1. Field of the Invention
The invention relates to an illumination system, in particular for a projection exposure machine in semiconductor lithography, having a homogenizing element. The invention also relates to a projection exposure machine in semiconductor lithography having an illumination system that has a homogenizing element.
2. Description of the Related Art
The purpose of homogenizing the intensity of a light produced by a light source, for example a laser, is served in an illumination system of a projection exposure machine in semiconductor lithography by a so-called rod integrator by means of which the light is guided and which is preferably arranged with its longitudinal axis parallel to an optical axis of the illumination system. Reflections occur at the walls of the rod, which generally has a flat rectangular shape, the effect being that downstream of the rod pupil distributions, also termed settings, are reflected relative to the x-axis and relative to the y-axis, and therefore symmetrically with reference to this coordinate system. In the case of a rod indictor, for example, in which the edge lengths of the rod that are perpendicular to the longitudinal axis are usually situated along the x- and y-axes, this means that downstream of the rod there is always a symmetrical distribution of a light spot located upstream of the rod, in all four coordinate areas (coordinate quadrants). Symmetrical pupil distributions therefore obtain. In this case, the xyz-coordinate system is defined as a Cartesian coordinate system whose z-axis runs in the longitudinal direction of the rod and through the center of the rod cross section, while the x,y-axes run parallel to the edges of the rectangular illuminated field on the wafer or parallel to the rod edges of the rod cross section when the latter are parallel to the rectangular illuminated field on the wafer. The optical axis runs through the center of the rod cross section.
Reference is made to DE 101 32 988 A1 (U.S. Pat. No. 6,707,537 B2), U.S. Pat. No. 5,675,401 and U.S. Pat. No. 6,285,443 for the prior art.
However, it is also occasionally required that homogenization not be symmetrical relative to the x-/y-coordinate system, or an asymmetric pupil distribution is desired. The standard procedure is for patterns in the wafer to be imaged on the masks vertically or horizontally. Recently, however, there are also patterns that are situated in the x-/y-coordinate system at an angle differing from 90° or 180°. Such structures require an asymmetric pupil distribution. This could certainly be achieved by introducing a stop downstream of the rod in a suitable pupil plane, but it is disadvantageous here that 50% of the light is always lost by vignetting.
It is therefore the object of the present invention to achieve an asymmetric pupil distribution without the occurrence of excessively high light losses.
This is achieved according to the invention by virtue of the fact that for an asymmetric pupil distribution at least the optical elements that produce non-rotationally symmetrical light distributions, and/or the homogenizing element are supported rotatably about the optical axis that forms a z-axis of an x-/y-coordinate system, it being possible to set at least one rotational angle a in such a way that the pupil distribution is located on an axis or symmetrically in relation to an axis of an x′-/y′-coordinate system newly formed by the rotational angle a by means of rotating the x-/y-coordinate system by the angle a.
The invention is based on the following findings. When the pupil distributions or settings are located on an axis of the x-/y-coordinate system or run symmetrically relative to a coordinate axis, in the downstream beam path (with reference to the coordinate axis with reference to which the pupil distribution is symmetrical) the settings are then reflected only into themselves by the rod, and no new settings reflected symmetrically in the coordinate system are produced (with reference to the said coordinate axis). However, an asymmetric pupil distribution requires that the setting produced by the optical element correspondingly provided therefor be seated outside the x- or y-axis (or the pupil distribution is asymmetric with reference to at least one axis), as a result of which the rod would give rise to corresponding reflections in all four quadrants of the coordinate system. If, in accordance with the invention, the optical elements that act asymmetrically or produce no rotationally symmetrical distributions (or exhibit astigmatic conditions) are now adjusted by an angle that corresponds to the angle of the desired obliquity of the patterns on the wafer, and the homogenizing element (for example the rod) also rotates about its z-axis such that the pupil distributions are once again symmetrical relative to an x- or y-axis of the homogenizing element (for example of the rod), the distribution (the setting) is, as mentioned, reflected into itself with reference to this axis, and asymmetric pupil distributions can be achieved. The coordinate system of the rotated homogenizing element is denoted by x′, y′, in order to distinguish it from that of the non-rotated one. The adjustment of the asymmetrically acting optical elements and of the homogenizing element (the rod) can be performed synchronously (at the same time) or sequentially. Furthermore, the adjustment angle or rotational angle of the elements or of the homogenizing element can be the same or different, depending on the initial pupil distribution and the desired obliquity that is prescribed by the patterns. It is also possible in this case for an adjustment angle or rotational angle to vanish.
The desired angle of obliquity can be set arbitrarily in this case, and is selected in accordance with the requirements, the outlay for this being relatively slight, since the elements are already present and only their angle need be correspondingly changed.
Although with this solution the scanning field is delimited in x and y and light is also vignetted thereby, the losses are not so high as with the introduction of a stop.
A further substantial advantage of the invention consists in that the same illumination system is suitable for imaging both vertical or horizontal patterns and oblique patterns, owing to the inventive rotatable setting and the associated mounting of the optical elements and the homogenizing element. All the elements are in the “normal position” in the x-/y-coordinate system for “normal operation”. When it is desired to produce oblique patterns on the wafer, it is necessary merely to set the appropriate rotational angle. Since this can be done without great outlay, this results in an illumination system that can be used very universally in accordance with the customer's requirements.
In a particularly advantageous refinement of the invention, it is possible to provide as homogenizing element a rectangular rod integrator that can be rotated by the rotational angle a for an asymmetric pupil distribution.
The solution according to the invention can be used here with particular advantage whenever use is made not of a rod of decidedly rectangular cross section, but of a rod with an at least approximately square profile. In this case, the light loss and the reduction of the field turn out to be substantially smaller than in the case of a decidedly rectangular rod.
Since an asymmetric distribution in the pupil is not desired permanently, it can be provided in an inventive development of the invention that the illumination system is designed such that the rod integrator is exchangeable. In this case, it is possible to work for a “normal method” with a standard scanner rod integrator with a decidedly rectangular profile and, in case of need, to operate with the same illumination system in the case of exchanging the standard rod integrator for a rod integrator of square or approximately square cross section. All that is additionally required in this case is also for the optical elements, which can be, for example, refractive and/or diffractive optical elements in the illumination system, to be provided in a changing device, for example, so that they can be exchanged or else supported rotatably.
In order to be able to achieve maximum freedom of the possible rotational angle and at the same time not to have to accept limitations with reference to the scanner field, it can be provided in an advantageous refinement of the invention that in the case of a square rod the length of the diagonal of an end face of the rod corresponds to the edge length of the rod. Although the light is substantially vignetted in this case, the advantage of the solution with the exchangeable rod integrator by comparison with a rod integrator that is set at an angle consists in that the scanning field can retain the original size, and therefore results in no additional factor that leads to a reduction in throughput.
Advantageous developments and refinements emerge from the remaining subclaims and from the following exemplary embodiment described in principle with the aid of the drawings.
a shows a diagram of a setting in an x-/y-coordinate system upstream of a homogenizing element;
b shows a diagram of the setting according to
a shows a diagram of two poles of a dipole setting that are located on the y-axis;
b shows a diagram of two extra-axially arranged poles of a dipole setting;
The design and the mode of operation of a projection exposure machine having an illumination system that has a rod integrator or a honeycomb condenser, for example, as homogenizing element are known in principle, and for this reason its design and mode of operation are described only briefly below. As an example, reference is made for further details to DE 101 32 988 A1 (U.S. Pat. No. 6,707,537, B2), which thereby forms a part of the disclosure of the subject matter of the application.
A laser, for example, serves as light source 1, and in this case after traversing a beam expander 2 a projection light bundle passes one or more diffractive optical elements 3 arranged in sequence. The diffractive optical element 3 is arranged in the region of an object plane of an objective 4 that is provided, for example, with a zoom lens 5 and an integrated axicon pair 6. The zoom lens 5 can be used to set the focal length of the objective 4 over a relatively large range such that illumination settings or pupil distributions with different maximum illumination angles can be produced. By adjusting the axicon pair 6, moreover, it is possible to set adapted annular illumination settings. A refractive optical element 7 is arranged downstream of the objective 4. Instead of a refractive optical element 7, it is also possible in case of need to provide a further diffractive optical element at this location. Downstream of the refractive optical element 7, a projection light bundle 8 traverses an incoupling optics 9. The incoupling optics 9 transmits the projection light bundle 8 onto an end-face entrance surface 10a of a rod integrator 10 as homogenizing element. The rod integrator 10 mixes and homogenizes the light by means of multiple internal reflection. Located in the region of an exit surface 10b is a field plane of the illumination optics in which a reticle/mask system (ReMa) is arranged. An adjustable field stop 11 is provided for this purpose. Following after the light bundle has traversed the field stop 11 is a further objective 12 having optical elements 13 that are not shown in more detail. Also located in the objective 12 is a pupil plane 14. A deflecting mirror 15 deflects the light bundle, after which, having traversed a further lens group 16, it strikes a reticle 17 on which the field plane of the field stop 11 is imaged. Following the reticle 17 in the usual way is a projection objective 18 downstream of which a wafer 19 is provided for imaging the correspondingly reduced patterns imaged on the reticle.
a illustrates the imaging of a pupil distribution S or a setting that is arranged upstream of the homogenizing element, for example the rod integrator 10, off-center and not on one of the two axes of an x-/y-coordinate system. During the homogenization of the light bundle, the setting illustrated in
The procedure is as follows according to the invention, however, if distributions that are not symmetrical relative to the x-/y-coordinate system after the homogenization are required in order to produce patterns on the wafer 19 that are obliquely situated:
The pupil distribution produced by the light source 1 after traversing the beam expander 2, the diffractive optical element 3, the objective 4 and the refractive optical element 7 is selected such that these are imaged on an axis, for example the y-axis of the x-/y-coordinate system, as may be seen from
In order to avoid this, the optical elements producing non-rotationally symmetrical conditions, and the rod integrator are now rotated about their optical axis by a rotational angle such that the rotational angle corresponds to the desired obliquity of the patterns on the wafer 19. This means in practice that the x-/y-coordinate system for these optical elements and the rod integrator 10 is rotated about the rotational angle into an x′-/y′-coordinate system, as a result of which the two pupil distributions S again lie on an axis, specifically the new y′-axis, and so there are no additional reflections or duplications: or, in other words, the optical elements and/or the rod integrator are rotated by a rotational angle with reference to the initially defined x-/y-coordinate system such that the pupil distribution is located on an axis of a x′-/y′-coordinate system that emerges from the x-/y-coordinate system by means of rotation by the same rotational angle. This change of coordinate system exerts no influence on the optical elements that are rotationally symmetrical.
It is to be seen from the arrows in
When a “normal” imaging of patterns in a vertical or horizontal direction is desired, the diffractive optical element 3, the refractive optical element 7 and the rod integrator 10 remain in their original position. This means that the same system can be used to image vertical, horizontal and oblique patterns.
As a rule, rod integrators 10 have a decidedly rectangular shape. If such a rod integrator 10 is also used to image oblique patterns of an appropriate rotation, it is unavoidably necessary in the case of prescribed rotational angles to accept a light loss owing to the reduction of the field that turns out to be greater the flatter the rectangular rod integrator 10.
These conditions are apparent from
As illustrated in
In order to achieve maximum freedom of a possible rotational angle a and, at the same time, not to have to accept any limitations on the size of the scanning field, the square rod should have the length of the diagonal of the end face of the rod integrator of a rectangular cross section as edge length.
If it is known, for example, that rotational angles a of at most 20° are being used, the rotatable rod integrator 10 or 10″ must then not be square, but can have a somewhat smaller geometry in one direction, the result being that the light loss is not entirely so large.
It is also possible to provide an exchangeable element instead of a rotatable diffractive optical element. This means that in the case of an asymmetric pupil distribution the “normal” diffractive optical element is exchanged for a diffractive optical element that produces the asymmetric distribution directly. For this purpose, the diffractive pattern is correspondingly selected such that the “rotated” pattern is produced automatically.
Number | Date | Country | Kind |
---|---|---|---|
10 2005 004 216.3 | Jan 2005 | DE | national |
This application is a U.S. National Phase Entry Under 35 U.S.C. §371 of, and claims priority under 35 U.S.C. §§ 119 and 365 to copending PCT/EP2006/000535, filed Jan. 21, 2006 which designated the U.S. and which claims priority to German Patent Application No. 10 2005 004 216.3, filed Jan. 29, 2005.
Filing Document | Filing Date | Country | Kind | 371c Date |
---|---|---|---|---|
PCT/EP2006/000535 | 1/21/2006 | WO | 00 | 4/3/2008 |