Claims
- 1. An apparatus for remotely sensing for the presence of a material that possesses molecular vibrational bands in the infrared electromagnetic region in a sample comprising:
- interrogation component means including infrared radiation source means for irradiating the sample at a predetermined exciting energy to said material's vibrational bands to vibrationally excite said material, and for irradiating the sample at a reference energy different from said predetermined exciting energy;
- collection component means for gathering backscattering radiations from said sample as the sample is irradiated at each of the exciting energy and the reference energy by said radiation source means;
- optical analysis component means for converting the gathered backscattering radiations into a difference Mueller matrix representing a subtractive comparison of said backscattering radiations; and
- filter component means for receiving said difference Mueller matrix from the optical analysis component means and comparing it to a predetermined difference Mueller matrix of the material to thereby determine the presence of the material in the sample.
- 2. The apparatus of claim 1 wherein:
- said infrared radiation source means includes a first infrared laser source for applying said predetermined exciting energy to said sample, and second infrared laser source for applying said reference exciting energy to said sample, wherein applications of energy are sequentially applied to the sample.
- 3. The apparatus of claim 2 wherein:
- said optical analysis component means converts the gathered backscattering radiations into intermediate Mueller matrices at the exciting and reference energies and produces said difference Mueller matrix derived from a subtraction of said intermediate Mueller matrices.
- 4. The apparatus of claim 2 wherein:
- said infrared radiation source means includes a third infrared laser source for a applying another exciting energy to said sample to vibrationally excite the material in a second vibrational mode;
- said optical analysis component means converts the gathered backscattering radiations resulting from application of said another exciting energy into another intermediate Mueller matrix and produces another difference Mueller matrix derived from a subtraction of said another intermediate Mueller matrix and the reference energy Mueller matrix; and
- said filter component means also receives said another difference Mueller matrix from the optical analysis component means and compares it to another predetermined difference Mueller matrix of the material to thereby determine the presence of the material in the sample.
- 5. The apparatus of claim 2 wherein:
- said interrogation component means further including means to polarization-modulate the infrared laser sources.
- 6. The apparatus of claim 5 wherein;
- each of said infrared laser sources emits lasers in the middle infrared region.
- 7. The apparatus of claim 1 wherein:
- said collection component means includes a beam compression telescope to gather the backscattering radiations.
- 8. The apparatus of claim 1 wherein said optical analysis component means includes a phase comparator means for determining range to the sample.
- 9. The apparatus of claim 1 wherein, reference energy applied to the sample is detuned from the material's vibrational bands to preclude the material from achieving a vibrationally excited state during application of the reference energy.
- 10. A method for sensing for the presence of a material that possesses molecular vibrational bands in the infrared electromagnetic region in a sample comprising the steps of:
- irradiating the sample with an infrared radiation laser source at a predetermined exciting energy to said material's vibrational bands to vibrationally excite said material;
- gathering backscattering radiations from said sample as the sample is irradiated at the predetermined exciting energy;
- irradiating the sample with an infrared radiation laser source at a reference energy different from said predetermined exciting energy;
- gathering backscattering radiations from said sample as the sample is irradiated at the reference energy;
- converting the gathered backscattering radiations into a difference Mueller matrix representing a subtractive comparison of said backscattering radiations; and
- comparing the resultant difference Mueller matrix to a predetermined difference Mueller matrix of the material to thereby determine the presence of the material in the sample.
- 11. The method of claim 10 further comprising the step of converting the gathered backscattering radiations to scattergrams containing physical and geometric information describing the sample in elastic scattering as an intermediate step toward achieving the difference Mueller matrix.
- 12. The method of claim 10 further comprising the step of determining distance to the sample by comparing modulation between the first infrared radiation laser source and its resultant backscattering radiation.
- 13. The method of claim 10 further comprising the step of irradiating the sample with an infrared radiation laser source at another exciting energy to vibrationally excite the material in a second vibrational mode;
- gathering backscattering radiations from said sample as the sample is irradiated at each of the another exciting energy and the reference energy;
- converting the gathered backscattering radiations into a difference Mueller matrix representing a subtractive comparison of said backscattering radiations; and
- comparing the resultant difference Mueller matrix to another predetermined difference Mueller matrix of the material to thereby determine the presence of the material in the sample.
GOVERNMENT INTEREST
The invention described herein may be manufactured, licensed, and used by or for the U.S. Government.
US Referenced Citations (9)