Scan or image signal processing specially adapted therefor

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G01N21/8851

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/8851Scan or image signal processing specially adapted therefor

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Electrode sheet defect detection system
- Patent number 12,241,843
- Issue date Mar 4, 2025
- LG ENERGY SOLUTION, LTD.
- Ee Beom Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System comprising a dishwasher and method for operating a dishwasher
- Patent number 12,239,274
- Issue date Mar 4, 2025
- BSH Hausgeräte GmbH
- Alfredo Calvimontes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Appearance inspection system and appearance inspection method for t...
- Patent number 12,236,570
- Issue date Feb 25, 2025
- Kabushika Kaisha Toshiba
- Ikuo Motonaga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection system using 3D measuring machine
- Patent number 12,235,222
- Issue date Feb 25, 2025
- Young Han Lim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method of welding workpiece by vision guided welding pla...
- Patent number 12,236,569
- Issue date Feb 25, 2025
- TE CONNECTIVITY SOLUTIONS GmbH
- Zongjie (Jason) Tao
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Self-leveling inspection systems and methods
- Patent number 12,235,221
- Issue date Feb 25, 2025
- SeeScan, Inc.
- Mark S. Olsson
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Surface analysis of gemstones
- Patent number 12,228,521
- Issue date Feb 18, 2025
- Gemological Institute of America, Inc.
- Tsung-Han Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection device and inspecting method using the same
- Patent number 12,222,294
- Issue date Feb 11, 2025
- Samsung Display Co., Ltd.
- Jeong Moon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Multi-sensor pipe inspection system and method
- Patent number 12,222,298
- Issue date Feb 11, 2025
- HYDROMAX USA, LLC
- Guy Schiavone
- G01 - MEASURING TESTING
Information Patent Grant
Decay detection system
- Patent number 12,217,410
- Issue date Feb 4, 2025
- SUNKIST GROWERS, INC.
- Aaron Gorsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection system having human-machine interaction function
- Patent number 12,217,498
- Issue date Feb 4, 2025
- KAPITO INC.
- Feng-Tso Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for inspecting cans
- Patent number 12,216,062
- Issue date Feb 4, 2025
- Krones AG
- Stefan Piana
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device which can determine a dirtiness level
- Patent number 12,216,063
- Issue date Feb 4, 2025
- PixArt Imaging Inc.
- Tsung-Fa Wang
- G01 - MEASURING TESTING
Information Patent Grant
Inspection support device, inspection support method, and inspectio...
- Patent number 12,209,972
- Issue date Jan 28, 2025
- FUJIFILM Corporation
- Shuhei Horita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spark spectrometry for inclusions content distribution on the surfa...
- Patent number 12,203,864
- Issue date Jan 21, 2025
- NCS TESTING TECHNOLOGY CO., LTD
- Yunhai Jia
- G01 - MEASURING TESTING
Information Patent Grant
Qualitative or quantitative characterization of a coating surface
- Patent number 12,203,868
- Issue date Jan 21, 2025
- Evonik Operations GmbH
- Philipp Isken
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Method for inspecting pattern defects
- Patent number 12,196,687
- Issue date Jan 14, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ju-Ying Chen
- G01 - MEASURING TESTING
Information Patent Grant
Syclops
- Patent number 12,198,319
- Issue date Jan 14, 2025
- Ronald Baker
- G01 - MEASURING TESTING
Information Patent Grant
Image processing system, image processing device, image processing...
- Patent number 12,190,477
- Issue date Jan 7, 2025
- FUJIFILM Corporation
- Kenkichi Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated optical double-sided inspection apparatus
- Patent number 12,188,877
- Issue date Jan 7, 2025
- Feng Chia University
- Yee Siang Gan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Microscopic non-destructive measurement method of microstructure li...
- Patent number 12,190,495
- Issue date Jan 7, 2025
- NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Zhishan Gao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Foreign object debris detection
- Patent number 12,188,878
- Issue date Jan 7, 2025
- The Government of the United States of America, as represented by the Secreta...
- Andrew Nicholas
- G01 - MEASURING TESTING
Information Patent Grant
Station and method for translationally detecting glaze defects on g...
- Patent number 12,181,419
- Issue date Dec 31, 2024
- TIAMA
- Laurent Cosneau
- G01 - MEASURING TESTING
Information Patent Grant
Methods, systems and devices for automated assembly of building str...
- Patent number 12,179,361
- Issue date Dec 31, 2024
- Promise Robotics Inc.
- Ramtin Attar
- G01 - MEASURING TESTING
Information Patent Grant
Measurement tool for cable-preparation system
- Patent number 12,176,689
- Issue date Dec 24, 2024
- 3M Innovative Properties Company
- Douglas B. Gundel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect position determination system, appearance inspection method...
- Patent number 12,175,653
- Issue date Dec 24, 2024
- NEC Corporation
- Yuka Oshima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for transformer in-situ inspection
- Patent number 12,163,896
- Issue date Dec 10, 2024
- HITACHI ENERGY LTD
- Luiz V. Cheim
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
System and method for inspecting a component for anomalous regions
- Patent number 12,163,970
- Issue date Dec 10, 2024
- RTX Corporation
- Brigid A. Blakeslee
- G01 - MEASURING TESTING
Information Patent Grant
Method for multivariate testing, development, and validation of a m...
- Patent number 12,158,432
- Issue date Dec 3, 2024
- Stratasys, Inc.
- Joel Ong
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Grant
Device for optical inspection of preforms
- Patent number 12,158,433
- Issue date Dec 3, 2024
- Sacmi Cooperativa Meccanici Imola Societa Cooperativa
- Donato Laico
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
IMAGING SYSTEM AND IMAGING INSPECTION APPARATUS INCLUDING THE SAME
- Publication number 20250076204
- Publication date Mar 6, 2025
- Samsung Electronics Co., Ltd.
- Min Hwan SEO
- G01 - MEASURING TESTING
Information Patent Application
DISPLAYING MULTI-STAGE NDT ANALYTIC INFORMATION
- Publication number 20250076210
- Publication date Mar 6, 2025
- Baker Hughes Holdings LLC
- Kevin Coombs
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTIDIRECTIONAL ILLUMINATION FOR HYBRID BONDING DEFECT DETECTION
- Publication number 20250076212
- Publication date Mar 6, 2025
- Applied Materials, Inc.
- Venkatakaushik VOLETI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SENSOR FUSION WITH EDDY CURRENT SENSING
- Publication number 20250073780
- Publication date Mar 6, 2025
- DIVERGENT TECHNOLOGIES, INC.
- Farzaneh KAJI
- B22 - CASTING POWDER METALLURGY
Information Patent Application
METHOD AND DEVICE FOR ANALYSING A DEVICE FOR SPRAYING A PHARMACEUTI...
- Publication number 20250076158
- Publication date Mar 6, 2025
- APTAR FRANCE SAS
- Guillaume GRANJON
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20250076209
- Publication date Mar 6, 2025
- Mitsubishi Heavy Industries, Ltd.
- Yuki YANO
- G01 - MEASURING TESTING
Information Patent Application
FOREIGN SUBSTANCE INSPECTION METHOD, FOREIGN SUBSTANCE INSPECTION A...
- Publication number 20250076213
- Publication date Mar 6, 2025
- Canon Kabushiki Kaisha
- TOSHIKI ITO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING THE STATUS OF GREASE CONTAINING PARTICLES BY...
- Publication number 20250078543
- Publication date Mar 6, 2025
- Aktiebolaget SKF
- Weichen GU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
JUDGMENT APPARATUS
- Publication number 20250076211
- Publication date Mar 6, 2025
- Kabushiki Kaisha Toshiba
- Tomoyuki YAHAGI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...
- Publication number 20250076205
- Publication date Mar 6, 2025
- Canon Kabushiki Kaisha
- Takayuki Jinno
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHODS FOR THE CALCULATION OF ADDITIONAL LOCAL STRETCHI...
- Publication number 20250066153
- Publication date Feb 27, 2025
- VALMET AB
- Fabrizio BARTOLINI
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
SYSTEM AND METHOD FOR USE OF POLARIZED LIGHT TO IMAGE TRANSPARENT M...
- Publication number 20250067660
- Publication date Feb 27, 2025
- COGNEX CORPORATION
- Ben R. Carey
- G01 - MEASURING TESTING
Information Patent Application
DIAGNOSIS METHOD, DIAGNOSIS DEVICE, AND PROGRAM
- Publication number 20250067682
- Publication date Feb 27, 2025
- Mitsubishi Heavy Industries, Ltd.
- Tsuyoshi Tomita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERIORATION ESTIMATION SYSTEM, DETERIORATION ESTIMATION METHOD, A...
- Publication number 20250067681
- Publication date Feb 27, 2025
- NEC Corporation
- Yusuke Mizukoshi
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR ACQUIRING THREE-DIMENSIONAL INFORMATION OF OBJECTS AN...
- Publication number 20250060316
- Publication date Feb 20, 2025
- SCUOLA UNIVERSITARIA PROFESSIONALE DELLA SVIZZERA ITALIANA (SUPSI)
- Daniele Guido ALLEGRI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DURATION-BASED SAMPLE PATH ADJUSTMENT
- Publication number 20250060317
- Publication date Feb 20, 2025
- KLA Corporation
- Arthur Kalman
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR EVALUATING FIBER QUALITIES
- Publication number 20250060318
- Publication date Feb 20, 2025
- TEXAS TECH UNIVERSITY SYSTEM
- Aniruddha Ray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Optical Inspection System for Detecting Surface Profile Defects in...
- Publication number 20250060319
- Publication date Feb 20, 2025
- 3M Innovative Properties Company
- Steven P. Floeder
- G01 - MEASURING TESTING
Information Patent Application
POSITIONING SYSTEM OF IMAGE SENSORS AND ELECTROMAGNETIC RADIATION E...
- Publication number 20250058897
- Publication date Feb 20, 2025
- QUANDUM AEROSPACE S.L.
- RAFAEL RODRIGUEZ ROSAS
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Application
SURFACE INSPECTION DEVICE, SURFACE INSPECTION METHOD, AUTOMATIC DEF...
- Publication number 20250045898
- Publication date Feb 6, 2025
- Konica Minolta, Inc.
- Yoshihito SOUMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Remotely Deployed and Operated Drone-based Sealed Tank Inspections
- Publication number 20250044809
- Publication date Feb 6, 2025
- OCEANEERING INTERNATIONAL, INC.
- Nikunj PATEL
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL APPARATUS, OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION...
- Publication number 20250044235
- Publication date Feb 6, 2025
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING AT LEAST ONE DEFECT ON A SUPPORT, DEVICE AND C...
- Publication number 20250045905
- Publication date Feb 6, 2025
- AQC INDUSTRY
- Pierre MAGRANGEAS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER DEFECT INSPECTION SYSTEM
- Publication number 20250044241
- Publication date Feb 6, 2025
- SYNTEC RESOURCES CO., LTD.
- KANG-FENG FAN
- G01 - MEASURING TESTING
Information Patent Application
MULTI-TASK DEVICE COMPRISING A CAMERA AND A SINGLE SPINDLE FOR PLAC...
- Publication number 20250039524
- Publication date Jan 30, 2025
- SETI-TEC
- Sébastien Pereira-Santo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, APPARATUS, AND SYSTEM FOR DEFECT DETECTION OF CATHODE ELECT...
- Publication number 20250035559
- Publication date Jan 30, 2025
- CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITED
- Baiquan ZHAO
- G01 - MEASURING TESTING
Information Patent Application
METHOD, APPARATUS, AND SYSTEM FOR INSPECTING CATHODE ELECTRODE PLAT...
- Publication number 20250035560
- Publication date Jan 30, 2025
- CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITED
- Baiquan ZHAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR INSPECTING A SUBSTRATE
- Publication number 20250027887
- Publication date Jan 23, 2025
- Applied Materials, Inc.
- Srikanth V. Racherla
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM, INSPECTION METHOD, AND NON-TRANSITORY RECORDING...
- Publication number 20250026603
- Publication date Jan 23, 2025
- Konica Minolta, Inc.
- Hiromu Nagato
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE OF INSPECTING DEFECTS OF WAFER DICED OR ALIGNED
- Publication number 20250027885
- Publication date Jan 23, 2025
- YAYATECH CO., LTD.
- Chien-Cheng CHEN
- G01 - MEASURING TESTING

Scan or image signal processing specially adapted therefor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Electrode sheet defect detection system

System comprising a dishwasher and method for operating a dishwasher

Appearance inspection system and appearance inspection method for t...

Defect inspection system using 3D measuring machine

System and method of welding workpiece by vision guided welding pla...

Self-leveling inspection systems and methods

Surface analysis of gemstones

Optical inspection device and inspecting method using the same

Multi-sensor pipe inspection system and method

Decay detection system

Defect inspection system having human-machine interaction function

Apparatus and method for inspecting cans

Electronic device which can determine a dirtiness level

Inspection support device, inspection support method, and inspectio...

Spark spectrometry for inclusions content distribution on the surfa...

Qualitative or quantitative characterization of a coating surface

Method for inspecting pattern defects

Syclops

Image processing system, image processing device, image processing...

Automated optical double-sided inspection apparatus

Microscopic non-destructive measurement method of microstructure li...

Foreign object debris detection

Station and method for translationally detecting glaze defects on g...

Methods, systems and devices for automated assembly of building str...

Measurement tool for cable-preparation system

Defect position determination system, appearance inspection method...

Device and method for transformer in-situ inspection

System and method for inspecting a component for anomalous regions

Method for multivariate testing, development, and validation of a m...

Device for optical inspection of preforms

Patents Applicationslast 30 patents

IMAGING SYSTEM AND IMAGING INSPECTION APPARATUS INCLUDING THE SAME

DISPLAYING MULTI-STAGE NDT ANALYTIC INFORMATION

MULTIDIRECTIONAL ILLUMINATION FOR HYBRID BONDING DEFECT DETECTION

SENSOR FUSION WITH EDDY CURRENT SENSING

METHOD AND DEVICE FOR ANALYSING A DEVICE FOR SPRAYING A PHARMACEUTI...

INSPECTION DEVICE AND INSPECTION METHOD

FOREIGN SUBSTANCE INSPECTION METHOD, FOREIGN SUBSTANCE INSPECTION A...

METHOD FOR DETERMINING THE STATUS OF GREASE CONTAINING PARTICLES BY...

JUDGMENT APPARATUS

IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...

SYSTEM AND METHODS FOR THE CALCULATION OF ADDITIONAL LOCAL STRETCHI...

SYSTEM AND METHOD FOR USE OF POLARIZED LIGHT TO IMAGE TRANSPARENT M...

DIAGNOSIS METHOD, DIAGNOSIS DEVICE, AND PROGRAM

DETERIORATION ESTIMATION SYSTEM, DETERIORATION ESTIMATION METHOD, A...

APPARATUS FOR ACQUIRING THREE-DIMENSIONAL INFORMATION OF OBJECTS AN...

SYSTEM AND METHOD FOR DURATION-BASED SAMPLE PATH ADJUSTMENT

METHODS AND SYSTEMS FOR EVALUATING FIBER QUALITIES

Optical Inspection System for Detecting Surface Profile Defects in...

POSITIONING SYSTEM OF IMAGE SENSORS AND ELECTROMAGNETIC RADIATION E...

SURFACE INSPECTION DEVICE, SURFACE INSPECTION METHOD, AUTOMATIC DEF...

Remotely Deployed and Operated Drone-based Sealed Tank Inspections

OPTICAL APPARATUS, OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION...

METHOD FOR DETECTING AT LEAST ONE DEFECT ON A SUPPORT, DEVICE AND C...

WAFER DEFECT INSPECTION SYSTEM

MULTI-TASK DEVICE COMPRISING A CAMERA AND A SINGLE SPINDLE FOR PLAC...

METHOD, APPARATUS, AND SYSTEM FOR DEFECT DETECTION OF CATHODE ELECT...

METHOD, APPARATUS, AND SYSTEM FOR INSPECTING CATHODE ELECTRODE PLAT...

SYSTEMS AND METHODS FOR INSPECTING A SUBSTRATE

INSPECTION SYSTEM, INSPECTION METHOD, AND NON-TRANSITORY RECORDING...

DEVICE OF INSPECTING DEFECTS OF WAFER DICED OR ALIGNED