Claims
- 1. A mass calibration apparatus for a mass analyzer, comprising:an ion source for providing analyte ions to the mass analyzer; ion optics, situated between the ion source and the mass analyzer, for assisting the motion of the analyte ions from the ion source to the mass analyzer; and a source of lock mass ions including a lock mass source and a lock mass ionization source adjacent the ion optics for creating lock mass ions within the ion optics; wherein the lock mass ionization source comprises a photoionization source.
- 2. The mass calibration apparatus of claim 1, wherein the lock mass source comprises a gas source and the ion optics has a central axis, the gas source introducing gas orthogonally with respect to the central axis of the ion optics.
- 3. The mass calibration apparatus of claim 1, wherein the ion optics includes at least two vacuum stages, a first of the at least two vacuum stages being situated upstream with respect to a second of the at least two vacuum stages.
- 4. The mass calibration apparatus of claim 3, wherein the lock mass ionization source is situated in the second vacuum stage of the ion optics.
- 5. The mass calibration apparatus of claim 3, wherein the lock mass ionization source is situated externally and adjacent to the second vacuum stage of the ion optics.
- 6. A method for mass calibration of analyte ions with lock masses in a mass spectrometer that includes an analyte ion source, ion optics and a mass analyzer, said method comprising:introducing lock mass molecules into the ion optics; and photoionizing the lock mass molecules within the ion optics.
- 7. The method of claim 6, wherein the ion optics includes at least two vacuum stages, a first of the at least two vacuum stages being situated upstream with respect to a second of the at least two vacuum stages.
- 8. The method of claim 7, wherein the photoionization of the lock mass molecules within the ion optics takes place within the second vacuum stage.
- 9. The method of claim 6, wherein the lock mass molecules are introduced into the ion optics in gaseous form.
- 10. The method of claim 7, further comprising:directing the gas including the lock mass molecules orthogonally with respect to a longitudinal axis of the ion optics.
RELATED APPLICATIONS
This application is a continuation of U.S. patent application Ser. No. 10/081,780, filed Feb. 20, 2002 now U.S. Pat. No. 6,649,909.
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Continuations (1)
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Number |
Date |
Country |
Parent |
10/081780 |
Feb 2002 |
US |
Child |
10/664512 |
|
US |