Scan or image signal processing specially adapted therefor

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CPC
G01N21/8851

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/8851Scan or image signal processing specially adapted therefor

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Simultaneous back and/or front and/or bulk defect detection
- Patent number 12,339,235
- Issue date Jun 24, 2025
- Onto Innovation Inc.
- Felix Moellmann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for determination of textile fiber composition
- Patent number 12,339,224
- Issue date Jun 24, 2025
- VALVAN NV
- Frank Vandeputte
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting product for defects, electronic device, and st...
- Patent number 12,332,183
- Issue date Jun 17, 2025
- Hon Hai Precision Industry Co., Ltd.
- Chung-Yu Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Physical body inspection system and display control method
- Patent number 12,335,630
- Issue date Jun 17, 2025
- TOYOTA PRODUCTION ENGINEERING
- Haruki Kabashima
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System for automatic diagnostics and monitoring of semiconductor de...
- Patent number 12,332,182
- Issue date Jun 17, 2025
- KLA Corporation
- David W. Price
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface-defect detecting method, surface-defect detecting apparatus...
- Patent number 12,320,756
- Issue date Jun 3, 2025
- JFE Steel Corporation
- Hiroaki Ono
- G01 - MEASURING TESTING
Information Patent Grant
Detection method of crease degree of screen and visual detection ap...
- Patent number 12,313,567
- Issue date May 27, 2025
- WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD.
- Yali Liu
- G01 - MEASURING TESTING
Information Patent Grant
Light reflection support and through hole inspection system
- Patent number 12,313,568
- Issue date May 27, 2025
- JOONGWOO M-TECH CO., LTD.
- Sung Soo Park
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and inspection method
- Patent number 12,313,564
- Issue date May 27, 2025
- Toyota Jidosha Kabushiki Kaisha
- Tomohiro Matsuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
3D image acquisition system for optical inspection and method for o...
- Patent number 12,306,110
- Issue date May 20, 2025
- Scuola universitaria professionale della Svizzera italiana (SUPSI)
- Daniele Guido Allegri
- G01 - MEASURING TESTING
Information Patent Grant
Container leakage detection using thermal imaging
- Patent number 12,306,065
- Issue date May 20, 2025
- Institut National D'Optique
- Timothy Pope
- G01 - MEASURING TESTING
Information Patent Grant
Continuous dust accumulation monitoring system with impaired optics...
- Patent number 12,298,255
- Issue date May 13, 2025
- Industrial Intelligence Inc.
- George T. Armbruster
- B08 - CLEANING
Information Patent Grant
Apparatus and method for inspecting laser defect inside of transpar...
- Patent number 12,292,387
- Issue date May 6, 2025
- Corning Incorporated
- Chong Pyung An
- G01 - MEASURING TESTING
Information Patent Grant
Deterioration diagnosis device, deterioration diagnosis method, and...
- Patent number 12,292,388
- Issue date May 6, 2025
- NEC Corporation
- Chisato Sugawara
- G01 - MEASURING TESTING
Information Patent Grant
System and method of object detection using AI deep learning models
- Patent number 12,288,390
- Issue date Apr 29, 2025
- QC Hero, Inc.
- Michael A. Walt
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Ultra-micro defect detection apparatus and detection method thereof
- Patent number 12,288,318
- Issue date Apr 29, 2025
- Casi Vision Technology (Beijing) Co., Ltd.
- Feng Lei
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for defect detection and correction in additive...
- Patent number 12,280,429
- Issue date Apr 22, 2025
- Sentient Science Corporation
- Jingfu Liu
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Information display apparatus, information display method, and info...
- Patent number 12,283,035
- Issue date Apr 22, 2025
- FUJIFILM Corporation
- Makoto Yonaha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tool wear monitoring device, tool wear monitoring system, and program
- Patent number 12,283,038
- Issue date Apr 22, 2025
- Hitachi, Ltd.
- Kenji Nishikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical inspection apparatus, processing device, optical inspection...
- Patent number 12,276,616
- Issue date Apr 15, 2025
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for detecting defects of the horizontal mold seal for glass...
- Patent number 12,265,035
- Issue date Apr 1, 2025
- TIAMIA
- Lubin Fayolle
- G01 - MEASURING TESTING
Information Patent Grant
Type of device(s) for automatically monitoring a coating and/or str...
- Patent number 12,264,909
- Issue date Apr 1, 2025
- QUISS QUALITAETS-INSPEKTIONSSYSTEME UND SERVICE GMBH
- Bernhard Gruber
- G01 - MEASURING TESTING
Information Patent Grant
Substrate inspection system and a method of use thereof
- Patent number 12,258,665
- Issue date Mar 25, 2025
- JNK TECH
- Youngjin Choi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for evaluating agricultural material with an...
- Patent number 12,259,376
- Issue date Mar 25, 2025
- Deer & Company
- Bret M. Culpepper
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
Automated in-line object inspection
- Patent number 12,254,617
- Issue date Mar 18, 2025
- KODAK ALARIS LLC
- Bruce A. Link
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface defect monitoring system
- Patent number 12,253,471
- Issue date Mar 18, 2025
- TERRACON CONSULTANTS, INC.
- Scott Steffan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection method and system for determining the location of a surfa...
- Patent number 12,253,474
- Issue date Mar 18, 2025
- HUA YANG Precision Machinery Co., Ltd
- Hsien-Te Hsiao
- G01 - MEASURING TESTING
Information Patent Grant
Detecting damaged semiconductor wafers utilizing a semiconductor wa...
- Patent number 12,249,526
- Issue date Mar 11, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chen Min Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Endoscope cleaning and inspection system and method
- Patent number 12,245,904
- Issue date Mar 11, 2025
- Medivators Inc.
- Mark Jackson
- B08 - CLEANING
Information Patent Grant
Electrode sheet defect detection system
- Patent number 12,241,843
- Issue date Mar 4, 2025
- LG ENERGY SOLUTION, LTD.
- Ee Beom Choi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
BIOLOGICAL SAMPLE ANALYZER CALIBRATION AND CONTROL
- Publication number 20250208058
- Publication date Jun 26, 2025
- Beckman Coulter, Inc.
- Jose Chacon
- G01 - MEASURING TESTING
Information Patent Application
METHOD TO QUALIFY ADDITIONAL DIES AFTER MASTER DIE
- Publication number 20250209607
- Publication date Jun 26, 2025
- Pratt & Whitney Canada Corp.
- Michael Morash
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Laser scanning of cable and cable accessory components subjected to...
- Publication number 20250208062
- Publication date Jun 26, 2025
- NEXANS
- Espen DOEDENS
- G01 - MEASURING TESTING
Information Patent Application
LIGHTING FOR AN OPTICAL MONITORING APPARATUS
- Publication number 20250208055
- Publication date Jun 26, 2025
- BÜHLER UK LTD.
- Brice THURIN
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
YARN-OUT STATE DETECTION METHOD AND APPARATUS, DEVICE AND STORAGE M...
- Publication number 20250207300
- Publication date Jun 26, 2025
- ZHEJIANG HENGYI PETROCHEMICAL CO., LTD.
- Mingyi LIU
- D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
Information Patent Application
SCREW CONSTRUCTION INFERENCE DEVICE, SCREW CONSTRUCTION INFERENCE M...
- Publication number 20250208056
- Publication date Jun 26, 2025
- THE JAPAN STEEL WORKS, LTD
- Tomoya ODA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus
- Publication number 20250208057
- Publication date Jun 26, 2025
- Noki Technologies Oy
- Marja Pauliina Salmimaa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPECTRAL FEATURE MEASUREMENT METHOD
- Publication number 20250198915
- Publication date Jun 19, 2025
- Industrial Technology Research Institute
- Yan-Rung Lin
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING SYSTEM AND PROCESSING METHOD CAPABLE OF AUTOMATICALLY MO...
- Publication number 20250198948
- Publication date Jun 19, 2025
- GLORY STEEL ENTERPRISE CO., LTD.
- YI-LIANG CHEN
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
ELECTRODE MARKING DEVICE AND ROLL MAP CREATION SYSTEM
- Publication number 20250198940
- Publication date Jun 19, 2025
- LG ENERGY SOLUTION, LTD.
- Ki Deok HAN
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
Measurements Of Complex Semiconductor Structures Based On Component...
- Publication number 20250198942
- Publication date Jun 19, 2025
- KLA Corporation
- Zhengquan Tan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECT INSPECTION SYSTEM AND DEFECT INSPECTION METHOD
- Publication number 20250198941
- Publication date Jun 19, 2025
- Samsung Electronics Co., Ltd.
- Min Ho RIM
- G01 - MEASURING TESTING
Information Patent Application
ADAPTATION OF ILLUMINATION SETTINGS FOR OPTICAL MEASUREMENT AND INS...
- Publication number 20250198947
- Publication date Jun 19, 2025
- HEXAGON TECHNOLOGY CENTER GMBH
- Bernd REIMANN
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
OPTICAL INSPECTION SYSTEM OF ELIMINATING IMAGE NOISE
- Publication number 20250189458
- Publication date Jun 12, 2025
- GUDENG EQUIPMENT CO., LTD.
- Che-Wei Chan
- G01 - MEASURING TESTING
Information Patent Application
IMAGING AND ANALYZING CRACK PROPAGATION IN GLASS
- Publication number 20250189459
- Publication date Jun 12, 2025
- Corning Incorporated
- Davide Giassi
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20250191173
- Publication date Jun 12, 2025
- Hitachi Astemo, Ltd.
- Yoshihiko KOBAYASHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER DEFECT ANALYZING DEVICE AND WAFER DEFECT ANALYZING METHOD
- Publication number 20250189460
- Publication date Jun 12, 2025
- INGENTEC CORPORATION
- Chia-Liang LIN
- G01 - MEASURING TESTING
Information Patent Application
IMAGING
- Publication number 20250189457
- Publication date Jun 12, 2025
- Rolls-Royce plc
- Benjamin J MOORE
- F01 - MACHINES OR ENGINES IN GENERAL ENGINE PLANTS IN GENERAL STEAM ENGINES
Information Patent Application
HETEROGENEOUS CHIPLET ID USING PHOTOLUMINESCENCE IN uASSEMBLER SYSTEM
- Publication number 20250180488
- Publication date Jun 5, 2025
- Xerox Corporation
- Jeng PING LU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR INSPECTING HOT GLASS CONTAINERS WITH A VIEW T...
- Publication number 20250180489
- Publication date Jun 5, 2025
- TIAMA
- Olivier COLLE
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
DETECTING DAMAGED SEMICONDUCTOR WAFERS UTILIZING A SEMICONDUCTOR WA...
- Publication number 20250183073
- Publication date Jun 5, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chen Min LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INFORMATION PROCESSING APPARATUS AND INFORMATION PROCESSING METHOD
- Publication number 20250182720
- Publication date Jun 5, 2025
- Canon Kabushiki Kaisha
- Kenji SUGIYAMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL FOREIGN SUBSTANCE DETECTION DEVICE USING LIGHT SCATTERING A...
- Publication number 20250172493
- Publication date May 29, 2025
- JEDEX INC.
- Jin Ho KIM
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC MAVERICK WAFER SCREENING USING DIE PASS PATTERN
- Publication number 20250172503
- Publication date May 29, 2025
- Infineon Technologies Canada Inc.
- Iman ABDALI MASHHADI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POLARIZING MICROSCOPE, CRYSTAL DEFECT EVALUATION DEVICE, AND CRYSTA...
- Publication number 20250164407
- Publication date May 22, 2025
- NATIONAL UNIVERSITY CORPORATION TOKAI NATIONAL HIGHER EDUCATION AND RESEARCH...
- Shunta HARADA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND APPARATUS TO IMPROVE DETECTION OF DEFECTS IN PHOTOMASK...
- Publication number 20250164871
- Publication date May 22, 2025
- Intel Corporation
- Yoshihiro Tezuka
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR QUALITY CONTROL OF A WELDING JOINT BETWEEN A PAIR OF END...
- Publication number 20250162086
- Publication date May 22, 2025
- ATOP S.p.A.
- Massimiliano GIACHI
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Systems and Methods for Detection of Defects in Machine Surfaces
- Publication number 20250164409
- Publication date May 22, 2025
- MATTHEWS INTERNATIONAL CORPORATION
- Thomas HACKFORT
- G01 - MEASURING TESTING
Information Patent Application
Single-Pass 3D Reconstruction of Internal Surface of Pipelines Usin...
- Publication number 20250164412
- Publication date May 22, 2025
- NUTECH VENTURES
- Zhigang Shen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Lock-in Averaging for Semiconductor Diagnostics
- Publication number 20250155381
- Publication date May 15, 2025
- IMEC vzw
- Kristof J.P. Jacobs
- G01 - MEASURING TESTING

Scan or image signal processing specially adapted therefor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Simultaneous back and/or front and/or bulk defect detection

Method and apparatus for determination of textile fiber composition

Method for detecting product for defects, electronic device, and st...

Physical body inspection system and display control method

System for automatic diagnostics and monitoring of semiconductor de...

Surface-defect detecting method, surface-defect detecting apparatus...

Detection method of crease degree of screen and visual detection ap...

Light reflection support and through hole inspection system

Inspection device and inspection method

3D image acquisition system for optical inspection and method for o...

Container leakage detection using thermal imaging

Continuous dust accumulation monitoring system with impaired optics...

Apparatus and method for inspecting laser defect inside of transpar...

Deterioration diagnosis device, deterioration diagnosis method, and...

System and method of object detection using AI deep learning models

Ultra-micro defect detection apparatus and detection method thereof

Systems and methods for defect detection and correction in additive...

Information display apparatus, information display method, and info...

Tool wear monitoring device, tool wear monitoring system, and program

Optical inspection apparatus, processing device, optical inspection...

Method for detecting defects of the horizontal mold seal for glass...

Type of device(s) for automatically monitoring a coating and/or str...

Substrate inspection system and a method of use thereof

Methods and apparatus for evaluating agricultural material with an...

Automated in-line object inspection

Surface defect monitoring system

Detection method and system for determining the location of a surfa...

Detecting damaged semiconductor wafers utilizing a semiconductor wa...

Endoscope cleaning and inspection system and method

Electrode sheet defect detection system

Patents Applicationslast 30 patents

BIOLOGICAL SAMPLE ANALYZER CALIBRATION AND CONTROL

METHOD TO QUALIFY ADDITIONAL DIES AFTER MASTER DIE

Laser scanning of cable and cable accessory components subjected to...

LIGHTING FOR AN OPTICAL MONITORING APPARATUS

YARN-OUT STATE DETECTION METHOD AND APPARATUS, DEVICE AND STORAGE M...

SCREW CONSTRUCTION INFERENCE DEVICE, SCREW CONSTRUCTION INFERENCE M...

Apparatus

SPECTRAL FEATURE MEASUREMENT METHOD

PROCESSING SYSTEM AND PROCESSING METHOD CAPABLE OF AUTOMATICALLY MO...

ELECTRODE MARKING DEVICE AND ROLL MAP CREATION SYSTEM

Measurements Of Complex Semiconductor Structures Based On Component...

DEFECT INSPECTION SYSTEM AND DEFECT INSPECTION METHOD

ADAPTATION OF ILLUMINATION SETTINGS FOR OPTICAL MEASUREMENT AND INS...

OPTICAL INSPECTION SYSTEM OF ELIMINATING IMAGE NOISE

IMAGING AND ANALYZING CRACK PROPAGATION IN GLASS

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

WAFER DEFECT ANALYZING DEVICE AND WAFER DEFECT ANALYZING METHOD

IMAGING

HETEROGENEOUS CHIPLET ID USING PHOTOLUMINESCENCE IN uASSEMBLER SYSTEM

METHOD AND DEVICE FOR INSPECTING HOT GLASS CONTAINERS WITH A VIEW T...

DETECTING DAMAGED SEMICONDUCTOR WAFERS UTILIZING A SEMICONDUCTOR WA...

INFORMATION PROCESSING APPARATUS AND INFORMATION PROCESSING METHOD

OPTICAL FOREIGN SUBSTANCE DETECTION DEVICE USING LIGHT SCATTERING A...

AUTOMATIC MAVERICK WAFER SCREENING USING DIE PASS PATTERN

POLARIZING MICROSCOPE, CRYSTAL DEFECT EVALUATION DEVICE, AND CRYSTA...

METHODS AND APPARATUS TO IMPROVE DETECTION OF DEFECTS IN PHOTOMASK...

METHOD FOR QUALITY CONTROL OF A WELDING JOINT BETWEEN A PAIR OF END...

Systems and Methods for Detection of Defects in Machine Surfaces

Single-Pass 3D Reconstruction of Internal Surface of Pipelines Usin...

Lock-in Averaging for Semiconductor Diagnostics