Patent Application
20240055248
Certain configurations of mass spectrometer sampler cones, metal gaskets and interfaces that can be used together to provide a seal.
Mass spectrometer analysis requires various vacuum stages often operating at pressure significantly below atmospheric pressure. Leaks can develop between various components in the system, which can lead to inaccuracies in mass measurements and reduced precision.
In an aspect, a mass spectrometer assembly comprises a sampler cone, a mass analyzer interface and a gasket. In some examples, the sampler cone comprises a sample orifice configured to fluidically couple to an ionization source that provides a fluid beam comprising ions to the sample orifice, wherein the sampler cone comprises a first surface feature on a surface of the sampler cone. In certain examples, the mass analyzer interface can be configured to couple to the sampler cone, wherein the mass analyzer interface comprises a second surface feature on a surface of the interface. In some configurations, the gasket can be present between the first surface feature and the second surface feature, wherein the first surface features provides a force to a first surface of the gasket and the second surface feature provides a force to a second surface of the gasket to provide a substantially fluid tight seal (or a fluid tight seal) between the sampler cone and the interface when the sampler cone is coupled to the interface.
In certain embodiments, the first surface feature of the sampler cone comprises a recess and the second surface feature of the mass analyzer interface comprises a projection, and wherein the recess is configured to engage the projection and crush the gasket between the recess and the projection to provide the substantially fluid tight seal (or the fluid tight seal) between the sampler cone and the interface as the sampler cone is coupled to the mass analyzer interface. In other embodiments, the first surface feature of the sampler cone comprises a projection and the second surface feature of the interface comprises a recess, and wherein the projection is configured to engage the recess and crush the gasket between the recess and the projection to provide the substantially fluid tight seal (or the fluid tight seal) between the sampler cone and the interface as the sampler cone is coupled to the mass analyzer interface. In some examples, the sampler cone further comprises threads configured to couple to threads on the mass analyzer interface. In other examples, the first surface feature of the sampler cone comprises a first projection and the second surface feature of the mass analyzer interface comprises a second projection, and wherein the first projection is configured to provide the force to the first surface of the gasket and the second projection is configured to provide the force to the second surface of the gasket to compress the gasket to provide the substantially fluid tight seal (or the fluid tight seal) between the sampler cone and the mass analyzer interface. In certain embodiments, at least one of the sampler cone and the mass analyzer interface further comprises an additional surface feature. In other embodiments, the gasket comprises a metal gasket with a thickness of about 0.1 mm to about 0.5 mm. In some examples, the first surface feature, the second surface feature and the gasket each comprises a material with a substantially similar coefficient of thermal expansion. In other examples, the gasket is a multi-layer metal gasket.
In some embodiments, the gasket comprises a thickness of about 0.2 mm to about 0.25 mm, wherein the first surface feature is configured as a triangular projection with a height of less than 1 mm and the second surface feature is configured as a triangular projection with a height of less than 1 mm.
In other embodiments, the gasket comprises a thickness of about 0.2 mm to about 0.25 mm, wherein the first surface feature is configured as a triangular projection with a height of less than 1 mm and the second surface feature is configured as a triangular recess with a depth of less than 1 mm.
In some configurations, the gasket comprises a thickness of about 0.2 mm to about 0.25 mm, wherein the first surface feature is configured as a triangular recess with a depth of less than 1 mm and the second surface feature is configured as a triangular projection with a height of less than 1 mm.
In another aspect, a method of sealing a sampler cone to a mass analyzer interface is described. In some instances, the method comprises coupling a sampler cone to the mass analyzer interface to provide a substantially fluid tight seal (or a fluid tight seal) between the sampler cone and the mass analyzer interface by crushing a metal gasket between a first surface feature of the sampler cone and a second surface feature of the mass analyzer interface to provide the substantially fluid tight seal (or the fluid tight seal) between the sampler cone and the mass analyzer interface.
In some examples, the method comprises tightening first threads of the sampler cone to second threads of the mass analyzer interface crushes the metal gasket between the first surface feature and the second surface feature. In some instances, the first surface feature of the sampler cone comprises a recess and the second surface feature of the mass analyzer interface comprises a projection, and wherein the recess is configured to engage the projection and crush the gasket between the recess and the projection to provide the substantially fluid tight seal (or the fluid tight seal) between the sampler cone and the interface as the sampler cone is coupled to the interface. In other instances, the first surface feature of the sampler cone comprises a projection and the second surface feature of the mass analyzer interface comprises a recess, and wherein the projection is configured to engage the recess and crush the gasket between the recess and the projection to provide the substantially fluid tight seal (or the fluid tight seal) between the sampler cone and the interface as the sampler cone is coupled to the mass analyzer interface. In some embodiments, the first surface feature of the sampler cone comprises a first projection and the second surface feature of the mass analyzer interface comprises a second projection, and wherein the first projection is configured to provide the force to the first surface of the gasket and the second projection is configured to provide the force to the second surface of the gasket to compress the gasket to provide the substantially fluid tight seal (or the fluid tight seal).
In some examples, the gasket comprises a thickness of about 0.2 mm to about 0.25 mm, wherein the first surface feature is configured as a triangular projection with a height of less than 1 mm and the second surface feature is configured as a triangular projection with a height of less than 1 mm.
In certain examples, the first surface feature, the second surface feature and the gasket each comprises a material with a substantially similar (or the same) coefficient of thermal expansion. In some examples, the gasket is a multi-layer metal gasket.
In another aspect, a mass spectrometer comprises a sampler cone comprising a sample orifice configured to fluidically couple to an ionization source that provides a fluid beam comprising ions to the sample orifice, wherein the sampler cone comprises a first surface feature on a surface of the sampler cone, a mass analyzer interface configured to couple to the sampler cone, wherein the mass analyzer interface comprises a second surface feature on a surface of the mass analyzer interface, a gasket between the first surface feature and the second surface feature, wherein the first surface features provides a force to a first surface of the gasket and the second surface feature provides a force to a second surface of the gasket to provide a substantially fluid tight seal (or the fluid tight seal) between the sampler cone and the interface when the sampler cone is coupled to the mass analyzer interface, and a mass analyzer.
In certain configurations, the mass spectrometer comprises a sample introduction device fluidically coupled to an ionization source, wherein the ionization source is fluidically coupled to the orifice of the sampler cone. In other configurations, the mass spectrometer comprises a detector. In some examples, the ionization source comprises an inductively coupled plasma. In certain examples, the mass analyzer comprises at least one quadrupole. In some embodiments, the detector comprises an electron multiplier. In some examples, the first surface feature of the sampler cone comprises a recess and the second surface feature of the mass analyzer interface comprises a projection, and wherein the recess is configured to engage the projection and crush the gasket between the recess and the projection to provide the substantially fluid tight seal (or the fluid tight seal) between the sampler cone and the mass analyzer interface as the sampler cone is coupled to the mass analyzer interface. In other examples, the first surface feature of the sampler cone comprises a projection and the second surface feature of the mass analyzer interface comprises a recess, and wherein the projection is configured to engage the recess and crush the gasket between the recess and the projection to provide the substantially fluid tight seal (or the fluid tight seal) between the sampler cone and the interface as the sampler cone is coupled to the mass analyzer interface. In other embodiments, the first surface feature of the sampler cone comprises a first projection and the second surface feature of the mass analyzer interface comprises a second projection, and wherein the first projection is configured to provide the force to the first surface of the gasket and the second projection is configured to provide the force to the second surface of the gasket to compress the gasket to provide the substantially fluid tight seal (or the fluid tight seal) between the sampler cone and the mass analyzer interface. In some embodiments, the gasket comprises a thickness of about 0.1 mm to about 0.5 mm.
In another aspect, a kit comprises a sampler cone comprising a sample orifice configured to fluidically couple to an ionization source that provides a fluid beam comprising ions to the sample orifice, wherein the sampler cone comprises a first surface feature configured to engage a second surface feature on an interface of a mass spectrometer, a gasket, e.g., a metal gasket, sized and arranged to be placed between the first surface feature of the sampler cone and the second surface feature of the interface and configured to be crushed between the first surface feature of the sampler cone and the second surface feature of the interface when the sampler cone is coupled to the interface of the mass spectrometer; and written or electronic instructions for using the sampler cone and the metal gasket to couple the sampler cone to the interface of the mass spectrometer to provide a substantially fluid tight seal (or the fluid tight seal) between the sampler cone and the interface of the mass spectrometer. In some examples, the kit comprises the interface. In other examples, the kit comprises a tool comprising a pre-set torque to tighten threads of the sampler cone to threads of the interface to crush the metal gasket and provide the substantially fluid tight seal.
In another aspect, a mass spectrometer sampler cone comprises a sample orifice configured to fluidically couple to an ionization source that provides a fluid beam comprising ions to the sample orifice, and a first surface feature on a surface of the sampler cone, wherein the first surface feature is configured to provide a force to a surface of a metal gasket to crush the metal gasket between the first surface feature of the sampler cone and a second surface feature of a mass analyzer interface to provide a substantially fluid tight seal (or the fluid tight seal) between the sampler cone and the mass analyzer.
In certain embodiments, the first surface feature of the sampler cone comprises a recess. In other embodiments, the first surface feature of the sampler cone comprises a projection. In some examples, the sampler cone further comprises threads configured to couple to threads on the mass analyzer interface.
In an additional aspect, a mass spectrometer interface configured to couple to a sampler cone comprises a first surface feature, wherein the first surface feature is configured to provide a force to a surface of a metal gasket to crush the metal gasket between the first surface feature of the mass spectrometer interface and a second surface feature of a sampler cone to provide a substantially fluid tight seal (or the fluid tight seal) between the sampler cone and the mass spectrometer interface.
In some examples, the first surface feature of the mass spectrometer interface comprises a recess. In other examples, the first surface feature of the mass spectrometer interface cone comprises a projection. In some examples, the mass spectrometer interface further comprises threads configured to couple to threads on the sampler cone.
In another aspect, a mass spectrometer sampler cone comprising a sample orifice and a surface feature is described. In some configurations, the sample orifice is configured to fluidically couple to an ionization source that provides a fluid beam comprising ions to the sample orifice. In certain examples, the sampler cone comprises a surface feature on a surface of the sampler cone, wherein the surface feature is configured to engage and crush a metal gasket between the surface feature of the sampler cone and a surface feature of an interface of a mass spectrometer to provide a substantially fluid tight seal between the sampler cone and the interface of the mass analyzer.
In certain embodiments, the surface feature of the sampler cone comprises a recess and the surface feature of the interface comprises a projection, and wherein the recess is configured to engage the projection and crush the metal gasket between the recess and the projection as the sampler cone is tightened to the interface. In other embodiments, the surface feature of the sampler cone comprises a projection and the surface feature of the interface comprises a recess, and wherein the projection is configured to engage the recess and crush the metal gasket between the recess and the projection as the sampler cone is tightened to the interface.
In some examples, the sampler cone further comprises threads configured to couple to threads on the interface.
In other examples, the surface feature of the sampler cone comprises a circular recess and the surface feature of the interface comprises a circular projection, and wherein the circular recess is configured to engage the circular projection through the metal gasket to crush the metal gasket between the circular recess and the circular projection to provide the substantially fluid tight seal (or fluid tight seal) between the sampler cone and the interface of the mass analyzer. In some examples, the circular recess comprises a depth of less than 1 mm, and wherein the metal gasket comprises a thickness less than 0.5 mm.
In other examples, the sampler cone comprises a similar material as the metal gasket. In some embodiments, the sampler cone comprises one or more of aluminum, nickel, platinum or a nickel base with a platinum tip.
In certain embodiments, the sampler cone comprises a conical shape with an inner diameter of the sampler cone increasing from the sample orifice to a base of the sampler cone where the surface feature of the sampler cone is present.
In other embodiments, the sampler cone comprises a second surface feature on the sampler cone, wherein the second surface feature is separate from the surface feature.
In an additional aspect, a mass spectrometer interface comprises first threads configured to couple to second threads of a sampler cone. In some examples, the interface further comprises a first surface feature configured to engage a second surface feature on a sampler cone. In some configurations, the first surface feature and the second surface feature crush a metal gasket positioned between the first surface feature and the second surface feature to provide a substantially fluid tight seal (or fluid tight seal) between the sampler cone and the interface when the second threads of the sampler cone are mated to the first threads of the interface.
In some embodiments, the first surface feature of the interface comprises a recess and wherein the second surface feature of the sampler cone comprises a projection, and wherein the recess is configured to engage the projection to crush the metal gasket between the recess and the projection as the sampler cone is tightened to the interface.
In other embodiments, the first surface feature of the interface comprises a projection and wherein the second surface feature of the sampler cone comprises a recess, and wherein the projection is configured to engage the recess to crush the metal gasket between the recess and the projection as the sampler cone is tightened to the interface.
In additional embodiments, the first surface feature of the interface comprises a circular recess and wherein the second surface feature of the sampler cone comprises a circular projection, and wherein the circular recess is configured to engage the circular projection to crush the metal gasket between the circular recess and the circular projection to provide the substantially fluid tight seal (or fluid tight seal) between the sampler cone and the interface of the mass analyzer. In some examples, the circular recess comprises a depth of less than 1 mm, and wherein the metal gasket comprises a thickness less than 0.5 mm.
In other examples, the first surface feature of the interface comprises a circular projection and the second surface feature of the sampler cone comprises a circular recess, and wherein the circular projection is configured to engage the circular recess to crush the metal gasket between the circular projection and the circular recess to provide the substantially fluid tight seal (or fluid tight seal) between the sampler cone and the interface of the mass analyzer.
In some embodiments, the interface comprises a similar material as the metal gasket. In other embodiments, the interface comprises aluminum.
In some examples, the mass spectrometer interface comprises a second surface feature on the interface, wherein the second surface feature is separate from the surface feature.
In some embodiments, the interface is configured to couple to the sampler cone without the use of a rubber O-ring between the interface and the sampler cone.
In another aspect, a mass spectrometer comprises a sampler cone comprising a sample orifice configured to fluidically couple to an ionization source that provides a fluid beam comprising ions to the sample orifice, wherein the sampler cone comprises first threads and a first surface feature. The mass spectrometer may also comprise a metal gasket, and an interface coupled to a mass analyzer and comprising second threads configured to couple to the first threads of a sampler cone, wherein the interface further comprises a second surface feature configured to engage the first surface feature of the sampler cone, wherein when the first threads of the sampler cone are mated to the second threads of the interface the metal gasket is crushed between the first surface feature and the second surface feature to provide a substantially fluid tight seal (or fluid tight seal) between the sampler cone and the interface.
In certain embodiments, the mass spectrometer comprises a sample introduction device, an ionization source, and a detector, wherein the sample introduction device is fluidically coupled to the ionization source, wherein the sample orifice of the sampler cone is fluidically coupled to the ionization source, and wherein the mass analyzer is fluidically coupled to the detector. In some embodiments, the ionization source comprises an inductively coupled plasma. In other examples, the mass analyzer comprises at least one quadrupole. In some embodiments, the detector comprises an electron multiplier. In other examples, the detector comprises a time of flight device.
In certain embodiments, the first surface feature of the sampler cone comprises a recess, and wherein the second surface feature of the interface comprises a projection configured to engage the recess, and wherein the metal gasket is positioned between the recess and the projection and is crushed when the first threads of the sampler cone are mated to the second threads of the interface.
In some examples, the first surface feature of the sampler cone comprises a projection and wherein the second surface feature of the interface comprises a recess configured to engage the projection, and wherein the metal gasket is positioned between the projection and the recess and is crushed when the first threads of the sampler cone are mated to the second threads of the interface.
In other examples, the first surface feature of the sampler cone comprises a circular recess and wherein the seconds surface feature of the interface comprises a circular projection configured to engage the circular recess, and wherein the metal gasket is positioned between the circular recess and the circular projection and is crushed when the first threads of the sampler cone are mated to the second threads of the interface.
In further embodiments, the first surface feature of the sampler cone comprises a circular projection and wherein the seconds surface feature of the interface comprises a circular recess configured to engage the circular projection, and wherein the metal gasket is positioned between the circular projection and the circular recess and is crushed when the first threads of the sampler cone are mated to the second threads of the interface.
In another aspect, a kit comprises a sampler cone, a metal gasket and instructions for using the sampler cone and gasket. In some embodiments, the sampler cone of the kit comprises a sample orifice configured to fluidically couple to an ionization source that provides a fluid beam comprising ions to the sample orifice, wherein the sampler cone comprises a first surface feature configured to engage a second surface feature on an interface. In some embodiments, the metal gasket can be sized and arranged to be placed between the first surface feature of the sampler cone and the second surface feature of the interface and configured to be crushed between the first surface feature of the sampler cone and the second surface feature of the interface when the sampler cone is coupled to the interface of the mass analyzer. In certain instances, the kit comprises instructions for using the sampler cone and the metal gasket to couple the sampler cone to the interface of the mass analyzer to provide a substantially fluid tight seal (or fluid tight seal) between the sampler cone and the interface of the mass analyzer.
In some examples, the kit may also comprise the interface. In other examples, the kit may comprise a tool comprising a pre-set torque to tighten the sampler cone to the interface to crush the metal gasket and provide the substantially fluid tight seal (or fluid tight seal) without overtightening the sampler cone.
In an additional aspect, a method of coupling a sampler cone to a mass analyzer interface to provide a substantially fluid tight seal (or fluid tight seal) between the sampler cone and the mass analyzer interface is provided. In some examples, the method comprises crushing a metal gasket between a first surface feature of the sampler cone and a second surface feature of the mass analyzer interface to provide the substantially fluid tight seal (or fluid tight seal) between the sampler cone and the mass analyzer interface. In other examples, the method comprises tightening first threads of the sampler cone to second threads of the mass analyzer interface to a selected torque value to crush the metal gasket between the first surface feature and the second surface feature.
Additional features, aspects, embodiments and configurations are described in more detail below.
Certain embodiments and configurations are described with reference to the accompanying figures in which:
It will be recognized by the skilled person in the art, given the benefit of this disclosure, that the various components shown in the figures are not necessarily shown to scale. Certain features may be enlarged or otherwise distorted to facilitate a better understanding. For example, the thickness of the gasket may be increased to illustrate better how one component couples to or applies a force to another component. Illustrative thicknesses for the gaskets are described and no particular gasket thickness, based on the relative sizes of the components shown in the figures, is intended from the exemplary configurations shown in the figures.
Certain configurations are described of sampling cones that can be used to form a seal with a mass spectrometer interface without the need to have highly polished or planar surfaces. For example, a flat metal gasket can be positioned between surface features on each of a sampler cone and an interface and can be crushed between the surface features to assist in sealing the sampler cone to the interface. In certain instances, the sampler cone and/or interface does not need to rely on the seal made between flat and highly polished surfaces and instead can implement a crush seal approach optionally in combination with surface features on the sampler cone and/or surface features on the interface to seal the interface to the sampler cone. The seal can be provided by torqueing down the sampler cone to the interface with a crush washer or gasket between them assisting in production of a fluid tight seal between the two components. Tightening of the sampler cone to the interface results in distortion or “crushing” of at least some portion of the metal gasket, to at least some degree, to provide the seal between the components. As noted in more detail below, a portion or all of the metal gasket can be sandwiched or crushed between other components to assist in providing a substantially fluid tight seal.
Reference is made herein in certain instances to “projections” or “recesses.” These terms are used to provide a more user-friendly description and signify the presence of a surface feature which is positioned, at least to some extent, above a surface, in the case of a projection, or penetrates into a surface, in the case of a recess, to provide some open space along the surface. Unless specified in reference to a particular configuration, no particular shape, width, height, length or configuration is intended to be required by the use of these terms. Reference is also made to a “substantially fluid tight seal,” which refers to a seal between the sampler cone and the interface such that little or no gas can leak into the vacuum stages of the mass analyzer from the sampler cone/interface surfaces. If desired, the seal between the sampler cone and the interface may be fluid tight such that zero gas can be drawn into the mass analyzer through any space between the sampler cone and the interface, except for the sampler orifice.
In certain embodiments, a general schematic of certain components of a mass spectrometer (MS) is shown in
In certain examples, to maintain the vacuum in the different stages of the mass analyzer using the pumps 130, 140, a fluid tight seal between the sampling cone 110 and the edge 120 of the interface is needed so fluid only enters into the mass analyzer through the small orifice in the sampler cone 110.
In certain embodiments, to avoid or reduce the problems associated with coupling a sampler cone to an interface using a rubber O-ring, certain configurations described herein advantageously include a suitable shape or surface feature on or in a surface of the sampler cone that can engage or otherwise receive a suitable shape or surface feature on or in a surface of an interface. In other instances, the sampler cone may be configured to sandwich or crush a gasket between two or more components to provide a substantially fluid tight seal. For example, a thin metal crush gasket, washer or seal can be positioned between the surface features of the sampler cone and interface so engagement of the sampler cone surface feature to the interface surface features crushes the thin metal gasket and provides a seal between the sampler cone and the interface. Alternatively, a thin metal crush gasket, washer or seal can be positioned between the surface features of the sampler cone such that placing surface features in proximity to each other can sandwich or crush the thin metal crush gasket and effectuate the substantially fluid tight seal. By using a metal gasket/seal along with suitably configured sampler cones and/or interfaces, improved sealing and heat transfer can be achieved. In addition, the use of a metal gasket/seal avoids the need to have highly polished mating surfaces on the sampler cone and the interface.
For example, the surfaces of the sampler cone and/or interface where the surface projections are present could be non-planar. Further, the surface features need not have any particular shape or geometry and can be designed, for example, to amplify the force at a given area to enhance sealing at the contact point(s) between the gasket and component.
In certain examples and referring to
In certain embodiments, the shape of the features of the sampler cone and interface need not be those shown in
While threads present on the sampler cone and interface are described above as being used to couple the sampler cone to the interface, other configurations are possible. For example, there can be a retaining ring around the sampler cone which comprises the threads and no threads are present on the sampler cone. In another configuration, the sampler cone has multiple screws or bolts (or other type of external fastener) around its outer circumference and away from the seal line. The fasteners are tightened and the cone is pushed against the interface, which would also result in crushing of the metal gasket between the surface features. In other instances, the vacuum pressure itself in the vacuum manifold can be used to draw the sampler cone against the interface and crush the metal gasket to provide the seal without using any external fasteners or threads. The sampler cone may comprise many different types of materials and typical materials and generally inert and unreactive with an ions or other analytes which pass through the sample orifice of the sampler cone or otherwise contact surfaces of the sampler cone. For example, the sampler cone may comprise one or more of aluminum, nickel, platinum or a nickel base with a platinum tip. The interface may comprise similar materials as the sampler cone, e.g., aluminum, nickel, platinum, etc., though the interface materials need not be the same as the materials of the sampler cone and/or any skimmer cones that are present.
In some embodiments, the metal gaskets 215, 255 each can be configured as a generally planar metal ring or may have other shapes that generally mirror that on sampler cone. For example, the metal gaskets 215, 255 each can be circular, elliptical or have other shapes. The metal gaskets 215, 255 can also each be configured as a single layer gasket or a multi-layer gasket. Two or more separate gaskets could also be used if desired. While not required in all cases, the metal gasket may comprise a soft metal material that can crush or compress at least to some degree as the threads of the sampler cone are tightened to threads of the interface. For example, the metal gaskets 215, 255 each may independently comprise aluminum, nickel, brass, pure platinum, gold, copper or other transition metals that can be crushed, to at least some degree, upon application of a force used to tighten the sampler cone to the interface. As noted herein, a tool with a pre-set torque limit can be used to ensure the sampler cone is tightened to the interface to a suitable degree but not overtightened to deform or break the metal gasket and disrupt any seal. The metal gasket may also permit heat transfer from the sampler cone to the interface (or vice versa) as desired. The metal gasket thickness can vary, for example, from about 0.1 mm to about 0.5 mm, though these values are merely illustrative and smaller or larger thicknesses could be used if desired. The metal gasket thickness is typically sized based on the depth and/or height of any surface features present on the non-planar sampler cone and/or interface. For example, the recess on the sampler cone might be around 0.2-1 mm deep, and the height of the projection or boss on the interface can be about 0.2-1 mm high. The metal gasket can be sized so it occupies at least some of the space that may be present when the projection of the interface is coupled to the recess of the sampler cone, e.g., it can contact substantially all surfaces of the surface features of the sampler cone and interface after the metal gasket is compressed or crushed. As noted in more detail below, the metal gasket need not have the same thickness at all areas and need not be produced from the same material across the surface of the gasket. Further, the gasket may comprise indicia, indentations or other surface features which can aid in positioning the gasket at a certain site or area if desired.
In other configurations, the sampler cone need not have a recess but could instead comprise a projection or boss. One illustration is shown in
In certain embodiments, the sampler cone and the interface could each have a recess or other inward surface feature designed to mate to/engage a metal gasket. In such cases, the gasket thickness itself may be increased, or the gasket may have a variable thickness across a surface of the metal gasket, so when it is crushed or compressed it is pushed into the recesses of each of the sampler cone and the interface. An illustration is shown in
In certain embodiments, the sampler cone and the interface could each have a projection or other outward surface feature designed to mate to/engage a metal gasket. An illustration is shown in
In certain embodiments, the metal gaskets described herein need not be planar. For example, the metal gasket may have its own shapes or surface features configured to couple to the surface features of a sampler cone and/or interface. One illustration is shown in
In certain embodiments, the entire surface of the gasket need not be produced from the same material. For example, it may be desirable to match the materials used in the mating area surfaces of the gasket with those materials used in the cone, interface or other component such there is little or no difference in thermal expansion rates of the materials, e.g., little or no mismatch in the coefficients of thermal expansion, to maintain the substantially fluid tight seal over a wide temperature range. An illustration is shown in
In other configurations, the gasket need not have the same thickness across its entire surface. Referring to
In certain examples, the gasket and surface features on the cone, interface or other component can be configured together to provide a desired sealing force between the components. Referring to
In other examples, the projections used to apply a force to the surfaces of the gasket need not be non-planar. For example, as shown in
In other configurations, it may be desirable to use more than a single projection or recess on one or more of the components, e.g., on one or more of a sampler cone and an interface. While many different configurations are possible, one configuration is shown in
In certain embodiments, the sampler cone and metal gaskets, and other devices which can use a gasket to provide a substantially fluid tight seal described herein, can be used in a mass spectrometer system comprising many different components or stages. One illustration is shown in
In some configurations, the ionization device/source 1020 may comprise many different types of devices that can receive a fluid from the sample introduction device 1010 and ionize/atomize analyte in the fluid sample. In some examples, the ionization device/source 1020 may comprise an inductively coupled plasma that can be produced using a torch and an induction device, a capacitively coupled plasma, an electron ionization device, a chemical ionization device, a field ionization source, desorption sources such as, for example, those sources configured for fast atom bombardment, field desorption, laser desorption, plasma desorption, thermal desorption, electrohydrodynamic ionization/desorption, etc., thermospray or electrospray ionization sources or other types of ionization sources. Notwithstanding that many different types of ionization devices/sources 1020 can be used, the ionization device/source 1020 typically ionizes analyte ions in the sample and provides them in a fluid beam downstream to a sampler cone and into the mass analyzer 730 where the ions/atoms can be separated/selected based on different mass-to-charge ratios. Various types of ionization devices/sources and associated componentry can be found, for example, in commonly assigned U.S. Pat. Nos. 10,096,457, 9,942,974, 9,848,486, 9,810,636, 9,686,849 and other patents currently owned by PerkinElmer Health Sciences, Inc. (Waltham, MA) or PerkinElmer Health Sciences Canada, Inc. (Woodbridge, Canada).
In some examples, the mass analyzer 1030 may take numerous forms depending generally on the sample nature, desired resolution, etc. and exemplary mass analyzers may comprise one or more rod assemblies such as, for example, a quadrupole or other rod assembly. The mass analyzer 1030 may comprise one or more cones, e.g., a skimmer cone, sampling cone, an interface, ion guides, collision cells, lenses and other components that can be used to sample an entering beam received from the ionization device/source 1020. The various components can be selected to remove interfering species, remove photons and otherwise assist in selecting desired ions from the entering fluid comprising the ions. In some examples, the mass analyzer 1030 may be, or may include, a time of flight device. In some instances, the mass analyzer 1030 may comprise its own radio frequency generator. In certain examples, the mass analyzer 1030 can be a scanning mass analyzer, a magnetic sector analyzer (e.g., for use in single and double-focusing MS devices), a quadrupole mass analyzer, an ion trap analyzer (e.g., cyclotrons, quadrupole ions traps), time-of-flight analyzers (e.g., matrix-assisted laser desorbed ionization time of flight analyzers), and other suitable mass analyzers that can separate species with different mass-to-charge ratios. If desired, the mass analyzer 1030 may comprise two or more different devices arranged in series, e.g., tandem MS/MS devices or triple quadrupole devices, to select and/or identify the ions that are received from the ionization device/source 1020. Various components that can be present in a mass analyzer are described, for example, in commonly owned U.S. Pat. Nos. 10,032,617, 9,916,969, 9,613,788, 9,589,780, 9,368,334, 9,190,253 and other patents currently owned by PerkinElmer Health Sciences, Inc. (Waltham, MA) or PerkinElmer Health Sciences Canada, Inc. (Woodbridge, Canada).
In some examples, the detector 1040 may be any suitable detection device that may be used with existing mass spectrometers, e.g., electron multipliers, Faraday cups, coated photographic plates, scintillation detectors, multi-channel plates, etc., and other suitable devices that will be selected by the person of ordinary skill in the art, given the benefit of this disclosure. Illustrative detectors that can be used in a mass spectrometer are described, for example, in commonly owned U.S. Pat. Nos. 9,899,202, 9,384,954, 9,355,832, 9,269,552, and other patents currently owned by PerkinElmer Health Sciences, Inc. (Waltham, MA) or PerkinElmer Health Sciences Canada, Inc. (Woodbridge, Canada).
In certain instances, the mass spectrometer system may also comprise a processor 1050, which typically take the forms of a microprocessor and/or computer and suitable software for analysis of samples introduced into the mass spectrometer 1000. While the processor 1050 is shown as being electrically coupled to the mass analyzer 1030 and the detector 1040, it can also be electrically coupled to the other components shown in
In certain configurations, the processor 1050 may be present in one or more computer systems and/or common hardware circuity including, for example, a microprocessor and/or suitable software for operating the system, e.g., to control the voltages of the ion source, pumps, mass analyzer, detector, etc. In some examples, any one or more components of the system 700 may comprise its own respective processor, operating system and other features to permit operation of that component. The processor can be integral to the systems or may be present on one or more accessory boards, printed circuit boards or computers electrically coupled to the components of the system. The processor is typically electrically coupled to one or more memory units to receive data from the other components of the system and permit adjustment of the various system parameters as needed or desired. The processor may be part of a general-purpose computer such as those based on Unix, Intel PENTIUM-type processor, Apple A series processors, Motorola PowerPC, Sun UltraSPARC, Hewlett-Packard PA-RISC processors, or any other type of processor. One or more of any type computer system may be used according to various embodiments of the technology. Further, the system may be connected to a single computer or may be distributed among a plurality of computers attached by a communications network. It should be appreciated that other functions, including network communication, can be performed and the technology is not limited to having any particular function or set of functions. Various aspects may be implemented as specialized software executing in a general-purpose computer system. The computer system may include a processor connected to one or more memory devices, such as a disk drive, memory, or other device for storing data. Memory is typically used for storing programs, calibrations and data during operation of the system in the various modes using the gas mixture. Components of the computer system may be coupled by an interconnection device, which may include one or more buses (e.g., between components that are integrated within a same machine) and/or a network (e.g., between components that reside on separate discrete machines). The interconnection device provides for communications (e.g., signals, data, instructions) to be exchanged between components of the system. The computer system typically can receive and/or issue commands within a processing time, e.g., a few milliseconds, a few microseconds or less, to permit rapid control of the system 1000. For example, computer control can be implemented to control the vacuum pressure, to control voltages provided to the mass analyzer, etc. The processor typically is electrically coupled to a power source which can, for example, be a direct current source, an alternating current source, a battery, a fuel cell or other power sources or combinations of power sources. The power source can be shared by the other components of the system. The system may also include one or more input devices, for example, a keyboard, mouse, trackball, microphone, touch screen, manual switch (e.g., override switch) and one or more output devices, for example, a printing device, display screen, speaker. In addition, the system may contain one or more communication interfaces that connect the computer system to a communication network (in addition or as an alternative to the interconnection device). The system may also include suitable circuitry to convert signals received from the various electrical devices present in the systems. Such circuitry can be present on a printed circuit board or may be present on a separate board or device that is electrically coupled to the printed circuit board through a suitable interface, e.g., a serial ATA interface, ISA interface, PCI interface or the like or through one or more wireless interfaces, e.g., Bluetooth, Wi-Fi, Near Field Communication or other wireless protocols and/or interfaces.
In certain embodiments, the storage system used in the systems described herein typically includes a computer readable and writeable non-volatile recording medium in which codes can be stored that can be used by a program to be executed by the processor or information stored on or in the medium to be processed by the program. The medium may, for example, be a hard disk, solid state drive or flash memory. Typically, in operation, the processor causes data to be read from the non-volatile recording medium into another memory that allows for faster access to the information by the processor than does the medium. This memory is typically a volatile, random access memory such as a dynamic random access memory (DRAM) or static memory (SRAM). It may be located in the storage system or in the memory system. The processor generally manipulates the data within the integrated circuit memory and then copies the data to the medium after processing is completed. A variety of mechanisms are known for managing data movement between the medium and the integrated circuit memory element and the technology is not limited thereto. The technology is also not limited to a particular memory system or storage system. In certain embodiments, the system may also include specially-programmed, special-purpose hardware, for example, an application-specific integrated circuit (ASIC) or a field programmable gate array (FPGA). Aspects of the technology may be implemented in software, hardware or firmware, or any combination thereof. Further, such methods, acts, systems, system elements and components thereof may be implemented as part of the systems described above or as an independent component. Although specific systems are described by way of example as one type of system upon which various aspects of the technology may be practiced, it should be appreciated that aspects are not limited to being implemented on the described system. Various aspects may be practiced on one or more systems having a different architecture or components. The system may comprise a general-purpose computer system that is programmable using a high-level computer programming language. The systems may be also implemented using specially programmed, special purpose hardware. In the systems, the processor is typically a commercially available processor such as the well-known Pentium class processors available from the Intel Corporation. Many other processors are also commercially available. Such a processor usually executes an operating system which may be, for example, the Windows 95, Windows 98, Windows NT, Windows 2000 (Windows ME), Windows XP, Windows Vista, Windows 7, Windows 8 or Windows 10 operating systems available from the Microsoft Corporation, MAC OS X, e.g., Snow Leopard, Lion, Mountain Lion or other versions available from Apple, the Solaris operating system available from Sun Microsystems, or UNIX or Linux operating systems available from various sources. Many other operating systems may be used, and in certain embodiments a simple set of commands or instructions may function as the operating system.
In certain examples, the processor and operating system may together define a platform for which application programs in high-level programming languages may be written. It should be understood that the technology is not limited to a particular system platform, processor, operating system, or network. Also, it should be apparent to those skilled in the art, given the benefit of this disclosure, that the present technology is not limited to a specific programming language or computer system. Further, it should be appreciated that other appropriate programming languages and other appropriate systems could also be used. In certain examples, the hardware or software can be configured to implement cognitive architecture, neural networks or other suitable implementations. If desired, one or more portions of the computer system may be distributed across one or more computer systems coupled to a communications network. These computer systems also may be general-purpose computer systems. For example, various aspects may be distributed among one or more computer systems configured to provide a service (e.g., servers) to one or more client computers, or to perform an overall task as part of a distributed system. For example, various aspects may be performed on a client-server or multi-tier system that includes components distributed among one or more server systems that perform various functions according to various embodiments. These components may be executable, intermediate (e.g., IL) or interpreted (e.g., Java) code which communicate over a communication network (e.g., the Internet) using a communication protocol (e.g., TCP/IP). It should also be appreciated that the technology is not limited to executing on any particular system or group of systems. Also, it should be appreciated that the technology is not limited to any particular distributed architecture, network, or communication protocol.
In some instances, various embodiments may be programmed using an object-oriented programming language, such as, for example, SQL, SmallTalk, Basic, Java, Javascript, PHP, C++, Ada, Python, iOS/Swift, Ruby on Rails or C# (C-Sharp). Other object-oriented programming languages may also be used. Alternatively, functional, scripting, and/or logical programming languages may be used. Various configurations may be implemented in a non-programmed environment (e.g., documents created in HTML, XML or other format that, when viewed in a window of a browser program, render aspects of a graphical-user interface (GUI) or perform other functions). Certain configurations may be implemented as programmed or non-programmed elements, or any combination thereof. In some instances, the systems may comprise a remote interface such as those present on a mobile device, tablet, laptop computer or other portable devices which can communicate through a wired or wireless interface and permit operation of the systems remotely as desired.
In some embodiments, one or both of the sampler cone or interface may comprise more than one surface feature. Referring to
In certain embodiments, the sampler cone, metal gasket and/or interface can be present in a kit that can be used to retrofit an existing MS system with the various components. A tool with a pre-set torque may also be included in the kit to tighten the sampler cone to the interface using an appropriate amount of torque. The kit, for example, may comprise a sampler cone comprising a sample orifice configured to fluidically couple to an ionization source that provides an ionized sample comprising ions to the sample orifice, wherein the sampler cone comprises a first surface feature configured to engage a second surface feature on an interface. The kit may also comprise a metal gasket sized and arranged to be placed between the first surface feature of the sampler cone and the second surface feature of the interface and configured to be crushed between the first surface feature of the sampler cone and the second surface feature of the interface when the sampler cone is coupled to the interface of the mass analyzer. The kit may further comprise instructions for using the sampler cone and the metal gasket to couple the sampler cone to the interface of the mass analyzer to provide a substantially fluid tight seal between the sampler cone and the interface of the mass analyzer. If desired, the kit may also comprise an interface. If desired, the kit may also comprise a tool, e.g., a wrench, driver, ratchet, etc., comprising a pre-set torque to tighten the sampler cone to the interface to crush the metal gasket and provide the substantially fluid tight seal without overtightening the sampler cone. In other embodiments, the kit may comprise more than one type of gasket, gaskets of different thicknesses or gaskets comprising different materials.
In certain embodiments, a method can be implemented to couple a sampler cone to a mass analyzer interface to provide a substantially fluid tight seal between the sampler cone and the mass analyzer interface. The method is shown in
Certain specific examples are described to facilitate a better understanding of some of the novel and inventive aspects of the technology described herein.
Referring to
Referring to
Referring to
When introducing elements of the examples disclosed herein, the articles “a,” “an,” “the” and “said” are intended to mean that there are one or more of the elements. The terms “comprising,” “including” and “having” are intended to be open-ended and mean that there may be additional elements other than the listed elements. It will be recognized by the person of ordinary skill in the art, given the benefit of this disclosure, that various components of the examples can be interchanged or substituted with various components in other examples.
Although certain aspects, examples and embodiments have been described above, it will be recognized by the person of ordinary skill in the art, given the benefit of this disclosure, that additions, substitutions, modifications, and alterations of the disclosed illustrative aspects, examples and embodiments are possible.
This application is a divisional of U.S. application Ser. No. 16/662,545, filed Oct. 24, 2019, which claims priority to, and the benefit of, U.S. Provisional Application No. 62/750,114, filed on Oct. 24, 2018, the entire disclosures of which are hereby incorporated herein by reference for all purposes.
| Number | Date | Country | |
|---|---|---|---|
| 62750114 | Oct 2018 | US |
| Number | Date | Country | |
|---|---|---|---|
| Parent | 16662545 | Oct 2019 | US |
| Child | 18384075 | US |
