Number | Date | Country | Kind |
---|---|---|---|
63-327636 | Dec 1988 | JPX |
Number | Name | Date | Kind |
---|---|---|---|
4410231 | Senor | Oct 1983 | |
4722060 | Quinn et al. | Jan 1988 | |
4795798 | Tamai et al. | Jan 1989 | |
4838799 | Tonooka | Jun 1989 | |
4847349 | Ohta et al. | Jul 1989 |
Number | Date | Country |
---|---|---|
0090059 | Mar 1982 | EPX |
63-32881 | Feb 1988 | JPX |
Entry |
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Chemical Abstracts, vol. 77, No. 12, 18 Sep. 1972, p. 51, Abstract No. 7617x, "Materials for High Temperature Integrated Circuit Testing", pp. 86-92. |