Timing generation or clock distribution

Industry

CPC
G01R31/31922

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/31922Timing generation or clock distribution

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Delay measurement system and measurement method
- Patent number 12,169,222
- Issue date Dec 17, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Shang Hsien Yang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Device under test synchronization with automated test equipment che...
- Patent number 12,140,632
- Issue date Nov 12, 2024
- Synopsys, Inc.
- Yongkang Hu
- G01 - MEASURING TESTING
Information Patent Grant
Device under test (DUT) measurement circuit having harmonic minimiz...
- Patent number 12,000,892
- Issue date Jun 4, 2024
- Texas Instruments Incorporated
- Charles Kasimer Sestok
- G01 - MEASURING TESTING
Information Patent Grant
System and method for testing clocking systems in integrated circuits
- Patent number 11,879,939
- Issue date Jan 23, 2024
- NXP B.V.
- Nikila Krishnamoorthy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Built in self test (BIST) for clock generation circuitry
- Patent number 11,821,946
- Issue date Nov 21, 2023
- NXP USA, INC.
- Jorge Arturo Corso Sarmiento
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of testing electronic circuits and corresponding circuit
- Patent number 11,762,019
- Issue date Sep 19, 2023
- STMicroelectronics S.r.l.
- David Vincenzoni
- G01 - MEASURING TESTING
Information Patent Grant
On-chip spread spectrum characterization
- Patent number 11,714,127
- Issue date Aug 1, 2023
- International Business Machines Corporation
- Christopher W. Steffen
- G01 - MEASURING TESTING
Information Patent Grant
Performing testing utilizing staggered clocks
- Patent number 11,668,750
- Issue date Jun 6, 2023
- NVIDIA Corporation
- Sailendra Chadalavada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for selecting a clock
- Patent number 11,644,504
- Issue date May 9, 2023
- STMicroelectronics S.r.l.
- Mirko Dondini
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fault injection in a clock monitor unit
- Patent number 11,609,833
- Issue date Mar 21, 2023
- NXP USA, INC.
- Praveen Durga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Temporal resolution control for temporal point spread function gene...
- Patent number 11,607,132
- Issue date Mar 21, 2023
- HI LLC
- Bruno Do Valle
- G01 - MEASURING TESTING
Information Patent Grant
Runtime measurement of process variations and supply voltage charac...
- Patent number 11,585,854
- Issue date Feb 21, 2023
- Xilinx, Inc.
- Da Cheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-channel timing calibration device and method
- Patent number 11,531,065
- Issue date Dec 20, 2022
- Youngtek Electronics Corporation
- Ching-Yung Tseng
- G01 - MEASURING TESTING
Information Patent Grant
Testing memory elements using an internal testing interface
- Patent number 11,500,017
- Issue date Nov 15, 2022
- Xilinx, Inc.
- Albert Shih-Huai Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of testing electronic circuits and corresponding circuit
- Patent number 11,500,021
- Issue date Nov 15, 2022
- STMicroelectronics S.r.l.
- David Vincenzoni
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and device for sending data according to a signal timing
- Patent number 11,409,689
- Issue date Aug 9, 2022
- Infineon Technologies AG
- Siak Pin Lim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device and burn-in test method thereof
- Patent number 11,372,042
- Issue date Jun 28, 2022
- Renesas Electronics Corporation
- Koji Suzuki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High speed debug-delay compensation in external tool
- Patent number 11,360,143
- Issue date Jun 14, 2022
- STMICROELECTRONICS INTERNATIONAL N.V.
- Avneep Kumar Goyal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Status check for a switch
- Patent number 11,346,881
- Issue date May 31, 2022
- Infineon Technologies AG
- Denis Bilstein
- G01 - MEASURING TESTING
Information Patent Grant
Self-test of an asynchronous circuit
- Patent number 11,307,253
- Issue date Apr 19, 2022
- CRYPTOGRAPHY RESEARCH, INC.
- Matthew Pond Baker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for synchronizing a checking apparatus, and a checking appar...
- Patent number 11,255,909
- Issue date Feb 22, 2022
- dspace digital signal processing and control engineering GmbH
- Matthias Klemm
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determination of the dispersion of an electronic component
- Patent number 11,249,133
- Issue date Feb 15, 2022
- STMicroelectronics (Crolles 2) SAS
- Yann Carminati
- G05 - CONTROLLING REGULATING
Information Patent Grant
Real-time jitter impairment insertion for signal sources
- Patent number 11,237,204
- Issue date Feb 1, 2022
- Tektronix, Inc.
- Gregory A. Martin
- G01 - MEASURING TESTING
Information Patent Grant
Speaker load diagnostics
- Patent number 11,218,823
- Issue date Jan 4, 2022
- Texas Instruments Incorporated
- Aditya Polepeddi
- G01 - MEASURING TESTING
Information Patent Grant
Voltage spike detector and system for detecting voltage spikes in s...
- Patent number 11,150,292
- Issue date Oct 19, 2021
- Anora, LLC
- Pramodchandran Variyam
- G01 - MEASURING TESTING
Information Patent Grant
Automated test equipment for testing high-power electronic components
- Patent number 11,067,629
- Issue date Jul 20, 2021
- Teradyne, Inc.
- Jack E. Weimer
- G01 - MEASURING TESTING
Information Patent Grant
Equivalent time network analyzer
- Patent number 11,016,146
- Issue date May 25, 2021
- Massachusetts Institute of Technology
- Eric Judson VanWyk
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus
- Patent number 10,983,164
- Issue date Apr 20, 2021
- SK Hynix Inc.
- Chul Woo Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Self-test of an asynchronous circuit
- Patent number 10,884,058
- Issue date Jan 5, 2021
- CRYPTOGRAPHY RESEARCH, INC.
- Matthew Pond Baker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determining the integrity of a computing device
- Patent number 10,884,059
- Issue date Jan 5, 2021
- Hand Held Products, Inc.
- H. Sprague Ackley
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE UNDER TEST (DUT) MEASUREMENT CIRCUIT HAVING HARMONIC MINIMIZ...
- Publication number 20240310440
- Publication date Sep 19, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Charles Kasimer SESTOK
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ANALOG PHASE SELECTION TEST SYSTEM
- Publication number 20240085476
- Publication date Mar 14, 2024
- NXP B.V.
- Andreas Johannes Köllmann
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DELAY MEASUREMENT SYSTEM AND MEASUREMENT METHOD
- Publication number 20230258721
- Publication date Aug 17, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- SHANG HSIEN YANG
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DIGITAL FILTER CIRCUIT
- Publication number 20230179179
- Publication date Jun 8, 2023
- ROHDE & SCHWARZ GMBH & CO. KG
- Michael Vonbun
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Systems and Methods for Measurement of a Parameter of a DUT
- Publication number 20230147947
- Publication date May 11, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tsung-Hsien Tsai
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF TESTING ELECTRONIC CIRCUITS AND CORRESPONDING CIRCUIT
- Publication number 20230031516
- Publication date Feb 2, 2023
- STMicroelectronics S.r.l
- David Vincenzoni
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DEVICE UNDER TEST (DUT) MEASUREMENT CIRCUIT HAVING HARMONIC MINIMIZ...
- Publication number 20220268838
- Publication date Aug 25, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Charles Kasimer SESTOK
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DEVICE UNDER TEST SYNCHRONIZATION WITH AUTOMATED TEST EQUIPMENT CHE...
- Publication number 20220155370
- Publication date May 19, 2022
- Synopsys, Inc.
- Yongkang HU
- G01 - MEASURING TESTING
Information Patent Application
MULTI-CHANNEL TIMING CALIBRATION DEVICE AND METHOD
- Publication number 20220146575
- Publication date May 12, 2022
- YOUNGTEK ELECTRONICS CORPORATION
- Ching-Yung Tseng
- G01 - MEASURING TESTING
Information Patent Application
SELF-TEST OF AN ASYNCHRONOUS CIRCUIT
- Publication number 20210190862
- Publication date Jun 24, 2021
- CRYPTOGRAPHY RESEARCH, INC.
- Matthew Pond Baker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF TESTING ELECTRONIC CIRCUITS AND CORRESPONDING CIRCUIT
- Publication number 20210165043
- Publication date Jun 3, 2021
- STMicroelectronics S.r.l
- David Vincenzoni
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TEST EQUIPMENT FOR TESTING HIGH-POWER ELECTRONIC COMPONENTS
- Publication number 20200379043
- Publication date Dec 3, 2020
- Teradyne, Inc.
- Jack E. Weimer
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR SENDING DATA ACCORDING TO A SIGNAL TIMING
- Publication number 20200355743
- Publication date Nov 12, 2020
- INFINEON TECHNOLOGIES AG
- Siak Pin Lim
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR SELECTING A CLOCK
- Publication number 20200278393
- Publication date Sep 3, 2020
- STMicroelectronics S.r.l
- Mirko Dondini
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINATION OF THE DISPERSION OF AN ELECTRONIC COMPONENT
- Publication number 20200233032
- Publication date Jul 23, 2020
- STMicroelectronics (Crolles 2) SAS
- Yann CARMINATI
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Dynamic Phase Alignment of Clocks
- Publication number 20200212915
- Publication date Jul 2, 2020
- Intel Corporation
- Ravindar Attineni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REAL-TIME JITTER IMPAIRMENT INSERTION FOR SIGNAL SOURCES
- Publication number 20200209307
- Publication date Jul 2, 2020
- Tektronix, Inc.
- Gregory A. Martin
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS
- Publication number 20200132765
- Publication date Apr 30, 2020
- SK HYNIX INC.
- Chul Woo KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPEAKER LOAD DIAGNOSTICS
- Publication number 20200112808
- Publication date Apr 9, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Aditya POLEPEDDI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
COMMAND RECORDING ARRANGEMENT AND COMMAND RECORDING METHOD
- Publication number 20200064403
- Publication date Feb 27, 2020
- Rohde& Schwarz GmbH & Co. KG
- Wolfgang Wendler
- G01 - MEASURING TESTING
Information Patent Application
EYE DIAGRAM MEASUREMENT DEVICE AND EYE DIAGRAM MEASUREMENT METHOD
- Publication number 20200014501
- Publication date Jan 9, 2020
- Global Unichip Corporation
- Wen-Juh KANG
- G01 - MEASURING TESTING
Information Patent Application
ON-CHIP SPREAD SPECTRUM CHARACTERIZATION
- Publication number 20190377026
- Publication date Dec 12, 2019
- International Business Machines Corporation
- CHRISTOPHER W. STEFFEN
- G01 - MEASURING TESTING
Information Patent Application
Method for Synchronizing a Checking Apparatus, and a Checking Appar...
- Publication number 20190146035
- Publication date May 16, 2019
- dSpace digital signal processing and control engineering GmbH
- Matthias KLEMM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINING THE INTEGRITY OF A COMPUTING DEVICE
- Publication number 20190113571
- Publication date Apr 18, 2019
- HAND HELD PRODUCTS, INC.
- H. Sprague Ackley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SELF-TEST OF AN ASYNCHRONOUS CIRCUIT
- Publication number 20180299509
- Publication date Oct 18, 2018
- Cryptography Research, Inc.
- Matthew Pond Baker
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Equivalent Time Network Analyzer
- Publication number 20180284191
- Publication date Oct 4, 2018
- Massachusetts Institute of Technology
- Eric Judson VanWyk
- G01 - MEASURING TESTING
Information Patent Application
SYMBOL TIMING RECOVERY SCHEME FOR PARALLEL RECORDING CHANNEL SYSTEMS
- Publication number 20160363625
- Publication date Dec 15, 2016
- International Business Machines Corporation
- Simeon Furrer
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20160269026
- Publication date Sep 15, 2016
- RENESAS ELECTRONICS CORPORATION
- Toru MOCHIDA
- G01 - MEASURING TESTING
Information Patent Application
METHOD WITH SYSTEM AND PROGRAM PRODUCT FOR PRIORITIZING CLOCK DOMAI...
- Publication number 20150185286
- Publication date Jul 2, 2015
- International Business Machines Corporation
- Douglas E. Sprague
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TEST SYSTEM WITH EVENT DETECTION CAPABILITY
- Publication number 20150128003
- Publication date May 7, 2015
- Teradyne, Inc.
- Ronald A. Sartschev
- G01 - MEASURING TESTING

Timing generation or clock distribution

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Delay measurement system and measurement method

Device under test synchronization with automated test equipment che...

Device under test (DUT) measurement circuit having harmonic minimiz...

System and method for testing clocking systems in integrated circuits

Built in self test (BIST) for clock generation circuitry

Method of testing electronic circuits and corresponding circuit

On-chip spread spectrum characterization

Performing testing utilizing staggered clocks

System and method for selecting a clock

Fault injection in a clock monitor unit

Temporal resolution control for temporal point spread function gene...

Runtime measurement of process variations and supply voltage charac...

Multi-channel timing calibration device and method

Testing memory elements using an internal testing interface

Method of testing electronic circuits and corresponding circuit

Method and device for sending data according to a signal timing

Semiconductor device and burn-in test method thereof

High speed debug-delay compensation in external tool

Status check for a switch

Self-test of an asynchronous circuit

Method for synchronizing a checking apparatus, and a checking appar...

Determination of the dispersion of an electronic component

Real-time jitter impairment insertion for signal sources

Speaker load diagnostics

Voltage spike detector and system for detecting voltage spikes in s...

Automated test equipment for testing high-power electronic components

Equivalent time network analyzer

Test apparatus

Self-test of an asynchronous circuit

Determining the integrity of a computing device

Patents Applicationslast 30 patents

DEVICE UNDER TEST (DUT) MEASUREMENT CIRCUIT HAVING HARMONIC MINIMIZ...

ANALOG PHASE SELECTION TEST SYSTEM

DELAY MEASUREMENT SYSTEM AND MEASUREMENT METHOD

DIGITAL FILTER CIRCUIT

Systems and Methods for Measurement of a Parameter of a DUT

METHOD OF TESTING ELECTRONIC CIRCUITS AND CORRESPONDING CIRCUIT

DEVICE UNDER TEST (DUT) MEASUREMENT CIRCUIT HAVING HARMONIC MINIMIZ...

DEVICE UNDER TEST SYNCHRONIZATION WITH AUTOMATED TEST EQUIPMENT CHE...

MULTI-CHANNEL TIMING CALIBRATION DEVICE AND METHOD

SELF-TEST OF AN ASYNCHRONOUS CIRCUIT

METHOD OF TESTING ELECTRONIC CIRCUITS AND CORRESPONDING CIRCUIT

AUTOMATED TEST EQUIPMENT FOR TESTING HIGH-POWER ELECTRONIC COMPONENTS

METHOD AND DEVICE FOR SENDING DATA ACCORDING TO A SIGNAL TIMING

SYSTEM AND METHOD FOR SELECTING A CLOCK

DETERMINATION OF THE DISPERSION OF AN ELECTRONIC COMPONENT

Systems and Methods for Dynamic Phase Alignment of Clocks

REAL-TIME JITTER IMPAIRMENT INSERTION FOR SIGNAL SOURCES

TEST APPARATUS

SPEAKER LOAD DIAGNOSTICS

COMMAND RECORDING ARRANGEMENT AND COMMAND RECORDING METHOD

EYE DIAGRAM MEASUREMENT DEVICE AND EYE DIAGRAM MEASUREMENT METHOD

ON-CHIP SPREAD SPECTRUM CHARACTERIZATION

Method for Synchronizing a Checking Apparatus, and a Checking Appar...

DETERMINING THE INTEGRITY OF A COMPUTING DEVICE

SELF-TEST OF AN ASYNCHRONOUS CIRCUIT

Equivalent Time Network Analyzer

SYMBOL TIMING RECOVERY SCHEME FOR PARALLEL RECORDING CHANNEL SYSTEMS

SEMICONDUCTOR DEVICE

METHOD WITH SYSTEM AND PROGRAM PRODUCT FOR PRIORITIZING CLOCK DOMAI...

AUTOMATED TEST SYSTEM WITH EVENT DETECTION CAPABILITY