Number | Name | Date | Kind |
---|---|---|---|
5086477 | Yu et al. | Feb 1992 | |
5483461 | Lee et al. | Jan 1996 | |
5581475 | Majors | Dec 1996 | |
5689432 | Blaauw et al. | Nov 1997 |
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Satish ("Tutorial on design for testability (DFT) 'An ASIC design philosophy for testablity from chips to systems'", IEEE, Proceedings of the Sixth Annual IEEE International ASIC Conference and Exhibit, 27 Sep. 1993, pp. 130-139). |
Martin et al. ("A CAD tool for circuit extraction from VLSI layout cells", IEEE, Southeastcon 1989 Proceedings on Energy and Information Technologies in the Southeast, 9-12 Apr. 1989, pp. 817-820). |