Manufacturing method of magnetoresistive effect sensor and manufacturing method of magnetic head with the sensor

FIELD OF THE INVENTION

The present invention relates to a method of manufacturing a magnetoresistive effect (MR) sensor utilizing the giant magnetoresistive effect (GMR) and to a method of manufacturing a magnetic head with the MR sensor, used for a magnetic recording and reproducing device such as a hard disc drive (HDD) unit.

DESCRIPTION OF THE RELATED ART

Recently, thin-film magnetic heads with MR sensors based on spin valve effect of GMR characteristics are proposed in order to realize high sensitivity and high power magnetic heads which will satisfy the requirement for ever increasing data storage densities in today's HDD units.

The spin valve effect will be obtained by a structure with first and second thin-film layers of a ferromagnetic material separated by a thin-film layer of non-magnetic and electrically conductive material, and an adjacent layer of anti-ferromagnetic material formed in physical contact with the second ferromagnetic layer to provide exchange bias magnetic field by exchange coupling at the interface of the layers. The magnetization direction in the second ferromagnetic layer is constrained or maintained by the exchange coupling, hereinafter the second layer is called “pinned layer”. On the other hand the magnetization direction of the first ferromagnetic layer is free to rotate in response to an externally applied magnetic field, hereinafter the first layer is called “free layer”. The direction of the magnetization in the free layer changes between parallel and anti-parallel against the direction of the magnetization in the pinned layer, and hence the magneto-resistance greatly changes and GMR characteristics are obtained.

The output characteristic of the spin valve effect MR sensor depends upon the angular difference of magnetization between the free and pinned ferromagnetic layers. The direction of the magnetization of the free layer is free to rotate in accordance with an external magnetic field such as a leakage magnetic field from a magnetic recording medium. That of the pinned layer is fixed to a specific direction (called as “pinned direction”) by the exchange coupling between this layer and adjacently formed anti-ferromagnetic layer.

In order to provide an exchange coupling between the pinned layer and the adjacently formed anti-ferromagnetic layer made of ordered anti-ferromagnetic material, it is necessary to give the anti-ferromagnetic layer an crystal structure of the CuAu—I type by executing ordering heat treatment on a deposited anti-ferromagnetic layer under application of magnetic field.

The output characteristics of the spin valve effect MR sensor with such ordered anti-ferromagnetic layer will be improved if the thickness of the anti-ferromagnetic layer becomes thinner. Namely, in the spin valve effect MR sensor, since the anti-ferromagnetic layer and the ferromagnetic layers are connected in parallel with the conductor layer for passing the sense current, it is necessary to make the thickness of the anti-ferromagnetic layer and the ferromagnetic layers thin to increase their resistance. If the resistance of the anti-ferromagnetic layer and the ferromagnetic layers increases, the divided current passing through these layers decreases and thus a rate of the output resistance change increases. Since the thickness of the anti-ferromagnetic layer will have in general extremely greater than that of the ferromagnetic layers, it is effective to form a thinner anti-ferromagnetic layer in order to decrease the divided current passing through these layers.

In addition, since it is requested that the magnetic head has a narrower recording gap to satisfy the requirement for increasing data storage density in the recent HDD unit, the thickness of the anti-ferromagnetic layer has to decrease more.

In the spin valve effect MR sensor, the energy of the exchange coupling for magnetizing the ferromagnetic layer toward one direction will increase if the thickness of the anti-ferromagnetic layer increases. Thus, conventionally the anti-ferromagnetic layer has been designed to have a relatively large thickness such as 25 nm or more.

If the thickness of the anti-ferromagnetic layer becomes thicker than 25 nm, the MR changing rate and the sheet-resistance value of the spin valve effect sensor become low. Thus, the rate of the output resistance change of the sensor decreases under the influence of low MR changing rate and low sheet-resistance value. Also, if the thickness of the anti-ferromagnetic layer becomes thinner than 5 nm, the MR changing rate of the sensor abruptly decreases and therefore the rate of the output resistance change suddenly decreases.

As mentioned above, requirement for lowering of the divided sense current passing through the anti-ferromagnetic layer and the ferromagnetic layers and requirement for increasing of the exchange-coupling energy conflict with each other with respect to the thickness of the anti-ferromagnetic layer. Since these requirements are fundamental requirements for the spin valve effect sensor, it is very important to satisfy both of these requirements.

SUMMARY OF THE INVENTION

It is therefore an object of the present invention to provide a manufacturing method of a MR sensor and a manufacturing method of a magnetic head with the MR sensor, whereby exchange-coupling energy can be increased without increasing the thickness of an anti-ferromagnetic layer.

The present invention relates to a method for manufacturing a MR sensor having at least an anti-ferromagnetic layer and a ferromagnetic layer, and to a method for manufacturing a magnetic head with the MR sensor. The sensor utilizes bias magnetic field provided by exchange coupling between the anti-ferromagnetic layer and the ferromagnetic layer. The sensor manufacturing method includes a step of depositing an anti-ferromagnetic layer to have a larger thickness than a target thickness, a step of ordering the deposited anti-ferromagnetic layer, and a step of thinning the ordered anti-ferromagnetic layer to have the target thickness.

The anti-ferromagnetic layer deposited to have a larger thickness than a target thickness is ordered and thereafter thinned to have the target thickness. Thus, it is possible to obtain a multi-layered MR structure with a larger exchange-coupling energy than that of a multi-layered MR structure in which an anti-ferromagnetic layer is deposited to have the target thickness from the beginning and ordered. As a result, the exchange-coupling energy between the ferromagnetic layer and the anti-ferromagnetic layer of the multi-layered MR structure can be increased without changing or increasing the thickness of the anti-ferromagnetic layer so as to keep the divided sense current passing through the anti-ferromagnetic layer at almost the same value and so as to maintain the output characteristics of the MR sensor.

Japanese unexamined patent publication No.9-69210 discloses that anti-ferromagnetic layers for magnetic domain control are etched to have a thickness so that the anti-ferromagnetic layers become magnetically inactive. Namely, in the publication, it is described that the anti-ferromagnetic layers are thinned by ion milling to destroy the magnetic exchange coupling between these anti-ferromagnetic layers and the MR layer so as to use them layers as protection layers of the MR layer. Thus, thinning of the anti-ferromagnetic layers is not executed to improve the exchange coupling but just opposite to that of the present invention. Therefore, there is no teaching in the publication that the anti-ferromagnetic layer is deposited to have a larger thickness than a target thickness, then ordered and thereafter thinned to have the target thickness.

It is preferred that the thinning step includes thinning the ordered anti-ferromagnetic layer by a thinning amount of 5 nm or more.

It is preferred that the anti-ferromagnetic layer is made of a Mn-containing compound with the CuAu—I type ordered crystal structure. In this case, preferably, the ordered anti-ferromagnetic layer is oriented along (111) crystal alignment face after the ordering.

It is preferred that the anti-ferromagnetic layer is made of PtMn, or made of an alloy containing 80 at % or more of PtMn and additive of at least one of Ru, Rh, Pd, Au, Ag, Fe and Cr. In this case, preferably, content of Mn in PtMn is 40 to 60 at %.

It is also preferred that the anti-ferromagnetic layer is made of NiMn, or made of 80 at % or more of NiMn and additive of at least one of Ru, Rh, Pd, Au, Ag, Fe and Cr. In this case, preferably, content of Mn in NiMn is 40 to 60 at %.

Further objects and advantages of the present invention will be apparent from the following description of the preferred embodiments of the invention as illustrated in the accompanying drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1

is a cross-sectional view schematically illustrating a fundamental configuration of a thin-film magnetic head fabricated by a manufacturing method in a preferred embodiment according to the present invention;

FIG. 2

is a cross-sectional view seen from the air-bearing surface (ABS) illustrating layer structure of a MR sensor part of the magnetic head shown in

FIG. 1

;

FIGS. 3

a,

3

b

3

c

illustrate the manufacturing method in the embodiment shown in

FIG. 1

; degradation of output characteristics of the SVMR element when its pinned direction rotates;

FIG. 4

is a graph illustrating results of measurement of exchange-coupling magnetic field Hua of various samples with anti-ferromagnetic layers having different thickness values at deposition;

FIG. 5

is a graph illustrating results of measurement of exchange-coupling magnetic field Hua of various samples with anti-ferromagnetic layers having different thickness values at deposition;

FIG. 6

is a graph illustrating results of measurement of exchange-coupling magnetic field Hua of various samples with anti-ferromagnetic layers having different thickness values at deposition;

FIG. 7

is a graph illustrating results of measurement of exchange-coupling magnetic field Hua of various samples with anti-ferromagnetic layers having different thickness values at deposition;

FIG. 8

is a graph illustrating results of measurement of exchange-coupling magnetic field Hua of various samples with anti-ferromagnetic layers having different thickness values at deposition;

FIG. 9

is a graph illustrating results of measurement of exchange-coupling magnetic field Hua of various samples with anti-ferromagnetic layers having different thickness values at deposition;

FIG. 10

is a graph illustrating results of measurement of exchange-coupling magnetic field Hua of various samples with anti-ferromagnetic layers having different thickness values at deposition;

FIG. 11

is a graph illustrating results of measurement of exchange-coupling magnetic field Hua of various samples with anti-ferromagnetic layers having different thickness values at deposition;

FIG. 12

is a graph illustrating results of measurement of exchange-coupling magnetic field Hua of various samples with anti-ferromagnetic layers having different thickness values at deposition;

FIG. 13

is a graph illustrating results of measurement of exchange-coupling magnetic field Hua of various samples with anti-ferromagnetic layers having different thickness values at deposition;

FIG. 14

is a graph illustrating results of measurement of exchange-coupling magnetic field Hua of various samples with anti-ferromagnetic layers having different thickness values at deposition; and

FIG. 15

is a graph illustrating results of measurement of exchange-coupling magnetic field Hua of various samples with anti-ferromagnetic layers having different thickness values at deposition.

DESCRIPTION OF THE PREFERRED EMBODIMENTS

FIG. 1

schematically illustrates a fundamental configuration of a thin-film magnetic head fabricated by a manufacturing method in a preferred embodiment according to the present invention, and

FIG. 2

illustrates layer structure of a MR sensor part of the magnetic head shown in FIG.

1

.

The magnetic head of this embodiment is a composite type thin-film magnetic head with a reading head part consisting of a MR sensor and a writing head part consisting of an inductive magnetic transducer element.

In

FIG. 1

, reference numeral

10

denotes a substrate which constitutes a base of a slider,

11

a lower shield layer formed on an under layer (not shown) which is deposited on the substrate

10

,

12

an upper shield layer which also operates as a lower magnetic layer of the writing head part,

13

a spin valve multi-layered structure formed between the lower shield layer

11

and the upper shield layer

12

via insulation layers

14

and

15

so as to run along an ABS

10

a,

16

an upper magnetic layer,

17

coil conductor layers surrounded by insulation layers

18

made of organic resin,

19

a gap layer and

20

a protection layer, respectively.

Top end portions of the lower and upper magnetic layers

12

and

16

constitute writing magnetic poles

12

a

and

16

a

that oppose to each other through the gap layer

19

with a minute thickness. Back gap parts of the lower and upper magnetic layers

12

and

16

that constitute a yoke are jointed with each other so as to complete a magnetic circuit. The coil conductor layers

17

are formed on the insulation layers

18

so as to turn spirally around the joint part of the yoke.

As shown in

FIG. 2

, the spin valve multi-layered structure

13

has soft magnetic layers

130

a

and

130

b

that constitute a first ferromagnetic layer or a free layer

130

, a nonmagnetic conductive layer

131

, a second ferromagnetic layer or a pinned layer

132

and an anti-ferromagnetic layer

133

, multi-layered in this order.

Although the first ferromagnetic layer

130

has a double-layered structure of the soft magnetic layers

130

a

and

130

b

in this embodiment, this layer

130

may be formed by a single layer structure or a multi-layered structure with three or more layers. A NiFe film with a thickness of about 7 nm for example may be constitute the magnetic layer

130

a,

and a Co film with a thickness of about 1 nm for example may constitute the magnetic layer

130

b.

One surface of the nonmagnetic conductive layer

131

is in contact with one surface of the soft magnetic layer

130

b

. A Cu film with a thickness of about 3 nm for example may constitute this conductive layer

131

.

One surface of the second ferromagnetic layer

132

is in contact with the other surface of the nonmagnetic conductive layer

131

. A Co film with a thickness of about 2 nm for example may constitute this ferromagnetic layer

132

.

The anti-ferromagnetic layer

133

is constituted by a Mn-containing compound that is an ordered anti-ferromagnetic material. The Mn-containing compound has the CuAu—I type ordered crystal structure, is oriented along (111) crystal alignment face after ordering and has a thickness equal to or thicker than about 5 nm. The second ferromagnetic layer

132

is exchange-coupled with the anti-ferromagnetic layer

133

and magnetized toward one direction by the exchange coupling.

Although it is not shown in

FIG. 2

, an under film is formed under the soft magnetic layer

130

a

and a protection film is formed on the anti-ferromagnetic layer

133

. At the both end edges of the spin valve multi-layered structure, magnetic domain control layers for providing longitudinal magnetic bias to the first ferromagnetic layer

130

are formed. The magnetic domain control layers may be permanent magnet layers or anti-ferromagnetic layers for providing exchange coupling between these anti-ferromagnetic layers and the first ferromagnetic layer

130

. Lead conductor layers for leading a sense current flowing through the nonmagnetic conductive layer

131

in the spin valve multi-layered structure will be formed on the respective magnetic domain control layers.

Described following is a manufacturing method of the spin valve MR sensor in this embodiment.

First, as shown in

FIG. 3

a,

on the substrate, the soft magnetic layers

130

a

and

130

b

that constitute the first ferromagnetic layer or a free layer

130

, the nonmagnetic conductive layer

131

, the second ferromagnetic layer

132

and an anti-ferromagnetic layer

133

′ are sequentially deposited in this order. At this stage, the deposited anti-ferromagnetic layer

133

′ has a thickness greater than a target thickness of the completed anti-ferromagnetic layer

133

.

In this embodiment, a NiFe layer with a thickness of about 7 nm constitutes the soft magnetic layer

130

a,

a Co layer with a thickness of about 1 nm constitutes the soft magnetic layer

130

b,

a Cu layer with a thickness of about 3 nm constitutes the nonmagnetic conductive layer

131

, a Co layer with a thickness of about 2 nm constitutes the second ferromagnetic layer

132

, and a Mn-containing compound layer with a thickness of about 100-300 nm constitutes the deposited anti-ferromagnetic layer

133

′, respectively.

Then, as shown in

FIG. 3

b,

the deposited anti-ferromagnetic layer

133

′ is ordered under application of heat and magnetic field. This ordering heat treatment is executed by heating the multi-layered structure (wafer) to keep temperature of 250° C. for 10 hours under application of magnetic field of 3 kOe and then by gradually cooling it to decrease the temperature to 80° C. at a rate of 22° C./hour under application of magnetic field of 3 kOe.

Thereafter, the ordered anti-ferromagnetic layer

133

′ is thinned by a reverse sputtering or by a dry etching such as ion milling or RIE (reactive ion etching), so that the anti-ferromagnetic layer

133

with a target thickness shown in

FIG. 3

c

is obtained.

According to the present invention, an anti-ferromagnetic layer is deposited to have a larger thickness than a target thickness, then ordered and thereafter thinned to have the target thickness. Thus, it is possible to obtain a multi-layered MR structure such as a spin valve structure with a larger exchange-coupling energy than that of a multi-layered MR structure in which an anti-ferromagnetic layer is deposited to have the target thickness from the beginning and ordered. As a result, the exchange-coupling energy between the ferromagnetic layer and the anti-ferromagnetic layer of the multi-layered MR structure can be increased without changing or increasing the thickness of the anti-ferromagnetic layer so as to keep the divided sense current passing through the anti-ferromagnetic layer at almost the same value and so as to maintain the output characteristics of the MR sensor.

Hereinafter, measured results of the exchange-coupling magnetic field Hua of various examples of the spin valve MR sensors with respective anti-ferromagnetic layers made of different materials are described. In each example, various samples with the anti-ferromagnetic layers that have now the same target thickness but had different thickness values at deposition, in other words, were thinned by different values.

Each sample indicated as “with thinning process” in the examples was fabricated by depositing, on a substrate of AlTiC covered by an alumina film, Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/Co(2 nm)/anti-ferromagnetic layer with a thickness larger than the target thickness were sequentially deposited in this order, by ordering with heat and magnetic field, by thinning the anti-ferromagnetic layer to the target thickness, and then by depositing Ta layer of 5 nm thickness. Each sample indicated as “without thinning process” in the examples was fabricated by depositing, on a substrate of AlTiC covered by an alumina film, Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/Co(2 nm)/anti-ferromagnetic layer with the target thickness/Ta(5 nm) were sequentially deposited in this order, and then by ordering with heat and magnetic field.

FIRST EXAMPLE

FIG. 4

illustrates the measurement results of exchange-coupling magnetic field Hua of the various samples with anti-ferromagnetic layers of PtMn. The thickness values at deposition of the anti-ferromagnetic layers in the samples are indicated in Table 1. In this example, the target or final thickness of the anti-ferromagnetic layer was 30 nm, and the composition of PtMn was Pt—50 at % and Mn—50 at %.

TABLE 1

Layer Structure at Deposition

Sample 1-0

Without

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Thinning

Co(2 nm)/PtMn(30 nm)/Ta(5 nm)

Process after

Heat Treatment

Sample 1-1

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtMn(33 nm)

Heat Treatment

Sample 1-2

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtMn(34 nm)

Heat Treatment

Sample 1-3

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtMn(35 nm)

Heat Treatment

Sample 1-4

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtMn(40 nm)

Heat Treatment

Sample 1-5

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtMn(50 nm)

Heat Treatment

Sample 1-6

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtMn(60 nm)

Heat Treatment

Sample 1-7

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtMn(100 nm)

Heat Treatment

SECOND EXAMPLE

FIG. 5

illustrates the measurement results of exchange-coupling magnetic field Hua of the various samples with anti-ferromagnetic layers of NiMn. The thickness values at deposition of the anti-ferromagnetic layers in the samples are indicated in Table 2. In this example, the target or final thickness of the anti-ferromagnetic layer was 15 nm, and the composition of NiMn was Ni—50 at % and Mn—50 at %.

TABLE 2

Layer Structure at Deposition

Sample 2-0

Without

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Thinning

Co(2 nm)/NiMn(15 nm)/Ta(5 nm)

Process after

Heat Treatment

Sample 2-1

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/NiMn(30 nm)

Heat Treatment

Sample 2-2

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/NiMn(40 nm)

Heat Treatment

Sample 2-3

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/NiMn(50 nm)

Heat Treatment

Sample 2-4

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/NiMn(60 nm)

Heat Treatment

Sample 2-5

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/NiMn(100 nm)

Heat Treatment

THIRD EXAMPLE

FIG. 6

illustrates the measurement results of exchange-coupling magnetic field Hua of the various samples with anti-ferromagnetic layers of PtMn. The thickness values at deposition of the anti-ferromagnetic layers in the samples are indicated in Table 3. In this example, the target or final thickness of the anti-ferromagnetic layer was 5 nm, and the composition of PtMn was Pt—50 at % and Mn—50 at %.

TABLE 3

Layer Structure at Deposition

Sample 3-0

Without

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Thinning

Co(2 nm)/PtMn(5 nm)/Ta(5 nm)

Process after

Heat Treatment

Sample 3-1

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtMn(30 nm)

Heat Treatment

Sample 3-2

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtMn(40 nm)

Heat Treatment

Sample 3-3

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtMn(50 nm)

Heat Treatment

Sample 3-4

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtMn(60 nm)

Heat Treatment

Sample 3-5

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtMn(100 nm)

Heat Treatment

FOURTH EXAMPLE

FIG. 7

illustrates the measurement results of exchange-coupling magnetic field Hua of the various samples with anti-ferromagnetic layers of PtPdMn. The thickness values at deposition of the anti-ferromagnetic layers in the samples are indicated in Table 4. In this example, the target or final thickness of the anti-ferromagnetic layer was 20 nm, and the composition of PtPdMn was Pt—45 at %, Pd—5 at % and Mn—50 at %.

TABLE 4

Layer Structure at Deposition

Sample 4-0

Without

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Thinning

Co(2 nm)/PtPdMn(20 nm)/Ta(5 nm)

Process after

Heat Treatment

Sample 4-1

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtPdMn(30 nm)

Heat Treatment

Sample 4-2

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtPdMn(40 nm)

Heat Treatment

Sample 4-3

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtPdMn(50 nm)

Heat Treatment

Sample 4-4

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtPdMn(60 nm)

Heat Treatment

Sample 4-5

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtPdMn(100 nm)

Heat Treatment

FIFTH EXAMPLE

FIG. 8

illustrates the measurement results of exchange-coupling magnetic field Hua of the various samples with anti-ferromagnetic layers of PtRuMn. The thickness values at deposition of the anti-ferromagnetic layers in the samples are indicated in Table 5. In this example, the target or final thickness of the anti-ferromagnetic layer was 35 nm, and the composition of PtRuMn was Pt—46 at %, Ru—5 at % and Mn—49 at %.

TABLE 5

Layer Structure at Deposition

Sample 5-0

Without

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Thinning

Co(2 nm)/PtRuMn(35 nm)/Ta(5 nm)

Process after

Heat Treatment

Sample 5-1

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtRuMn(38 nm)

Heat Treatment

Sample 5-2

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtRuMn(39 nm)

Heat Treatment

Sample 5-3

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtRuMn(40 nm)

Heat Treatment

Sample 5-4

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtRuMn(50 nm)

Heat Treatment

Sample 5-5

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtRuMn(60 nm)

Heat Treatment

Sample 5-6

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtRuMu(100 nm)

Heat Treatment

SIXTH EXAMPLE

FIG. 9

illustrates the measurement results of exchange-coupling magnetic field Hua of the various samples with anti-ferromagnetic layers of PtRhMn. The thickness values at deposition of the anti-ferromagnetic layers in the samples are indicated in Table 6. In this example, the target or final thickness of the anti-ferromagnetic layer was 15 nm, and the composition of PtRhMn was Pt—45 at %, Rh—7 at % and Mn—48 at %.

TABLE 6

Layer Structure at Deposition

Sample 6-0

Without

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Thinning

Co(2 nm)/PtRhMn(15 nm)/Ta(5 nm)

Process after

Heat Treatment

Sample 6-1

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtRhMn(30 nm)

Heat Treatment

Sample 6-2

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtRhMn(40 nm)

Heat Treatment

Sample 6-3

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtRhMn(50 nm)

Heat Treatment

Sample 6-4

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtRhMn(60 nm)

Heat Treatment

Sample 6-5

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtRhMn(100 nm)

Heat Treatment

SEVENTH EXAMPLE

FIG. 10

illustrates the measurement results of exchange-coupling magnetic field Hua of the various samples with anti-ferromagnetic layers of PtAuMn. The thickness values at deposition of the anti-ferromagnetic layers in the samples are indicated in Table 7. In this example, the target or final thickness of the anti-ferromagnetic layer was 15 nm, and the composition of PtAuMn was Pt—43 at %, Au—9 at % and Mn—48 at %.

TABLE 7

Layer Structure at Deposition

Sample 7-0

Without

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Thinning

Co(2 nm)/PtAuMn(15 nm)/Ta(5 nm)

Process after

Heat Treatment

Sample 7-1

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtAuMn(30 nm)

Heat Treatment

Sample 7-2

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtAuMn(40 nm)

Heat Treatment

Sample 7-3

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtAuMn(50 nm)

Heat Treatment

Sample 7-4

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtAuMn(60 nm)

Heat Treatment

Sample 7-5

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtAuMn(100 nm)

Heat Treatment

EIGHTH EXAMPLE

FIG. 11

illustrates the measurement results of exchange-coupling magnetic field Hua of the various samples with anti-ferromagnetic layers of NiPtMn. The thickness values at deposition of the anti-ferromagnetic layers in the samples are indicated in Table 8. In this example, the target or final thickness of the anti-ferromagnetic layer was 15 nm, and the composition of NiPtMn was Ni—40 at %, Pt—15 at % and Mn—45 at %.

TABLE 8

Layer Structure at Deposition

Sample 8-0

Without

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Thinning

Co(2 nm)/NiPtMn(15 nm)/Ta(5 nm)

Process after

Heat Treatment

Sample 8-1

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/NiPtMn(30 nm)

Heat Treatment

Sample 8-2

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/NiPtMn(40 nm)

Heat Treatment

Sample 8-3

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/NiPtMn(50 nm)

Heat Treatment

Sample 8-4

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/NiPtMn(60 nm)

Heat Treatment

Sample 8-5

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/NiPtMn(100 nm)

Heat Treatment

NINTH EXAMPLE

FIG. 12

illustrates the measurement results of exchange-coupling magnetic field Hua of the various samples with anti-ferromagnetic layers of NiAgMn. The thickness values at deposition of the anti-ferromagnetic layers in the samples are indicated in Table 9. In this example, the target or final thickness of the anti-ferromagnetic layer was 15 nm, and the composition of NiAgMn was Ni—45 at %, Ag—5 at % and Mn—45 at %.

TABLE 9

Layer Structure at Deposition

Sample 9-0

Without

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Thinning

Co(2 nm)/NiAgMn(15 nm)/Ta(5 nm)

Process after

Heat Treatment

Sample 9-1

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/NiAgMn(30 nm)

Heat Treatment

Sample 9-2

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/NiAgMn(40 nm)

Heat Treatment

Sample 9-3

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/NiAgMn(50 nm)

Heat Treatment

Sample 9-4

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/NiAgMn(60 nm)

Heat Treatment

Sample 9-5

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/NiAgMn(100 nm)

Heat Treatment

TENTH EXAMPLE

FIG. 13

illustrates the measurement results of exchange-coupling magnetic field Hua of the various samples with anti-ferromagnetic layers of NiFeMn. The thickness values at deposition of the anti-ferromagnetic layers in the samples are indicated in Table 10. In this example, the target or final thickness of the anti-ferromagnetic layer was 15 nm, and the composition of NiFeMn was Ni—45 at %, Fe—5 at % and Mn—50 at %.

TABLE 10

Layer Structure at Deposition

Sample 10-0

Without

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Thinning

Co(2 nm)/NiFeMn(15 nm)/Ta(5 nm)

Process after

Heat Treatment

Sample 10-1

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/NiFeMn(30 nm)

Heat Treatment

Sample 10-2

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/NiFeMn(40 nm)

Heat Treatment

Sample 10-3

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/NiFeMn(50 nm)

Heat Treatment

Sample 10-4

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/NiFeMn(60 nm)

Heat Treatment

Sample 10-5

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/NiFeMn(100 nm)

Heat Treatment

ELEVENTH EXAMPLE

FIG. 14

illustrates the measurement results of exchange-coupling magnetic field Hua of the various samples with anti-ferromagnetic layers of PtCrMn. The thickness values at deposition of the anti-ferromagnetic layers in the samples are indicated in Table 11. In this example, the target or final thickness of the anti-ferromagnetic layer was 15 nm, and the composition of PtCrMn was Pt—43 at %, Cr—9 at % and Mn—48 at %.

TABLE 11

Layer Structure at Deposition

Sample 11-0

Without

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Thinning

Co(2 nm)/PtCrMn(15 nm)/Ta(5 nm)

Process after

Heat Treatment

Sample 11-1

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtCrMn(30 nm)

Heat Treatment

Sample 11-2

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtCrMn(40 nm)

Heat Treatment

Sample 11-3

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtCrMn(50 nm)

Heat Treatment

Sample 11-4

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtCrMn(60 nm)

Heat Treatment

Sample 11-5

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/PtCrMn(100 nm)

Heat Treatment

TWELFTH EXAMPLE

FIG. 15

illustrates the measurement results of exchange-coupling magnetic field Hua of the various samples with anti-ferromagnetic layers of NiRuMn. The thickness values at deposition of the anti-ferromagnetic layers in the samples are indicated in Table 12. In this example, the target or final thickness of the anti-ferromagnetic layer was 15 nm, and the composition of NiRuMn was Ni—43 at %, Ru—9 at % and Mn—48 at %.

TABLE 12

Layer Structure at Deposition

Sample 12-0

Without

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Thinning

Co(2 nm)/NiRuMn(15 nm)/Ta(5 nm)

Process after

Heat Treatment

Sample 12-1

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/NiRuMn(30 nm)

Heat Treatment

Sample 12-2

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/NiRuMn(40 nm)

Heat Treatment

Sample 12-3

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/NiRuMn(50 nm)

Heat Treatment

Sample 12-4

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/NiRuMn(60 nm)

Heat Treatment

Sample 12-5

With Thinning

Ta(5 nm)/NiFe(7 nm)/Co(1 nm)/Cu(3 nm)/

Process after

Co(2 nm)/NiRuMn(100 nm)

Heat Treatment

As will be apparent from

FIGS. 4

to

15

, the thicker of the anti-ferromagnetic layer at deposition, namely the greater of the thinning amount of the anti-ferromagnetic layer after ordering, the larger exchange-coupling magnetic field Hua can be obtained even if the anti-ferromagnetic layer has the target thickness. As a result, the exchange-coupling energy between the ferromagnetic layer and the anti-ferromagnetic layer of the spin valve structure can be increased without changing or increasing the thickness of the anti-ferromagnetic layer so as to keep the divided sense current passing through the anti-ferromagnetic layer at almost the same value and so as to maintain the output characteristics of the MR sensor.

As will be understood from

FIGS. 4 and 8

, if the amount of thinning of the anti-ferromagnetic layer is less than 5 nm, the exchange-coupling magnetic field Hua in the spin valve structure becomes smaller than that of the structure with the anti-ferromagnetic layer formed by executing no thinning process. This is because a certain region near the surface (from the surface to a depth of 5 nm or more) of the anti-ferromagnetic layer becomes a dead region for operating as an anti-ferromagnetic layer due to oxidation and thus the dead region will not be completely removed if the thinning amount is less than 5 nm. Therefore, it is desired that, in the thinning process, the anti-ferromagnetic layer is thinned by 5 nm or more.

Also, it is desired that the anti-ferromagnetic layer is formed by a Mn-containing compound that has the CuAu—I type ordered crystal structure and is oriented along (111) crystal alignment face after ordering.

The Mn-containing compound is preferably an alloy that contains 80 at % or more of PtMn and additive of at least one of Ru, Rh, Pd, Au, Ag, Fe and Cr. Content of Mn in PtMn should be 40 to 60 at %. If the content of Mn is out of this range, ordered crystal structure cannot be formed in general and thus anti-ferromagnetic property cannot be expected.

The Mn-containing compound is also preferably an alloy that contains 80 at % or more of NiMn and additive of at least one of Ru, Rh, Pd, Au, Ag, Fe and Cr. Content of Mn in NiMn should be 40 to 60 at %. If the content of Mn is out of this range, ordered crystal structure cannot be formed in general and thus anti-ferromagnetic property cannot be expected.

As mentioned before, according to the present invention, an anti-ferromagnetic layer is deposited to have a larger thickness than a target thickness, then ordered and thereafter thinned to have the target thickness. Thus, it is possible to obtain a multi-layered MR structure with a larger exchange-coupling energy than that of a multi-layered MR structure in which an anti-ferromagnetic layer is deposited to have the target thickness from the beginning and ordered. As a result, according to the present invention, the exchange-coupling energy between the ferromagnetic layer and the anti-ferromagnetic layer of the multi-layered MR structure can be increased without changing or increasing the thickness of the anti-ferromagnetic layer so as to keep the divided sense current passing through the anti-ferromagnetic layer at almost the same value and so as to maintain the output characteristics of the MR sensor.

Many widely different embodiments of the present invention may be constructed without departing from the spirit and scope of the present invention. It should be understood that the present invention is not limited to the specific embodiments described in the specification, except as defined in the appended claims.

Manufacturing method of magnetoresistive effect sensor and manufacturing method of magnetic head with the sensor

Information

Patent Number

Date Filed

Date Issued

Inventors

Original Assignees

Examiners

Agents

CPC

US Classifications

Field of Search

US

International Classifications

Abstract

Description

Claims

Priority Claims (1)

US Referenced Citations (1)