Scan or image signal processing specially adapted therefor

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G01N21/8851

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/8851Scan or image signal processing specially adapted therefor

Industries

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Patents Grantslast 30 patents

Information Patent Grant
3D image acquisition system for optical inspection and method for o...
- Patent number 12,306,110
- Issue date May 20, 2025
- Scuola universitaria professionale della Svizzera italiana (SUPSI)
- Daniele Guido Allegri
- G01 - MEASURING TESTING
Information Patent Grant
Container leakage detection using thermal imaging
- Patent number 12,306,065
- Issue date May 20, 2025
- Institut National D'Optique
- Timothy Pope
- G01 - MEASURING TESTING
Information Patent Grant
Continuous dust accumulation monitoring system with impaired optics...
- Patent number 12,298,255
- Issue date May 13, 2025
- Industrial Intelligence Inc.
- George T. Armbruster
- B08 - CLEANING
Information Patent Grant
Apparatus and method for inspecting laser defect inside of transpar...
- Patent number 12,292,387
- Issue date May 6, 2025
- Corning Incorporated
- Chong Pyung An
- G01 - MEASURING TESTING
Information Patent Grant
Deterioration diagnosis device, deterioration diagnosis method, and...
- Patent number 12,292,388
- Issue date May 6, 2025
- NEC Corporation
- Chisato Sugawara
- G01 - MEASURING TESTING
Information Patent Grant
System and method of object detection using AI deep learning models
- Patent number 12,288,390
- Issue date Apr 29, 2025
- QC Hero, Inc.
- Michael A. Walt
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Ultra-micro defect detection apparatus and detection method thereof
- Patent number 12,288,318
- Issue date Apr 29, 2025
- Casi Vision Technology (Beijing) Co., Ltd.
- Feng Lei
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for defect detection and correction in additive...
- Patent number 12,280,429
- Issue date Apr 22, 2025
- Sentient Science Corporation
- Jingfu Liu
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Information display apparatus, information display method, and info...
- Patent number 12,283,035
- Issue date Apr 22, 2025
- FUJIFILM Corporation
- Makoto Yonaha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tool wear monitoring device, tool wear monitoring system, and program
- Patent number 12,283,038
- Issue date Apr 22, 2025
- Hitachi, Ltd.
- Kenji Nishikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical inspection apparatus, processing device, optical inspection...
- Patent number 12,276,616
- Issue date Apr 15, 2025
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for detecting defects of the horizontal mold seal for glass...
- Patent number 12,265,035
- Issue date Apr 1, 2025
- TIAMIA
- Lubin Fayolle
- G01 - MEASURING TESTING
Information Patent Grant
Type of device(s) for automatically monitoring a coating and/or str...
- Patent number 12,264,909
- Issue date Apr 1, 2025
- QUISS QUALITAETS-INSPEKTIONSSYSTEME UND SERVICE GMBH
- Bernhard Gruber
- G01 - MEASURING TESTING
Information Patent Grant
Substrate inspection system and a method of use thereof
- Patent number 12,258,665
- Issue date Mar 25, 2025
- JNK TECH
- Youngjin Choi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for evaluating agricultural material with an...
- Patent number 12,259,376
- Issue date Mar 25, 2025
- Deer & Company
- Bret M. Culpepper
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
Automated in-line object inspection
- Patent number 12,254,617
- Issue date Mar 18, 2025
- KODAK ALARIS LLC
- Bruce A. Link
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface defect monitoring system
- Patent number 12,253,471
- Issue date Mar 18, 2025
- TERRACON CONSULTANTS, INC.
- Scott Steffan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection method and system for determining the location of a surfa...
- Patent number 12,253,474
- Issue date Mar 18, 2025
- HUA YANG Precision Machinery Co., Ltd
- Hsien-Te Hsiao
- G01 - MEASURING TESTING
Information Patent Grant
Detecting damaged semiconductor wafers utilizing a semiconductor wa...
- Patent number 12,249,526
- Issue date Mar 11, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chen Min Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Endoscope cleaning and inspection system and method
- Patent number 12,245,904
- Issue date Mar 11, 2025
- Medivators Inc.
- Mark Jackson
- B08 - CLEANING
Information Patent Grant
Electrode sheet defect detection system
- Patent number 12,241,843
- Issue date Mar 4, 2025
- LG ENERGY SOLUTION, LTD.
- Ee Beom Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System comprising a dishwasher and method for operating a dishwasher
- Patent number 12,239,274
- Issue date Mar 4, 2025
- BSH Hausgeräte GmbH
- Alfredo Calvimontes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Appearance inspection system and appearance inspection method for t...
- Patent number 12,236,570
- Issue date Feb 25, 2025
- Kabushika Kaisha Toshiba
- Ikuo Motonaga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection system using 3D measuring machine
- Patent number 12,235,222
- Issue date Feb 25, 2025
- Young Han Lim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method of welding workpiece by vision guided welding pla...
- Patent number 12,236,569
- Issue date Feb 25, 2025
- TE CONNECTIVITY SOLUTIONS GmbH
- Zongjie (Jason) Tao
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Self-leveling inspection systems and methods
- Patent number 12,235,221
- Issue date Feb 25, 2025
- SeeScan, Inc.
- Mark S. Olsson
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Surface analysis of gemstones
- Patent number 12,228,521
- Issue date Feb 18, 2025
- Gemological Institute of America, Inc.
- Tsung-Han Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection device and inspecting method using the same
- Patent number 12,222,294
- Issue date Feb 11, 2025
- Samsung Display Co., Ltd.
- Jeong Moon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Multi-sensor pipe inspection system and method
- Patent number 12,222,298
- Issue date Feb 11, 2025
- HYDROMAX USA, LLC
- Guy Schiavone
- G01 - MEASURING TESTING
Information Patent Grant
Decay detection system
- Patent number 12,217,410
- Issue date Feb 4, 2025
- SUNKIST GROWERS, INC.
- Aaron Gorsky
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
POLARIZING MICROSCOPE, CRYSTAL DEFECT EVALUATION DEVICE, AND CRYSTA...
- Publication number 20250164407
- Publication date May 22, 2025
- NATIONAL UNIVERSITY CORPORATION TOKAI NATIONAL HIGHER EDUCATION AND RESEARCH...
- Shunta HARADA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND APPARATUS TO IMPROVE DETECTION OF DEFECTS IN PHOTOMASK...
- Publication number 20250164871
- Publication date May 22, 2025
- Intel Corporation
- Yoshihiro Tezuka
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR QUALITY CONTROL OF A WELDING JOINT BETWEEN A PAIR OF END...
- Publication number 20250162086
- Publication date May 22, 2025
- ATOP S.p.A.
- Massimiliano GIACHI
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Systems and Methods for Detection of Defects in Machine Surfaces
- Publication number 20250164409
- Publication date May 22, 2025
- MATTHEWS INTERNATIONAL CORPORATION
- Thomas HACKFORT
- G01 - MEASURING TESTING
Information Patent Application
Single-Pass 3D Reconstruction of Internal Surface of Pipelines Usin...
- Publication number 20250164412
- Publication date May 22, 2025
- NUTECH VENTURES
- Zhigang Shen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Lock-in Averaging for Semiconductor Diagnostics
- Publication number 20250155381
- Publication date May 15, 2025
- IMEC vzw
- Kristof J.P. Jacobs
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20250155377
- Publication date May 15, 2025
- TOYOTA JIDOSHA KABUSHIKI KAISHA
- Shuta NEGORO
- G01 - MEASURING TESTING
Information Patent Application
COMPUTER IMPLEMENTED METHOD FOR DEFECT DETECTION IN AN IMAGING DATA...
- Publication number 20250155378
- Publication date May 15, 2025
- Carl Zeiss SMT GMBH
- Alexander Freytag
- G01 - MEASURING TESTING
Information Patent Application
VISUAL INSPECTION SYSTEM AND METHOD
- Publication number 20250146951
- Publication date May 8, 2025
- CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- Wushu LI
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR DETECTION OF ALKALI-SILICA REACTIVITY ON CONC...
- Publication number 20250146946
- Publication date May 8, 2025
- Board of Trustees of Western Michigan University
- Upul Attanayake
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTION OF PANEL EMBEDDED DIES USING CO...
- Publication number 20250146955
- Publication date May 8, 2025
- ORBOTECH LTD.
- Elkana Porat
- G01 - MEASURING TESTING
Information Patent Application
THERMAL IMAGING METHOD FOR CRACK AND HOLE DETECTION IN SEMICONDUCTO...
- Publication number 20250146964
- Publication date May 8, 2025
- ORBOTECH LTD.
- Elkana Porat
- G01 - MEASURING TESTING
Information Patent Application
MOVABLE VISUAL INSPECTION DEVICE FOR SHIELD MACHINES
- Publication number 20250146954
- Publication date May 8, 2025
- China Railway Sunward Engineering Equipment Co., Ltd.
- Dinghua Wang
- B60 - VEHICLES IN GENERAL
Information Patent Application
INSPECTION ASSISTANCE SYSTEM, INSPECTION ASSISTANCE METHOD, AND PRO...
- Publication number 20250146950
- Publication date May 8, 2025
- Sumitomo Heavy Industries, Ltd.
- Shintaroh SUGIMOTO
- G01 - MEASURING TESTING
Information Patent Application
Visual Inspection Systems for Containers of Liquid Pharmaceutical P...
- Publication number 20250130176
- Publication date Apr 24, 2025
- Amgen Inc.
- Thomas Clark Pearson
- G01 - MEASURING TESTING
Information Patent Application
ELECTRODE ASSEMBLY ALIGNMENT INSPECTION APPARATUS AND METHOD
- Publication number 20250130177
- Publication date Apr 24, 2025
- SK On Co., Ltd.
- Ji-Won YANG
- G01 - MEASURING TESTING
Information Patent Application
Surface Inspection Sensor
- Publication number 20250130178
- Publication date Apr 24, 2025
- Araz Yacoubian
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION HANDLING SYSTEM VISUAL IMAGE INSPECTION TO DETECT BATTE...
- Publication number 20250123217
- Publication date Apr 17, 2025
- Dell Products L.P.
- Jace W. Files
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENT TOOL FOR CABLE-PREPARATION SYSTEM
- Publication number 20250125597
- Publication date Apr 17, 2025
- 3M Innovative Properties Company
- Douglas B. Gundel
- G01 - MEASURING TESTING
Information Patent Application
BATTERY DEFECT DETECTION APPARATUS, METHOD, AND SYSTEM
- Publication number 20250123219
- Publication date Apr 17, 2025
- LG ENERGY SOLUTION, LTD.
- Tae Jin NOH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect Inspection Apparatus and Defect Inspection Method
- Publication number 20250123220
- Publication date Apr 17, 2025
- Hitachi High-Tech Corporation
- Takanori KONDO
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION SYSTEM USING 3D MEASURING MACHINE
- Publication number 20250123216
- Publication date Apr 17, 2025
- Young Han LIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM TO FOR RAPID INSPECTION OF PHOTOLITHOGRAPHY RETICLE
- Publication number 20250123555
- Publication date Apr 17, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jia-Lin SYU
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING METHOD, PROCESSING APPARATUS, AND PROCESSING SYSTEM
- Publication number 20250123218
- Publication date Apr 17, 2025
- Lenovo (Beijing) Limited
- Yonghua LIU
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SENSING SYSTEM AND OPTICAL SENSING METHOD
- Publication number 20250116608
- Publication date Apr 10, 2025
- PIXART IMAGING Inc.
- Guo-Zhen Wang
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SUPPORT DEVICE, INSPECTION SUPPORT METHOD, AND INSPECTIO...
- Publication number 20250116611
- Publication date Apr 10, 2025
- FUJIFILM CORPORATION
- Shuhei HORITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-SENSOR PIPE INSPECTION SYSTEM AND METHOD
- Publication number 20250116614
- Publication date Apr 10, 2025
- Hydromax USA, LLC
- Guy Schiavone
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ENHANCED MODES FOR SCANNING ACOUSTIC MICROSCOPE INSPECTION IN SEMIC...
- Publication number 20250116598
- Publication date Apr 10, 2025
- KLA Corporation
- Daniel Ivanov Kavaldjiev
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR EVALUATING A WELDING QUALITY OF A WELD SEAM B...
- Publication number 20250111496
- Publication date Apr 3, 2025
- GEHRING TECHNOLOGIES GMBH + CO. KG
- Laurens Schmid
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EVALUATING THE SEALING QUALITY OF A SEALING STRIP SEALED TO A PACKA...
- Publication number 20250108949
- Publication date Apr 3, 2025
- Tetra Laval Holdings & Finance S.A.
- Daniele BULGARELLI
- G01 - MEASURING TESTING

Scan or image signal processing specially adapted therefor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

3D image acquisition system for optical inspection and method for o...

Container leakage detection using thermal imaging

Continuous dust accumulation monitoring system with impaired optics...

Apparatus and method for inspecting laser defect inside of transpar...

Deterioration diagnosis device, deterioration diagnosis method, and...

System and method of object detection using AI deep learning models

Ultra-micro defect detection apparatus and detection method thereof

Systems and methods for defect detection and correction in additive...

Information display apparatus, information display method, and info...

Tool wear monitoring device, tool wear monitoring system, and program

Optical inspection apparatus, processing device, optical inspection...

Method for detecting defects of the horizontal mold seal for glass...

Type of device(s) for automatically monitoring a coating and/or str...

Substrate inspection system and a method of use thereof

Methods and apparatus for evaluating agricultural material with an...

Automated in-line object inspection

Surface defect monitoring system

Detection method and system for determining the location of a surfa...

Detecting damaged semiconductor wafers utilizing a semiconductor wa...

Endoscope cleaning and inspection system and method

Electrode sheet defect detection system

System comprising a dishwasher and method for operating a dishwasher

Appearance inspection system and appearance inspection method for t...

Defect inspection system using 3D measuring machine

System and method of welding workpiece by vision guided welding pla...

Self-leveling inspection systems and methods

Surface analysis of gemstones

Optical inspection device and inspecting method using the same

Multi-sensor pipe inspection system and method

Decay detection system

Patents Applicationslast 30 patents

POLARIZING MICROSCOPE, CRYSTAL DEFECT EVALUATION DEVICE, AND CRYSTA...

METHODS AND APPARATUS TO IMPROVE DETECTION OF DEFECTS IN PHOTOMASK...

METHOD FOR QUALITY CONTROL OF A WELDING JOINT BETWEEN A PAIR OF END...

Systems and Methods for Detection of Defects in Machine Surfaces

Single-Pass 3D Reconstruction of Internal Surface of Pipelines Usin...

Lock-in Averaging for Semiconductor Diagnostics

INSPECTION APPARATUS AND INSPECTION METHOD

COMPUTER IMPLEMENTED METHOD FOR DEFECT DETECTION IN AN IMAGING DATA...

VISUAL INSPECTION SYSTEM AND METHOD

DEVICE AND METHOD FOR DETECTION OF ALKALI-SILICA REACTIVITY ON CONC...

METHOD AND APPARATUS FOR INSPECTION OF PANEL EMBEDDED DIES USING CO...

THERMAL IMAGING METHOD FOR CRACK AND HOLE DETECTION IN SEMICONDUCTO...

MOVABLE VISUAL INSPECTION DEVICE FOR SHIELD MACHINES

INSPECTION ASSISTANCE SYSTEM, INSPECTION ASSISTANCE METHOD, AND PRO...

Visual Inspection Systems for Containers of Liquid Pharmaceutical P...

ELECTRODE ASSEMBLY ALIGNMENT INSPECTION APPARATUS AND METHOD

Surface Inspection Sensor

INFORMATION HANDLING SYSTEM VISUAL IMAGE INSPECTION TO DETECT BATTE...

MEASUREMENT TOOL FOR CABLE-PREPARATION SYSTEM

BATTERY DEFECT DETECTION APPARATUS, METHOD, AND SYSTEM

Defect Inspection Apparatus and Defect Inspection Method

DEFECT INSPECTION SYSTEM USING 3D MEASURING MACHINE

METHOD AND SYSTEM TO FOR RAPID INSPECTION OF PHOTOLITHOGRAPHY RETICLE

PROCESSING METHOD, PROCESSING APPARATUS, AND PROCESSING SYSTEM

OPTICAL SENSING SYSTEM AND OPTICAL SENSING METHOD

INSPECTION SUPPORT DEVICE, INSPECTION SUPPORT METHOD, AND INSPECTIO...

MULTI-SENSOR PIPE INSPECTION SYSTEM AND METHOD

ENHANCED MODES FOR SCANNING ACOUSTIC MICROSCOPE INSPECTION IN SEMIC...

METHOD AND DEVICE FOR EVALUATING A WELDING QUALITY OF A WELD SEAM B...

EVALUATING THE SEALING QUALITY OF A SEALING STRIP SEALED TO A PACKA...