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Number | Date | Country |
---|---|---|
254017 | Jan 1988 | EP |
146221983 | Jan 1983 | JP |
Entry |
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A Low-Cost High-Performance CMOS Timing Vernier for ATE, Chapman et al. IEEE International Test Concerence 1995 (No month available). |
Integrated Pin Electronics for a VLSI Test System, Branson et al. IEEE International Test Conference 1988 (No month available). |
Integrated Pin Electronics for Automatic Test Equipment, Grace et al. Hewlett-Packard Journal 1994 (No month available). |
Internal Oscillator Ring, Heuer et al. IBM Technical Disclosure Bulletin 1977. |
High-Performance CMOS-Based VLSI Testers: Timing Control and Compensation, Chapman IEEE International Test Conference 1992 Compensation, Chapman IEEE International Test Conference 1992 (No month available). |
Design of PLL-Based Clock Generation Circuits, IEEE Journal of Solid-State Circuits vol. sc-22 No. 2 1987 (No month available). |