(1) Field of the Invention
The present invention is related to an inspecting device for optical films, which is especially applied in the inspection as feeding raw materials to inspect the thickness homogeneousness and defects of optical films and report the inspection results when supplying raw materials. The structure of the inspecting device is simple and we don't need extra expensive instruments and extra processing procedures for optical film samples for inspection. It doesn't take a long time for the inspecting procedures. Its cost is also not high. It's very beneficial for reducing production cost.
(2) Description of the Prior Art
The polarizer is one of the indispensable key components in liquid crystal display industry. There are three types: TN (Twisted Nematic), STN (Super Twisted Nematic), and TFT (Thin Film Transistor) in the application of LCD. As the prosperity of LCD panel industry, the market of polarizers also largely grows. The function of a polarizer is to filter the light of unspecific direction and become the light of specific direction. If we put two polarizers with their polarization direction being right angle, the light passing through one polarizer cannot pass through the other polarizer and will become dark. However, if we utilize voltage to control the molecule array direction in a liquid crystal layer, we can make the direction of polarized light to turn 90 degree and to pass through the other polarizer. It will show white light and make the panel to display light or dark. Briefly, the main function of a polarizer is to polarize the non-polarized light and make the light to pass through the liquid crystal layer to be polarized light.
Referring to
The process of a polarizer can be divided into pre-process and past-process. As shown in
Since the polarizer is a multi-layer optical film product, the raw material quality of each film layer, the homogeneousness of painting, and the cohesiveness between layers will affect the properties of polarizer products. In the present production line, there are inspecting points at the end of pre-process. Using polarized light directly and indirectly penetrating inspecting method, we can inspect the film homogeneousness and defects of polarizer semimanufacture. However, the defects and the gooseflesh of optical films are made when feeding raw materials but can't be cleaned out. We have to inspect them when semimanufactures are made. It wastes manpower and resources, increases production cost, but can't provide the quality condition of optical film materials to the suppliers for improvement.
Thus in the process of polarizer, if we can proceed a simple, fast inspection for optical film materials when feeding the optical film materials (such as TAC, PE, PET), it will be conducive to avoid defects of products. It will be the direction of improvement in the process techniques of polarizers.
The invention provides an inspecting device for optical films. The inspecting device is installed in the location of feeding raw materials to inspect the quality of fed optical film materials and the homogeneousness of films, and report the inspection results to the materials suppliers in time. It is conducive for improvement and can reduce the production cost. The inspection cost of the inspecting device is not high. We don't need to have any expensive facility or extra process for optical film samples.
The invention is an inspecting device for optical films, which can be installed before the optical film materials are fed. The main purpose is to inspect before raw materials are fed and to discern if the films are homogeneous and if there are defects. We can report the quality status of the optical film materials to suppliers for the improvement and promotion of the quality of materials.
The invention is an inspecting device for optical films. Its secondary purpose is to provide a simple, low-inspection-cost inspecting device. Using the inspecting device to inspect optical films is conducive to reduce production cost.
The invention is an inspecting device for optical films used to inspect the optical films. It comprises one or more than one illuminant, a filtering device, one or more than one polarization device, and a scattering device. The illuminant radiates a beam through the filtering device to filter the most suitable beam for inspection and to be polarized through the polarization device because of the polarization action. The polarized beam is magnified as it passes through the scattering device and increases the inspection range of optical films. When polarized light passes through the optical films for inspection, if the film is not homogeneous or there are defects in the films, there will be a phase difference of the polarized light and make the beam to become light or dark after projection to discern the status of the optical films. The inspecting device can have a screen. It is conducive to show the inspection results of optical films by projecting the image on the screen.
To help those who are familiar with the techniques to realize the purpose, the characteristic, and the function of the invention, we describe the invention by the embodiment examples and figures as follow:
The present invention is an inspecting device for optical films used to inspect the thickness homogeneousness and defects of optical films.
As shown in
As shown in
As shown in
Referring to
The present invention is an inspecting device for optical films used not only to inspect the gooseflesh of optical films but also to inspect if there are scratches and unevenly painting when feeding raw materials. Moreover, since the structure of the inspecting device is simple, it is not necessary to install other expensive instruments and to proceed extra procedures of the optical film sample for inspection. We can inspect as the optical film raw materials are fed and discern the quality of the optical film raw materials. Thus we can report the inspection results to the suppliers. It doesn't take a long time for the inspection procedures. Its cost is also not high. It is beneficial for reducing production cost.
We have provided a detailed description of this present invention. What we have described is only three of the better embodiment examples of the invention. It can't restrict the embodiment scope of the invention. All the variation and modification from the application extent of this invention should still belong to the patent scope of the invention.
Number | Date | Country | Kind |
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093108440 | Mar 2004 | TW | national |