1. Technical Field
The present disclosure relates to an impact testing device for testing impact resistances of electronic devices.
2. Description of Related Art
Electronic devices, such as mobile phones, are usually impact tested to test their impact resistance. A typical method to test the electronic device is operating an impact head to make the head fall down to impact a testing point of the electronic device. The impact resistance of the electronic device is determined by the damaged condition of the impact point of the electronic device. While sometimes there may be many points that need to be tested, the position of the electronic device should be able to be changed for the impact test on different testing points. Currently, the position changes of the electronic device are commonly manually operated. However, the manual operation of the position of the electronic device is time consuming and commonly results in imprecise results.
Therefore, there is room for improvement within the art.
Many aspects of the disclosure can be better understood with reference to the following figures. The components in the figures are not necessarily drawn to scale, the emphasis instead being placed upon clearly illustrating the principles of the disclosure. Moreover, in the drawings, like reference numerals designate corresponding parts throughout the several views.
The impact testing device 100 includes a controller box 10, a supporting assembly 30, a falling assembly 50, and a control station 70. The electronic device 200 is located on the supporting assembly 30.
The controller box 10 electrically connects to the supporting assembly 30, the falling assembly 50, and the control station 70. The control station 70 gives out commands to the controller box 10 to adjust the height of the falling assembly 50 and the position of the supporting assembly 30.
The supporting assembly 30 includes a first adjusting module 31 and a second adjusting module 33 located on the first adjusting module 31. The electronic device 200 is located on the top of the second adjusting module 33.
Referring to
The second adjusting module 33 is similar to the first adjusting module 31. The second adjusting module 33 includes a second cylinder 331, two second sliding rails 333, and a supporting board 335. The two second sliding rails 333 are arranged in parallel along the Y-axis and fastened on the connecting board 315. The supporting board 335 is removably mounted on the two second sliding rails 333. The second cylinder 331 is fastened on the connecting board 315, and connects the supporting board 335 to drive the supporting board 335 to remove on the second sliding rails 333 along the Y-axis.
In the embodiment, the supporting assembly 30 further includes a limiting module 35 positioned on the supporting board 335 to restrict the electronic device 200 in the testing position (initial position) on the supporting board 335. The electronic device 200 in the embodiment may have a rectangular figure. The limiting module 35 includes two limiting elements 351 and two stopping members 353. The limiting elements 351 are positioned adjacent to one diagonal corners of the electronic device 200. The two stopping members 353 are positioned adjacent to the opposite two sides of the electronic device 200.
Each limiting element 351 includes a limiting cylinder 3511 and a resisting block 3513 connecting to the limiting cylinder 3511. In the embodiment, the resisting blocks 3513 are āLā shaped and towards the electronic device 200. The resisting block 3513 has a shape mating with the corner of the electronic device 200. The two resisting blocks 3513 are driven by the limiting cylinders 3511 to move to the electronic device 200 to catch the diagonal two corners of the electronic device 200 thus limiting the electronic device 200 at an initial location on the supporting board 335. Each stopping member 353 has an end positioning upon the electronic device 200. When a test is started, the limiting cylinders 3511 drive the resisting blocks 3513 away from the electronic device 200 to release the electronic device 200, making the electronic device 200 be tested at a free status. The stopping members 353 and the resisting blocks 3513 prevent the electronic device 200 from falling down from the supporting assembly 30 during test.
The sliding element 53 includes two guiding rails 531, a sliding plate 533 slidably mounted on the two guiding rails 531, and a connecting plate 535 fastened to the sliding plate 533. The two guiding rails 531 are arranged in parallel along the Z-axis and oppositely located on the side of the post 51 towards the supporting assembly 30. The sliding plate 533 defines two sliding grooves 5331 on the side towards the guiding rails 531. The sliding grooves 5331 have shapes mating with the guiding rails 531 for slidably mounting the sliding plate 533 on the guiding rails 531. The connecting plate 535 is fastened on the sliding plate 533 opposite to the sliding grooves 5331. The falling board 57 is fastened to the connecting plate 535. The connecting plate 535 also connects to the driver 55, so that the driver 55 drives the connecting plate 535 to make the sliding plate 533 slide along the guiding rails 531 to adjust the height of the falling board 57 along the Z-axis. In the embodiment, the connecting plate 535 defines a notch 5351, and a connecting block 5353 is formed on the surface of the notch 5351 to form a slot 5355 between the surface of the notch 5351 and the connecting block 5353. The connecting plate 535 connects to the driver 55 by the connecting block 5353 and the slot 5355.
The driver 55 includes a motor 551, a wheel 553, and a driving band 555. The motor 551 and the wheel 533 are located at the two ends of the post 51 along the Z-axis. The driving band 555 surrounds the motor 551 and the wheel 553 and forms two parallel parts along the Z-axis. The part of the driving band 555 far from the post 51 passes through the slot 5355 and locks with the connecting block 5353 of the connecting plate 535, thus connecting the connecting plate 535 to the driving band 555. As such, when the driving band 555 is driven by the motor 551, the driving band 555 drives the connecting plate 535 and the falling board 57 along the Z-axis and adjust the height of the impact head 300. In the embodiment, the motor 551 is fastened on the top of the controller box 10. The wheel 553 is fastened on the top end of the post 51.
The falling board 57 is āLā shaped. The falling board 57 has a part parallel to the supporting assembly 30 in which a falling hole 571 is defined. The falling hole 571 has a diameter a little more than the diameter of the impact head 300 so that the impact head 300 can fall through the falling hole 571 to hit the electronic device 200. The falling board 57 defines another part vertical to the supporting assembly which may be fastened to the connecting plate 535 by screws.
The control station 70 is for testers to input testing parameters, such as the height of the falling board 57 (or the impact head 300), and the testing points of the electronic device 200. The control station 70 also gives out commands to the controller box 10 to control the work of the first cylinder 311, the second cylinder 331, and the motor 551.
When using the impact testing device 100 to test the electronic device 200, the electronic device 200 is first positioned on the supporting board 335, and the limiting elements 351 and the stopping members 353 surround the electronic device 200. Then, testers set the testing parameters on the control station 70. Next, the control station 70 gives out an implementing command to the controller box 10. The controller box 10 controls the limiting elements 351 to put the electronic device 200 at the test location (initial location) on the supporting board 335. Simultaneously, the controller box 10 controls the driver 55 to adjust the height of the falling board 57 along the Z-axis, and drives the first adjusting module 31 and the second adjusting module 33 to remove the electronic device 200 and make the first testing point of the electronic device 200 aim the center of the falling hole 571. At this time, the limiting elements 351 release the electronic device 200 and the impact head 300 falls down through the falling hole 571 of the falling board 57 to hit the first testing point of the electronic device 200. As such, a first test cycle is finished. The impact head 300 can be controlled by an auto-falling device (not shown). After the first test cycle, the limiting elements 351 work to again restrict the electronic device 200 at the initial location on the supporting board 335 (the electronic device 200 may move while being hit by the impact head 300), then the first adjusting module 31 and the second adjusting module 33 change the position of the electronic device 200 to make the second testing point of the electronic device 200 aim the center of the falling hole 571, the limiting elements 351 release the electronic device 200 once more, and then the impact head 300 falls through the falling hole 571 again to hit the second testing point of the electronic device 200. As such, a second test cycle is finished. The other test cycles for the different testing points of the electronic device 200 will be finished similarly.
The impact testing device 100 of the exemplary embodiment can automatically remove the electronic device 200 to make different testing points of the electronic device 200 aim the impact head 300 orderly for tests, which is much more effective. Furthermore, compared to the manual operation of the electronic device 200, the locations of the electronic device 200 controlled by the impact testing device 100 are much more precise, and the test results using the impact testing device 100 are also much more consistent and precise.
It is believed that the exemplary embodiment and its advantages will be understood from the foregoing description, and it will be apparent that various changes may be made thereto without departing from the spirit and scope of the disclosure or sacrificing all of its advantages, the examples hereinbefore described merely being preferred or exemplary embodiment of the disclosure.
Number | Date | Country | Kind |
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201210037711.7 | Feb 2012 | CN | national |