm, preferably Hd is 2 μm. A width of the supporting portion 50 is defined as wp. wp is about 0.5-40 μm, preferably Wp is about 5 μm.
Referring to
In method of manufacturing the flip chip light emitting diode 100, the apex angle A is formed by a way of etching epitaxial layer 11.
The exemplary embodiments shown and described above are only examples. Many details are often found in the art such as the other features of a flip chip light emitting diode and method of manufacturing the same. Therefore, many such details are neither shown nor described. Even though numerous characteristics and advantages of the present technology have been set forth in the foregoing description, together with details of the structure and function of the present disclosure, the disclosure is illustrative only, and changes can be made in the detail, including in matters of shape, size and arrangement of the parts within the principles of the present disclosure up to, and including the full extent established by the broad general meaning of the terms used in the claims. It will therefore be appreciated that the exemplary embodiments described above can be modified within the scope of the claims.
Number | Date | Country | Kind |
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2017 1 0049601 | Jan 2017 | CN | national |
Number | Name | Date | Kind |
---|---|---|---|
9691944 | Jeon | Jun 2017 | B2 |
20090200568 | Horie | Aug 2009 | A1 |
20150280066 | Fujimura | Oct 2015 | A1 |
Number | Date | Country |
---|---|---|
200812124 | Mar 2008 | TW |
201034246 | Sep 2010 | TW |
201251119 | Dec 2012 | TW |
201308691 | Feb 2013 | TW |
Number | Date | Country | |
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20180212105 A1 | Jul 2018 | US |