Patent Application
20140053974
The present invention relates to a lamination method and a lamination system, and more particularly, to a lamination method and a lamination system for laminating a film-type laminate on a brittle lamination target which is loaded on and carried by a mount member.
When a film such as an NCF film is laminated on a lamination target such as a semiconductor wafer, a lamination device using a roll as disclosed in Patent Literature 1 has been used. Even though the lamination target has a small thickness, if the lamination target has flexibility, lamination targets may be successively supplied to be laminated. However, in general cases, a lamination target and a film are mounted on a carrier film and carried into a lamination device to be laminated. In this method, when the lamination target such as a semiconductor wafer is mounted onto the carrier film or taken off from the carrier film, it is needed to contact the semiconductor wafer by a human hand or a carrier robot.
However, a semiconductor wafer having a thickness of 0.3 mm or less or a wafer using brittle material made of a compound such as gallium nitride recently becomes available, and the wafer may be easily damaged by contact when the semiconductor wafer is mounted on a carrier film before lamination or the laminated semiconductor wafer is carried out from the carrier film. In addition, in the lamination device using a roll, a pressure becomes a linear load during laminating and is partially applied to the semiconductor wafer, and therefore the wafer may be easily broken, similar to the case of mounting or carrying out. In addition, a protrusion such as a bump is provided on the upper surface of the semiconductor wafer. If lamination is performed using a roll, a force is applied to the bump or the like in the lateral direction, and therefore the bump or the like may collapse.
Therefore, as disclosed in Patent Literature 2 and Patent Literature 3, a film-type laminate is also laminated on a semiconductor wafer using a lamination device having a pressing film member which is an elastic body. If this lamination device is used, the semiconductor wafer may be substantially uniformly pressed by the pressing film member, and therefore the semiconductor wafer is not pressed linearly, different from the lamination device using a roll. In addition, since the lamination device having the pressing film member may substantially uniformly press a semiconductor wafer from the above even though the semiconductor wafer has a protrusion such as a bump, the protrusion such as a pump does not easily collapse during the pressing performed by a roll.
However, in Patent Literature 2, since the semiconductor wafer is directly mounted on a carrier film and carried in the lamination device having a pressing film member, when mounting the semiconductor wafer onto the carrier film or carrying out the semiconductor from the carrier film after lamination, it is required to directly contact and carry the semiconductor wafer. In addition, Patent Literature 3 does not disclose how a semiconductor is carried into or out of the lamination device having a pressing film member.
As described above, in Patent Literature 1 to Patent Literature 3, when mounting a lamination target such as a semiconductor wafer onto a carrier film or carrying out the lamination target from the carrier film, it is needed to directly contact the semiconductor wafer by a human hand or a carrier robot. However, in case of laminating a brittle lamination target recently used such as a foil-type semiconductor or a semiconductor made of highly brittle material, a lamination method or a lamination system which ensures good lamination of a film-type laminate without damaging the brittle lamination target when carrying the laminate into a lamination device, laminating the laminate in the lamination device and carrying out the laminate from the lamination device has not been established.
The present invention is designed in consideration of the above problems, and the present invention is directed to providing a lamination method and a lamination system, which may agreeably laminate a film-type laminate without damage even though the film-type laminate is a brittle lamination target such as a foil-type semiconductor or a semiconductor made of highly brittle material.
A lamination method of the claim 1 laminates a film-type laminate on a brittle lamination target by overlapping the brittle lamination target and the film-type laminate and heating and pressing the brittle lamination target and the film-type laminate, wherein, with respect to the brittle lamination target mounted on a mount member and carried into a lamination device, an elastic film member is expanded into a vacuum chamber of the lamination device from the above to press and laminate the brittle lamination target and the film-type laminate.
In the lamination method of the claim 2, according to the claim 1, the mount member may include a wafer ring having a rim shape and a dicing tape adhered to the wafer ring.
In the lamination method of the claim 3, according to the claim 2, a thickness of the wafer ring having a rim shape may be larger than the sum of thicknesses of the brittle lamination target and the film-type laminate.
In the lamination method of the claim 4, according to the claim 2, the brittle lamination target may be carried into or out of the lamination device while supporting the wafer ring of the mount member.
In the lamination method of the claim 5, according to the claim 3, the brittle lamination target may be carried into or out of the lamination device while supporting the wafer ring of the mount member.
In the lamination method of the claim 6, according to the claim 1, the mount member on which the brittle lamination target and the film-type laminate are mounted may be carried into or out of the lamination device by using a carrier film.
A lamination system of the claim 7 of the present invention laminates a film-type laminate on a brittle lamination target by overlapping the brittle lamination target and the film-type laminate and heating and pressing the brittle lamination target and the film-type laminate, and the lamination system includes a lamination device having an upper plate, a lower plate capable of forming a vacuum chamber between the upper plate and the lower plate, and an elastic film member installed to the upper plate and expandable into the vacuum chamber; and a mount member carried into or out of the lamination device in a state where the brittle lamination target is mounted thereto.
In the lamination system of the claim 8, according to the claim 7, the mount member may include a wafer ring having a rim shape and a dicing tape adhered to the wafer ring.
The lamination method of the claim 1 according to the present invention laminates a film-type laminate on a brittle lamination target by overlapping the brittle lamination target and the film-type laminate and heating and pressing the brittle lamination target and the film-type laminate, wherein, with respect to the brittle lamination target mounted on a mount member and carried into a lamination device, an elastic film member is expanded into a vacuum chamber of the lamination device from the above to press and laminate the brittle lamination target and the film-type laminate. Therefore, since the brittle lamination target is not damaged during a carrying-in process, a carrying-out process and a laminating process, a yield may be enhanced when the film-type laminate is laminated on the brittle lamination target.
The lamination system of the claim 6 according to the present invention laminates a film-type laminate on a brittle lamination target by overlapping the brittle lamination target and the film-type laminate and heating and pressing the brittle lamination target and the film-type laminate, and the lamination system includes a lamination device having an upper plate, a lower plate capable of forming a vacuum chamber between the upper plate and the lower plate, and an elastic film member installed to the upper plate and expandable into the vacuum chamber; and a mount member carried into or out of the lamination device in a state where the brittle lamination target is mounted thereto. Therefore, since the brittle lamination target is not damaged during a carrying-in process, a carrying-out process and a laminating process, a yield may be enhanced when the film-type laminate is laminated on the brittle lamination target.
A lamination system 11 according to an embodiment will be described with reference to
As shown in
In addition, a heat plate 19 which is a part of the upper plate is attached to the base 18 of the upper plate 14. A cartridge heater (not shown) is installed in the heat plate 19, or a rubber heater (not shown) is installed at the surface thereof, so that the heat plate 19 may generate heat. In addition, an absorbed/compressed air supply hole 20 is formed toward an opposite side of the elastic film member 16 through the base 18 of the upper plate 14 and the heat plate 19. An opening of the absorbed/compressed air supply hole 20 in the device is opened at the opposite side of the elastic film member 16, and an opening thereof out of the device is connected to a vacuum pump and a compression pump (not shown) installed out of the upper plate 14 by means of a valve or the like.
With respect to the lower plate 15, a heat plate 21 which is a part of the lower plate is also installed to a base 22 thereof. In addition, the elastic fixing film member 23 is also adhered to the upper surface of the heat plate 21 of the lower plate 15. The elastic fixing film member 23 is made of heat-resisting rubber such as a silicon rubber having hardness (Shore A hardness) of 10° to 60° and a thickness of 1 mm to 6 mm. In addition, a fine unevenness is formed on the surface of the elastic fixing film member 23. An absorbing hole 24 is formed at a part of the lower plate 15. In addition, an opening of the absorbing hole 24 inside the device is opened to the vacuum chamber C, and an opening thereof out of the device is connected to a vacuum pump (not shown). Moreover, a seal member such as an O-ring 26 is installed at a wall 25 around the lower plate 15, and when the vacuum chamber C is formed, the upper surface of the wall 25 of the lower plate 15 and the O-ring 26 are interposed between carrier films f1, f2, described later, or directly contact the lower surface of the frame body 17 of the upper plate 14. In addition, the vacuum chamber C is not limited to the above structure if it has appropriate width and height.
Next, the carrying mechanism 13 for the semiconductor wafer W and the film-type laminate F will be described. In the carrying mechanism 13, a carrier film f1 unwound from an unwinding roll 31 installed at the upper side near a preprocess of the lamination device 12 passes between the upper plate 14 and the lower plate 15 of the lamination device 12 and is wound around a winding roll 32 installed at the upper side near a post-process of the lamination device 12. In addition, a carrier film f2 unwound from an unwinding roll 33 installed at the lower side near the preprocess of the lamination device 12 passes between the upper plate 14 and the lower plate 15 of the lamination device 12 and is wound around a winding roll 34 installed at the lower side near the post-process of the lamination device. The carrier films f1, f2 are made of resin films such as polyethylene terephthalate, as known in the art.
The carrying mechanism 13 will be described in more detail. The lower carrier film f2 is unwound from the unwinding roll 33 and then changes its direction by a roller 35 to be sent in a horizontal direction toward the lamination device 12. In addition, a carrying-in stage S1 for carrying in the mount member 36 to which the semiconductor wafer W and the film-type laminate F are mounted is installed at a portion (a portion having an open upper side) where only the lower carrier film f2 is sent in the horizontal direction.
Meanwhile, the upper carrier film f1 also changes its direction by rollers 37, 38 to be sent to the lamination device 12 so that it overlaps with the lower carrier film f2 in front of the lamination device 12, instead of the carrying-in stage S1. In addition, in the post-process of the lamination device 12, after the upper carrier film f1 changes its direction toward the winding roll 32 by the roller 39, the lower carrier film f2 is also sent in the horizontal direction. In addition, a carrying-out stage S2 for carrying out the mount member 36 to which the laminated semiconductor wafer W is mounted is installed at a portion (a portion having an open upper side) where only the lower carrier film f2 is sent in the horizontal direction. After that, the lower carrier film f2 changes its direction by the roller 40 and is wound around the winding roll 34.
In addition, as another embodiment of the carrying mechanism 13, a gripping carrier device for gripping both ends of the carrier films f1, f2 between the lamination device 12 and the winding rolls 32, 34 by a chuck device and pulling the carrier films f1, f2 toward the post-process may also be installed. Further, a plurality of lamination devices may be installed, without being limited to a single device, and a press device may be added after the lamination device 12 using the elastic film member 16 which is expanded.
Moreover, as another embodiment of the carrying mechanism, in the mount member to which the semiconductor wafer W serving as a brittle lamination target and the film-type laminate F serving as a film-type laminate are mounted, a portion of the wafer ring 41 may be supported by a transfer device such as a multi-joint robot so that the mount member may be directly carried into or out of the lamination device 12. In this case, the mount member may be carried by interposing the wafer ring 41 by a grip unit of a robot, or the wafer ring 41 may be carried while being loaded on a support of the robot. In addition, interposing by the grip unit of the robot or loading on the support is included in the concept of supporting the semiconductor wafer W or the like. In addition, in another embodiment, the carrier film f2 is not used when carrying the semiconductor wafer W.
Next, the mount member 36 of the carrying mechanism 13 will be described with reference to
Therefore, in the mount member 36, the adhesive layer of the dicing tape f3 is attached upwards, and the dicing tape f3 having an exposed adhesive layer is installed at the portion (the central portion) of the inside hole H of the wafer ring 41. In addition, a circular semiconductor wafer W is attached to the adhesive layer of the dicing tape f3, and a rectangular film-type laminate F overlaps thereon. The film-type laminate F is generally cut to a size capable of covering the entire surface of the semiconductor wafer W as described above. In addition, in the film-type laminate F, surrounding portions other than the portion contacting the upper surface of the semiconductor wafer W are installed to face the dicing tape f3. In this case, the film-type laminate F may be adhered to the dicing tape f3 or simple overlap therewith. In this configuration, the semiconductor wafer W and the film-type laminate F are fixed on the mount member 36 without being dislocated. In addition, the shape of the film-type laminate F is not limited to a rectangular shape but may have a circular shape or a continuous strip shape as described later.
Next, a lamination method using the lamination system 11 according to an embodiment will be described with reference to
First, as shown in
In addition, the mount member 36 is carried out in the carrying-out stage S2 simultaneously. In case of carrying out the mount member 36, similar to the carrying-in work, the portion of the wafer ring 41 of the mount member 36 is gripped by a handling robot or a human hand without contacting the semiconductor wafer W. In other case, the mount member may be transferred to/from a belt conveyor of a post-process without being gripped.
Moreover, if the semiconductor wafer W is completely laminated in the lamination device 12 by spending a predetermined time, the atmospheric pressure in the vacuum chamber C returns to a normal pressure, and then, as shown in
In addition, if the upper plate 14 and the lower plate 15 of the lamination device 12 are closed again, the vacuum chamber C is formed, and the vacuum chamber C is made vacuous by sucking through the absorbing hole 24 by a vacuum pump, not shown. At this time, since the heat plate 19 of the upper plate 14 and the heat plate 21 of the lower plate 15 are heated, the layer of the film-type laminate F toward the semiconductor wafer W or the entire film-type laminate F is melted. In addition, the heat plate 19 of the upper plate 14 and the heat plate 21 of the lower plate 15 are heated to, for example, 80° C. to 200° C., without being limited thereto. In this stage, preferably, the opposite side of the elastic film member 16 is absorbed by the vacuum pump but not pressed. In addition, if a predetermined time passes, as shown in
At this time, it is advantageous to expand the elastic film member 16 to press the upper surface of the semiconductor wafer W mounted on the mount member 36 due to the following reason. By pressing at the upper surface, the dicing tape f3 adhered to the lower surface of the wafer ring 41 of the mount member 36 is pressed to the elastic fixing film member 23 at the lower side, and at this time, the dicing tape f3 may not have substantially no bent or a small bent. Meanwhile, in the case an elastic film member is installed at the lower plate 15 and the elastic film member at the lower plate 15 is expanded, the dicing tape f3 is lifted up and bent greatly, and simultaneously the portion around the semiconductor wafer W is also bent and easily broken. In addition, the bent semiconductor wafer W may be easily broken due to the difference of shrinkage caused by air cooling. Moreover, the dicing tape f3 may also be easily torn. In addition, in case of pressing the elastic film member installed at the lower plate 15, the entire mount member 36 is lifted up by the expansion of the elastic film member, so that the mount member may deviate from the center of the vacuum chamber C of the lamination device 12. In this case, the semiconductor wafer W may stick out between the carrier films f1, f2 so that a part of the melted film-type laminate may be attached into the vacuum chamber C of the lamination device 12, irregularly pressed by the elastic film member, or cause a problem in handling to a post-process in the carrying-out stage S2.
In addition to the above, it may also be conceived that the film-type laminate such as a NCF film, the semiconductor wafer W, and the mount member 36 including the dicing tape f3 are mounted in order from the bottom and pressed from the below by the elastic film member. However, in this case, when the entire elastic film member is lifted up, the semiconductor wafer W may also be broken. In addition, there is a limit in carrying in or out the semiconductor wafer W, and when the semiconductor wafer W is attached to the dicing tape f3 of the mount member 36 or detached from the dicing tape f3 in a preprocess or a post-process, a process of, for example, reversing the mount member 36 is required.
When the film-type laminate such as a NCF film and the semiconductor wafer W are pressed by the lamination device 12, the pressure (the surface pressure applied to the semiconductor wafer W) may be, for example, in the range of 0.2 MPa to 1.0 MPa, without being limited thereto. In addition, the pressing time is, for example, 15 seconds to 90 seconds, without being limited thereto. Moreover, a predetermined time passes, the supply of compressed air to the opposite side of the elastic film member 16 is intercepted, and the elastic film member 16 is absorbed again toward the heat plate 19, consequently the laminating work is completed in the lamination device 12 by using the elastic film member 16. In addition, the vacuum chamber C is opened to the atmosphere to return to a normal pressure, and as shown in
In addition, in the above embodiment, the film-type laminate F is adhered to the mount member 36 and carried together with the semiconductor wafer W. However, the film-type laminate F may also be a strip-type continuous film. If the film-type laminate F is a continuous film, in a state where a protective film or the like is wound from the unwinding roll of the film-type laminate F, the strip-like film-type laminate F overlaps on the semiconductor wafer W mounted on the mount member 36 and is supplied to the lamination device 12, and this is pressed in the lamination device 12 and then carried out. In a state where the semiconductor wafer W and the strip-like film-type laminate F laminated are mounted on the lower carrier film f2, a surplus of the film-type laminate F is cut from the laminated semiconductor wafer W.
In addition, in this embodiment, the film-type laminate F and the semiconductor wafer W are mounted on the mount member 36 and carried as being loaded on the carrier film f2. However, the semiconductor wafer W may also be directly carried in or out to a pressing position at the center of the lamination device 12 by supporting a portion of the wafer ring 41 by a grip unit of a multi-joint robot. In this case, during a pressing process by the lamination device 12, it should be considered that the film-type laminate F is melted and attached to the elastic film member 16 or the like. For this reason, it should also be considered that a protective film having the same size as an area contacting the upper surface of the wafer ring 41 is mounted on the film-type laminate F. The area of the protective film needs to be larger than the area of the film-type laminate F so that at least the film-type laminate F does not stick out, and preferably smaller than the area of the wafer ring 41. In addition, since the lower surface of the semiconductor wafer W is covered by the dicing tape f3, a protective film is not necessary. In addition, the laminating process is completed, the semiconductor wafer W is carried out of the lamination device 12 as the portion of the wafer ring 41 is gripped by a multi-joint robot. In this case, the semiconductor wafer W may be moved toward the same side as the carrying-in side by using a single robot, or the semiconductor wafer W may also be moved toward a certain direction by using two robots. Moreover, if a protective film overlaps therewith, the protective film is removed (or, a surplus of the film-type laminate F and the protective film may also be cut in advance).
The case where the semiconductor wafer W is carried without using a carrier film will be described as a second embodiment. As shown in
Next, a laminating method for laminating the semiconductor wafer W and the film-type laminate F by the lamination system 51 will be described with reference to
Next, as shown in
In addition, when the film-type laminate F is mounted, it is possible to prevent the film-type laminate F from contacting the dicing tape f3 and creating an inner space. The ring spacer 59 may also overlap with the mount member 36 together with the semiconductor wafer W from the first. In addition, it is not essential to install the ring spacer 59 depending on sizes of the semiconductor wafer W and the wafer ring 41.
Next, as shown in
At this time, the region between the semiconductor wafer W and the ring spacer 59 is covered by the film-type laminate F, so that the dicing tape f3 does not expose. Next, the upper plate 60 and the lower plate 53 of the lamination device 52 are adhered to form a chamber therein, and the chamber is made vacuous by sucking.
After that, as shown in
At this time, a tension is applied to the dicing tape f3 by the ring spacer 59, and the adhesion between the elastic film member 16 and the dicing tape f3 is prevented. If the laminating work is completed, the upper plate 60 and the lower plate 53 are opened, and only the ring spacer 59 is absorbed and removed by the transfer device. In addition, simultaneously or before or after this, a compressed air is supplied through the hole 58 and the mounting stand 57 made of porous material, so that the opposite side of the semiconductor wafer W is released. In addition, a compressed air is also supplied from the hole 56, and the upper surface of the wafer ring 41 is absorbed and taken off.
Moreover, in another embodiment, if the area between the semiconductor wafer W and the film-type laminate F may be made vacuous by sucking, from the beginning, a mount member 36 on which the semiconductor wafer W and the ring spacer 59 or the film-type laminate F are mounted may be carried in. In addition, in the lamination device 52 of this embodiment, the concave portion 55 may not be formed at the heat plate 54, but a positioning protrusion may be formed around the heat plate 54 to determine a position of the mount member 36. Moreover, as long as the lamination device 52 is capable of absorbing and supporting at least the mount member 36 to the lower plate 53, an elastic film member such as a silicon or rubber may be adhered to the upper surface of the heat plate 54 of the lower plate 53, and a portion of the semiconductor wafer W may be mounted thereon. In this case, portions other than the portion to which the semiconductor wafer W is mounted may be absorbed through a hole formed in the elastic film member or other members.
Though not described one by one in regard to the present invention, the present invention is not limited to the above embodiments but may be applied to modifications made by a person skilled in the art based on the spirit of the present invention, needless to say. The brittle lamination target employed in the lamination method and the lamination system of the present invention includes a wiring substrate having a plate thickness of 0.3 mm or less, a solar cell of 0.3 mm or less, a substrate (a green sheet) having a optical waveguide and ceramic before sintering regardless of a thickness, or the like, in addition to all semiconductor wafers having a plate thickness of 0.3 mm or less and nitride semiconductor wafers. In addition, regarding the plate thickness of the semiconductor wafer W, since a semiconductor wafer having a thickness of 0.01 mm to 0.05 mm may be easily broken while being handled, the present invention is very effective.
| Number | Date | Country | Kind |
|---|---|---|---|
| 2012-184884 | Aug 2012 | JP | national |
