related to environmental aspects

Industry

CPC
G01R1/0458

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Multi-beam cantilever style contact pin for IC testing
- Patent number 12,313,650
- Issue date May 27, 2025
- Equiptest Engineering Pte Ltd
- Michael Goh
- G01 - MEASURING TESTING
Information Patent Grant
Electronic component handling apparatus and electronic component te...
- Patent number 12,282,057
- Issue date Apr 22, 2025
- Advantest Corporation
- Yuya Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Plasma reactor having array of coaxial multiple pins and processing...
- Patent number 12,230,481
- Issue date Feb 18, 2025
- HANGZHOU CITY UNIVERSITY
- Qi Qiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Active thermal interposer device
- Patent number 12,216,154
- Issue date Feb 4, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Testing devices and method for testing semiconductor devices
- Patent number 12,092,655
- Issue date Sep 17, 2024
- NANYA TECHNOLOGY CORPORATION
- Wu-Der Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test socket assemblies with liquid cooled frame for semiconductor i...
- Patent number 12,032,000
- Issue date Jul 9, 2024
- Smiths Interconnect Americas, Inc.
- Quynh Ngoc Nguyen
- G01 - MEASURING TESTING
Information Patent Grant
Heat exchanger for thermal control of heat producing devices
- Patent number 12,019,095
- Issue date Jun 25, 2024
- Mikros Manufacturing, Inc.
- Jesse D. McGowan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test socket having an automated lid
- Patent number 12,007,411
- Issue date Jun 11, 2024
- Teradyne, Inc.
- John P. Toscano
- G01 - MEASURING TESTING
Information Patent Grant
Frame for contact unit and socket
- Patent number 12,009,614
- Issue date Jun 11, 2024
- Enplas Corporation
- Yuki Ueyama
- G01 - MEASURING TESTING
Information Patent Grant
Modular automated test system
- Patent number 11,953,519
- Issue date Apr 9, 2024
- Teradyne, Inc.
- Christopher James Bruno
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device characterization systems and methods
- Patent number 11,940,478
- Issue date Mar 26, 2024
- Duke University
- Aaron D. Franklin
- G01 - MEASURING TESTING
Information Patent Grant
Socket side thermal system
- Patent number 11,879,910
- Issue date Jan 23, 2024
- Delta Design, Inc.
- Jerry Ihor Tustaniwskyj
- G01 - MEASURING TESTING
Information Patent Grant
Active thermal interposer device
- Patent number 11,846,669
- Issue date Dec 19, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus for testing semiconductor devices
- Patent number 11,802,910
- Issue date Oct 31, 2023
- NANYA TECHNOLOGY CORPORATION
- Wu-Der Yang
- G01 - MEASURING TESTING
Information Patent Grant
Test system including active thermal interposer device
- Patent number 11,774,492
- Issue date Oct 3, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Test and burn-in apparatus that provides variable thermal resistance
- Patent number 11,768,224
- Issue date Sep 26, 2023
- Kes Systems, Inc.
- Ballson Gopal
- G01 - MEASURING TESTING
Information Patent Grant
Test site configuration in an automated test system
- Patent number 11,754,596
- Issue date Sep 12, 2023
- Teradyne, Inc.
- Michael O. McKenna
- G01 - MEASURING TESTING
Information Patent Grant
DUT placement and handling for active thermal interposer device
- Patent number 11,754,620
- Issue date Sep 12, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Thermal control system for an automated test system
- Patent number 11,754,622
- Issue date Sep 12, 2023
- Teradyne, Inc.
- Larry Wayne Akers
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Grant
Multistory electronic device testing apparatus
- Patent number 11,740,283
- Issue date Aug 29, 2023
- CHROMA ATE INC.
- Chin-Yi Ouyang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for conducting burn-in testing of semiconducto...
- Patent number 11,719,743
- Issue date Aug 8, 2023
- Kes Systems, Inc.
- Ballson Gopal
- G01 - MEASURING TESTING
Information Patent Grant
Thermal sensor
- Patent number 11,709,200
- Issue date Jul 25, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Szu-Lin Liu
- G01 - MEASURING TESTING
Information Patent Grant
Test carrier
- Patent number 11,693,026
- Issue date Jul 4, 2023
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Grant
Low-thermal resistance pressing device for a socket
- Patent number 11,630,147
- Issue date Apr 18, 2023
- CHROMA ATE INC.
- Ming Cheng Huang
- G01 - MEASURING TESTING
Information Patent Grant
Chip testing apparatus
- Patent number 11,630,148
- Issue date Apr 18, 2023
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- G01 - MEASURING TESTING
Information Patent Grant
IC socket for semiconductor
- Patent number 11,624,774
- Issue date Apr 11, 2023
- Yamaichi Electronics Co., Ltd.
- Hiroki Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Active thermal interposer device
- Patent number 11,609,266
- Issue date Mar 21, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Testing system including active thermal interposer device
- Patent number 11,567,119
- Issue date Jan 31, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus which tests semiconductor chips
- Patent number 11,506,740
- Issue date Nov 22, 2022
- Samsung Electronics Co., Ltd.
- Ung Jin Jang
- G01 - MEASURING TESTING
Information Patent Grant
Chuck unit and method for controlling temperature of the chuck unit
- Patent number 11,486,895
- Issue date Nov 1, 2022
- HiSOL, Inc.
- Hirofumi Yanai
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...

Patents Applicationslast 30 patents

Information Patent Application
TEST SOCKET
- Publication number 20250231218
- Publication date Jul 17, 2025
- ISC CO., LTD
- Jong Woo OH
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL SOCKET WITH AN IMPROVED ELEVATING MECHANISM FOR A HEATIN...
- Publication number 20250189558
- Publication date Jun 12, 2025
- FOXCONN (KUNSHAN) COMPUTER CONNECTOR CO., LTD.
- MING-YUE CHEN
- G01 - MEASURING TESTING
Information Patent Application
HEAT DISSIPATION STRUCTURE
- Publication number 20250176144
- Publication date May 29, 2025
- Siliconware Precision Industries Co., Ltd.
- Meng-Lin WU
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Semiconductor Module Inspection Device
- Publication number 20250130252
- Publication date Apr 24, 2025
- Nippon Telegraph and Telephone Corporation
- Masayuki Takahashi
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE THERMAL INTERPOSER DEVICE
- Publication number 20250093408
- Publication date Mar 20, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SOCKET
- Publication number 20250052782
- Publication date Feb 13, 2025
- YOKOWO CO., LTD
- Hirotaka TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
PHASE-CHANGE TEMPERATURE REGULATING SYSTEM AND ELECTRONIC COMPONENT...
- Publication number 20250040095
- Publication date Jan 30, 2025
- CHROMA ATE INC.
- Xin-Yi Wu
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
INSPECTION SYSTEM WITH THERMAL INTERFACE, AND ELECTRONIC COMPONENT...
- Publication number 20250027987
- Publication date Jan 23, 2025
- CHROMA ATE INC.
- I-Shih Tseng
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20240183878
- Publication date Jun 6, 2024
- TAIWAN MASK CORPORATION
- Chih-Ming CHEN
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE THERMAL INTERPOSER DEVICE WITH THERMAL ISOLATION STRUCTURES
- Publication number 20240183898
- Publication date Jun 6, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
SOCKET DEVICE FOR TESTING ICs
- Publication number 20240183879
- Publication date Jun 6, 2024
- HICON CO., LTD.
- Dong Weon HWANG
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET FOR AND A METHOD OF TESTING ELECTRONIC COMPONENTS, IN P...
- Publication number 20240168055
- Publication date May 23, 2024
- Cohu GmbH
- Stefan ENGELBRECHT
- G01 - MEASURING TESTING
Information Patent Application
IC INSPECTION SOCKET
- Publication number 20240159793
- Publication date May 16, 2024
- YOKOWO CO., LTD.
- Daigo TAKEI
- G01 - MEASURING TESTING
Information Patent Application
POGO PIN COOLING SYSTEM AND METHOD AND ELECTRONIC DEVICE TESTING AP...
- Publication number 20240151746
- Publication date May 9, 2024
- CHROMA ATE INC.
- I-Shih TSENG
- G01 - MEASURING TESTING
Information Patent Application
TEST BOARD, AND DIAGNOSTIC SYSTEM, DIAGNOSTIC METHOD, AND NON-TRANS...
- Publication number 20240077530
- Publication date Mar 7, 2024
- KIOXIA Corporation
- Tetsuharu KOJIMA
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE THERMAL INTERPOSER DEVICE
- Publication number 20240003967
- Publication date Jan 4, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Application
PLASMA REACTOR HAVING ARRAY OF COAXIAL MULTIPLE PINS AND PROCESSING...
- Publication number 20240006162
- Publication date Jan 4, 2024
- HANGZHOU CITY UNIVERSITY
- QI QIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HEAT EXCHANGER FOR THERMAL CONTROL OF HEAT PRODUCING DEVICES
- Publication number 20230408545
- Publication date Dec 21, 2023
- Mikros Manufacturing, Inc.
- Jesse D. McGowan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Liquid cooling system, liquid cooling method and electronic device-...
- Publication number 20230400478
- Publication date Dec 14, 2023
- CHROMA ATE INC.
- I-Shih TSENG
- G01 - MEASURING TESTING
Information Patent Application
PROBE APPARATUS FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20230366926
- Publication date Nov 16, 2023
- NANYA TECHNOLOGY CORPORATION
- Wu-Der Yang
- G01 - MEASURING TESTING
Information Patent Application
MULTI-BEAM CANTILEVER STYLE CONTACT PIN FOR IC TESTING
- Publication number 20230349949
- Publication date Nov 2, 2023
- EQUIPTEST ENGINEERING PTE LTD
- Michael GOH
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC COMPONENT HANDLING APPARATUS AND ELECTRONIC COMPONENT TE...
- Publication number 20230305053
- Publication date Sep 28, 2023
- Advantest Corporation
- Yuya Yamada
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for the Temperature Control of a Substrate and Correspond...
- Publication number 20230148124
- Publication date May 11, 2023
- ERS electronic GmbH
- Klaus Reitinger
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
ACTIVE THERMAL INTERPOSER DEVICE
- Publication number 20230129112
- Publication date Apr 27, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Application
TEST CARRIER
- Publication number 20230131189
- Publication date Apr 27, 2023
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET ASSEMBLIES WITH LIQUID COOLED FRAME FOR SEMICONDUCTOR I...
- Publication number 20230047762
- Publication date Feb 16, 2023
- Smiths Interconnect Americas, Inc.
- Quynh Ngoc Nguyen
- G01 - MEASURING TESTING
Information Patent Application
CHIP TESTING APPARATUS
- Publication number 20230048515
- Publication date Feb 16, 2023
- ONE TEST SYSTEMS
- CHEN-LUNG TSAI
- G01 - MEASURING TESTING
Information Patent Application
Multistory Electronic Device Testing Apparatus
- Publication number 20230022501
- Publication date Jan 26, 2023
- CHROMA ATE INC.
- Chin-Yi OUYANG
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET HAVING AN AUTOMATED LID
- Publication number 20220404394
- Publication date Dec 22, 2022
- Teradyne, Inc.
- John P. Toscano
- G01 - MEASURING TESTING
Information Patent Application
THERMAL SENSOR
- Publication number 20220365129
- Publication date Nov 17, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Szu-Lin Liu
- G01 - MEASURING TESTING

related to environmental aspects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Multi-beam cantilever style contact pin for IC testing

Electronic component handling apparatus and electronic component te...

Plasma reactor having array of coaxial multiple pins and processing...

Active thermal interposer device

Testing devices and method for testing semiconductor devices

Test socket assemblies with liquid cooled frame for semiconductor i...

Heat exchanger for thermal control of heat producing devices

Test socket having an automated lid

Frame for contact unit and socket

Modular automated test system

Electronic device characterization systems and methods

Socket side thermal system

Active thermal interposer device

Probe apparatus for testing semiconductor devices

Test system including active thermal interposer device

Test and burn-in apparatus that provides variable thermal resistance

Test site configuration in an automated test system

DUT placement and handling for active thermal interposer device

Thermal control system for an automated test system

Multistory electronic device testing apparatus

Method and apparatus for conducting burn-in testing of semiconducto...

Thermal sensor

Test carrier

Low-thermal resistance pressing device for a socket

Chip testing apparatus

IC socket for semiconductor

Active thermal interposer device

Testing system including active thermal interposer device

Test apparatus which tests semiconductor chips

Chuck unit and method for controlling temperature of the chuck unit

Patents Applicationslast 30 patents

TEST SOCKET

ELECTRICAL SOCKET WITH AN IMPROVED ELEVATING MECHANISM FOR A HEATIN...

HEAT DISSIPATION STRUCTURE

Semiconductor Module Inspection Device

ACTIVE THERMAL INTERPOSER DEVICE

INSPECTION SOCKET

PHASE-CHANGE TEMPERATURE REGULATING SYSTEM AND ELECTRONIC COMPONENT...

INSPECTION SYSTEM WITH THERMAL INTERFACE, AND ELECTRONIC COMPONENT...

TEST SYSTEM FOR TESTING SEMICONDUCTOR DEVICES

ACTIVE THERMAL INTERPOSER DEVICE WITH THERMAL ISOLATION STRUCTURES

SOCKET DEVICE FOR TESTING ICs

TEST SOCKET FOR AND A METHOD OF TESTING ELECTRONIC COMPONENTS, IN P...

IC INSPECTION SOCKET

POGO PIN COOLING SYSTEM AND METHOD AND ELECTRONIC DEVICE TESTING AP...

TEST BOARD, AND DIAGNOSTIC SYSTEM, DIAGNOSTIC METHOD, AND NON-TRANS...

ACTIVE THERMAL INTERPOSER DEVICE

PLASMA REACTOR HAVING ARRAY OF COAXIAL MULTIPLE PINS AND PROCESSING...

HEAT EXCHANGER FOR THERMAL CONTROL OF HEAT PRODUCING DEVICES

Liquid cooling system, liquid cooling method and electronic device-...

PROBE APPARATUS FOR TESTING SEMICONDUCTOR DEVICES

MULTI-BEAM CANTILEVER STYLE CONTACT PIN FOR IC TESTING

ELECTRONIC COMPONENT HANDLING APPARATUS AND ELECTRONIC COMPONENT TE...

Apparatus for the Temperature Control of a Substrate and Correspond...

ACTIVE THERMAL INTERPOSER DEVICE

TEST CARRIER

TEST SOCKET ASSEMBLIES WITH LIQUID COOLED FRAME FOR SEMICONDUCTOR I...

CHIP TESTING APPARATUS

Multistory Electronic Device Testing Apparatus

TEST SOCKET HAVING AN AUTOMATED LID

THERMAL SENSOR