| Number | Date | Country | Kind |
|---|---|---|---|
| 63-327636 | Dec 1988 | JPX |
| Number | Name | Date | Kind |
|---|---|---|---|
| 4410231 | Senor | Oct 1983 | |
| 4722060 | Quinn et al. | Jan 1988 | |
| 4795798 | Tamai et al. | Jan 1989 | |
| 4838799 | Tonooka | Jun 1989 | |
| 4847349 | Ohta et al. | Jul 1989 |
| Number | Date | Country |
|---|---|---|
| 0090059 | Mar 1982 | EPX |
| 63-32881 | Feb 1988 | JPX |
| Entry |
|---|
| Chemical Abstracts, vol. 77, No. 12, 18 Sep. 1972, p. 51, Abstract No. 7617x, "Materials for High Temperature Integrated Circuit Testing", pp. 86-92. |