Claims
- 1. A crystal growth system, comprising:
at least one vertical furnace; at least one means for inputting thermal energy in said vertical furnace; at least a first thermal boundary member adjacent a top side of said thermal in-put means; at least a second thermal boundary member adjacent a bottom side of said thermal in-put means; and said at least first and second thermal boundary members effective to divide said vertical furnace into at least one narrow high-temperature zone, at least one upper low-temperature zone, and at least one lower low-temperature zone during a use of said vertical furnace, whereby each said low-temperature zone has a lower temperature than said high-temperature zone.
- 2. A crystal growth system, according to claim 1, further comprising:
an inner surface on said at least first and second thermal boundary members; at least one crucible assembly in said vertical furnace; an outer surface on said crucible assembly; and each said inner surface being a distance D less than about 15.0 mm from said outer surface during said use, whereby said thermal boundary members limit transfer of thermal energy along said outer surface into said upper and lower low-temperature zones during said use.
- 3. A crystal growth system, according to claim 2, further comprising:
a ceramic member in said crucible assembly; said outer surface being an outer boundary of said ceramic member; a crucible in said crucible assembly; said crucible containing at least a batch material zone, a melting zone, and a as-grown crystal zone during said use, said melt zone adjacent said high-temperature zone during said use; and a ceramic powder between said crucible and said ceramic member, whereby said ceramic power stabilizes said crucible within said ceramic member during said use.
- 4. A crystal growth system, according to claim 3, further comprising:
means for thermally monitoring at least a first temperature of said thermal in-put means, a second temperature of said crucible in said high-temperature zone, and a third temperature adjacent a base portion of said crucible; means for positioning said crucible assembly relative to said high-temperature zone during said use; said positioning means moving said crucible assembly relative to said high-temperature zone at a rate R between at least 0.2 and 10.0 mm/hr during said use; means for controlling and interfacing with said means for inputting, said means for positioning, and said means for thermally monitoring and operating said crystal growth system during said use.
- 5. A crystal growth system, according to claim 2, wherein, said distance D is preferably less than about 10 mm.
- 6. A crystal growth system, according to claim 5, wherein, said distance D is less than about 5 mm.
- 7. A crystal growth system, according to claim 4, wherein said rate R is preferably between at least 0.2 and 2.4 mm/hr during said use.
- 8. A crystal growth system, according to claim 7, wherein said rate R is more preferably between at least 0.2 and 2.0 mm/hr.
- 9. A crystal growth system, according to claim 3, wherein: a thermal gradient G within said high-temperature zone is from 10 to 50° C./cm.
- 10. A crystal growth system, according to claim 9, wherein said thermal gradient G is preferably from 10 to 40° C./cm.
- 11. A crystal growth system, according to claim 10, wherein a thermal gradient G1 within each said upper and said lower low-temperature zones is a negative thermal gradient.
- 12. A crystal growth system, according to claim 11, wherein said negative thermal gradient G1 is between at least about 40-100° C./cm.
- 13. A crystal growth system, according to claim 3, further comprising:
a wall of said crucible; said wall extending from said lower low-temperature zone through said high-temperature zone and into both said upper low-temperature zone during said use, and a temperature T at said wall of said crucible adjacent said melting zone being less than 1375° C. during said use.
- 14. A crystal growth system, according to claim 13, wherein said temperature T is preferably less than 1360° C. during said use.
- 15. A crystal growth system, according to claim 3, wherein a separation S between said at least first and second thermal boundary members bounding said high-temperature zone is from 3 cm to 7 cm.
- 16. A crystal growth system, according to claim 13, wherein said wall of said crucible has a thickness T between 0.07 mm and 1.2 mm;
- 17. A crystal growth system, according to claim 3, wherein said crucible has a volume between 20 cc and 2000 cc.
- 18. A crystal growth system, comprising:
a triple-zone temperature chamber co-axially containing a crucible assembly having at least three growth sections separated from said temperature chamber by at least two baffles and having sufficient separation therefrom to allow movement there-through during a use; at least one high temperature heating elements; and a means for controllably moving said crucible assembly within said triple-zone chamber during said use.
- 19. A method of forming a crystalline based material, comprising the steps of:
providing a precursor material; loading at least said precursor material into at least one crucible; placing said now-loaded crucible into a rigid ceramic member; filling a space formed between said crucible and said ceramic member with at least one powdered ceramic and forming a crucible assembly; providing a vertical furnace assembly containing at least a narrow high-temperature zone, an upper low-temperature zone, and a lower low-temperature zone, wherein said low-temperature zones are adjacent respective thermal boundaries and each have a negative thermal gradient vertically bounding said high-temperature zone; inserting each said crucible assembly into said furnace assembly and positioning each said crucible assembly on a means for positioning said crucible relative to said high-temperature zone; providing a means for controlling of said crucible assembly, said furnace assembly, and said means for positioning; operating said furnace assembly and forming an as-grown crystalline material in said crucible at a rate from 0.2 to 2.5 mm/hr; and maintaining a temperature gradient at a growth interface in said crucible adjacent said high-temperature zone of from 10° C./cm to about 40° C./cm during said step of operating to form said crystalline material.
- 20. A method, according to claim 19, wherein: said precursor material includes a PMN-PT-based material.
- 21. A method, according to claim 20, wherein: said PMN-PT based material is a selected composition having at least one of the following formulas:
- 22. A method, according to claim 21, wherein: said step of loading further comprises the steps of selecting at least one seed crystal and placing said seed crystal at a bottom of said crucible prior to a loading of said precursor material.
- 23. A method, according to claim 22, wherein: said at least one crystal seed has an orientation including at least one of a <001>, <110>, <211> and a <111> orientation.
- 24. A method, according to claim 21, wherein: said step of loading further comprises the steps of selecting at least one seed crystal and placing said seed crystal at a bottom of said crucible prior to a loading said precursor material.
- 25. A transducer, formed by a process according to claim 20, comprising:
a single crystal element material having the following chemical formula: (1−y)Pb(Mg⅓Nb⅔)1−xTixO3+yPb(R½Nb½O3 (VIII) wherein x is defined as molar % 0.00 to 0.50, y is defined as molar % 0.00 to 0.25, and R is selected from Sc, Yb, Sb, In, Co, Lu, and TM.
- 26. A transducer, according to claim 25, wherein said transducer has a chemical formula according to formula VII and an effective Tc° C. of greater than 176° C. in use.
- 27. A transducer, formed by a method according to claim 20, wherein:
one of a longitudinal and a thickness direction of said transducer is at least one of a <011>, <110>, <211>, and a <111> orientation; and said transducer has an effective coupling constant of at least 0.90.
- 28. A method of forming a crystalline piezoelectric based material, according to claim 20, wherein said step of operating further comprises the steps of:
ramping a furnace temperature, up to less than 1480° C., at a rate of 100° C./hr; holding said furnace temperature between 1430-1480° C. for 6 to 12 hrs, while operably adjusting positions of each crucible assembly and regulating said furnace temperature to confirm the following conditions for each respective crucible during said hold time:
(h) maximum temperature in a melting zone of less than about 1360° C., (i) vertical temperature gradient at a middle of a crystal seed of greater than 25° C./cm, and (j) stable crucible temperature within +/−2° C./hr change; and soaking each crucible for at least 2 hours after achieving the above-defined stable crucible temperature, whereby a crystal growth period is established
- 29. A PMN-PT based material, comprising:
a single crystal; and said single crystal having a formula: (1−y)Pb(Mg⅓Nb⅔)1−xTixO3+yPb(R½Nb½)O3 (IX) wherein x is defined as molar % 0.00 to 0.50, y is defined as molar % 0.00 to 0.25, and R is selected from Sc, Yb, Sb, In, Co, Lu, and TM.
- 30. A PMN-PT based material, according to claim 29, wherein: said single crystal element has at least one of a <001>, <110>, and <111> orientation.
- 31. A PMN-PT based material, according to claim 30, wherein and said single crystal element has a Tc at least from 5 to 10% higher than known PMN-PT crystalline materials.
RELATED APPLICATIONS
[0001] This application claims priority from U.S. Provisional Application Ser. No. 60/330,915, filed Nov. 2, 2001, and said U.S. Provisional Application is incorporated herein by reference.
GOVERNMENT SPONSORSHIP
[0002] This invention was made with Government support under Grant No. N00014-99-C-0367 and N00014-00-C-0436 awarded by the Office of Navy Research. The government has certain rights in the invention.
Provisional Applications (1)
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Number |
Date |
Country |
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60330915 |
Nov 2001 |
US |