Scan or image signal processing specially adapted therefor

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CPC
G01N21/8851

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/8851Scan or image signal processing specially adapted therefor

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Decay detection system
- Patent number 12,217,410
- Issue date Feb 4, 2025
- SUNKIST GROWERS, INC.
- Aaron Gorsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection system having human-machine interaction function
- Patent number 12,217,498
- Issue date Feb 4, 2025
- KAPITO INC.
- Feng-Tso Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for inspecting cans
- Patent number 12,216,062
- Issue date Feb 4, 2025
- Krones AG
- Stefan Piana
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device which can determine a dirtiness level
- Patent number 12,216,063
- Issue date Feb 4, 2025
- PixArt Imaging Inc.
- Tsung-Fa Wang
- G01 - MEASURING TESTING
Information Patent Grant
Inspection support device, inspection support method, and inspectio...
- Patent number 12,209,972
- Issue date Jan 28, 2025
- FUJIFILM Corporation
- Shuhei Horita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spark spectrometry for inclusions content distribution on the surfa...
- Patent number 12,203,864
- Issue date Jan 21, 2025
- NCS TESTING TECHNOLOGY CO., LTD
- Yunhai Jia
- G01 - MEASURING TESTING
Information Patent Grant
Qualitative or quantitative characterization of a coating surface
- Patent number 12,203,868
- Issue date Jan 21, 2025
- Evonik Operations GmbH
- Philipp Isken
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Method for inspecting pattern defects
- Patent number 12,196,687
- Issue date Jan 14, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ju-Ying Chen
- G01 - MEASURING TESTING
Information Patent Grant
Syclops
- Patent number 12,198,319
- Issue date Jan 14, 2025
- Ronald Baker
- G01 - MEASURING TESTING
Information Patent Grant
Image processing system, image processing device, image processing...
- Patent number 12,190,477
- Issue date Jan 7, 2025
- FUJIFILM Corporation
- Kenkichi Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated optical double-sided inspection apparatus
- Patent number 12,188,877
- Issue date Jan 7, 2025
- Feng Chia University
- Yee Siang Gan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Foreign object debris detection
- Patent number 12,188,878
- Issue date Jan 7, 2025
- The Government of the United States of America, as represented by the Secreta...
- Andrew Nicholas
- G01 - MEASURING TESTING
Information Patent Grant
Microscopic non-destructive measurement method of microstructure li...
- Patent number 12,190,495
- Issue date Jan 7, 2025
- NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Zhishan Gao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Station and method for translationally detecting glaze defects on g...
- Patent number 12,181,419
- Issue date Dec 31, 2024
- TIAMA
- Laurent Cosneau
- G01 - MEASURING TESTING
Information Patent Grant
Methods, systems and devices for automated assembly of building str...
- Patent number 12,179,361
- Issue date Dec 31, 2024
- Promise Robotics Inc.
- Ramtin Attar
- G01 - MEASURING TESTING
Information Patent Grant
Measurement tool for cable-preparation system
- Patent number 12,176,689
- Issue date Dec 24, 2024
- 3M Innovative Properties Company
- Douglas B. Gundel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect position determination system, appearance inspection method...
- Patent number 12,175,653
- Issue date Dec 24, 2024
- NEC Corporation
- Yuka Oshima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for transformer in-situ inspection
- Patent number 12,163,896
- Issue date Dec 10, 2024
- HITACHI ENERGY LTD
- Luiz V. Cheim
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
System and method for inspecting a component for anomalous regions
- Patent number 12,163,970
- Issue date Dec 10, 2024
- RTX Corporation
- Brigid A. Blakeslee
- G01 - MEASURING TESTING
Information Patent Grant
Method for multivariate testing, development, and validation of a m...
- Patent number 12,158,432
- Issue date Dec 3, 2024
- Stratasys, Inc.
- Joel Ong
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Grant
Device for optical inspection of preforms
- Patent number 12,158,433
- Issue date Dec 3, 2024
- Sacmi Cooperativa Meccanici Imola Societa Cooperativa
- Donato Laico
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Die inspection method and apparatus
- Patent number 12,152,995
- Issue date Nov 26, 2024
- ONTARIO DIE INTERNATIONAL INC.
- Wesley Elton Scott
- G01 - MEASURING TESTING
Information Patent Grant
Method for predicting reliability of semiconductor device
- Patent number 12,152,997
- Issue date Nov 26, 2024
- Renesas Electronics Corporation
- Takuo Funaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vehicle inspection method and vehicle inspection system
- Patent number 12,151,754
- Issue date Nov 26, 2024
- Toyota Jidosha Kabushiki Kaisha
- Tatsuhiro Takahashi
- B62 - LAND VEHICLES FOR TRAVELLING OTHERWISE THAN ON RAILS
Information Patent Grant
Inspection system, inspection method, and inspection program
- Patent number 12,148,145
- Issue date Nov 19, 2024
- Mitsubishi Heavy Industries, Ltd.
- Takahiro Tachibana
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Deep learning-based crack segmentation through heterogeneous image...
- Patent number 12,146,838
- Issue date Nov 19, 2024
- The Board of Trustees of the University of Alabama
- Wei Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Deep learning system applicable for quality inspection by learning...
- Patent number 12,146,839
- Issue date Nov 19, 2024
- INTER X Co., Ltd.
- Ha Il Jung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Single pass automated vehicle inspection system and method
- Patent number 12,140,501
- Issue date Nov 12, 2024
- UVEYE LTD.
- Ohad Hever
- G01 - MEASURING TESTING
Information Patent Grant
Imaging device, inspection apparatus and inspection method
- Patent number 12,135,294
- Issue date Nov 5, 2024
- Toyo Seikan Co., Ltd.
- Tatsuya Shirasaka
- G01 - MEASURING TESTING
Information Patent Grant
Method for checking compliance of a mechanical part of a vehicle
- Patent number 12,135,293
- Issue date Nov 5, 2024
- JTEKT Europe
- Sarah Tallet-Pinet
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SURFACE INSPECTION DEVICE, SURFACE INSPECTION METHOD, AUTOMATIC DEF...
- Publication number 20250045898
- Publication date Feb 6, 2025
- Konica Minolta, Inc.
- Yoshihito SOUMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Remotely Deployed and Operated Drone-based Sealed Tank Inspections
- Publication number 20250044809
- Publication date Feb 6, 2025
- OCEANEERING INTERNATIONAL, INC.
- Nikunj PATEL
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL APPARATUS, OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION...
- Publication number 20250044235
- Publication date Feb 6, 2025
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING AT LEAST ONE DEFECT ON A SUPPORT, DEVICE AND C...
- Publication number 20250045905
- Publication date Feb 6, 2025
- AQC INDUSTRY
- Pierre MAGRANGEAS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER DEFECT INSPECTION SYSTEM
- Publication number 20250044241
- Publication date Feb 6, 2025
- SYNTEC RESOURCES CO., LTD.
- KANG-FENG FAN
- G01 - MEASURING TESTING
Information Patent Application
MULTI-TASK DEVICE COMPRISING A CAMERA AND A SINGLE SPINDLE FOR PLAC...
- Publication number 20250039524
- Publication date Jan 30, 2025
- SETI-TEC
- Sébastien Pereira-Santo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, APPARATUS, AND SYSTEM FOR DEFECT DETECTION OF CATHODE ELECT...
- Publication number 20250035559
- Publication date Jan 30, 2025
- CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITED
- Baiquan ZHAO
- G01 - MEASURING TESTING
Information Patent Application
METHOD, APPARATUS, AND SYSTEM FOR INSPECTING CATHODE ELECTRODE PLAT...
- Publication number 20250035560
- Publication date Jan 30, 2025
- CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITED
- Baiquan ZHAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR INSPECTING A SUBSTRATE
- Publication number 20250027887
- Publication date Jan 23, 2025
- Applied Materials, Inc.
- Srikanth V. Racherla
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM, INSPECTION METHOD, AND NON-TRANSITORY RECORDING...
- Publication number 20250026603
- Publication date Jan 23, 2025
- Konica Minolta, Inc.
- Hiromu Nagato
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE OF INSPECTING DEFECTS OF WAFER DICED OR ALIGNED
- Publication number 20250027885
- Publication date Jan 23, 2025
- YAYATECH CO., LTD.
- Chien-Cheng CHEN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR TRANSLATIONAL TRIGGERING FOR IMAGE-BASED IN...
- Publication number 20250027884
- Publication date Jan 23, 2025
- COGNEX CORPORATION
- Eric Moore
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD AND DEFECT INSPECTION SYSTEM
- Publication number 20250027886
- Publication date Jan 23, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- SHAO-CHIEN CHIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS OF IMAGE EXTRACTION FOR EFFECTIVE GLOBAL AND LO...
- Publication number 20250020597
- Publication date Jan 16, 2025
- Government of the United States, as represented by the Secretary of the Air F...
- Jie Wei
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODULE AND SYSTEM FOR, AND METHOD OF DETECTING DEFECTS IN ULTRA-THI...
- Publication number 20250022120
- Publication date Jan 16, 2025
- SAMSUNG DISPLAY CO., LTD.
- YUNKU KANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR CALENDERING AN ELECTRODE TAPE, AND CALENDERING DEVICE
- Publication number 20250015253
- Publication date Jan 9, 2025
- Volkswagen Aktiengesellschaft
- Ludger BUSSWINKEL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS LEAK DETECTION DEVICE AND DETECTING METHOD
- Publication number 20250012655
- Publication date Jan 9, 2025
- VIA TECHNOLOGIES, INC.
- Yeh Cho
- G08 - SIGNALLING
Information Patent Application
METROLOGY METHOD AND METHOD FOR TRAINING A DATA STRUCTURE FOR USE I...
- Publication number 20250014164
- Publication date Jan 9, 2025
- ASML NETHERLANDS B.V.
- Vasco Tomas TENNER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Multiple Pass Optical Measurements Of Semiconductor Structures
- Publication number 20250012734
- Publication date Jan 9, 2025
- KLA Corporation
- Zhengquan Tan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DAMAGE INDICATING COATING SYSTEM
- Publication number 20250011604
- Publication date Jan 9, 2025
- PRC-DeSoto International, Inc.
- Matthew Robert Davis
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
EMISSION DETECTING CAMERA PLACEMENT PLANNING USING 3D MODELS
- Publication number 20250014048
- Publication date Jan 9, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Lukasz Zielinski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PHOTO RESPONSE NON-UNIFORMITY CORRECTION DURING SEMICONDUCTOR INSPE...
- Publication number 20250003888
- Publication date Jan 2, 2025
- Onto Innovation Inc.
- John M. Thornell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PORTABLE SCANNING DEVICE FOR ASCERTAINING ATTRIBUTES OF SAMPLE MATE...
- Publication number 20250003887
- Publication date Jan 2, 2025
- BRITESCAN, INC.
- Danica HARBAUGH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EXAMINATION APPARATUS
- Publication number 20250003890
- Publication date Jan 2, 2025
- FUJIFILM CORPORATION
- Yoshinobu MIURA
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...
- Publication number 20250003889
- Publication date Jan 2, 2025
- Canon Kabushiki Kaisha
- Tomoe Kikuchi
- G01 - MEASURING TESTING
Information Patent Application
Method and optical system for imaging optical defect
- Publication number 20240426761
- Publication date Dec 26, 2024
- John Le
- G01 - MEASURING TESTING
Information Patent Application
Product Detection System
- Publication number 20240426762
- Publication date Dec 26, 2024
- TE Connectivity Solutions GMBH
- Qing (Carrie) Zhou
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
TOMOGRAPHIC REFRACTIVE INDEX PROFILE EVALUATION OF NON-SYMMETRICAL...
- Publication number 20240426750
- Publication date Dec 26, 2024
- Heraeus Quartz North America LLC
- Maximilian SCHMITT
- G01 - MEASURING TESTING
Information Patent Application
Inspection Unit For Cans And Method For Determining The Quality of...
- Publication number 20240426764
- Publication date Dec 26, 2024
- H & T Marsberg GmbH & Co. KG
- Mark Andrews
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR GRADING, PROCESSING, AND LOADING LOGS
- Publication number 20240420309
- Publication date Dec 19, 2024
- Hendtech LLC
- Andrew Henderson
- G06 - COMPUTING CALCULATING COUNTING

Scan or image signal processing specially adapted therefor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Decay detection system

Defect inspection system having human-machine interaction function

Apparatus and method for inspecting cans

Electronic device which can determine a dirtiness level

Inspection support device, inspection support method, and inspectio...

Spark spectrometry for inclusions content distribution on the surfa...

Qualitative or quantitative characterization of a coating surface

Method for inspecting pattern defects

Syclops

Image processing system, image processing device, image processing...

Automated optical double-sided inspection apparatus

Foreign object debris detection

Microscopic non-destructive measurement method of microstructure li...

Station and method for translationally detecting glaze defects on g...

Methods, systems and devices for automated assembly of building str...

Measurement tool for cable-preparation system

Defect position determination system, appearance inspection method...

Device and method for transformer in-situ inspection

System and method for inspecting a component for anomalous regions

Method for multivariate testing, development, and validation of a m...

Device for optical inspection of preforms

Die inspection method and apparatus

Method for predicting reliability of semiconductor device

Vehicle inspection method and vehicle inspection system

Inspection system, inspection method, and inspection program

Deep learning-based crack segmentation through heterogeneous image...

Deep learning system applicable for quality inspection by learning...

Single pass automated vehicle inspection system and method

Imaging device, inspection apparatus and inspection method

Method for checking compliance of a mechanical part of a vehicle

Patents Applicationslast 30 patents

SURFACE INSPECTION DEVICE, SURFACE INSPECTION METHOD, AUTOMATIC DEF...

Remotely Deployed and Operated Drone-based Sealed Tank Inspections

OPTICAL APPARATUS, OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION...

METHOD FOR DETECTING AT LEAST ONE DEFECT ON A SUPPORT, DEVICE AND C...

WAFER DEFECT INSPECTION SYSTEM

MULTI-TASK DEVICE COMPRISING A CAMERA AND A SINGLE SPINDLE FOR PLAC...

METHOD, APPARATUS, AND SYSTEM FOR DEFECT DETECTION OF CATHODE ELECT...

METHOD, APPARATUS, AND SYSTEM FOR INSPECTING CATHODE ELECTRODE PLAT...

SYSTEMS AND METHODS FOR INSPECTING A SUBSTRATE

INSPECTION SYSTEM, INSPECTION METHOD, AND NON-TRANSITORY RECORDING...

DEVICE OF INSPECTING DEFECTS OF WAFER DICED OR ALIGNED

SYSTEMS AND METHODS FOR TRANSLATIONAL TRIGGERING FOR IMAGE-BASED IN...

DEFECT INSPECTION METHOD AND DEFECT INSPECTION SYSTEM

SYSTEMS AND METHODS OF IMAGE EXTRACTION FOR EFFECTIVE GLOBAL AND LO...

MODULE AND SYSTEM FOR, AND METHOD OF DETECTING DEFECTS IN ULTRA-THI...

METHOD FOR CALENDERING AN ELECTRODE TAPE, AND CALENDERING DEVICE

GAS LEAK DETECTION DEVICE AND DETECTING METHOD

METROLOGY METHOD AND METHOD FOR TRAINING A DATA STRUCTURE FOR USE I...

Multiple Pass Optical Measurements Of Semiconductor Structures

DAMAGE INDICATING COATING SYSTEM

EMISSION DETECTING CAMERA PLACEMENT PLANNING USING 3D MODELS

PHOTO RESPONSE NON-UNIFORMITY CORRECTION DURING SEMICONDUCTOR INSPE...

PORTABLE SCANNING DEVICE FOR ASCERTAINING ATTRIBUTES OF SAMPLE MATE...

EXAMINATION APPARATUS

IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...

Method and optical system for imaging optical defect

Product Detection System

TOMOGRAPHIC REFRACTIVE INDEX PROFILE EVALUATION OF NON-SYMMETRICAL...

Inspection Unit For Cans And Method For Determining The Quality of...

SYSTEM AND METHOD FOR GRADING, PROCESSING, AND LOADING LOGS